{"id":"https://openalex.org/W2149188309","doi":"https://doi.org/10.1109/cicc.2003.1249473","title":"A 5-channel, variable resolution, 10-GHz sampling rate coherent tester/oscilloscope IC and associated test vehicles","display_name":"A 5-channel, variable resolution, 10-GHz sampling rate coherent tester/oscilloscope IC and associated test vehicles","publication_year":2004,"publication_date":"2004-03-02","ids":{"openalex":"https://openalex.org/W2149188309","doi":"https://doi.org/10.1109/cicc.2003.1249473","mag":"2149188309"},"language":"en","primary_location":{"id":"doi:10.1109/cicc.2003.1249473","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc.2003.1249473","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the IEEE 2003 Custom Integrated Circuits Conference, 2003.","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5075705685","display_name":"M.M. Hafed","orcid":null},"institutions":[{"id":"https://openalex.org/I4210129216","display_name":"CMC Microsystems (Canada)","ror":"https://ror.org/03k70ea39","country_code":"CA","type":"company","lineage":["https://openalex.org/I4210129216"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"M.M. Hafed","raw_affiliation_strings":["DFT MicroSystems, Inc., Montreal, QUE, Canada"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"DFT MicroSystems, Inc., Montreal, QUE, Canada","institution_ids":["https://openalex.org/I4210129216"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5083312864","display_name":"Gordon W. Roberts","orcid":"https://orcid.org/0000-0002-4880-0272"},"institutions":[{"id":"https://openalex.org/I5023651","display_name":"McGill University","ror":"https://ror.org/01pxwe438","country_code":"CA","type":"education","lineage":["https://openalex.org/I5023651"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"G.W. Roberts","raw_affiliation_strings":["Microelectronics and Computer Systems Laboratory, McGill University, Montreal, QUE, Canada"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Microelectronics and Computer Systems Laboratory, McGill University, Montreal, QUE, Canada","institution_ids":["https://openalex.org/I5023651"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":"4","issue":null,"first_page":"621","last_page":"624"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/oscilloscope","display_name":"Oscilloscope","score":0.8759098649024963},{"id":"https://openalex.org/keywords/comparator","display_name":"Comparator","score":0.6515670418739319},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5903149843215942},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5556426644325256},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5105041265487671},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.5085951089859009},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.491001158952713},{"id":"https://openalex.org/keywords/digital-storage-oscilloscope","display_name":"Digital storage oscilloscope","score":0.48342907428741455},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.44240593910217285},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.44160598516464233},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.39964619278907776},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.39096009731292725},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3486981987953186}],"concepts":[{"id":"https://openalex.org/C184026988","wikidata":"https://www.wikidata.org/wiki/Q174320","display_name":"Oscilloscope","level":3,"score":0.8759098649024963},{"id":"https://openalex.org/C155745195","wikidata":"https://www.wikidata.org/wiki/Q1164179","display_name":"Comparator","level":3,"score":0.6515670418739319},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5903149843215942},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5556426644325256},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5105041265487671},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.5085951089859009},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.491001158952713},{"id":"https://openalex.org/C45851521","wikidata":"https://www.wikidata.org/wiki/Q5276167","display_name":"Digital storage oscilloscope","level":4,"score":0.48342907428741455},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.44240593910217285},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.44160598516464233},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.39964619278907776},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.39096009731292725},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3486981987953186},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/cicc.2003.1249473","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc.2003.1249473","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the IEEE 2003 Custom Integrated Circuits Conference, 2003.","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.7900000214576721,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1839452802","https://openalex.org/W1943406714","https://openalex.org/W2034714147","https://openalex.org/W2102148049","https://openalex.org/W2130738940","https://openalex.org/W2141592563","https://openalex.org/W2155908475","https://openalex.org/W2160423692","https://openalex.org/W2288998059","https://openalex.org/W6658802955","https://openalex.org/W6681436805","https://openalex.org/W6683961774"],"related_works":["https://openalex.org/W2355173512","https://openalex.org/W1979233082","https://openalex.org/W1972598373","https://openalex.org/W4379987496","https://openalex.org/W2461096983","https://openalex.org/W1489049788","https://openalex.org/W1410358171","https://openalex.org/W2520784184","https://openalex.org/W4393639588","https://openalex.org/W2014998420"],"abstract_inverted_index":{"An":[0],"integrated":[1],"circuit":[2],"uses":[3],"a":[4,23,28,51,62],"0.18":[5],"/spl":[6],"mu/m":[7],"CMOS":[8],"process":[9],"and":[10,27,40,67],"contains":[11],"five":[12],"10-GHz":[13],"effective":[14],"sampling":[15],"rate":[16],"analog-tester/oscilloscope":[17],"cores.":[18,75],"Each":[19,47],"core":[20,49],"consists":[21],"of":[22,37,54],"memory,":[24],"two":[25],"samplers,":[26],"voltage":[29],"comparator.":[30],"It":[31],"can":[32],"perform":[33],"coherent":[34],"DSP-based":[35],"testing":[36],"mixed-signal":[38],"macros":[39],"transient":[41],"measurement":[42],"for":[43],"signal":[44],"integrity":[45],"evaluation.":[46],"such":[48,60],"supports":[50],"variable":[52],"resolution":[53],"up":[55],"to":[56],"9-b.":[57],"Test":[58],"vehicles,":[59],"as":[61],"tuned":[63],"amplifier,":[64],"on-chip":[65],"interconnect,":[66],"digital":[68],"noise":[69],"generators,":[70],"are":[71],"measured":[72],"using":[73],"the":[74]},"counts_by_year":[{"year":2021,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}