{"id":"https://openalex.org/W2166910075","doi":"https://doi.org/10.1109/cicc.2002.1012862","title":"A low-voltage multi-GHz VCO with 58% tuning range in SOI CMOS","display_name":"A low-voltage multi-GHz VCO with 58% tuning range in SOI CMOS","publication_year":2003,"publication_date":"2003-06-25","ids":{"openalex":"https://openalex.org/W2166910075","doi":"https://doi.org/10.1109/cicc.2002.1012862","mag":"2166910075"},"language":"en","primary_location":{"id":"doi:10.1109/cicc.2002.1012862","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc.2002.1012862","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the IEEE 2002 Custom Integrated Circuits Conference (Cat. No.02CH37285)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5030852582","display_name":"N. Fong","orcid":null},"institutions":[{"id":"https://openalex.org/I67031392","display_name":"Carleton University","ror":"https://ror.org/02qtvee93","country_code":"CA","type":"education","lineage":["https://openalex.org/I67031392"]}],"countries":["CA"],"is_corresponding":true,"raw_author_name":"Neric Fong","raw_affiliation_strings":["Department of Electronics, Carleton University, Ottawa, ONT, Canada"],"affiliations":[{"raw_affiliation_string":"Department of Electronics, Carleton University, Ottawa, ONT, Canada","institution_ids":["https://openalex.org/I67031392"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064593653","display_name":"Jean\u2010Olivier Plouchart","orcid":"https://orcid.org/0000-0002-4914-1598"},"institutions":[{"id":"https://openalex.org/I4210114115","display_name":"IBM Research - Thomas J. Watson Research Center","ror":"https://ror.org/0265w5591","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"J.-O. Plouchart","raw_affiliation_strings":["IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA"],"affiliations":[{"raw_affiliation_string":"IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA","institution_ids":["https://openalex.org/I4210114115"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004151401","display_name":"N. Zamdmer","orcid":null},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"N. Zamdmer","raw_affiliation_strings":["IBM Microelectronics, Hopewell Junction, NY, USA"],"affiliations":[{"raw_affiliation_string":"IBM Microelectronics, Hopewell Junction, NY, USA","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019319751","display_name":"Duixian Liu","orcid":"https://orcid.org/0000-0001-9152-3744"},"institutions":[{"id":"https://openalex.org/I4210114115","display_name":"IBM Research - Thomas J. Watson Research Center","ror":"https://ror.org/0265w5591","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Duixian Liu","raw_affiliation_strings":["IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA"],"affiliations":[{"raw_affiliation_string":"IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA","institution_ids":["https://openalex.org/I4210114115"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5027581755","display_name":"L. Wagner","orcid":null},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"L. Wagner","raw_affiliation_strings":["IBM Microelectronics, Hopewell Junction, NY, USA"],"affiliations":[{"raw_affiliation_string":"IBM Microelectronics, Hopewell Junction, NY, USA","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5009390419","display_name":"Calvin Plett","orcid":"https://orcid.org/0000-0003-0524-1850"},"institutions":[{"id":"https://openalex.org/I67031392","display_name":"Carleton University","ror":"https://ror.org/02qtvee93","country_code":"CA","type":"education","lineage":["https://openalex.org/I67031392"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"C. Plett","raw_affiliation_strings":["Department of Electronics, Carleton University, Ottawa, ONT, Canada"],"affiliations":[{"raw_affiliation_string":"Department of Electronics, Carleton University, Ottawa, ONT, Canada","institution_ids":["https://openalex.org/I67031392"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5110386497","display_name":"G. Tarr","orcid":null},"institutions":[{"id":"https://openalex.org/I67031392","display_name":"Carleton University","ror":"https://ror.org/02qtvee93","country_code":"CA","type":"education","lineage":["https://openalex.org/I67031392"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"G. Tarr","raw_affiliation_strings":["Department of Electronics, Carleton University, Ottawa, ONT, Canada"],"affiliations":[{"raw_affiliation_string":"Department of Electronics, Carleton University, Ottawa, ONT, Canada","institution_ids":["https://openalex.org/I67031392"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5030852582"],"corresponding_institution_ids":["https://openalex.org/I67031392"],"apc_list":null,"apc_paid":null,"fwci":3.1295,"has_fulltext":false,"cited_by_count":18,"citation_normalized_percentile":{"value":0.91962273,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"423","last_page":"426"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/voltage-controlled-oscillator","display_name":"Voltage-controlled oscillator","score":0.8739098310470581},{"id":"https://openalex.org/keywords/dbc","display_name":"dBc","score":0.8604165315628052},{"id":"https://openalex.org/keywords/phase-noise","display_name":"Phase noise","score":0.8345050811767578},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.6569471955299377},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6357583403587341},{"id":"https://openalex.org/keywords/silicon-on-insulator","display_name":"Silicon on insulator","score":0.6226394772529602},{"id":"https://openalex.org/keywords/inductor","display_name":"Inductor","score":0.6062819957733154},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5374489426612854},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5371229648590088},{"id":"https://openalex.org/keywords/offset","display_name":"Offset (computer science)","score":0.5242391228675842},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.490759938955307},{"id":"https://openalex.org/keywords/dissipation","display_name":"Dissipation","score":0.4414752423763275},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.24685555696487427},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18734124302864075},{"id":"https://openalex.org/keywords/silicon","display_name":"Silicon","score":0.1775951385498047},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.07868382334709167}],"concepts":[{"id":"https://openalex.org/C5291336","wikidata":"https://www.wikidata.org/wiki/Q852341","display_name":"Voltage-controlled oscillator","level":3,"score":0.8739098310470581},{"id":"https://openalex.org/C193523891","wikidata":"https://www.wikidata.org/wiki/Q1771950","display_name":"dBc","level":3,"score":0.8604165315628052},{"id":"https://openalex.org/C89631360","wikidata":"https://www.wikidata.org/wiki/Q1428766","display_name":"Phase noise","level":2,"score":0.8345050811767578},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6569471955299377},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6357583403587341},{"id":"https://openalex.org/C53143962","wikidata":"https://www.wikidata.org/wiki/Q1478788","display_name":"Silicon on insulator","level":3,"score":0.6226394772529602},{"id":"https://openalex.org/C144534570","wikidata":"https://www.wikidata.org/wiki/Q5325","display_name":"Inductor","level":3,"score":0.6062819957733154},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5374489426612854},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5371229648590088},{"id":"https://openalex.org/C175291020","wikidata":"https://www.wikidata.org/wiki/Q1156822","display_name":"Offset (computer science)","level":2,"score":0.5242391228675842},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.490759938955307},{"id":"https://openalex.org/C135402231","wikidata":"https://www.wikidata.org/wiki/Q898440","display_name":"Dissipation","level":2,"score":0.4414752423763275},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.24685555696487427},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18734124302864075},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.1775951385498047},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.07868382334709167},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/cicc.2002.1012862","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cicc.2002.1012862","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the IEEE 2002 Custom Integrated Circuits Conference (Cat. No.02CH37285)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.8600000143051147,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W1563802837","https://openalex.org/W1593494329","https://openalex.org/W1891494671","https://openalex.org/W2005367079","https://openalex.org/W2103288739","https://openalex.org/W2120586032","https://openalex.org/W2165450044","https://openalex.org/W6675409127","https://openalex.org/W6684373327"],"related_works":["https://openalex.org/W2141726610","https://openalex.org/W2061664740","https://openalex.org/W1964543336","https://openalex.org/W2619153394","https://openalex.org/W2134439706","https://openalex.org/W2057338677","https://openalex.org/W2105518569","https://openalex.org/W4236967454","https://openalex.org/W4242529045","https://openalex.org/W2112742062"],"abstract_inverted_index":{"A":[0],"low-voltage":[1],"3.0-5.6":[2],"GHz":[3],"VCO":[4,18,108],"was":[5],"designed":[6],"and":[7,24,39,60,73,85],"fabricated":[8],"in":[9,35],"an":[10,25],"0.13":[11],"/spl":[12],"mu/m":[13],"SOI":[14],"CMOS":[15],"process.":[16],"This":[17,33],"features":[19],"a":[20,40,54],"single-loop":[21],"horseshoe-shaped":[22],"inductor":[23],"array":[26],"of":[27,44],"band-switching":[28],"accumulation":[29],"MOS":[30],"(AMOS)":[31],"varactors.":[32],"results":[34],"good":[36],"phase":[37,65],"noise":[38,66],"wide":[41],"tuning":[42,91],"range":[43],"58.7%":[45],"when":[46],"tuned":[47],"between":[48,83],"0":[49],"to":[50,104],"1.4":[51],"V.":[52],"At":[53],"1":[55,61,112],"V":[56],"Supply":[57],"(V/sub":[58],"DD/)":[59],"MHz":[62],"offset,":[63],"the":[64,89,107],"is":[67,82,97,102],"-120":[68],"dBc/Hz":[69,75],"at":[70,76,114],"3.0":[71],"GHz,":[72],"-114.5":[74],"5.6":[77,115],"GHz.":[78,116],"The":[79,93],"power":[80,96],"dissipation":[81],"2":[84],"3":[86],"mW":[87,113],"across":[88],"whole":[90],"range.":[92],"buffered":[94],"output":[95],"-7":[98],"dBm.":[99],"When":[100],"VDD":[101],"reduced":[103],"0.83":[105],"V,":[106],"dissipates":[109],"less":[110],"than":[111]},"counts_by_year":[{"year":2014,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}