{"id":"https://openalex.org/W2104161320","doi":"https://doi.org/10.1109/ccece.2011.6030652","title":"Development of a device characterization curve tracer based on transient thermal measurement","display_name":"Development of a device characterization curve tracer based on transient thermal measurement","publication_year":2011,"publication_date":"2011-05-01","ids":{"openalex":"https://openalex.org/W2104161320","doi":"https://doi.org/10.1109/ccece.2011.6030652","mag":"2104161320"},"language":"en","primary_location":{"id":"doi:10.1109/ccece.2011.6030652","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ccece.2011.6030652","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 24th Canadian Conference on Electrical and Computer Engineering(CCECE)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5067369962","display_name":"E. Talebi Nejad","orcid":null},"institutions":[{"id":"https://openalex.org/I530967","display_name":"Toronto Metropolitan University","ror":"https://ror.org/05g13zd79","country_code":"CA","type":"education","lineage":["https://openalex.org/I530967"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"E. Talebi Nejad","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Ryerson University, Toronto, Ontario, Canada","Department of Electrical and Computer Engineering, Ryerson University, 350 Victoria Street, M5B 2K3, Toronto, Ontario, Canada#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Ryerson University, Toronto, Ontario, Canada","institution_ids":["https://openalex.org/I530967"]},{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Ryerson University, 350 Victoria Street, M5B 2K3, Toronto, Ontario, Canada#TAB#","institution_ids":["https://openalex.org/I530967"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103283614","display_name":"Farah Mohammadi","orcid":"https://orcid.org/0009-0008-9947-3209"},"institutions":[{"id":"https://openalex.org/I530967","display_name":"Toronto Metropolitan University","ror":"https://ror.org/05g13zd79","country_code":"CA","type":"education","lineage":["https://openalex.org/I530967"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"F. A. Mohammadi","raw_affiliation_strings":["Ryerson University, Toronto, ON, CA","Department of Electrical and Computer Engineering, Ryerson University, 350 Victoria Street, M5B 2K3, Toronto, Ontario, Canada#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Ryerson University, Toronto, ON, CA","institution_ids":["https://openalex.org/I530967"]},{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Ryerson University, 350 Victoria Street, M5B 2K3, Toronto, Ontario, Canada#TAB#","institution_ids":["https://openalex.org/I530967"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5084298756","display_name":"E. Astvatsatryan","orcid":null},"institutions":[{"id":"https://openalex.org/I530967","display_name":"Toronto Metropolitan University","ror":"https://ror.org/05g13zd79","country_code":"CA","type":"education","lineage":["https://openalex.org/I530967"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"E. Astvatsatryan","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Ryerson University, Toronto, Ontario, Canada","Department of Electrical and Computer Engineering, Ryerson University, 350 Victoria Street, M5B 2K3, Toronto, Ontario, Canada#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Ryerson University, Toronto, Ontario, Canada","institution_ids":["https://openalex.org/I530967"]},{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Ryerson University, 350 Victoria Street, M5B 2K3, Toronto, Ontario, Canada#TAB#","institution_ids":["https://openalex.org/I530967"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I530967"],"apc_list":null,"apc_paid":null,"fwci":0.4475,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.59345403,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"33","issue":null,"first_page":"001198","last_page":"001201"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.8280889987945557},{"id":"https://openalex.org/keywords/pid-controller","display_name":"PID controller","score":0.6922993659973145},{"id":"https://openalex.org/keywords/controller","display_name":"Controller (irrigation)","score":0.6095811128616333},{"id":"https://openalex.org/keywords/characterization","display_name":"Characterization (materials science)","score":0.5618379712104797},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.5341213345527649},{"id":"https://openalex.org/keywords/thermal","display_name":"Thermal","score":0.47214367985725403},{"id":"https://openalex.org/keywords/temperature-measurement","display_name":"Temperature measurement","score":0.45698052644729614},{"id":"https://openalex.org/keywords/tracer","display_name":"TRACER","score":0.4490179419517517},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4445461630821228},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.42115306854248047},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3524168133735657},{"id":"https://openalex.org/keywords/temperature-control","display_name":"Temperature control","score":0.316919207572937},{"id":"https://openalex.org/keywords/control-engineering","display_name":"Control engineering","score":0.303393691778183},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.2793928384780884},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.26425451040267944},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.17528924345970154}],"concepts":[{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.8280889987945557},{"id":"https://openalex.org/C47116090","wikidata":"https://www.wikidata.org/wiki/Q716829","display_name":"PID controller","level":3,"score":0.6922993659973145},{"id":"https://openalex.org/C203479927","wikidata":"https://www.wikidata.org/wiki/Q5165939","display_name":"Controller (irrigation)","level":2,"score":0.6095811128616333},{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.5618379712104797},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.5341213345527649},{"id":"https://openalex.org/C204530211","wikidata":"https://www.wikidata.org/wiki/Q752823","display_name":"Thermal","level":2,"score":0.47214367985725403},{"id":"https://openalex.org/C72293138","wikidata":"https://www.wikidata.org/wiki/Q909741","display_name":"Temperature measurement","level":2,"score":0.45698052644729614},{"id":"https://openalex.org/C2778863792","wikidata":"https://www.wikidata.org/wiki/Q16909918","display_name":"TRACER","level":2,"score":0.4490179419517517},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4445461630821228},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.42115306854248047},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3524168133735657},{"id":"https://openalex.org/C536315585","wikidata":"https://www.wikidata.org/wiki/Q7698332","display_name":"Temperature control","level":2,"score":0.316919207572937},{"id":"https://openalex.org/C133731056","wikidata":"https://www.wikidata.org/wiki/Q4917288","display_name":"Control engineering","level":1,"score":0.303393691778183},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.2793928384780884},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.26425451040267944},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.17528924345970154},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C153294291","wikidata":"https://www.wikidata.org/wiki/Q25261","display_name":"Meteorology","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C185544564","wikidata":"https://www.wikidata.org/wiki/Q81197","display_name":"Nuclear physics","level":1,"score":0.0},{"id":"https://openalex.org/C6557445","wikidata":"https://www.wikidata.org/wiki/Q173113","display_name":"Agronomy","level":1,"score":0.0},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.0},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ccece.2011.6030652","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ccece.2011.6030652","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 24th Canadian Conference on Electrical and Computer Engineering(CCECE)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.5,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1506911099","https://openalex.org/W1979502654","https://openalex.org/W2086937131","https://openalex.org/W2100130332","https://openalex.org/W2120983247","https://openalex.org/W2136181112","https://openalex.org/W2988193941","https://openalex.org/W3148176911","https://openalex.org/W3203748497","https://openalex.org/W4242339496","https://openalex.org/W4253232140"],"related_works":["https://openalex.org/W4223416174","https://openalex.org/W2361172335","https://openalex.org/W2776108294","https://openalex.org/W2110030150","https://openalex.org/W2122192178","https://openalex.org/W2384549355","https://openalex.org/W3188498978","https://openalex.org/W2051437113","https://openalex.org/W4220711674","https://openalex.org/W3013435404"],"abstract_inverted_index":{"This":[0],"paper":[1],"describes":[2],"the":[3,23,28,52,59,77],"development":[4],"of":[5],"a":[6,42,64],"power":[7,72],"device":[8,78],"characterization":[9],"curve":[10],"tracer":[11],"based":[12],"on":[13],"transient":[14,60],"thermal":[15],"measurement.":[16],"Experimental":[17],"test":[18],"set":[19,43,54],"ups":[20],"along":[21],"with":[22],"required":[24],"conditions":[25],"to":[26],"mitigate":[27],"measurement":[29,34,61],"errors":[30],"are":[31,36],"discussed.":[32],"The":[33,46],"algorithms":[35],"implemented":[37],"in":[38],"LabVIEW":[39],"environment":[40],"as":[41,76],"up":[44],"controller.":[45,70],"junction":[47],"temperature":[48,69],"is":[49,74],"maintained":[50],"at":[51],"specified":[53],"point":[55],"for":[56],"carrying":[57],"out":[58],"procedure":[62],"using":[63],"developed":[65],"proportional":[66],"integral-differential":[67],"(PID)":[68],"A":[71],"MOSFET":[73],"used":[75],"under":[79],"test.":[80]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2013,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}