{"id":"https://openalex.org/W4308090779","doi":"https://doi.org/10.1109/ccece49351.2022.9918298","title":"Early Fault Detection of Medium Voltage Covered Conductors with Deep Learning Method","display_name":"Early Fault Detection of Medium Voltage Covered Conductors with Deep Learning Method","publication_year":2022,"publication_date":"2022-09-18","ids":{"openalex":"https://openalex.org/W4308090779","doi":"https://doi.org/10.1109/ccece49351.2022.9918298"},"language":"en","primary_location":{"id":"doi:10.1109/ccece49351.2022.9918298","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ccece49351.2022.9918298","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE Canadian Conference on Electrical and Computer Engineering (CCECE)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5033276851","display_name":"Morteza Shamsoddini","orcid":"https://orcid.org/0000-0002-4802-6512"},"institutions":[{"id":"https://openalex.org/I32625721","display_name":"University of Saskatchewan","ror":"https://ror.org/010x8gc63","country_code":"CA","type":"education","lineage":["https://openalex.org/I32625721"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Morteza Shamsoddini","raw_affiliation_strings":["University of Saskatchewan,Department of Electrical and Computer Engineering,Saskatoon,Canada","Department of Electrical and Computer Engineering, University of Saskatchewan, Saskatoon, Canada"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Saskatchewan,Department of Electrical and Computer Engineering,Saskatoon,Canada","institution_ids":["https://openalex.org/I32625721"]},{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Saskatchewan, Saskatoon, Canada","institution_ids":["https://openalex.org/I32625721"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064463899","display_name":"Tongkun Lan","orcid":"https://orcid.org/0000-0002-1166-7922"},"institutions":[{"id":"https://openalex.org/I32625721","display_name":"University of Saskatchewan","ror":"https://ror.org/010x8gc63","country_code":"CA","type":"education","lineage":["https://openalex.org/I32625721"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Tongkun Lan","raw_affiliation_strings":["University of Saskatchewan,Department of Electrical and Computer Engineering,Saskatoon,Canada","Department of Electrical and Computer Engineering, University of Saskatchewan, Saskatoon, Canada"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Saskatchewan,Department of Electrical and Computer Engineering,Saskatoon,Canada","institution_ids":["https://openalex.org/I32625721"]},{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Saskatchewan, Saskatoon, Canada","institution_ids":["https://openalex.org/I32625721"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5025785946","display_name":"Hamid Teimourzadeh","orcid":null},"institutions":[{"id":"https://openalex.org/I32625721","display_name":"University of Saskatchewan","ror":"https://ror.org/010x8gc63","country_code":"CA","type":"education","lineage":["https://openalex.org/I32625721"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Hamid Teimourzadeh","raw_affiliation_strings":["University of Saskatchewan,Department of Electrical and Computer Engineering,Saskatoon,Canada","Department of Electrical and Computer Engineering, University of Saskatchewan, Saskatoon, Canada"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Saskatchewan,Department of Electrical and Computer Engineering,Saskatoon,Canada","institution_ids":["https://openalex.org/I32625721"]},{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Saskatchewan, Saskatoon, Canada","institution_ids":["https://openalex.org/I32625721"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110936099","display_name":"Mahdi Mazhari","orcid":null},"institutions":[{"id":"https://openalex.org/I32625721","display_name":"University of Saskatchewan","ror":"https://ror.org/010x8gc63","country_code":"CA","type":"education","lineage":["https://openalex.org/I32625721"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Mahdi Mazhari","raw_affiliation_strings":["University of Saskatchewan,Department of Electrical and Computer Engineering,Saskatoon,Canada","Department of Electrical and Computer Engineering, University of Saskatchewan, Saskatoon, Canada"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Saskatchewan,Department of Electrical and Computer Engineering,Saskatoon,Canada","institution_ids":["https://openalex.org/I32625721"]},{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Saskatchewan, Saskatoon, Canada","institution_ids":["https://openalex.org/I32625721"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083554304","display_name":"C. Y. Chung","orcid":"https://orcid.org/0000-0001-6607-2240"},"institutions":[{"id":"https://openalex.org/I14243506","display_name":"Hong Kong Polytechnic University","ror":"https://ror.org/0030zas98","country_code":"HK","type":"education","lineage":["https://openalex.org/I14243506"]}],"countries":["HK"],"is_corresponding":false,"raw_author_name":"Chi Yung Chung","raw_affiliation_strings":["Hong Kong Polytechnic University,Department of Electrical Engineering,Hong Kong,China","Department of Electrical Engineering, Hong Kong Polytechnic University, Hong Kong, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hong Kong Polytechnic University,Department of Electrical Engineering,Hong Kong,China","institution_ids":["https://openalex.org/I14243506"]},{"raw_affiliation_string":"Department of Electrical Engineering, Hong Kong Polytechnic University, Hong Kong, China","institution_ids":["https://openalex.org/I14243506"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5054217230","display_name":"Seok\u2010Bum Ko","orcid":"https://orcid.org/0000-0002-9287-317X"},"institutions":[{"id":"https://openalex.org/I32625721","display_name":"University of Saskatchewan","ror":"https://ror.org/010x8gc63","country_code":"CA","type":"education","lineage":["https://openalex.org/I32625721"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Seok-Bum Ko","raw_affiliation_strings":["University of Saskatchewan,Department of Electrical and Computer Engineering,Saskatoon,Canada","Department of Electrical and Computer Engineering, University of Saskatchewan, Saskatoon, Canada"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Saskatchewan,Department of Electrical and Computer Engineering,Saskatoon,Canada","institution_ids":["https://openalex.org/I32625721"]},{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Saskatchewan, Saskatoon, Canada","institution_ids":["https://openalex.org/I32625721"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.09153576,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"176","last_page":"181"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.9297000169754028,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.9297000169754028,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11941","display_name":"Power System Reliability and Maintenance","score":0.9211000204086304,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electrical-conductor","display_name":"Electrical conductor","score":0.7094118595123291},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.5776880383491516},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5580628514289856},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4640929102897644},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3916090726852417},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3351702094078064},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.3341074585914612},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2058943510055542},{"id":"https://openalex.org/keywords/actuator","display_name":"Actuator","score":0.07832509279251099}],"concepts":[{"id":"https://openalex.org/C202374169","wikidata":"https://www.wikidata.org/wiki/Q124291","display_name":"Electrical conductor","level":2,"score":0.7094118595123291},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.5776880383491516},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5580628514289856},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4640929102897644},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3916090726852417},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3351702094078064},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3341074585914612},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2058943510055542},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.07832509279251099}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ccece49351.2022.9918298","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ccece49351.2022.9918298","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE Canadian Conference on Electrical and Computer Engineering (CCECE)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320322675","display_name":"Mitacs","ror":"https://ror.org/00cjrc276"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2105579035","https://openalex.org/W2773988189","https://openalex.org/W3193816661","https://openalex.org/W2041933652","https://openalex.org/W4250267997","https://openalex.org/W4238652711","https://openalex.org/W2143123254","https://openalex.org/W4235564237","https://openalex.org/W3107078369"],"abstract_inverted_index":{"Partial":[0],"discharge":[1],"(PD)":[2],"is":[3,106,132],"the":[4,56,64,92,113,119,124,162,165,169],"initial":[5],"stage":[6],"of":[7,58,66,115,139,164,174],"a":[8,71,86,135,176],"complete":[9],"failure":[10],"in":[11,63,77,172],"some":[12,116,155],"power":[13,35],"systems\u2019":[14],"components,":[15],"such":[16],"as":[17],"electrical":[18],"machines,":[19],"cables,":[20],"covered":[21],"conductors,":[22],"etc.":[23],"If":[24],"left":[25],"without":[26],"repair,":[27],"these":[28,59],"phenomena":[29],"can":[30],"eventually":[31],"lead":[32],"to":[33,134],"substantial":[34],"outages":[36],"and":[37,50,98,110,123],"damages.":[38],"The":[39,129,149],"advanced":[40],"approaches":[41],"for":[42,73,108],"PD":[43,74,142],"detection":[44,76],"rely":[45],"on":[46,91,118],"statistical":[47],"feature":[48],"extraction":[49],"conventional":[51,170],"machine":[52,157],"learning":[53,88,121,158],"methods;":[54],"however,":[55],"performance":[57],"methods":[60],"will":[61],"decrease":[62],"presence":[65],"noise.":[67],"This":[68],"study":[69],"investigates":[70],"solution":[72],"fault":[75,143],"Medium":[78],"Voltage":[79],"Covered":[80],"Conductor":[81],"Overhead":[82],"lines":[83],"(MVCCO)":[84],"using":[85],"deep":[87,120],"method":[89,105,131,167],"based":[90],"Long":[93],"Term":[94],"Short":[95],"Memory":[96],"(LSTM)":[97],"Attention":[99],"layers.":[100],"A":[101],"k-fold":[102],"stratified":[103],"cross-validation":[104],"used":[107],"training":[109],"validation.":[111],"Also,":[112],"impacts":[114],"hyperparameters":[117],"model":[122],"classification":[125],"result":[126],"are":[127,152],"investigated.":[128],"proposed":[130,166],"applied":[133],"large":[136],"open-source":[137],"dataset":[138],"signals":[140],"with":[141,154],"provided":[144],"by":[145],"VSB\u2019s":[146],"ENET":[147],"center.":[148],"obtained":[150],"results":[151],"compared":[153],"traditional":[156],"methods,":[159],"which":[160],"proved":[161],"superiority":[163],"over":[168],"techniques":[171],"terms":[173],"detecting":[175],"faulty":[177],"signal.":[178]},"counts_by_year":[],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}