{"id":"https://openalex.org/W2102401509","doi":"https://doi.org/10.1109/cicc.2005.1568729","title":"Full-rate injection-locked 10.3Gb/s clock and data recovery circuit in a 45GHz-f/sub T/ SiGe process","display_name":"Full-rate injection-locked 10.3Gb/s clock and data recovery circuit in a 45GHz-f/sub T/ SiGe process","publication_year":2006,"publication_date":"2006-01-18","ids":{"openalex":"https://openalex.org/W2102401509","doi":"https://doi.org/10.1109/cicc.2005.1568729","mag":"2102401509"},"language":"en","primary_location":{"id":"doi:10.1109/cicc.2005.1568729","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc.2005.1568729","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, 2005.","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5005357456","display_name":"Jing-Hong Conan Zhan","orcid":null},"institutions":[{"id":"https://openalex.org/I205783295","display_name":"Cornell University","ror":"https://ror.org/05bnh6r87","country_code":"US","type":"education","lineage":["https://openalex.org/I205783295"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jing-Hong Conan Zhan","raw_affiliation_strings":["Cornell University, Ithaca, NY, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Cornell University, Ithaca, NY, USA","institution_ids":["https://openalex.org/I205783295"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070524748","display_name":"J.S. Duster","orcid":null},"institutions":[{"id":"https://openalex.org/I205783295","display_name":"Cornell University","ror":"https://ror.org/05bnh6r87","country_code":"US","type":"education","lineage":["https://openalex.org/I205783295"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"J.S. Duster","raw_affiliation_strings":["Cornell University, Ithaca, NY, USA","Cornell University (Ithaca, NY);"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Cornell University, Ithaca, NY, USA","institution_ids":["https://openalex.org/I205783295"]},{"raw_affiliation_string":"Cornell University (Ithaca, NY);","institution_ids":["https://openalex.org/I205783295"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5063608429","display_name":"Kevin Kornegay","orcid":"https://orcid.org/0000-0002-5233-0154"},"institutions":[{"id":"https://openalex.org/I205783295","display_name":"Cornell University","ror":"https://ror.org/05bnh6r87","country_code":"US","type":"education","lineage":["https://openalex.org/I205783295"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"K.T. Kornegay","raw_affiliation_strings":["Cornell University, Ithaca, NY, USA","Cornell University (Ithaca, NY);"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Cornell University, Ithaca, NY, USA","institution_ids":["https://openalex.org/I205783295"]},{"raw_affiliation_string":"Cornell University (Ithaca, NY);","institution_ids":["https://openalex.org/I205783295"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.1503,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.80194067,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"552","last_page":"555"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/bicmos","display_name":"BiCMOS","score":0.5317748188972473},{"id":"https://openalex.org/keywords/silicon-germanium","display_name":"Silicon-germanium","score":0.5174437165260315},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.47221165895462036},{"id":"https://openalex.org/keywords/lock","display_name":"Lock (firearm)","score":0.4239368140697479},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.404397189617157},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3509870767593384},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.33616143465042114},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.2937690019607544},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2699376940727234},{"id":"https://openalex.org/keywords/silicon","display_name":"Silicon","score":0.24398177862167358},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.17031949758529663},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.062091946601867676}],"concepts":[{"id":"https://openalex.org/C62427370","wikidata":"https://www.wikidata.org/wiki/Q173416","display_name":"BiCMOS","level":4,"score":0.5317748188972473},{"id":"https://openalex.org/C2780389399","wikidata":"https://www.wikidata.org/wiki/Q367849","display_name":"Silicon-germanium","level":3,"score":0.5174437165260315},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.47221165895462036},{"id":"https://openalex.org/C174839445","wikidata":"https://www.wikidata.org/wiki/Q1134386","display_name":"Lock (firearm)","level":2,"score":0.4239368140697479},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.404397189617157},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3509870767593384},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.33616143465042114},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.2937690019607544},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2699376940727234},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.24398177862167358},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.17031949758529663},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.062091946601867676},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/cicc.2005.1568729","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc.2005.1568729","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, 2005.","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8100000023841858,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W2018182084","https://openalex.org/W2034525900","https://openalex.org/W2039419466","https://openalex.org/W2076935827","https://openalex.org/W2116099132","https://openalex.org/W2120907638","https://openalex.org/W2132290795","https://openalex.org/W2218276985","https://openalex.org/W2306738904","https://openalex.org/W2539819018","https://openalex.org/W2562256660","https://openalex.org/W2891044306","https://openalex.org/W2983479669"],"related_works":["https://openalex.org/W1594634106","https://openalex.org/W1492027935","https://openalex.org/W2140183546","https://openalex.org/W2105454559","https://openalex.org/W2510447057","https://openalex.org/W3150117592","https://openalex.org/W4255700119","https://openalex.org/W2517605246","https://openalex.org/W2140681148","https://openalex.org/W2133337640"],"abstract_inverted_index":{"We":[0],"present":[1],"a":[2,11,17,22,51],"10.3Gb/s":[3],"full-rate":[4],"fully":[5],"integrated":[6],"injection-locked":[7],"CDR":[8,26,47],"circuit":[9],"with":[10],"BER":[12],"lower":[13],"than":[14],"1e-12":[15],"over":[16],"160MHz":[18],"lock":[19],"range.":[20],"With":[21],"33V":[23],"supply,":[24],"the":[25,29],"core":[27],"and":[28,34],"output":[30],"buffers":[31],"consume":[32],"230mW":[33],"175mW,":[35],"respectively,":[36],"while":[37],"occupying":[38],"an":[39],"active":[40],"area":[41],"of":[42],"730mum":[43],"times":[44],"680mum.":[45],"The":[46],"is":[48],"fabricated":[49],"in":[50],"mature":[52],"45-GHz":[53],"f":[54],"<sub":[55],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[56],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">T</sub>":[57],"SiGe":[58],"BiCMOS":[59],"technology":[60]},"counts_by_year":[{"year":2020,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2014,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}