{"id":"https://openalex.org/W2548180610","doi":"https://doi.org/10.1109/ccece.2016.7726602","title":"Total ionizing dose test facilities for micro-electronic circuits","display_name":"Total ionizing dose test facilities for micro-electronic circuits","publication_year":2016,"publication_date":"2016-05-01","ids":{"openalex":"https://openalex.org/W2548180610","doi":"https://doi.org/10.1109/ccece.2016.7726602","mag":"2548180610"},"language":"en","primary_location":{"id":"doi:10.1109/ccece.2016.7726602","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ccece.2016.7726602","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE Canadian Conference on Electrical and Computer Engineering (CCECE)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100408835","display_name":"Haibin Wang","orcid":"https://orcid.org/0000-0002-9269-1229"},"institutions":[{"id":"https://openalex.org/I163340411","display_name":"Hohai University","ror":"https://ror.org/01wd4xt90","country_code":"CN","type":"education","lineage":["https://openalex.org/I163340411"]},{"id":"https://openalex.org/I32625721","display_name":"University of Saskatchewan","ror":"https://ror.org/010x8gc63","country_code":"CA","type":"education","lineage":["https://openalex.org/I32625721"]}],"countries":["CA","CN"],"is_corresponding":false,"raw_author_name":"H.-B. Wang","raw_affiliation_strings":["College of IOT Engineering, Hohai University, Changzhou, China","University of Saskatchewan, Saskatoon, SK, Canada"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of IOT Engineering, Hohai University, Changzhou, China","institution_ids":["https://openalex.org/I163340411"]},{"raw_affiliation_string":"University of Saskatchewan, Saskatoon, SK, Canada","institution_ids":["https://openalex.org/I32625721"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014101284","display_name":"R. Liu","orcid":"https://orcid.org/0009-0006-6357-1603"},"institutions":[{"id":"https://openalex.org/I32625721","display_name":"University of Saskatchewan","ror":"https://ror.org/010x8gc63","country_code":"CA","type":"education","lineage":["https://openalex.org/I32625721"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"R. Liu","raw_affiliation_strings":["University of Saskatchewan, Saskatoon, SK, Canada"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Saskatchewan, Saskatoon, SK, Canada","institution_ids":["https://openalex.org/I32625721"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5016457027","display_name":"X.-T. Li","orcid":null},"institutions":[{"id":"https://openalex.org/I32625721","display_name":"University of Saskatchewan","ror":"https://ror.org/010x8gc63","country_code":"CA","type":"education","lineage":["https://openalex.org/I32625721"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"X.-T. Li","raw_affiliation_strings":["University of Saskatchewan, Saskatoon, SK, Canada"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Saskatchewan, Saskatoon, SK, Canada","institution_ids":["https://openalex.org/I32625721"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100379239","display_name":"Li Chen","orcid":"https://orcid.org/0000-0002-3769-1488"},"institutions":[{"id":"https://openalex.org/I32625721","display_name":"University of Saskatchewan","ror":"https://ror.org/010x8gc63","country_code":"CA","type":"education","lineage":["https://openalex.org/I32625721"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"L. Chen","raw_affiliation_strings":["University of Saskatchewan, Saskatoon, SK, Canada"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Saskatchewan, Saskatoon, SK, Canada","institution_ids":["https://openalex.org/I32625721"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110283457","display_name":"David M. Hiemstra","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"D. M. Hiemstra","raw_affiliation_strings":["MDA, Brampton, Canada"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"MDA, Brampton, Canada","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5050082013","display_name":"Valeri Kirischian","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"V. Kirischian","raw_affiliation_strings":["MDA, Brampton, Canada"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"MDA, Brampton, Canada","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":14,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9962999820709229,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9898999929428101,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/ionizing-radiation","display_name":"Ionizing radiation","score":0.8496906161308289},{"id":"https://openalex.org/keywords/absorbed-dose","display_name":"Absorbed dose","score":0.7485508918762207},{"id":"https://openalex.org/keywords/electronics","display_name":"Electronics","score":0.522926926612854},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4862176477909088},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.48077768087387085},{"id":"https://openalex.org/keywords/dose-rate","display_name":"Dose rate","score":0.47203007340431213},{"id":"https://openalex.org/keywords/medical-physics","display_name":"Medical physics","score":0.4466453194618225},{"id":"https://openalex.org/keywords/dosimetry","display_name":"Dosimetry","score":0.3743354082107544},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.35367798805236816},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3481404781341553},{"id":"https://openalex.org/keywords/nuclear-medicine","display_name":"Nuclear medicine","score":0.3242897391319275},{"id":"https://openalex.org/keywords/environmental-science","display_name":"Environmental science","score":0.3209150433540344},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.31617623567581177},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3147472143173218},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2521553933620453},{"id":"https://openalex.org/keywords/irradiation","display_name":"Irradiation","score":0.19149136543273926},{"id":"https://openalex.org/keywords/nuclear-physics","display_name":"Nuclear physics","score":0.13823452591896057},{"id":"https://openalex.org/keywords/medicine","display_name":"Medicine","score":0.1052427589893341},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.07173001766204834}],"concepts":[{"id":"https://openalex.org/C18231593","wikidata":"https://www.wikidata.org/wiki/Q186161","display_name":"Ionizing radiation","level":3,"score":0.8496906161308289},{"id":"https://openalex.org/C151337348","wikidata":"https://www.wikidata.org/wiki/Q215313","display_name":"Absorbed dose","level":3,"score":0.7485508918762207},{"id":"https://openalex.org/C138331895","wikidata":"https://www.wikidata.org/wiki/Q11650","display_name":"Electronics","level":2,"score":0.522926926612854},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4862176477909088},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.48077768087387085},{"id":"https://openalex.org/C3017588741","wikidata":"https://www.wikidata.org/wiki/Q3042357","display_name":"Dose rate","level":2,"score":0.47203007340431213},{"id":"https://openalex.org/C19527891","wikidata":"https://www.wikidata.org/wiki/Q1120908","display_name":"Medical physics","level":1,"score":0.4466453194618225},{"id":"https://openalex.org/C75088862","wikidata":"https://www.wikidata.org/wiki/Q2291081","display_name":"Dosimetry","level":2,"score":0.3743354082107544},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.35367798805236816},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3481404781341553},{"id":"https://openalex.org/C2989005","wikidata":"https://www.wikidata.org/wiki/Q214963","display_name":"Nuclear medicine","level":1,"score":0.3242897391319275},{"id":"https://openalex.org/C39432304","wikidata":"https://www.wikidata.org/wiki/Q188847","display_name":"Environmental science","level":0,"score":0.3209150433540344},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.31617623567581177},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3147472143173218},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2521553933620453},{"id":"https://openalex.org/C111337013","wikidata":"https://www.wikidata.org/wiki/Q2737837","display_name":"Irradiation","level":2,"score":0.19149136543273926},{"id":"https://openalex.org/C185544564","wikidata":"https://www.wikidata.org/wiki/Q81197","display_name":"Nuclear physics","level":1,"score":0.13823452591896057},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.1052427589893341},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.07173001766204834}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ccece.2016.7726602","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ccece.2016.7726602","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE Canadian Conference on Electrical and Computer Engineering (CCECE)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W2125961186","https://openalex.org/W2131271035","https://openalex.org/W2166246065","https://openalex.org/W2524330828","https://openalex.org/W6727734848"],"related_works":["https://openalex.org/W3088366447","https://openalex.org/W2083061615","https://openalex.org/W4302768515","https://openalex.org/W1965151911","https://openalex.org/W1990885697","https://openalex.org/W2911908587","https://openalex.org/W2984363285","https://openalex.org/W2059549055","https://openalex.org/W2606557054","https://openalex.org/W2316654980"],"abstract_inverted_index":{"This":[0],"paper":[1],"describes":[2],"the":[3,11,24],"total":[4,35],"ionizing":[5,36],"dose":[6,27,37],"test":[7],"facility":[8],"available":[9,19],"at":[10],"University":[12],"of":[13,32,39],"Saskatchewan.":[14],"Two":[15],"Co-60":[16],"sources":[17],"are":[18],"one":[20],"for":[21],"high":[22],"and":[23],"other":[25],"low":[26],"rate":[28],"radiation":[29],"effects":[30],"testing":[31,46],"electronics.":[33],"The":[34,45],"performance":[38],"an":[40],"operation":[41],"amplifier":[42],"was":[43],"evaluated.":[44],"results":[47],"compare":[48],"well":[49],"with":[50],"previously":[51],"published":[52],"results.":[53]},"counts_by_year":[{"year":2025,"cited_by_count":5},{"year":2024,"cited_by_count":2},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}