{"id":"https://openalex.org/W4389332287","doi":"https://doi.org/10.1109/cce60043.2023.10332836","title":"Cuprous Oxide Thin Films Deposited by Chemical Bath Deposition: Effect of Temperature and TEA","display_name":"Cuprous Oxide Thin Films Deposited by Chemical Bath Deposition: Effect of Temperature and TEA","publication_year":2023,"publication_date":"2023-10-25","ids":{"openalex":"https://openalex.org/W4389332287","doi":"https://doi.org/10.1109/cce60043.2023.10332836"},"language":"en","primary_location":{"id":"doi:10.1109/cce60043.2023.10332836","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/cce60043.2023.10332836","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 20th International Conference on Electrical Engineering, Computing Science and Automatic Control (CCE)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5056076956","display_name":"Od\u00edn Reyes\u2212Vallejo","orcid":"https://orcid.org/0000-0001-9878-9211"},"institutions":[{"id":"https://openalex.org/I68368234","display_name":"Center for Research and Advanced Studies of the National Polytechnic Institute","ror":"https://ror.org/009eqmr18","country_code":"MX","type":"facility","lineage":["https://openalex.org/I59361560","https://openalex.org/I68368234"]}],"countries":["MX"],"is_corresponding":true,"raw_author_name":"Od\u00edn Reyes-Vallejo","raw_affiliation_strings":["CINVESTAV- IPN, Ciudad de,Sección de Electrónica de Estado Sólido- Ingeniería eléctrica (SEES),México,México"],"affiliations":[{"raw_affiliation_string":"CINVESTAV- IPN, Ciudad de,Sección de Electrónica de Estado Sólido- Ingeniería eléctrica (SEES),México,México","institution_ids":["https://openalex.org/I68368234"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065724383","display_name":"Roc\u00edo Magdalena S\u00e1nchez-Albores","orcid":"https://orcid.org/0000-0002-5197-0125"},"institutions":[{"id":"https://openalex.org/I68368234","display_name":"Center for Research and Advanced Studies of the National Polytechnic Institute","ror":"https://ror.org/009eqmr18","country_code":"MX","type":"facility","lineage":["https://openalex.org/I59361560","https://openalex.org/I68368234"]}],"countries":["MX"],"is_corresponding":false,"raw_author_name":"Roc\u00edo M. S\u00e1nchez-Albores","raw_affiliation_strings":["CINVESTAV- IPN, Ciudad de,Sección de Electrónica de Estado Sólido- Ingeniería eléctrica (SEES),México,México"],"affiliations":[{"raw_affiliation_string":"CINVESTAV- IPN, Ciudad de,Sección de Electrónica de Estado Sólido- Ingeniería eléctrica (SEES),México,México","institution_ids":["https://openalex.org/I68368234"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108988271","display_name":"A. Ashok","orcid":"https://orcid.org/0009-0008-5447-6991"},"institutions":[{"id":"https://openalex.org/I68368234","display_name":"Center for Research and Advanced Studies of the National Polytechnic Institute","ror":"https://ror.org/009eqmr18","country_code":"MX","type":"facility","lineage":["https://openalex.org/I59361560","https://openalex.org/I68368234"]}],"countries":["MX"],"is_corresponding":false,"raw_author_name":"A. Ashok","raw_affiliation_strings":["CINVESTAV- IPN, Ciudad de,Sección de Electrónica de Estado Sólido- Ingeniería eléctrica (SEES),México,México"],"affiliations":[{"raw_affiliation_string":"CINVESTAV- IPN, Ciudad de,Sección de Electrónica de Estado Sólido- Ingeniería eléctrica (SEES),México,México","institution_ids":["https://openalex.org/I68368234"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070559511","display_name":"A. Fern\u00e1ndez-Madrigal","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Arturo Fern\u00e1ndez-Madrigal","raw_affiliation_strings":["Institute de Energías Renovables-UNAM (IER-UNAM),Morelos,México"],"affiliations":[{"raw_affiliation_string":"Institute de Energías Renovables-UNAM (IER-UNAM),Morelos,México","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101473929","display_name":"Juan J. Diaz","orcid":"https://orcid.org/0000-0002-6841-6542"},"institutions":[{"id":"https://openalex.org/I68368234","display_name":"Center for Research and Advanced Studies of the National Polytechnic Institute","ror":"https://ror.org/009eqmr18","country_code":"MX","type":"facility","lineage":["https://openalex.org/I59361560","https://openalex.org/I68368234"]}],"countries":["MX"],"is_corresponding":false,"raw_author_name":"J.J. D\u00edaz","raw_affiliation_strings":["CINVESTAV-IPN,Programa de Nanociencia y nanotecnología,Ciudad de México,México"],"affiliations":[{"raw_affiliation_string":"CINVESTAV-IPN,Programa de Nanociencia y nanotecnología,Ciudad de México,México","institution_ids":["https://openalex.org/I68368234"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064722051","display_name":"Wilber Montejo-L\u00f3pez","orcid":"https://orcid.org/0000-0001-6031-3410"},"institutions":[{"id":"https://openalex.org/I4210136187","display_name":"Autonomous University of Chiapas","ror":"https://ror.org/04eexme77","country_code":"MX","type":"education","lineage":["https://openalex.org/I4210136187"]}],"countries":["MX"],"is_corresponding":false,"raw_author_name":"Wilber Montejo-L\u00f3pez","raw_affiliation_strings":["Universidad Autónoma de Chiapas (UNACH),Escuela de Ciencias Químicas,Chiapas,México"],"affiliations":[{"raw_affiliation_string":"Universidad Autónoma de Chiapas (UNACH),Escuela de Ciencias Químicas,Chiapas,México","institution_ids":["https://openalex.org/I4210136187"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064400035","display_name":"Salvador Escobar","orcid":"https://orcid.org/0009-0000-8431-766X"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Salvador Escobar","raw_affiliation_strings":["Instituto de Física-UNAM (IF-UNAM),Ciudad de México,México"],"affiliations":[{"raw_affiliation_string":"Instituto de Física-UNAM (IF-UNAM),Ciudad de México,México","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5057438287","display_name":"P.J. Sebasti\u00e1n","orcid":"https://orcid.org/0000-0003-1810-6674"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"P. J. Sebastian","raw_affiliation_strings":["Institute de Energías Renovables-UNAM (IER-UNAM),Morelos,México"],"affiliations":[{"raw_affiliation_string":"Institute de Energías Renovables-UNAM (IER-UNAM),Morelos,México","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5056076956"],"corresponding_institution_ids":["https://openalex.org/I68368234"],"apc_list":null,"apc_paid":null,"fwci":0.1961,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.4275834,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":96},"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11907","display_name":"Copper-based nanomaterials and applications","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11907","display_name":"Copper-based nanomaterials and applications","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10090","display_name":"ZnO doping and properties","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12588","display_name":"Electronic and Structural Properties of Oxides","score":0.9882000088691711,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/triethanolamine","display_name":"Triethanolamine","score":0.7970408201217651},{"id":"https://openalex.org/keywords/band-gap","display_name":"Band gap","score":0.6617538332939148},{"id":"https://openalex.org/keywords/thin-film","display_name":"Thin film","score":0.6072477102279663},{"id":"https://openalex.org/keywords/oxide","display_name":"Oxide","score":0.6051415801048279},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.6038891673088074},{"id":"https://openalex.org/keywords/deposition","display_name":"Deposition (geology)","score":0.566712498664856},{"id":"https://openalex.org/keywords/chemical-engineering","display_name":"Chemical engineering","score":0.5429151058197021},{"id":"https://openalex.org/keywords/morphology","display_name":"Morphology (biology)","score":0.5289670825004578},{"id":"https://openalex.org/keywords/chemical-bath-deposition","display_name":"Chemical bath deposition","score":0.5044506788253784},{"id":"https://openalex.org/keywords/particle-size","display_name":"Particle size","score":0.49704888463020325},{"id":"https://openalex.org/keywords/copper-oxide","display_name":"Copper oxide","score":0.4505194425582886},{"id":"https://openalex.org/keywords/electrical-resistivity-and-conductivity","display_name":"Electrical resistivity and conductivity","score":0.4159945547580719},{"id":"https://openalex.org/keywords/chemical-vapor-deposition","display_name":"Chemical vapor deposition","score":0.41257014870643616},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.33265265822410583},{"id":"https://openalex.org/keywords/analytical-chemistry","display_name":"Analytical Chemistry (journal)","score":0.3075615167617798},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.23575761914253235},{"id":"https://openalex.org/keywords/metallurgy","display_name":"Metallurgy","score":0.22586986422538757},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.16311007738113403},{"id":"https://openalex.org/keywords/organic-chemistry","display_name":"Organic chemistry","score":0.1385602056980133},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.06249213218688965}],"concepts":[{"id":"https://openalex.org/C2775897365","wikidata":"https://www.wikidata.org/wiki/Q424314","display_name":"Triethanolamine","level":3,"score":0.7970408201217651},{"id":"https://openalex.org/C181966813","wikidata":"https://www.wikidata.org/wiki/Q806352","display_name":"Band gap","level":2,"score":0.6617538332939148},{"id":"https://openalex.org/C19067145","wikidata":"https://www.wikidata.org/wiki/Q1137203","display_name":"Thin film","level":2,"score":0.6072477102279663},{"id":"https://openalex.org/C2779851234","wikidata":"https://www.wikidata.org/wiki/Q50690","display_name":"Oxide","level":2,"score":0.6051415801048279},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6038891673088074},{"id":"https://openalex.org/C64297162","wikidata":"https://www.wikidata.org/wiki/Q1987070","display_name":"Deposition (geology)","level":3,"score":0.566712498664856},{"id":"https://openalex.org/C42360764","wikidata":"https://www.wikidata.org/wiki/Q83588","display_name":"Chemical engineering","level":1,"score":0.5429151058197021},{"id":"https://openalex.org/C499950583","wikidata":"https://www.wikidata.org/wiki/Q183252","display_name":"Morphology (biology)","level":2,"score":0.5289670825004578},{"id":"https://openalex.org/C2780228366","wikidata":"https://www.wikidata.org/wiki/Q1069397","display_name":"Chemical bath deposition","level":3,"score":0.5044506788253784},{"id":"https://openalex.org/C187530423","wikidata":"https://www.wikidata.org/wiki/Q7140503","display_name":"Particle size","level":2,"score":0.49704888463020325},{"id":"https://openalex.org/C2781183027","wikidata":"https://www.wikidata.org/wiki/Q106920642","display_name":"Copper oxide","level":3,"score":0.4505194425582886},{"id":"https://openalex.org/C69990965","wikidata":"https://www.wikidata.org/wiki/Q65402698","display_name":"Electrical resistivity and conductivity","level":2,"score":0.4159945547580719},{"id":"https://openalex.org/C57410435","wikidata":"https://www.wikidata.org/wiki/Q505668","display_name":"Chemical vapor deposition","level":2,"score":0.41257014870643616},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.33265265822410583},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.3075615167617798},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.23575761914253235},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.22586986422538757},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.16311007738113403},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.1385602056980133},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.06249213218688965},{"id":"https://openalex.org/C2816523","wikidata":"https://www.wikidata.org/wiki/Q180184","display_name":"Sediment","level":2,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C54355233","wikidata":"https://www.wikidata.org/wiki/Q7162","display_name":"Genetics","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/cce60043.2023.10332836","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/cce60043.2023.10332836","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 20th International Conference on Electrical Engineering, Computing Science and Automatic Control (CCE)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":31,"referenced_works":["https://openalex.org/W1967655036","https://openalex.org/W1968424592","https://openalex.org/W1971122149","https://openalex.org/W1977421759","https://openalex.org/W1982916197","https://openalex.org/W1997474940","https://openalex.org/W1998846287","https://openalex.org/W2020504721","https://openalex.org/W2027207617","https://openalex.org/W2215991028","https://openalex.org/W2304627192","https://openalex.org/W2318197806","https://openalex.org/W2323443137","https://openalex.org/W2331371685","https://openalex.org/W2609572487","https://openalex.org/W2626033133","https://openalex.org/W2801907609","https://openalex.org/W2988607039","https://openalex.org/W3089032579","https://openalex.org/W3207973730","https://openalex.org/W4226101232","https://openalex.org/W4281624705","https://openalex.org/W4307217603","https://openalex.org/W4308524310","https://openalex.org/W4311682253","https://openalex.org/W4311839621","https://openalex.org/W4319034473","https://openalex.org/W4360981403","https://openalex.org/W4362468815","https://openalex.org/W4366496905","https://openalex.org/W4386841767"],"related_works":["https://openalex.org/W2592285126","https://openalex.org/W2897934026","https://openalex.org/W2082981209","https://openalex.org/W2387026096","https://openalex.org/W2376087126","https://openalex.org/W1972679891","https://openalex.org/W1978656580","https://openalex.org/W2353557426","https://openalex.org/W1975965400","https://openalex.org/W4313358829"],"abstract_inverted_index":{"This":[0,63,148],"study":[1],"presents":[2],"the":[3,6,21,27,42,47,65,73,78,90,96,102,150],"synthesis":[4],"of":[5,18,23,41,44,89,152],"Cu2O":[9],"thin":[10],"films":[11,52,119],"by":[12],"chemical":[13],"bath":[14],"deposition.":[15],"The":[16,81],"effect":[17],"temperature":[19,49],"and":[20,31,59,70,75,100,107,124],"amount":[22,43],"triethanolamine":[24],"(TEA)":[25],"on":[26],"film's":[28],"structural,":[29],"optical,":[30],"electrical":[32],"properties":[33],"is":[34,37,98,114,129,140],"studied.":[35],"It":[36,128],"found":[38],"that":[39,95,131],"regardless":[40],"TEA,":[45],"as":[46,163],"deposit":[48],"increases,":[50],"thicker":[51,118],"are":[53],"formed":[54],"with":[55,110,120],"a":[56,86,108],"better-defined":[57],"morphology":[58],"larger":[60,125],"particle":[61,126],"size.":[62,127],"causes":[64,85],"structural":[66],"disorder":[67],"to":[68],"decrease":[69],"consequently,":[71,101],"reduces":[72],"conductivity,":[74],"then":[76],"increases":[77],"Bandgap":[79],"value.":[80],"increase":[82],"in":[83,117,145,159],"TEA":[84],"greater":[87,133],"complexation":[88],"copper":[91],"ion,":[92],"which":[93,139],"implies":[94],"reaction":[97],"slower,":[99],"oxide":[103],"precipitates":[104],"more":[105,111,121],"slowly,":[106],"film":[109],"controlled":[112],"growth":[113],"formed,":[115],"resulting":[116],"homogeneous":[122],"morphology,":[123],"noteworthy":[130],"thicknesses":[132],"than":[134],"one":[135],"micron":[136],"were":[137],"achieved,":[138],"remarkable":[141],"for":[142],"its":[143],"applications":[144],"diverse":[146],"fields.":[147],"opens":[149],"possibility":[151],"using":[153],"this":[154,157],"material":[155],"through":[156],"technique":[158],"solar":[160],"technology":[161],"such":[162],"photovoltaics.":[164]},"counts_by_year":[{"year":2024,"cited_by_count":2}],"updated_date":"2025-12-25T23:11:45.687758","created_date":"2025-10-10T00:00:00"}