{"id":"https://openalex.org/W3210174903","doi":"https://doi.org/10.1109/ccece53047.2021.9569128","title":"CCECE 2021 Invited Paper: Holistic Performance, Reliability and Thermal Understanding of HPC Real Utilization on Silicon Architecture","display_name":"CCECE 2021 Invited Paper: Holistic Performance, Reliability and Thermal Understanding of HPC Real Utilization on Silicon Architecture","publication_year":2021,"publication_date":"2021-09-12","ids":{"openalex":"https://openalex.org/W3210174903","doi":"https://doi.org/10.1109/ccece53047.2021.9569128","mag":"3210174903"},"language":"en","primary_location":{"id":"doi:10.1109/ccece53047.2021.9569128","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ccece53047.2021.9569128","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE Canadian Conference on Electrical and Computer Engineering (CCECE)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5061228505","display_name":"Gamal Refai-Ahmed","orcid":null},"institutions":[{"id":"https://openalex.org/I32923980","display_name":"Xilinx (United States)","ror":"https://ror.org/01rb7bk56","country_code":"US","type":"company","lineage":["https://openalex.org/I32923980"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Gamal Refai-Ahmed","raw_affiliation_strings":["Xilinx Inc., San Jose, CA, USA"],"affiliations":[{"raw_affiliation_string":"Xilinx Inc., San Jose, CA, USA","institution_ids":["https://openalex.org/I32923980"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084183923","display_name":"Hoa Do","orcid":"https://orcid.org/0000-0001-5442-507X"},"institutions":[{"id":"https://openalex.org/I32923980","display_name":"Xilinx (United States)","ror":"https://ror.org/01rb7bk56","country_code":"US","type":"company","lineage":["https://openalex.org/I32923980"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Hoa Do","raw_affiliation_strings":["Xilinx Inc., San Jose, CA, USA"],"affiliations":[{"raw_affiliation_string":"Xilinx Inc., San Jose, CA, USA","institution_ids":["https://openalex.org/I32923980"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5090920321","display_name":"I\u2212Ru Chen","orcid":"https://orcid.org/0000-0002-7424-0352"},"institutions":[{"id":"https://openalex.org/I32923980","display_name":"Xilinx (United States)","ror":"https://ror.org/01rb7bk56","country_code":"US","type":"company","lineage":["https://openalex.org/I32923980"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"I-Ru Chen","raw_affiliation_strings":["Xilinx Inc., San Jose, CA, USA"],"affiliations":[{"raw_affiliation_string":"Xilinx Inc., San Jose, CA, USA","institution_ids":["https://openalex.org/I32923980"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101978093","display_name":"Jae-Gyung Ahn","orcid":"https://orcid.org/0000-0003-3137-5924"},"institutions":[{"id":"https://openalex.org/I32923980","display_name":"Xilinx (United States)","ror":"https://ror.org/01rb7bk56","country_code":"US","type":"company","lineage":["https://openalex.org/I32923980"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jae-Gyung Ahn","raw_affiliation_strings":["Xilinx Inc., San Jose, CA, USA"],"affiliations":[{"raw_affiliation_string":"Xilinx Inc., San Jose, CA, USA","institution_ids":["https://openalex.org/I32923980"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109038420","display_name":"Huayan Wang","orcid":null},"institutions":[{"id":"https://openalex.org/I32923980","display_name":"Xilinx (United States)","ror":"https://ror.org/01rb7bk56","country_code":"US","type":"company","lineage":["https://openalex.org/I32923980"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Huayan Wang","raw_affiliation_strings":["Xilinx Inc., San Jose, CA, USA"],"affiliations":[{"raw_affiliation_string":"Xilinx Inc., San Jose, CA, USA","institution_ids":["https://openalex.org/I32923980"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111714809","display_name":"Xin Wu","orcid":"https://orcid.org/0009-0000-1056-1918"},"institutions":[{"id":"https://openalex.org/I32923980","display_name":"Xilinx (United States)","ror":"https://ror.org/01rb7bk56","country_code":"US","type":"company","lineage":["https://openalex.org/I32923980"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Xin Wu","raw_affiliation_strings":["Xilinx Inc., San Jose, CA, USA"],"affiliations":[{"raw_affiliation_string":"Xilinx Inc., San Jose, CA, USA","institution_ids":["https://openalex.org/I32923980"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5103745366","display_name":"Suresh Ramalingam","orcid":null},"institutions":[{"id":"https://openalex.org/I32923980","display_name":"Xilinx (United States)","ror":"https://ror.org/01rb7bk56","country_code":"US","type":"company","lineage":["https://openalex.org/I32923980"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Suresh Ramalingam","raw_affiliation_strings":["Xilinx Inc., San Jose, CA, USA"],"affiliations":[{"raw_affiliation_string":"Xilinx Inc., San Jose, CA, USA","institution_ids":["https://openalex.org/I32923980"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5061228505"],"corresponding_institution_ids":["https://openalex.org/I32923980"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.12569249,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"8"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.996399998664856,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9937999844551086,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/granularity","display_name":"Granularity","score":0.6390383243560791},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.6280918121337891},{"id":"https://openalex.org/keywords/power-density","display_name":"Power density","score":0.6061934232711792},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.46992528438568115},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.45945650339126587},{"id":"https://openalex.org/keywords/heat-sink","display_name":"Heat sink","score":0.445169597864151},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4109051823616028},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.41058939695358276},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.38627883791923523},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.35882073640823364},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.26193875074386597},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.10497769713401794}],"concepts":[{"id":"https://openalex.org/C177774035","wikidata":"https://www.wikidata.org/wiki/Q1246948","display_name":"Granularity","level":2,"score":0.6390383243560791},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.6280918121337891},{"id":"https://openalex.org/C21881925","wikidata":"https://www.wikidata.org/wiki/Q3503313","display_name":"Power density","level":3,"score":0.6061934232711792},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.46992528438568115},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.45945650339126587},{"id":"https://openalex.org/C186937647","wikidata":"https://www.wikidata.org/wiki/Q1796959","display_name":"Heat sink","level":2,"score":0.445169597864151},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4109051823616028},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.41058939695358276},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.38627883791923523},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.35882073640823364},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.26193875074386597},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.10497769713401794},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ccece53047.2021.9569128","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ccece53047.2021.9569128","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE Canadian Conference on Electrical and Computer Engineering (CCECE)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.7799999713897705,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W2917856904","https://openalex.org/W2945083638","https://openalex.org/W3127023525"],"related_works":["https://openalex.org/W2931688134","https://openalex.org/W2377919138","https://openalex.org/W2378857091","https://openalex.org/W2999756192","https://openalex.org/W4226090359","https://openalex.org/W4382701072","https://openalex.org/W2491314273","https://openalex.org/W2011624601","https://openalex.org/W936373746","https://openalex.org/W2903604954"],"abstract_inverted_index":{"The":[0,13,43,202,225,236,386],"power":[1,5,17,78,108,124,146,179],"density":[2,18,57,147],"and":[3,69,93,176,197,322,357],"total":[4],"from":[6,20,84,284],"the":[7,24,30,37,41,54,64,72,123,129,134,159,177,207,217,245,264,269,288,290,298,330,334,344,395],"package":[8],"have":[9],"been":[10],"increased":[11],"significantly.":[12],"rapid":[14],"rate":[15],"of":[16,45,53,71,91,145,151,169,181,193,263,343,347,364],"increases":[19],"one":[21],"generation":[22],"to":[23,49,63,112,140,261,328,380],"next":[25],"not":[26,241,254],"only":[27],"happens":[28,35],"at":[29,36,257],"device":[31,291,387],"level":[32],"but":[33],"also":[34],"localized":[38,55,398],"area":[39],"on":[40,313,394],"devices.":[42],"objective":[44],"this":[46,157,248,303],"study":[47],"is":[48,126,162,188,220,391],"build":[50],"more":[51,107,223],"understanding":[52,144],"high-power":[56],"in":[58,66,97,133,156,190,222,351],"silicon":[59,99],"blocks":[60],"with":[61,165,354],"respect":[62],"impact":[65],"temperature":[67,239,278,293,305,311,356,358,368],"gradient":[68],"reliability":[70,342,348,390],"silicon.":[73],"Conventionally,":[74],"individual":[75],"design":[76,130,154,186,218],"block":[77,100,131,187,219],"usage":[79],"numbers":[80],"are":[81],"often":[82],"reported":[83,189],"circuit":[85,166,374],"simulations":[86],"without":[87],"considering":[88],"physical":[89],"location":[90,252,266,324],"transistors":[92,103],"metal":[94],"wires.":[95],"However,":[96],"a":[98,142,152,182,307,361],"design,":[101],"certain":[102],"may":[104],"consume":[105],"significantly":[106],"than":[109,297],"others":[110],"due":[111,260,379],"higher":[113,215,296,355],"load":[114],"capacitance,":[115],"current":[116],"draw,":[117],"frequency,":[118],"or":[119,382],"toggle":[120],"rate.":[121],"Therefore,":[122],"distribution":[125,180],"uneven":[127],"within":[128],"even":[132],"same":[135],"use":[136,174],"case.":[137],"In":[138],"order":[139],"gain":[141],"better":[143],"peak":[148],"spot":[149,232],"inside":[150],"single":[153],"block,":[155],"study,":[158],"transistor":[160],"activity":[161],"dynamically":[163],"analyzed":[164,221],"simulation":[167],"vectors":[168],"an":[170,191],"actual":[171],"Versal":[172],"product":[173,365],"case":[175],"spatial":[178],"0.5mm":[183,185],"x":[184,195,199],"granularity":[192],"10um":[194,196],"turn":[198,200],"respectively.":[201],"analysis":[203],"results":[204],"show":[205],"that":[206,233,274],"local":[208,226,230,270,367],"heat":[209,227,314,319],"flux":[210,228,315],"can":[211,276,294],"be":[212,242,255,277,295,326,377],"several":[213],"magnitudes":[214],"when":[216],"granularity.":[224],"creates":[229],"hot":[231,271,338,399],"was":[234],"overlooked.":[235],"max":[237,292,304,310,331],"hotspot":[238,250],"would":[240,253,325],"captured":[243],"by":[244,268,370],"sensor":[246,251],"because":[247],"specific":[249],"known":[256],"first":[258],"hand":[259],"uncertainty":[262],"exact":[265],"created":[267],"spot.":[272,400],"Understanding":[273],"there":[275],"sensors":[279],"located":[280],"some":[281],"distance(700um)":[282],"away":[283],"hotspot,":[285],"reporting":[286],"out":[287],"temperature,":[289],"system":[299],"monitor":[300],"readout.":[301],"Given":[302],"discrepancy,":[306],"correlation":[308],"for":[309],"based":[312,393],"density,":[316],"source":[317],"area,":[318],"sink":[320],"resistance,":[321],"senor":[323],"defined":[327],"estimate":[329],"temperature.":[332],"When":[333,360],"semiconductor":[335],"chip":[336],"has":[337,366],"spots,":[339],"it":[340],"affects":[341],"chip.":[345],"Most":[346],"mechanisms":[349],"result":[350],"shorter":[352],"lifetime":[353],"gradients.":[359],"small":[362],"portion":[363],"increase":[369],"whatever":[371],"reason,":[372],"long-term":[373],"performance":[375],"should":[376],"altered":[378],"enhanced":[381],"reduced":[383],"aging":[384],"effect.":[385],"long":[388],"term":[389],"reassessed":[392],"new":[396],"discovered":[397]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}