{"id":"https://openalex.org/W2139710317","doi":"https://doi.org/10.1109/cicc.2002.1012889","title":"Modeling substrate noise generation in CMOS digital integrated circuits","display_name":"Modeling substrate noise generation in CMOS digital integrated circuits","publication_year":2003,"publication_date":"2003-06-25","ids":{"openalex":"https://openalex.org/W2139710317","doi":"https://doi.org/10.1109/cicc.2002.1012889","mag":"2139710317"},"language":"en","primary_location":{"id":"doi:10.1109/cicc.2002.1012889","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc.2002.1012889","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the IEEE 2002 Custom Integrated Circuits Conference (Cat. No.02CH37285)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5070370721","display_name":"Makoto Nagata","orcid":"https://orcid.org/0000-0002-0625-9107"},"institutions":[{"id":"https://openalex.org/I113306721","display_name":"Hiroshima University","ror":"https://ror.org/03t78wx29","country_code":"JP","type":"education","lineage":["https://openalex.org/I113306721"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"M. Nagata","raw_affiliation_strings":["Integrated Systems Laboratory, Hiroshima University, Higashihiroshima, Japan","Integrated Syst. Lab., Hiroshima Univ., Japan"],"affiliations":[{"raw_affiliation_string":"Integrated Systems Laboratory, Hiroshima University, Higashihiroshima, Japan","institution_ids":["https://openalex.org/I113306721"]},{"raw_affiliation_string":"Integrated Syst. Lab., Hiroshima Univ., Japan","institution_ids":["https://openalex.org/I113306721"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100729080","display_name":"Takashi Morie","orcid":"https://orcid.org/0000-0003-2708-4307"},"institutions":[{"id":"https://openalex.org/I113306721","display_name":"Hiroshima University","ror":"https://ror.org/03t78wx29","country_code":"JP","type":"education","lineage":["https://openalex.org/I113306721"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"T. Morie","raw_affiliation_strings":["Integrated Systems Laboratory, Hiroshima University, Higashihiroshima, Japan","Integrated Syst. Lab., Hiroshima Univ., Japan"],"affiliations":[{"raw_affiliation_string":"Integrated Systems Laboratory, Hiroshima University, Higashihiroshima, Japan","institution_ids":["https://openalex.org/I113306721"]},{"raw_affiliation_string":"Integrated Syst. Lab., Hiroshima Univ., Japan","institution_ids":["https://openalex.org/I113306721"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5025276777","display_name":"Akira Iwata","orcid":"https://orcid.org/0000-0002-5002-2553"},"institutions":[{"id":"https://openalex.org/I113306721","display_name":"Hiroshima University","ror":"https://ror.org/03t78wx29","country_code":"JP","type":"education","lineage":["https://openalex.org/I113306721"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"A. Iwata","raw_affiliation_strings":["Integrated Systems Laboratory, Hiroshima University, Higashihiroshima, Japan","Integrated Syst. Lab., Hiroshima Univ., Japan"],"affiliations":[{"raw_affiliation_string":"Integrated Systems Laboratory, Hiroshima University, Higashihiroshima, Japan","institution_ids":["https://openalex.org/I113306721"]},{"raw_affiliation_string":"Integrated Syst. Lab., Hiroshima Univ., Japan","institution_ids":["https://openalex.org/I113306721"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5070370721"],"corresponding_institution_ids":["https://openalex.org/I113306721"],"apc_list":null,"apc_paid":null,"fwci":2.0863,"has_fulltext":false,"cited_by_count":16,"citation_normalized_percentile":{"value":0.87616209,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"501","last_page":"504"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.7456599473953247},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.5996419787406921},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5541898608207703},{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.5156223177909851},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4658203125},{"id":"https://openalex.org/keywords/digital-electronics","display_name":"Digital electronics","score":0.4618337154388428},{"id":"https://openalex.org/keywords/clock-signal","display_name":"Clock signal","score":0.46054571866989136},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4333418011665344},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.428079754114151},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.22869467735290527},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20041626691818237},{"id":"https://openalex.org/keywords/electrode","display_name":"Electrode","score":0.1212473213672638}],"concepts":[{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.7456599473953247},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5996419787406921},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5541898608207703},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.5156223177909851},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4658203125},{"id":"https://openalex.org/C81843906","wikidata":"https://www.wikidata.org/wiki/Q173156","display_name":"Digital electronics","level":3,"score":0.4618337154388428},{"id":"https://openalex.org/C137059387","wikidata":"https://www.wikidata.org/wiki/Q426882","display_name":"Clock signal","level":3,"score":0.46054571866989136},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4333418011665344},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.428079754114151},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.22869467735290527},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20041626691818237},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.1212473213672638},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/cicc.2002.1012889","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc.2002.1012889","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the IEEE 2002 Custom Integrated Circuits Conference (Cat. No.02CH37285)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8299999833106995,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W1520187900","https://openalex.org/W1953076446","https://openalex.org/W2057675232","https://openalex.org/W2102664082","https://openalex.org/W2144874706","https://openalex.org/W2168820414","https://openalex.org/W2180333551","https://openalex.org/W4246681741","https://openalex.org/W6987482579"],"related_works":["https://openalex.org/W2389800961","https://openalex.org/W1995389502","https://openalex.org/W2796521923","https://openalex.org/W2991739378","https://openalex.org/W95651076","https://openalex.org/W2770163697","https://openalex.org/W2110521006","https://openalex.org/W2063536371","https://openalex.org/W2184033104","https://openalex.org/W1543777494"],"abstract_inverted_index":{"A":[0],"time-series":[1],"divided":[2],"parasitic":[3],"capacitance":[4],"model":[5,44],"accurately":[6],"simulates":[7],"substrate":[8,47],"noise":[9,48],"generation":[10],"of":[11,23,72],"practical":[12],"CMOS":[13],"digital":[14],"integrated":[15],"circuits":[16],"in":[17,57],"the":[18,43],"time":[19],"domain.":[20],"The":[21],"simulation":[22],"a":[24,39,69],"0.25-/spl":[25],"mu/m":[26],"z80":[27],"microcontroller":[28],"with":[29,51],"62.5-MHz":[30],"clock":[31,40,61],"frequency":[32,62],"costs":[33],"less":[34,73],"than":[35,74],"10":[36],"sec":[37],"per":[38],"cycle":[41],"including":[42],"generation.":[45],"Simulated":[46],"compares":[49],"well":[50],"200-ps":[52],"100-/spl":[53],"mu/V":[54],"resolution":[55],"measurements":[56],"wave-shapes":[58],"validated":[59],"for":[60],"up":[63],"to":[64,82],"125":[65],"MHz":[66],"and":[67],"shows":[68],"peak-amplitude":[70],"error":[71],"2%":[75],"against":[76],"supply-voltage":[77],"scaling":[78],"from":[79],"2.5":[80],"V":[81],"1.6":[83],"V.":[84]},"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2016,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}