{"id":"https://openalex.org/W4389332470","doi":"https://doi.org/10.1109/cce60043.2023.10332837","title":"Optical and Electrical Properties of Annealed AZO/Ag/AZO Multilayer Deposited Using RF Sputtering Technique","display_name":"Optical and Electrical Properties of Annealed AZO/Ag/AZO Multilayer Deposited Using RF Sputtering Technique","publication_year":2023,"publication_date":"2023-10-25","ids":{"openalex":"https://openalex.org/W4389332470","doi":"https://doi.org/10.1109/cce60043.2023.10332837"},"language":"en","primary_location":{"id":"doi:10.1109/cce60043.2023.10332837","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/cce60043.2023.10332837","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 20th International Conference on Electrical Engineering, Computing Science and Automatic Control (CCE)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5029535671","display_name":"H. Ferhati","orcid":null},"institutions":[{"id":"https://openalex.org/I3132180716","display_name":"Larbi Ben M'hidi University of Oum El Bouaghi","ror":"https://ror.org/0034tbg85","country_code":"DZ","type":"education","lineage":["https://openalex.org/I3132180716"]}],"countries":["DZ"],"is_corresponding":true,"raw_author_name":"H. Ferhati","raw_affiliation_strings":["University of Larbi Ben M&#x2019;Hidi, Oum El Bouaghi,ISTA,Oum El Bouaghi,Algeria"],"affiliations":[{"raw_affiliation_string":"University of Larbi Ben M&#x2019;Hidi, Oum El Bouaghi,ISTA,Oum El Bouaghi,Algeria","institution_ids":["https://openalex.org/I3132180716"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032030267","display_name":"K. Kacha","orcid":null},"institutions":[{"id":"https://openalex.org/I162489102","display_name":"University of Batna 1","ror":"https://ror.org/04hrbe508","country_code":"DZ","type":"education","lineage":["https://openalex.org/I162489102"]}],"countries":["DZ"],"is_corresponding":false,"raw_author_name":"K. Kacha","raw_affiliation_strings":["University of Batna 2,Advanced Electronics Laboratory (LEA),Batna,Algeria","Advanced Electronics Laboratory (LEA), University of Batna 2, Batna, Algeria"],"affiliations":[{"raw_affiliation_string":"University of Batna 2,Advanced Electronics Laboratory (LEA),Batna,Algeria","institution_ids":["https://openalex.org/I162489102"]},{"raw_affiliation_string":"Advanced Electronics Laboratory (LEA), University of Batna 2, Batna, Algeria","institution_ids":["https://openalex.org/I162489102"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085999771","display_name":"A. Bendjerad","orcid":null},"institutions":[{"id":"https://openalex.org/I162489102","display_name":"University of Batna 1","ror":"https://ror.org/04hrbe508","country_code":"DZ","type":"education","lineage":["https://openalex.org/I162489102"]}],"countries":["DZ"],"is_corresponding":false,"raw_author_name":"A. Bendjerad","raw_affiliation_strings":["University of Batna 2,Advanced Electronics Laboratory (LEA),Batna,Algeria","Advanced Electronics Laboratory (LEA), University of Batna 2, Batna, Algeria"],"affiliations":[{"raw_affiliation_string":"University of Batna 2,Advanced Electronics Laboratory (LEA),Batna,Algeria","institution_ids":["https://openalex.org/I162489102"]},{"raw_affiliation_string":"Advanced Electronics Laboratory (LEA), University of Batna 2, Batna, Algeria","institution_ids":["https://openalex.org/I162489102"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044226348","display_name":"F. Djeffal","orcid":"https://orcid.org/0000-0003-0742-5864"},"institutions":[{"id":"https://openalex.org/I162489102","display_name":"University of Batna 1","ror":"https://ror.org/04hrbe508","country_code":"DZ","type":"education","lineage":["https://openalex.org/I162489102"]}],"countries":["DZ"],"is_corresponding":false,"raw_author_name":"F. Djeffal","raw_affiliation_strings":["University of Batna 2,Advanced Electronics Laboratory (LEA),Batna,Algeria","Advanced Electronics Laboratory (LEA), University of Batna 2, Batna, Algeria"],"affiliations":[{"raw_affiliation_string":"University of Batna 2,Advanced Electronics Laboratory (LEA),Batna,Algeria","institution_ids":["https://openalex.org/I162489102"]},{"raw_affiliation_string":"Advanced Electronics Laboratory (LEA), University of Batna 2, Batna, Algeria","institution_ids":["https://openalex.org/I162489102"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5043513290","display_name":"A. Benhaya","orcid":null},"institutions":[{"id":"https://openalex.org/I162489102","display_name":"University of Batna 1","ror":"https://ror.org/04hrbe508","country_code":"DZ","type":"education","lineage":["https://openalex.org/I162489102"]}],"countries":["DZ"],"is_corresponding":false,"raw_author_name":"A. Benhaya","raw_affiliation_strings":["University of Batna 2,Advanced Electronics Laboratory (LEA),Batna,Algeria","Advanced Electronics Laboratory (LEA), University of Batna 2, Batna, Algeria"],"affiliations":[{"raw_affiliation_string":"University of Batna 2,Advanced Electronics Laboratory (LEA),Batna,Algeria","institution_ids":["https://openalex.org/I162489102"]},{"raw_affiliation_string":"Advanced Electronics Laboratory (LEA), University of Batna 2, Batna, Algeria","institution_ids":["https://openalex.org/I162489102"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5029535671"],"corresponding_institution_ids":["https://openalex.org/I3132180716"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.11571015,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10090","display_name":"ZnO doping and properties","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10090","display_name":"ZnO doping and properties","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10590","display_name":"Chalcogenide Semiconductor Thin Films","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11907","display_name":"Copper-based nanomaterials and applications","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.7910525798797607},{"id":"https://openalex.org/keywords/annealing","display_name":"Annealing (glass)","score":0.7603682279586792},{"id":"https://openalex.org/keywords/crystallinity","display_name":"Crystallinity","score":0.7566713094711304},{"id":"https://openalex.org/keywords/sheet-resistance","display_name":"Sheet resistance","score":0.6527800559997559},{"id":"https://openalex.org/keywords/sputter-deposition","display_name":"Sputter deposition","score":0.6314970850944519},{"id":"https://openalex.org/keywords/thin-film","display_name":"Thin film","score":0.623500645160675},{"id":"https://openalex.org/keywords/transmittance","display_name":"Transmittance","score":0.5857712030410767},{"id":"https://openalex.org/keywords/sputtering","display_name":"Sputtering","score":0.5201764106750488},{"id":"https://openalex.org/keywords/band-gap","display_name":"Band gap","score":0.5180228352546692},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.4708007574081421},{"id":"https://openalex.org/keywords/solar-cell","display_name":"Solar cell","score":0.4195248484611511},{"id":"https://openalex.org/keywords/analytical-chemistry","display_name":"Analytical Chemistry (journal)","score":0.4185423254966736},{"id":"https://openalex.org/keywords/layer","display_name":"Layer (electronics)","score":0.31327369809150696},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.220533549785614},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.17545941472053528},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.10252159833908081},{"id":"https://openalex.org/keywords/organic-chemistry","display_name":"Organic chemistry","score":0.07027441263198853}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7910525798797607},{"id":"https://openalex.org/C2777855556","wikidata":"https://www.wikidata.org/wiki/Q4339544","display_name":"Annealing (glass)","level":2,"score":0.7603682279586792},{"id":"https://openalex.org/C46275449","wikidata":"https://www.wikidata.org/wiki/Q2458815","display_name":"Crystallinity","level":2,"score":0.7566713094711304},{"id":"https://openalex.org/C66825105","wikidata":"https://www.wikidata.org/wiki/Q354718","display_name":"Sheet resistance","level":3,"score":0.6527800559997559},{"id":"https://openalex.org/C61427134","wikidata":"https://www.wikidata.org/wiki/Q847609","display_name":"Sputter deposition","level":4,"score":0.6314970850944519},{"id":"https://openalex.org/C19067145","wikidata":"https://www.wikidata.org/wiki/Q1137203","display_name":"Thin film","level":2,"score":0.623500645160675},{"id":"https://openalex.org/C150493377","wikidata":"https://www.wikidata.org/wiki/Q1427863","display_name":"Transmittance","level":2,"score":0.5857712030410767},{"id":"https://openalex.org/C22423302","wikidata":"https://www.wikidata.org/wiki/Q898444","display_name":"Sputtering","level":3,"score":0.5201764106750488},{"id":"https://openalex.org/C181966813","wikidata":"https://www.wikidata.org/wiki/Q806352","display_name":"Band gap","level":2,"score":0.5180228352546692},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4708007574081421},{"id":"https://openalex.org/C2780824857","wikidata":"https://www.wikidata.org/wiki/Q58803","display_name":"Solar cell","level":2,"score":0.4195248484611511},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.4185423254966736},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.31327369809150696},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.220533549785614},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.17545941472053528},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.10252159833908081},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.07027441263198853}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/cce60043.2023.10332837","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/cce60043.2023.10332837","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 20th International Conference on Electrical Engineering, Computing Science and Automatic Control (CCE)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.6000000238418579,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":30,"referenced_works":["https://openalex.org/W1965715563","https://openalex.org/W1982952545","https://openalex.org/W1997904588","https://openalex.org/W2034821734","https://openalex.org/W2059928796","https://openalex.org/W2073156676","https://openalex.org/W2147426725","https://openalex.org/W2163339265","https://openalex.org/W2346351063","https://openalex.org/W2469263411","https://openalex.org/W2523402184","https://openalex.org/W2555787440","https://openalex.org/W2565257472","https://openalex.org/W2808004583","https://openalex.org/W2891296417","https://openalex.org/W2907945045","https://openalex.org/W2925297077","https://openalex.org/W2935497437","https://openalex.org/W2948073623","https://openalex.org/W3000547188","https://openalex.org/W3081042513","https://openalex.org/W3111311891","https://openalex.org/W3166951052","https://openalex.org/W3173332691","https://openalex.org/W4205183328","https://openalex.org/W4211120906","https://openalex.org/W4221078057","https://openalex.org/W4281661587","https://openalex.org/W4288420798","https://openalex.org/W4309382152"],"related_works":["https://openalex.org/W3083677898","https://openalex.org/W1732267426","https://openalex.org/W2350440453","https://openalex.org/W2047063580","https://openalex.org/W4205741711","https://openalex.org/W2362680953","https://openalex.org/W2944200126","https://openalex.org/W3153301309","https://openalex.org/W2007957229","https://openalex.org/W1985377868"],"abstract_inverted_index":{"This":[0,115],"work":[1],"aims":[2],"at":[3],"analyzing":[4],"the":[5,16,63,67,80,85,100,110,119,122,129,140,144,164,171],"effect":[6],"of":[7,22,66,76,84,93,102,121,143,151,160,173],"both":[8],"Ag":[9,105],"middle":[10,106],"layer":[11,107],"and":[12,19,44,54,104,156],"annealing":[13,103,136],"effects":[14],"on":[15,34],"structural,":[17],"optical":[18,43],"electrical":[20,45,141],"properties":[21,142],"Al-doped":[23],"ZnO":[24],"(AZO)":[25],"thin-films.":[26],"In":[27,72],"this":[28],"framework,":[29],"AZO/Ag/AZO":[30,69,145],"tri-layers":[31],"were":[32,47],"deposited":[33],"glass":[35],"substrates":[36],"using":[37,50],"RF":[38],"magnetron":[39],"sputtering":[40],"technique.":[41],"Structural,":[42],"characterizations":[46,133],"carried":[48],"out":[49],"XRD,":[51],"UV-Vis":[52],"Spectrophotometry":[53],"Hall":[55],"measurements,":[56],"respectively.":[57],"The":[58],"obtained":[59],"XRD":[60],"patterns":[61],"demonstrated":[62],"enhanced":[64,81],"crystallinity":[65],"annealed":[68,86],"multilayer":[70],"structure.":[71],"addition,":[73],"transmittance":[74],"spectra":[75],"prepared":[77],"samples":[78],"revealed":[79],"visible":[82],"transparency":[83,92],"structure,":[87],"showing":[88],"a":[89,148,157],"high":[90,149],"average":[91],"85%.":[94],"It":[95],"is":[96,116],"found":[97],"also":[98],"that":[99,135],"use":[101],"can":[108,127,138,167,178],"enlarge":[109],"band":[111],"gap":[112],"(3.53":[113],"eV).":[114],"attributed":[117],"to":[118],"increase":[120],"free":[123],"charge":[124],"carrier,":[125],"which":[126,177],"shift":[128],"Fermi":[130],"Level.":[131],"Electrical":[132],"demonstrate":[134],"process":[137],"modulate":[139],"thin-film,":[146],"offering":[147],"mobility":[150],"17":[152],"cm<sup":[153],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[154],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</sup>/Vs":[155],"favorable":[158],"sheet-resistance":[159],"46":[161],"\u03a9/eq.":[162],"Therefore,":[163],"present":[165],"study":[166],"provide":[168],"guidelines":[169],"for":[170,181],"fabrication":[172],"alternative":[174],"buffer":[175],"layer,":[176],"be":[179],"appropriate":[180],"various":[182],"thin-film":[183],"solar":[184],"cell":[185],"technologies.":[186]},"counts_by_year":[],"updated_date":"2025-12-25T23:11:45.687758","created_date":"2025-10-10T00:00:00"}