{"id":"https://openalex.org/W1537793631","doi":"https://doi.org/10.1109/cdc.2002.1184704","title":"Support vector machines for fault detection","display_name":"Support vector machines for fault detection","publication_year":2003,"publication_date":"2003-08-27","ids":{"openalex":"https://openalex.org/W1537793631","doi":"https://doi.org/10.1109/cdc.2002.1184704","mag":"1537793631"},"language":"en","primary_location":{"id":"doi:10.1109/cdc.2002.1184704","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cdc.2002.1184704","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 41st IEEE Conference on Decision and Control, 2002.","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5111625217","display_name":"C. Batur","orcid":null},"institutions":[{"id":"https://openalex.org/I110152177","display_name":"University of Akron","ror":"https://ror.org/02kyckx55","country_code":"US","type":"education","lineage":["https://openalex.org/I110152177"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"C. Batur","raw_affiliation_strings":["Department of Mechanical Engineering, University of Akron, Akron, OH, USA"],"affiliations":[{"raw_affiliation_string":"Department of Mechanical Engineering, University of Akron, Akron, OH, USA","institution_ids":["https://openalex.org/I110152177"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073156712","display_name":"Ling Zhou","orcid":"https://orcid.org/0000-0002-6954-9574"},"institutions":[{"id":"https://openalex.org/I110152177","display_name":"University of Akron","ror":"https://ror.org/02kyckx55","country_code":"US","type":"education","lineage":["https://openalex.org/I110152177"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ling Zhou","raw_affiliation_strings":["Department of Mechanical Engineering, University of Akron, Akron, OH, USA"],"affiliations":[{"raw_affiliation_string":"Department of Mechanical Engineering, University of Akron, Akron, OH, USA","institution_ids":["https://openalex.org/I110152177"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5006984328","display_name":"Chien-Chung Chan","orcid":null},"institutions":[{"id":"https://openalex.org/I110152177","display_name":"University of Akron","ror":"https://ror.org/02kyckx55","country_code":"US","type":"education","lineage":["https://openalex.org/I110152177"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Chien-Chung Chan","raw_affiliation_strings":["Department of Computer Science, University of Akron, Akron, OH, USA"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science, University of Akron, Akron, OH, USA","institution_ids":["https://openalex.org/I110152177"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5111625217"],"corresponding_institution_ids":["https://openalex.org/I110152177"],"apc_list":null,"apc_paid":null,"fwci":1.6187,"has_fulltext":false,"cited_by_count":21,"citation_normalized_percentile":{"value":0.83893649,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"2","issue":null,"first_page":"1355","last_page":"1356"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10320","display_name":"Neural Networks and Applications","score":0.9965000152587891,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13717","display_name":"Advanced Algorithms and Applications","score":0.991100013256073,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.8240673542022705},{"id":"https://openalex.org/keywords/support-vector-machine","display_name":"Support vector machine","score":0.7982281446456909},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7167007923126221},{"id":"https://openalex.org/keywords/statistical-learning-theory","display_name":"Statistical learning theory","score":0.6264857649803162},{"id":"https://openalex.org/keywords/isolation","display_name":"Isolation (microbiology)","score":0.6142127513885498},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5519166588783264},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4966612458229065},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.49516311287879944},{"id":"https://openalex.org/keywords/identification","display_name":"Identification (biology)","score":0.48982831835746765},{"id":"https://openalex.org/keywords/statistical-learning","display_name":"Statistical learning","score":0.429848849773407},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.42929431796073914}],"concepts":[{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.8240673542022705},{"id":"https://openalex.org/C12267149","wikidata":"https://www.wikidata.org/wiki/Q282453","display_name":"Support vector machine","level":2,"score":0.7982281446456909},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7167007923126221},{"id":"https://openalex.org/C2779915298","wikidata":"https://www.wikidata.org/wiki/Q7604400","display_name":"Statistical learning theory","level":3,"score":0.6264857649803162},{"id":"https://openalex.org/C2775941552","wikidata":"https://www.wikidata.org/wiki/Q25212305","display_name":"Isolation (microbiology)","level":2,"score":0.6142127513885498},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5519166588783264},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4966612458229065},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.49516311287879944},{"id":"https://openalex.org/C116834253","wikidata":"https://www.wikidata.org/wiki/Q2039217","display_name":"Identification (biology)","level":2,"score":0.48982831835746765},{"id":"https://openalex.org/C2982736386","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Statistical learning","level":2,"score":0.429848849773407},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.42929431796073914},{"id":"https://openalex.org/C89423630","wikidata":"https://www.wikidata.org/wiki/Q7193","display_name":"Microbiology","level":1,"score":0.0},{"id":"https://openalex.org/C59822182","wikidata":"https://www.wikidata.org/wiki/Q441","display_name":"Botany","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/cdc.2002.1184704","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cdc.2002.1184704","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 41st IEEE Conference on Decision and Control, 2002.","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W85809644","https://openalex.org/W1512075693","https://openalex.org/W1512498126","https://openalex.org/W1544444001","https://openalex.org/W1601740268","https://openalex.org/W1974166884","https://openalex.org/W1980801609","https://openalex.org/W1986365894","https://openalex.org/W1993308439","https://openalex.org/W2022521851","https://openalex.org/W2067525202","https://openalex.org/W2119821739","https://openalex.org/W2124351082","https://openalex.org/W2124470735","https://openalex.org/W2137226992","https://openalex.org/W2139212933","https://openalex.org/W2148247379","https://openalex.org/W2156909104","https://openalex.org/W2292238226","https://openalex.org/W4239510810","https://openalex.org/W6632480798","https://openalex.org/W6636118231","https://openalex.org/W6680532697"],"related_works":["https://openalex.org/W2369526193","https://openalex.org/W2394142199","https://openalex.org/W2382810153","https://openalex.org/W3013091747","https://openalex.org/W2131042369","https://openalex.org/W2389264710","https://openalex.org/W2186819599","https://openalex.org/W2367955905","https://openalex.org/W2385435757","https://openalex.org/W2371052470"],"abstract_inverted_index":{"Support":[0],"vector":[1],"machines":[2],"(SVMs),":[3],"based":[4],"on":[5],"Vapnik's":[6],"statistical":[7],"learning":[8,41],"theory":[9],"is":[10,56],"a":[11,29],"new":[12,30],"tool":[13],"that":[14,32],"can":[15],"be":[16],"used":[17,57],"for":[18,43],"fault":[19,44],"detection":[20,45],"and":[21,38,46],"isolation":[22,47],"in":[23,48],"dynamic":[24,49],"systems.":[25,50],"This":[26],"paper":[27],"presents":[28],"approach":[31],"combines":[33],"the":[34,39,60],"system":[35],"identification":[36],"technique":[37],"SVM":[40],"algorithm":[42],"A":[51],"conventional":[52],"heat":[53],"exchanger":[54],"dynamics":[55],"to":[58],"illustrate":[59],"technique.":[61]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":3},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}