{"id":"https://openalex.org/W2165709314","doi":"https://doi.org/10.1109/cicc.2005.1568648","title":"A high performance, high voltage output buffer in a low voltage CMOS process","display_name":"A high performance, high voltage output buffer in a low voltage CMOS process","publication_year":2006,"publication_date":"2006-01-18","ids":{"openalex":"https://openalex.org/W2165709314","doi":"https://doi.org/10.1109/cicc.2005.1568648","mag":"2165709314"},"language":"en","primary_location":{"id":"doi:10.1109/cicc.2005.1568648","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc.2005.1568648","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, 2005.","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5001204992","display_name":"Rajat Chauhan","orcid":null},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"R. Chauhan","raw_affiliation_strings":["Bagmane Tech Park, Texas Instruments India Pvt. Ltd., Bangalore, Karnataka, INDIA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Bagmane Tech Park, Texas Instruments India Pvt. Ltd., Bangalore, Karnataka, INDIA","institution_ids":["https://openalex.org/I74760111"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041367930","display_name":"Karthik Rajagopal","orcid":null},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"K. Rajagopal","raw_affiliation_strings":["Bagmane Tech Park, Texas Instruments India Pvt. Ltd., Bangalore, Karnataka, INDIA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Bagmane Tech Park, Texas Instruments India Pvt. Ltd., Bangalore, Karnataka, INDIA","institution_ids":["https://openalex.org/I74760111"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047370225","display_name":"Vinod Menezes","orcid":"https://orcid.org/0000-0001-5399-0851"},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"V. Menezes","raw_affiliation_strings":["Bagmane Tech Park, Texas Instruments India Pvt. Ltd., Bangalore, Karnataka, INDIA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Bagmane Tech Park, Texas Instruments India Pvt. Ltd., Bangalore, Karnataka, INDIA","institution_ids":["https://openalex.org/I74760111"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017987224","display_name":"H.M. Roopashree","orcid":null},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"H.M. Roopashree","raw_affiliation_strings":["Bagmane Tech Park, Texas Instruments India Pvt. Ltd., Bangalore, Karnataka, INDIA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Bagmane Tech Park, Texas Instruments India Pvt. Ltd., Bangalore, Karnataka, INDIA","institution_ids":["https://openalex.org/I74760111"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5108081099","display_name":"Subhash Jacob","orcid":null},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"S.K. Jacob","raw_affiliation_strings":["Bagmane Tech Park, Texas Instruments India Pvt. Ltd., Bangalore, Karnataka, INDIA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Bagmane Tech Park, Texas Instruments India Pvt. Ltd., Bangalore, Karnataka, INDIA","institution_ids":["https://openalex.org/I74760111"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.7669,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.76529383,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"224","last_page":"227"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6723543405532837},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5853497982025146},{"id":"https://openalex.org/keywords/decoupling","display_name":"Decoupling (probability)","score":0.5748838186264038},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5205950736999512},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.47311994433403015},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.47127458453178406},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4652617275714874},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4574867784976959},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.44177037477493286},{"id":"https://openalex.org/keywords/low-voltage","display_name":"Low voltage","score":0.4411018490791321},{"id":"https://openalex.org/keywords/buffer-amplifier","display_name":"Buffer amplifier","score":0.43364065885543823},{"id":"https://openalex.org/keywords/buffer","display_name":"Buffer (optical fiber)","score":0.42594799399375916},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.41700854897499084},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.3337510824203491},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.26504701375961304},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.07317090034484863}],"concepts":[{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6723543405532837},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5853497982025146},{"id":"https://openalex.org/C205606062","wikidata":"https://www.wikidata.org/wiki/Q5249645","display_name":"Decoupling (probability)","level":2,"score":0.5748838186264038},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5205950736999512},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.47311994433403015},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.47127458453178406},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4652617275714874},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4574867784976959},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.44177037477493286},{"id":"https://openalex.org/C128624480","wikidata":"https://www.wikidata.org/wiki/Q1504817","display_name":"Low voltage","level":3,"score":0.4411018490791321},{"id":"https://openalex.org/C127749002","wikidata":"https://www.wikidata.org/wiki/Q978470","display_name":"Buffer amplifier","level":4,"score":0.43364065885543823},{"id":"https://openalex.org/C145018004","wikidata":"https://www.wikidata.org/wiki/Q4985944","display_name":"Buffer (optical fiber)","level":2,"score":0.42594799399375916},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.41700854897499084},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.3337510824203491},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.26504701375961304},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.07317090034484863},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C133731056","wikidata":"https://www.wikidata.org/wiki/Q4917288","display_name":"Control engineering","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/cicc.2005.1568648","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc.2005.1568648","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, 2005.","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8799999952316284,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W30798415","https://openalex.org/W1559837706","https://openalex.org/W2093446542","https://openalex.org/W2112542663","https://openalex.org/W2120121396","https://openalex.org/W2143905108"],"related_works":["https://openalex.org/W2083778211","https://openalex.org/W2184605757","https://openalex.org/W2907138634","https://openalex.org/W1946496572","https://openalex.org/W1992680361","https://openalex.org/W2022069833","https://openalex.org/W2036431156","https://openalex.org/W4387426370","https://openalex.org/W2354562708","https://openalex.org/W2113365965"],"abstract_inverted_index":{"The":[0],"proposed":[1],"output":[2],"buffer":[3],"circuit":[4,29],"uses":[5],"1.8V":[6],"transistors":[7],"in":[8,54,62],"90nm":[9,63],"CMOS":[10],"process":[11],"to":[12,32,52],"develop":[13],"I/Os":[14],"for":[15],"2.5V":[16],"and":[17,26,35,48],"3.3V":[18,64],"interfaces.":[19],"A":[20],"voltage":[21],"clamp":[22],"circuit,":[23],"bias":[24],"generators,":[25],"a":[27,55],"feedback":[28],"are":[30],"used":[31],"ensure":[33],"reliability":[34],"noise":[36],"decoupling.":[37],"Use":[38],"of":[39,58],"these":[40],"circuits":[41],"enables":[42],"achieving":[43],"low":[44],"power":[45],"(130/spl":[46],"mu/A)":[47],"high":[49],"performance":[50],"(up":[51],"275MHz)":[53],"comparative":[56],"area":[57],"an":[59],"equivalent":[60],"I/O":[61],"process.":[65]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":3},{"year":2012,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}