{"id":"https://openalex.org/W2126364003","doi":"https://doi.org/10.1109/cicc.2002.1012874","title":"Spatial averaging and ordering in matched element arrays","display_name":"Spatial averaging and ordering in matched element arrays","publication_year":2003,"publication_date":"2003-06-25","ids":{"openalex":"https://openalex.org/W2126364003","doi":"https://doi.org/10.1109/cicc.2002.1012874","mag":"2126364003"},"language":"en","primary_location":{"id":"doi:10.1109/cicc.2002.1012874","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc.2002.1012874","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the IEEE 2002 Custom Integrated Circuits Conference (Cat. No.02CH37285)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5043757580","display_name":"K. Sri Rama Krishna","orcid":null},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"K. Krishna","raw_affiliation_strings":["Texas Instruments, Inc., Dallas, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Texas Instruments, Inc., Dallas, TX, USA","institution_ids":["https://openalex.org/I74760111"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5061181733","display_name":"W. Bright","orcid":null},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"W. Bright","raw_affiliation_strings":["Texas Instruments, Inc., Dallas, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Texas Instruments, Inc., Dallas, TX, USA","institution_ids":["https://openalex.org/I74760111"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5046965400","display_name":"D.B. Dye","orcid":null},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"D.B. Dye","raw_affiliation_strings":["Texas Instruments, Inc., Dallas, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Texas Instruments, Inc., Dallas, TX, USA","institution_ids":["https://openalex.org/I74760111"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111966026","display_name":"K. Muhammad","orcid":null},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"K. Muhammad","raw_affiliation_strings":["Texas Instruments, Inc., Dallas, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Texas Instruments, Inc., Dallas, TX, USA","institution_ids":["https://openalex.org/I74760111"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5079719354","display_name":"Yin Hu","orcid":"https://orcid.org/0000-0003-2090-1845"},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yin Hu","raw_affiliation_strings":["Texas Instruments, Inc., Dallas, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Texas Instruments, Inc., Dallas, TX, USA","institution_ids":["https://openalex.org/I74760111"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I74760111"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"453","last_page":"456"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11527","display_name":"3D IC and TSV technologies","score":0.9966999888420105,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/limit","display_name":"Limit (mathematics)","score":0.7664391398429871},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6614512801170349},{"id":"https://openalex.org/keywords/matching","display_name":"Matching (statistics)","score":0.6063721179962158},{"id":"https://openalex.org/keywords/element","display_name":"Element (criminal law)","score":0.5674277544021606},{"id":"https://openalex.org/keywords/quadratic-equation","display_name":"Quadratic equation","score":0.5379059910774231},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.515110194683075},{"id":"https://openalex.org/keywords/bicmos","display_name":"BiCMOS","score":0.4991154670715332},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.43001389503479004},{"id":"https://openalex.org/keywords/image-resolution","display_name":"Image resolution","score":0.42614877223968506},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.28038790822029114},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.26977235078811646},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2285684049129486},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.13288256525993347},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.11802992224693298},{"id":"https://openalex.org/keywords/mathematical-analysis","display_name":"Mathematical analysis","score":0.11733248829841614},{"id":"https://openalex.org/keywords/geometry","display_name":"Geometry","score":0.08692315220832825},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.07715597748756409}],"concepts":[{"id":"https://openalex.org/C151201525","wikidata":"https://www.wikidata.org/wiki/Q177239","display_name":"Limit (mathematics)","level":2,"score":0.7664391398429871},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6614512801170349},{"id":"https://openalex.org/C165064840","wikidata":"https://www.wikidata.org/wiki/Q1321061","display_name":"Matching (statistics)","level":2,"score":0.6063721179962158},{"id":"https://openalex.org/C200288055","wikidata":"https://www.wikidata.org/wiki/Q2621792","display_name":"Element (criminal law)","level":2,"score":0.5674277544021606},{"id":"https://openalex.org/C129844170","wikidata":"https://www.wikidata.org/wiki/Q41299","display_name":"Quadratic equation","level":2,"score":0.5379059910774231},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.515110194683075},{"id":"https://openalex.org/C62427370","wikidata":"https://www.wikidata.org/wiki/Q173416","display_name":"BiCMOS","level":4,"score":0.4991154670715332},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.43001389503479004},{"id":"https://openalex.org/C205372480","wikidata":"https://www.wikidata.org/wiki/Q210521","display_name":"Image resolution","level":2,"score":0.42614877223968506},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.28038790822029114},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.26977235078811646},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2285684049129486},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.13288256525993347},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.11802992224693298},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.11733248829841614},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.08692315220832825},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.07715597748756409},{"id":"https://openalex.org/C17744445","wikidata":"https://www.wikidata.org/wiki/Q36442","display_name":"Political science","level":0,"score":0.0},{"id":"https://openalex.org/C199539241","wikidata":"https://www.wikidata.org/wiki/Q7748","display_name":"Law","level":1,"score":0.0},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/cicc.2002.1012874","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc.2002.1012874","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the IEEE 2002 Custom Integrated Circuits Conference (Cat. No.02CH37285)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.6200000047683716}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":2,"referenced_works":["https://openalex.org/W2032743383","https://openalex.org/W2042056852"],"related_works":["https://openalex.org/W3014521742","https://openalex.org/W2538534558","https://openalex.org/W27766761","https://openalex.org/W2043562057","https://openalex.org/W2617868873","https://openalex.org/W3204141294","https://openalex.org/W2136081556","https://openalex.org/W2168341847","https://openalex.org/W2012536985","https://openalex.org/W2119551906"],"abstract_inverted_index":{"Spatial":[0],"gradients":[1,20,33],"often":[2],"limit":[3,39],"the":[4,16,32,59],"matching":[5],"accuracy":[6],"of":[7,18,58],"element":[8],"arrays":[9],"in":[10],"ADC's":[11],"and":[12,22,53],"DAC's.":[13],"We":[14],"cast.":[15],"problem":[17],"spatial":[19],"formally":[21],"present":[23],"a":[24,49,54],"global":[25],"optimization-based":[26],"solution":[27],"that":[28],"does":[29],"not":[30],"require":[31],"to":[34,41],"be":[35],"pre-characterized":[36],"precisely":[37],"or":[38],"them":[40],"being":[42],"linear":[43],"and/or":[44],"quadratic.":[45],"Si":[46],"results":[47],"from":[48],"standalone":[50],"BiCMOS":[51],"DAC":[52],"CMOS":[55],"DAC,":[56],"part":[57],"industry's":[60],"first":[61],"DOCSIS":[62],"1.1":[63],"certified":[64],"cable":[65],"modem":[66],"solution,":[67],"are":[68],"presented.":[69]},"counts_by_year":[{"year":2015,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}