{"id":"https://openalex.org/W1578755511","doi":"https://doi.org/10.1109/cdc.2003.1272693","title":"Application of probabilistic robustness technique to the fault detection system design","display_name":"Application of probabilistic robustness technique to the fault detection system design","publication_year":2004,"publication_date":"2004-07-08","ids":{"openalex":"https://openalex.org/W1578755511","doi":"https://doi.org/10.1109/cdc.2003.1272693","mag":"1578755511"},"language":"en","primary_location":{"id":"doi:10.1109/cdc.2003.1272693","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cdc.2003.1272693","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"42nd IEEE International Conference on Decision and Control (IEEE Cat. No.03CH37475)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5046071840","display_name":"Steven X. Ding","orcid":"https://orcid.org/0000-0002-5149-5918"},"institutions":[{"id":"https://openalex.org/I62318514","display_name":"University of Duisburg-Essen","ror":"https://ror.org/04mz5ra38","country_code":"DE","type":"education","lineage":["https://openalex.org/I62318514"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"S.X. Ding","raw_affiliation_strings":["Institute for Automatic Control and Complex Systems, Faculty 5, University of Duisburg-Essen, Duisburg, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute for Automatic Control and Complex Systems, Faculty 5, University of Duisburg-Essen, Duisburg, Germany","institution_ids":["https://openalex.org/I62318514"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5000873881","display_name":"Ping Zhang","orcid":"https://orcid.org/0000-0002-9620-8193"},"institutions":[{"id":"https://openalex.org/I62318514","display_name":"University of Duisburg-Essen","ror":"https://ror.org/04mz5ra38","country_code":"DE","type":"education","lineage":["https://openalex.org/I62318514"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"P. Zhang","raw_affiliation_strings":["Institute for Automatic Control and Complex Systems, Faculty 5, University of Duisburg-Essen, Duisburg, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute for Automatic Control and Complex Systems, Faculty 5, University of Duisburg-Essen, Duisburg, Germany","institution_ids":["https://openalex.org/I62318514"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5109248550","display_name":"P.M. Frank","orcid":null},"institutions":[{"id":"https://openalex.org/I62318514","display_name":"University of Duisburg-Essen","ror":"https://ror.org/04mz5ra38","country_code":"DE","type":"education","lineage":["https://openalex.org/I62318514"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"P.M. Frank","raw_affiliation_strings":["Institute for Automatic Control and Complex Systems, Faculty 5, University of Duisburg-Essen, Duisburg, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute for Automatic Control and Complex Systems, Faculty 5, University of Duisburg-Essen, Duisburg, Germany","institution_ids":["https://openalex.org/I62318514"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I62318514"],"apc_list":null,"apc_paid":null,"fwci":5.8637,"has_fulltext":false,"cited_by_count":20,"citation_normalized_percentile":{"value":0.96784595,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"1","issue":null,"first_page":"972","last_page":"977"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11357","display_name":"Risk and Safety Analysis","score":0.9950000047683716,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T11443","display_name":"Advanced Statistical Process Monitoring","score":0.9866999983787537,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.80155348777771},{"id":"https://openalex.org/keywords/probabilistic-logic","display_name":"Probabilistic logic","score":0.668681263923645},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6621430516242981},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.5563774704933167},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5055990219116211},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.17351481318473816},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.14923062920570374}],"concepts":[{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.80155348777771},{"id":"https://openalex.org/C49937458","wikidata":"https://www.wikidata.org/wiki/Q2599292","display_name":"Probabilistic logic","level":2,"score":0.668681263923645},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6621430516242981},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.5563774704933167},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5055990219116211},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.17351481318473816},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.14923062920570374},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/cdc.2003.1272693","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cdc.2003.1272693","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"42nd IEEE International Conference on Decision and Control (IEEE Cat. No.03CH37475)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W1510598017","https://openalex.org/W1547820487","https://openalex.org/W1592847587","https://openalex.org/W1868559974","https://openalex.org/W1967311528","https://openalex.org/W1985995825","https://openalex.org/W1994382933","https://openalex.org/W1995603189","https://openalex.org/W1997498827","https://openalex.org/W1997713206","https://openalex.org/W2032173185","https://openalex.org/W2055561145","https://openalex.org/W2059138104","https://openalex.org/W2112892237","https://openalex.org/W2115424783","https://openalex.org/W2117844706","https://openalex.org/W2132922421","https://openalex.org/W3195133498","https://openalex.org/W3210839039"],"related_works":["https://openalex.org/W1575659177","https://openalex.org/W4290792893","https://openalex.org/W2363475415","https://openalex.org/W2029619274","https://openalex.org/W2004435960","https://openalex.org/W1481179460","https://openalex.org/W2736019006","https://openalex.org/W4239295757","https://openalex.org/W2153527126","https://openalex.org/W2145642206"],"abstract_inverted_index":{"This":[0],"paper":[1],"deals":[2],"with":[3],"problems":[4],"related":[5],"to":[6],"the":[7,14,22,31,37,44],"computation":[8],"of":[9,16,24,46],"false":[10],"alarm":[11],"rate":[12],"(FAR),":[13],"determination":[15],"thresholds":[17,48],"and":[18,49],"their":[19],"integration":[20],"in":[21],"design":[23],"observer-based":[25],"fault":[26],"detection":[27],"systems.":[28],"Different":[29],"from":[30],"known":[32],"norm-based":[33],"residual":[34],"evaluation":[35],"methods,":[36],"probabilistic":[38],"robustness":[39],"theory":[40],"is":[41],"applied":[42],"for":[43],"purposes":[45],"calculating":[47],"FAR.":[50]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}