{"id":"https://openalex.org/W1596702385","doi":"https://doi.org/10.1109/cicc.2004.1358718","title":"A robust large signal non-quasi-static MOSFET model for circuit simulation","display_name":"A robust large signal non-quasi-static MOSFET model for circuit simulation","publication_year":2004,"publication_date":"2004-11-30","ids":{"openalex":"https://openalex.org/W1596702385","doi":"https://doi.org/10.1109/cicc.2004.1358718","mag":"1596702385"},"language":"en","primary_location":{"id":"doi:10.1109/cicc.2004.1358718","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc.2004.1358718","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the IEEE 2004 Custom Integrated Circuits Conference (IEEE Cat. No.04CH37571)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100382773","display_name":"Hai Wang","orcid":"https://orcid.org/0000-0001-6507-5503"},"institutions":[{"id":"https://openalex.org/I130769515","display_name":"Pennsylvania State University","ror":"https://ror.org/04p491231","country_code":"US","type":"education","lineage":["https://openalex.org/I130769515"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"H. Wang","raw_affiliation_strings":["Department of Electrical Engineering, Pennsylvania State University, University Park, PA, USA","Dept. of Electr. Eng., Pennsylvania State Univ., University Park, PA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Pennsylvania State University, University Park, PA, USA","institution_ids":["https://openalex.org/I130769515"]},{"raw_affiliation_string":"Dept. of Electr. Eng., Pennsylvania State Univ., University Park, PA, USA","institution_ids":["https://openalex.org/I130769515"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5002945474","display_name":"G. Gildenblat","orcid":null},"institutions":[{"id":"https://openalex.org/I130769515","display_name":"Pennsylvania State University","ror":"https://ror.org/04p491231","country_code":"US","type":"education","lineage":["https://openalex.org/I130769515"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"G. Gildenblat","raw_affiliation_strings":["Department of Electrical Engineering, Pennsylvania State University, University Park, PA, USA","Dept. of Electr. Eng., Pennsylvania State Univ., University Park, PA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Pennsylvania State University, University Park, PA, USA","institution_ids":["https://openalex.org/I130769515"]},{"raw_affiliation_string":"Dept. of Electr. Eng., Pennsylvania State Univ., University Park, PA, USA","institution_ids":["https://openalex.org/I130769515"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I130769515"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":"sc 15","issue":null,"first_page":"5","last_page":"8"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/mosfet","display_name":"MOSFET","score":0.74048912525177},{"id":"https://openalex.org/keywords/spice","display_name":"Spice","score":0.61579430103302},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5967925786972046},{"id":"https://openalex.org/keywords/signal-integrity","display_name":"Signal integrity","score":0.5794789791107178},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5551398992538452},{"id":"https://openalex.org/keywords/electronic-circuit-simulation","display_name":"Electronic circuit simulation","score":0.5386021733283997},{"id":"https://openalex.org/keywords/equivalent-circuit","display_name":"Equivalent circuit","score":0.4276352524757385},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.40323498845100403},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.20369595289230347},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.18233251571655273},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16266819834709167},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.11732032895088196},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.08693823218345642}],"concepts":[{"id":"https://openalex.org/C2778413303","wikidata":"https://www.wikidata.org/wiki/Q210793","display_name":"MOSFET","level":4,"score":0.74048912525177},{"id":"https://openalex.org/C2780077345","wikidata":"https://www.wikidata.org/wiki/Q16891888","display_name":"Spice","level":2,"score":0.61579430103302},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5967925786972046},{"id":"https://openalex.org/C44938667","wikidata":"https://www.wikidata.org/wiki/Q4503810","display_name":"Signal integrity","level":3,"score":0.5794789791107178},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5551398992538452},{"id":"https://openalex.org/C46205389","wikidata":"https://www.wikidata.org/wiki/Q1270401","display_name":"Electronic circuit simulation","level":3,"score":0.5386021733283997},{"id":"https://openalex.org/C23572009","wikidata":"https://www.wikidata.org/wiki/Q964981","display_name":"Equivalent circuit","level":3,"score":0.4276352524757385},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.40323498845100403},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.20369595289230347},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.18233251571655273},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16266819834709167},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.11732032895088196},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.08693823218345642},{"id":"https://openalex.org/C123745756","wikidata":"https://www.wikidata.org/wiki/Q1665949","display_name":"Interconnection","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/cicc.2004.1358718","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc.2004.1358718","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the IEEE 2004 Custom Integrated Circuits Conference (IEEE Cat. No.04CH37571)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W1501443680","https://openalex.org/W1658890280","https://openalex.org/W2051365798","https://openalex.org/W2062828841","https://openalex.org/W2100324931","https://openalex.org/W2111505993","https://openalex.org/W2142776895"],"related_works":["https://openalex.org/W2908026729","https://openalex.org/W1629312120","https://openalex.org/W2134827725","https://openalex.org/W2922342296","https://openalex.org/W2907493518","https://openalex.org/W2021492835","https://openalex.org/W2074497518","https://openalex.org/W2493943245","https://openalex.org/W1972185800","https://openalex.org/W3023960978"],"abstract_inverted_index":{"This":[0],"work":[1],"introduces":[2],"a":[3],"surface-potential-based":[4],"compact":[5],"non-quasi-static":[6],"(NQS)":[7],"MOSFET":[8,21],"model":[9,39,69],"that":[10],"solves":[11],"the":[12,44,68,79],"current":[13],"continuity":[14,80],"equation,":[15],"works":[16],"in":[17,53,61],"all":[18],"regions":[19],"of":[20,58,78],"operation":[22],"(including":[23],"accumulation,":[24],"depletion,":[25],"and":[26,29,49,67],"inversion":[27],"regions)":[28],"can":[30],"be":[31],"implemented":[32,52],"into":[33],"SPICE-based":[34],"circuit":[35],"simulators.":[36],"The":[37,56],"new":[38],"is":[40,65,70],"obtained":[41],"by":[42,72],"extending":[43],"previously":[45],"reported":[46],"spline-collocation":[47],"method":[48],"has":[50],"been":[51],"Verilog-A":[54],"code.":[55],"study":[57],"NQS":[59],"effects":[60],"several":[62],"important":[63],"circuits":[64],"included":[66],"verified":[71],"comparison":[73],"with":[74],"direct":[75],"numerical":[76],"solution":[77],"equation.":[81]},"counts_by_year":[{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}