{"id":"https://openalex.org/W2157508970","doi":"https://doi.org/10.1109/cdc.2004.1429419","title":"Nonlinear model predictive control: From chemical industry to microelectronics","display_name":"Nonlinear model predictive control: From chemical industry to microelectronics","publication_year":2004,"publication_date":"2004-01-01","ids":{"openalex":"https://openalex.org/W2157508970","doi":"https://doi.org/10.1109/cdc.2004.1429419","mag":"2157508970"},"language":"en","primary_location":{"id":"doi:10.1109/cdc.2004.1429419","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cdc.2004.1429419","pdf_url":null,"source":{"id":"https://openalex.org/S4363608267","display_name":"2004 43rd IEEE Conference on Decision and Control (CDC) (IEEE Cat. No.04CH37601)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2004 43rd IEEE Conference on Decision and Control (CDC) (IEEE Cat. No.04CH37601)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5057438733","display_name":"Zolt\u00e1n K. Nagy","orcid":"https://orcid.org/0000-0003-4787-6678"},"institutions":[{"id":"https://openalex.org/I100066346","display_name":"University of Stuttgart","ror":"https://ror.org/04vnq7t77","country_code":"DE","type":"education","lineage":["https://openalex.org/I100066346"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Z.K. Nagy","raw_affiliation_strings":["Institute for Systems Theory in Engineering, Stuttgart, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute for Systems Theory in Engineering, Stuttgart, Germany","institution_ids":["https://openalex.org/I100066346"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5001090900","display_name":"Frank Allg\u00f6wer","orcid":"https://orcid.org/0000-0002-3702-3658"},"institutions":[{"id":"https://openalex.org/I100066346","display_name":"University of Stuttgart","ror":"https://ror.org/04vnq7t77","country_code":"DE","type":"education","lineage":["https://openalex.org/I100066346"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"F. Allgower","raw_affiliation_strings":["Institute for Systems Theory in Engineering, Stuttgart, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute for Systems Theory in Engineering, Stuttgart, Germany","institution_ids":["https://openalex.org/I100066346"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I100066346"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.2393193,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":"5","issue":null,"first_page":"4249","last_page":"4254 Vol.4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10791","display_name":"Advanced Control Systems Optimization","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10791","display_name":"Advanced Control Systems Optimization","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11749","display_name":"Iterative Learning Control Systems","score":0.9962000250816345,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9682999849319458,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/microelectronics","display_name":"Microelectronics","score":0.9397888779640198},{"id":"https://openalex.org/keywords/model-predictive-control","display_name":"Model predictive control","score":0.8863120079040527},{"id":"https://openalex.org/keywords/nonlinear-model","display_name":"Nonlinear model","score":0.6361039280891418},{"id":"https://openalex.org/keywords/nonlinear-system","display_name":"Nonlinear system","score":0.6052074432373047},{"id":"https://openalex.org/keywords/process-control","display_name":"Process control","score":0.5972491502761841},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4670350253582001},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4517204463481903},{"id":"https://openalex.org/keywords/control","display_name":"Control (management)","score":0.44333139061927795},{"id":"https://openalex.org/keywords/control-engineering","display_name":"Control engineering","score":0.4323793351650238},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3472590744495392},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.17578664422035217},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.13916978240013123},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.07330465316772461}],"concepts":[{"id":"https://openalex.org/C187937830","wikidata":"https://www.wikidata.org/wiki/Q175403","display_name":"Microelectronics","level":2,"score":0.9397888779640198},{"id":"https://openalex.org/C172205157","wikidata":"https://www.wikidata.org/wiki/Q1782962","display_name":"Model predictive control","level":3,"score":0.8863120079040527},{"id":"https://openalex.org/C2984755018","wikidata":"https://www.wikidata.org/wiki/Q17118374","display_name":"Nonlinear model","level":3,"score":0.6361039280891418},{"id":"https://openalex.org/C158622935","wikidata":"https://www.wikidata.org/wiki/Q660848","display_name":"Nonlinear system","level":2,"score":0.6052074432373047},{"id":"https://openalex.org/C155386361","wikidata":"https://www.wikidata.org/wiki/Q1649571","display_name":"Process control","level":3,"score":0.5972491502761841},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4670350253582001},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4517204463481903},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.44333139061927795},{"id":"https://openalex.org/C133731056","wikidata":"https://www.wikidata.org/wiki/Q4917288","display_name":"Control engineering","level":1,"score":0.4323793351650238},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3472590744495392},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.17578664422035217},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.13916978240013123},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.07330465316772461},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/cdc.2004.1429419","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cdc.2004.1429419","pdf_url":null,"source":{"id":"https://openalex.org/S4363608267","display_name":"2004 43rd IEEE Conference on Decision and Control (CDC) (IEEE Cat. No.04CH37601)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2004 43rd IEEE Conference on Decision and Control (CDC) (IEEE Cat. No.04CH37601)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6100000143051147,"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W160881533","https://openalex.org/W1484219741","https://openalex.org/W1485467598","https://openalex.org/W1573444832","https://openalex.org/W1968224762","https://openalex.org/W1978956894","https://openalex.org/W2016211524","https://openalex.org/W2044332575","https://openalex.org/W2132500407","https://openalex.org/W2134673975","https://openalex.org/W2157492267","https://openalex.org/W2612602605","https://openalex.org/W6628867630","https://openalex.org/W6737925363"],"related_works":["https://openalex.org/W1631623342","https://openalex.org/W1779399219","https://openalex.org/W648378158","https://openalex.org/W3083517787","https://openalex.org/W1839440842","https://openalex.org/W4251946813","https://openalex.org/W2885820669","https://openalex.org/W1981727740","https://openalex.org/W2368407738","https://openalex.org/W2143511391"],"abstract_inverted_index":{"The":[0,25],"paper":[1],"presents":[2],"a":[3],"general":[4],"overview":[5],"of":[6,22,28,41],"nonlinear":[7],"model":[8],"predictive":[9],"control":[10,21],"(NMPC),":[11],"with":[12],"emphasis":[13],"on":[14],"problems":[15],"related":[16],"to":[17],"robust":[18],"end-point":[19],"property":[20],"batch":[23],"processes.":[24],"potential":[26],"advantages":[27],"using":[29,37],"NMPC":[30],"in":[31],"the":[32],"microelectronics":[33],"industry":[34],"are":[35],"demonstrated":[36],"an":[38],"example":[39],"process":[40],"thin":[42],"film":[43],"deposition.":[44]},"counts_by_year":[{"year":2020,"cited_by_count":2},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2013,"cited_by_count":2}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}