{"id":"https://openalex.org/W2102004957","doi":"https://doi.org/10.1109/cca.2008.4629689","title":"Identification of low dimensional models for slow geometric parameter variation in an Industrial Glass Manufacturing Process","display_name":"Identification of low dimensional models for slow geometric parameter variation in an Industrial Glass Manufacturing Process","publication_year":2008,"publication_date":"2008-01-01","ids":{"openalex":"https://openalex.org/W2102004957","doi":"https://doi.org/10.1109/cca.2008.4629689","mag":"2102004957"},"language":"en","primary_location":{"id":"doi:10.1109/cca.2008.4629689","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cca.2008.4629689","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 IEEE International Conference on Control Applications","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://research.tue.nl/en/publications/2fc8c021-9399-4501-8ba2-ed50ce1b3ed4","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5064630613","display_name":"Satyajit Wattamwar","orcid":null},"institutions":[{"id":"https://openalex.org/I83019370","display_name":"Eindhoven University of Technology","ror":"https://ror.org/02c2kyt77","country_code":"NL","type":"education","lineage":["https://openalex.org/I83019370"]}],"countries":["NL"],"is_corresponding":true,"raw_author_name":"Satyajit Wattamwar","raw_affiliation_strings":["Department of Electrical Engineering, Technical University Eindhoven, Eindhoven, Netherlands","Dept. Of Electr. Eng., Tech. Univ. of Eindhoven, Eindhoven"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Technical University Eindhoven, Eindhoven, Netherlands","institution_ids":["https://openalex.org/I83019370"]},{"raw_affiliation_string":"Dept. Of Electr. Eng., Tech. Univ. of Eindhoven, Eindhoven","institution_ids":["https://openalex.org/I83019370"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006584942","display_name":"S. Weiland","orcid":"https://orcid.org/0000-0002-6131-4658"},"institutions":[{"id":"https://openalex.org/I83019370","display_name":"Eindhoven University of Technology","ror":"https://ror.org/02c2kyt77","country_code":"NL","type":"education","lineage":["https://openalex.org/I83019370"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Siep Weiland","raw_affiliation_strings":["Department of Electrical Engineering, Technical University Eindhoven, Eindhoven, Netherlands","Dept. Of Electr. Eng., Tech. Univ. of Eindhoven, Eindhoven"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Technical University Eindhoven, Eindhoven, Netherlands","institution_ids":["https://openalex.org/I83019370"]},{"raw_affiliation_string":"Dept. Of Electr. Eng., Tech. Univ. of Eindhoven, Eindhoven","institution_ids":["https://openalex.org/I83019370"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5023095219","display_name":"Ton Backx","orcid":null},"institutions":[{"id":"https://openalex.org/I83019370","display_name":"Eindhoven University of Technology","ror":"https://ror.org/02c2kyt77","country_code":"NL","type":"education","lineage":["https://openalex.org/I83019370"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Ton Backx","raw_affiliation_strings":["Department of Electrical Engineering, Technical University Eindhoven, Eindhoven, Netherlands","Dept. Of Electr. Eng., Tech. Univ. of Eindhoven, Eindhoven"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Technical University Eindhoven, Eindhoven, Netherlands","institution_ids":["https://openalex.org/I83019370"]},{"raw_affiliation_string":"Dept. Of Electr. Eng., Tech. Univ. of Eindhoven, Eindhoven","institution_ids":["https://openalex.org/I83019370"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5064630613"],"corresponding_institution_ids":["https://openalex.org/I83019370"],"apc_list":null,"apc_paid":null,"fwci":2.4837,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.90434252,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"989","last_page":"994"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11236","display_name":"Control Systems and Identification","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11236","display_name":"Control Systems and Identification","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10534","display_name":"Structural Health Monitoring Techniques","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11206","display_name":"Model Reduction and Neural Networks","score":0.9980999827384949,"subfield":{"id":"https://openalex.org/subfields/3109","display_name":"Statistical and Nonlinear Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.7227646112442017},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.7208503484725952},{"id":"https://openalex.org/keywords/subspace-topology","display_name":"Subspace topology","score":0.6348298788070679},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5068274140357971},{"id":"https://openalex.org/keywords/identification","display_name":"Identification (biology)","score":0.4974210560321808},{"id":"https://openalex.org/keywords/process-modeling","display_name":"Process modeling","score":0.4462253451347351},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.437033087015152},{"id":"https://openalex.org/keywords/process-variation","display_name":"Process variation","score":0.4251844584941864},{"id":"https://openalex.org/keywords/modal","display_name":"Modal","score":0.41817450523376465},{"id":"https://openalex.org/keywords/work-in-process","display_name":"Work in process","score":0.36233770847320557},{"id":"https://openalex.org/keywords/mathematical-optimization","display_name":"Mathematical optimization","score":0.3614886999130249},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.28974759578704834},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.26258087158203125},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20088034868240356},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.1390577256679535}],"concepts":[{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.7227646112442017},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.7208503484725952},{"id":"https://openalex.org/C32834561","wikidata":"https://www.wikidata.org/wiki/Q660730","display_name":"Subspace topology","level":2,"score":0.6348298788070679},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5068274140357971},{"id":"https://openalex.org/C116834253","wikidata":"https://www.wikidata.org/wiki/Q2039217","display_name":"Identification (biology)","level":2,"score":0.4974210560321808},{"id":"https://openalex.org/C76956256","wikidata":"https://www.wikidata.org/wiki/Q27610560","display_name":"Process modeling","level":3,"score":0.4462253451347351},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.437033087015152},{"id":"https://openalex.org/C93389723","wikidata":"https://www.wikidata.org/wiki/Q7247313","display_name":"Process variation","level":3,"score":0.4251844584941864},{"id":"https://openalex.org/C71139939","wikidata":"https://www.wikidata.org/wiki/Q910194","display_name":"Modal","level":2,"score":0.41817450523376465},{"id":"https://openalex.org/C174998907","wikidata":"https://www.wikidata.org/wiki/Q357662","display_name":"Work in process","level":2,"score":0.36233770847320557},{"id":"https://openalex.org/C126255220","wikidata":"https://www.wikidata.org/wiki/Q141495","display_name":"Mathematical optimization","level":1,"score":0.3614886999130249},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.28974759578704834},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.26258087158203125},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20088034868240356},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.1390577256679535},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C59822182","wikidata":"https://www.wikidata.org/wiki/Q441","display_name":"Botany","level":1,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.0},{"id":"https://openalex.org/C188027245","wikidata":"https://www.wikidata.org/wiki/Q750446","display_name":"Polymer chemistry","level":1,"score":0.0}],"mesh":[],"locations_count":5,"locations":[{"id":"doi:10.1109/cca.2008.4629689","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cca.2008.4629689","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 IEEE International Conference on Control Applications","raw_type":"proceedings-article"},{"id":"pmh:oai:pure.tue.nl:openaire/2fc8c021-9399-4501-8ba2-ed50ce1b3ed4","is_oa":true,"landing_page_url":"https://research.tue.nl/en/publications/2fc8c021-9399-4501-8ba2-ed50ce1b3ed4","pdf_url":null,"source":{"id":"https://openalex.org/S4406922641","display_name":"TU/e Research Portal","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Wattamwar, S K, Weiland, S & Backx, A C P M 2008, Identification of Low Dimensional Models for slow Geometric Parameter Variation in an Industrial Glass Manufacturing Process. in Control Applications, 2008. CCA 2008. 17th IEEE International Conference on applications, 3-5-09-2008, San Antonio, Texas USA. Institute of Electrical and Electronics Engineers, Piscataway. https://doi.org/10.1109/CCA.2008.4629689","raw_type":"info:eu-repo/semantics/publishedVersion"},{"id":"pmh:664502","is_oa":false,"landing_page_url":"http://library.tue.nl/csp/dare/LinkToRepository.csp?recordnumber=664502","pdf_url":null,"source":{"id":"https://openalex.org/S4406923046","display_name":"TU/e Research Portal (Eindhoven University of Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":""},{"id":"pmh:oai:library.tue.nl:664502","is_oa":false,"landing_page_url":"http://repository.tue.nl/664502","pdf_url":null,"source":{"id":"https://openalex.org/S4406923046","display_name":"TU/e Research Portal (Eindhoven University of Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":""},{"id":"pmh:tue:oai:pure.tue.nl:publications/2fc8c021-9399-4501-8ba2-ed50ce1b3ed4","is_oa":true,"landing_page_url":"https://research.tue.nl/nl/publications/2fc8c021-9399-4501-8ba2-ed50ce1b3ed4","pdf_url":null,"source":{"id":"https://openalex.org/S4306401843","display_name":"Data Archiving and Networked Services (DANS)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1322597698","host_organization_name":"Royal Netherlands Academy of Arts and Sciences","host_organization_lineage":["https://openalex.org/I1322597698"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Control Applications, 2008. CCA 2008. 17th IEEE International Conference on applications, 3-5-09-2008, San Antonio, Texas USA","raw_type":"info:eu-repo/semantics/conferencepaper"}],"best_oa_location":{"id":"pmh:oai:pure.tue.nl:openaire/2fc8c021-9399-4501-8ba2-ed50ce1b3ed4","is_oa":true,"landing_page_url":"https://research.tue.nl/en/publications/2fc8c021-9399-4501-8ba2-ed50ce1b3ed4","pdf_url":null,"source":{"id":"https://openalex.org/S4406922641","display_name":"TU/e Research Portal","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Wattamwar, S K, Weiland, S & Backx, A C P M 2008, Identification of Low Dimensional Models for slow Geometric Parameter Variation in an Industrial Glass Manufacturing Process. in Control Applications, 2008. CCA 2008. 17th IEEE International Conference on applications, 3-5-09-2008, San Antonio, Texas USA. Institute of Electrical and Electronics Engineers, Piscataway. https://doi.org/10.1109/CCA.2008.4629689","raw_type":"info:eu-repo/semantics/publishedVersion"},"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.44999998807907104}],"awards":[{"id":"https://openalex.org/G7455076812","display_name":null,"funder_award_id":"MRTN-CT-2004-512441","funder_id":"https://openalex.org/F4320320300","funder_display_name":"European Commission"}],"funders":[{"id":"https://openalex.org/F4320320300","display_name":"European Commission","ror":"https://ror.org/00k4n6c32"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W84177944","https://openalex.org/W1581313816","https://openalex.org/W2027986759","https://openalex.org/W2031845133","https://openalex.org/W2065135854","https://openalex.org/W2098051588","https://openalex.org/W2121315106","https://openalex.org/W2124192278","https://openalex.org/W2130739159","https://openalex.org/W2147908137","https://openalex.org/W2744008313","https://openalex.org/W4285719527","https://openalex.org/W6603451824","https://openalex.org/W6634912191","https://openalex.org/W6658425575"],"related_works":["https://openalex.org/W2295079537","https://openalex.org/W2808121504","https://openalex.org/W953697561","https://openalex.org/W2772268001","https://openalex.org/W2027498238","https://openalex.org/W181719207","https://openalex.org/W2238636028","https://openalex.org/W2385915069","https://openalex.org/W2062822655","https://openalex.org/W2185733045"],"abstract_inverted_index":{"In":[0,29],"this":[1,73,107],"paper":[2],"we":[3,31,75],"apply":[4],"the":[5,38,63,84,111],"method":[6],"of":[7,18],"Proper":[8],"Orthogonal":[9],"Decomposition":[10],"(POD)":[11],"to":[12,43,61],"identify":[13,32],"a":[14,19,33,48,77,118],"lower":[15,99,121],"dimensional":[16,100,122],"model":[17,35,123],"benchmark":[20],"problem":[21],"representing":[22],"an":[23,125],"Industrial":[24],"Glass":[25],"Manufacturing":[26],"Process":[27],"(IGMP).":[28],"particular,":[30],"reduced":[34],"by":[36,47,97],"identifying":[37],"mapping":[39],"from":[40,55],"process":[41,64,70,85,112],"inputs":[42],"POD":[44,56],"modal":[45],"coefficients":[46],"subspace":[49],"identification":[50],"method.":[51],"Reduced":[52],"models":[53],"obtained":[54],"are":[57],"not":[58],"well":[59],"equipped":[60],"capture":[62],"behavior":[65],"under":[66],"time":[67],"varying":[68],"uncertain":[69],"parameters.":[71],"For":[72],"reason":[74],"propose":[76],"novel":[78],"hybrid":[79],"detection":[80,108],"scheme":[81],"which":[82],"approximates":[83],"(benchmark":[86],"CFD":[87],"model)":[88],"exhibiting":[89],"non-smooth":[90],"geometric":[91],"parameter":[92,113],"dependence":[93],"(corrosion":[94],"and":[95,116],"wear)":[96],"using":[98],"models.":[101],"Given":[102],"state":[103],"or":[104],"output":[105],"information":[106],"mechanism":[109],"detects":[110],"operation":[114],"regime":[115],"suggests":[117],"computationally":[119],"faster":[120],"as":[124],"approximate":[126],"for":[127],"real":[128],"process.":[129]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2020,"cited_by_count":1}],"updated_date":"2026-04-21T08:09:41.155169","created_date":"2025-10-10T00:00:00"}