{"id":"https://openalex.org/W4403678360","doi":"https://doi.org/10.1109/case59546.2024.10711417","title":"Trustworthy dual-scale defect detection network for diversified electronic products","display_name":"Trustworthy dual-scale defect detection network for diversified electronic products","publication_year":2024,"publication_date":"2024-08-28","ids":{"openalex":"https://openalex.org/W4403678360","doi":"https://doi.org/10.1109/case59546.2024.10711417"},"language":"en","primary_location":{"id":"doi:10.1109/case59546.2024.10711417","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/case59546.2024.10711417","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE 20th International Conference on Automation Science and Engineering (CASE)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5113134727","display_name":"Xinting Liao","orcid":null},"institutions":[{"id":"https://openalex.org/I181326427","display_name":"Donghua University","ror":"https://ror.org/035psfh38","country_code":"CN","type":"education","lineage":["https://openalex.org/I181326427"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xinting Liao","raw_affiliation_strings":["Donghua University,Engineering Research Center of Artificial Intelligence for Textile Industry Ministry of Education, Institute of Artificial Intelligence,Shanghai,China,201620"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Donghua University,Engineering Research Center of Artificial Intelligence for Textile Industry Ministry of Education, Institute of Artificial Intelligence,Shanghai,China,201620","institution_ids":["https://openalex.org/I181326427"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100436775","display_name":"Jie Zhang","orcid":"https://orcid.org/0000-0002-6215-0237"},"institutions":[{"id":"https://openalex.org/I181326427","display_name":"Donghua University","ror":"https://ror.org/035psfh38","country_code":"CN","type":"education","lineage":["https://openalex.org/I181326427"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jie Zhang","raw_affiliation_strings":["Donghua University,Engineering Research Center of Artificial Intelligence for Textile Industry Ministry of Education, Institute of Artificial Intelligence,Shanghai,China,201620"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Donghua University,Engineering Research Center of Artificial Intelligence for Textile Industry Ministry of Education, Institute of Artificial Intelligence,Shanghai,China,201620","institution_ids":["https://openalex.org/I181326427"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5026626611","display_name":"Junliang Wang","orcid":"https://orcid.org/0000-0003-0558-8598"},"institutions":[{"id":"https://openalex.org/I181326427","display_name":"Donghua University","ror":"https://ror.org/035psfh38","country_code":"CN","type":"education","lineage":["https://openalex.org/I181326427"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Junliang Wang","raw_affiliation_strings":["Donghua University,Engineering Research Center of Artificial Intelligence for Textile Industry Ministry of Education, Institute of Artificial Intelligence,Shanghai,China,201620"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Donghua University,Engineering Research Center of Artificial Intelligence for Textile Industry Ministry of Education, Institute of Artificial Intelligence,Shanghai,China,201620","institution_ids":["https://openalex.org/I181326427"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I181326427"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.29252586,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1497","last_page":"1502"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9962999820709229,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9962999820709229,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9858999848365784,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9690999984741211,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/trustworthiness","display_name":"Trustworthiness","score":0.70308518409729},{"id":"https://openalex.org/keywords/dual","display_name":"Dual (grammatical number)","score":0.7005417943000793},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6347755193710327},{"id":"https://openalex.org/keywords/scale","display_name":"Scale (ratio)","score":0.5684590935707092},{"id":"https://openalex.org/keywords/computer-security","display_name":"Computer security","score":0.2896891236305237},{"id":"https://openalex.org/keywords/cartography","display_name":"Cartography","score":0.09941607713699341},{"id":"https://openalex.org/keywords/geography","display_name":"Geography","score":0.09109184145927429}],"concepts":[{"id":"https://openalex.org/C153701036","wikidata":"https://www.wikidata.org/wiki/Q659974","display_name":"Trustworthiness","level":2,"score":0.70308518409729},{"id":"https://openalex.org/C2780980858","wikidata":"https://www.wikidata.org/wiki/Q110022","display_name":"Dual (grammatical number)","level":2,"score":0.7005417943000793},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6347755193710327},{"id":"https://openalex.org/C2778755073","wikidata":"https://www.wikidata.org/wiki/Q10858537","display_name":"Scale (ratio)","level":2,"score":0.5684590935707092},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.2896891236305237},{"id":"https://openalex.org/C58640448","wikidata":"https://www.wikidata.org/wiki/Q42515","display_name":"Cartography","level":1,"score":0.09941607713699341},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.09109184145927429},{"id":"https://openalex.org/C124952713","wikidata":"https://www.wikidata.org/wiki/Q8242","display_name":"Literature","level":1,"score":0.0},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/case59546.2024.10711417","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/case59546.2024.10711417","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE 20th International Conference on Automation Science and Engineering (CASE)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320335787","display_name":"Fundamental Research Funds for the Central Universities","ror":null},{"id":"https://openalex.org/F4320337504","display_name":"Research and Development","ror":"https://ror.org/027s68j25"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W3034971973","https://openalex.org/W3096609285","https://openalex.org/W3193024002","https://openalex.org/W3214406712","https://openalex.org/W4200118103","https://openalex.org/W4225113999","https://openalex.org/W4313398231","https://openalex.org/W4317669908","https://openalex.org/W4362575754","https://openalex.org/W4372082063","https://openalex.org/W4376170979","https://openalex.org/W4377691132","https://openalex.org/W4381849166","https://openalex.org/W4386076325","https://openalex.org/W4386404700","https://openalex.org/W4387125416","https://openalex.org/W4387189885","https://openalex.org/W4389215987","https://openalex.org/W4390231733","https://openalex.org/W4390242528","https://openalex.org/W4390651064","https://openalex.org/W4391092590","https://openalex.org/W4391332950","https://openalex.org/W6777046832","https://openalex.org/W6790690058"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2899084033","https://openalex.org/W2748952813","https://openalex.org/W2076536433","https://openalex.org/W2390279801","https://openalex.org/W4391913857","https://openalex.org/W90316445","https://openalex.org/W2358668433","https://openalex.org/W4396701345","https://openalex.org/W2376932109"],"abstract_inverted_index":{"Surface":[0],"defect":[1,78,132],"detection":[2,42,121],"is":[3,37,53,91,113],"the":[4,19,29,41,73,136],"essential":[5],"part":[6],"of":[7,11,23,32,75,138],"product":[8],"quality":[9],"control":[10],"printed":[12],"circuit":[13],"board":[14],"(PCB),":[15],"deeply":[16],"related":[17],"to":[18,28,39,55,71,93,118],"efficiency":[20],"and":[21,57,84,98,105,125],"cost":[22],"PCB":[24,33,60,130],"production.":[25],"However,":[26],"due":[27],"various":[30],"morphologies":[31],"surface":[34,61,131],"defects,":[35],"it":[36],"difficult":[38],"improve":[40],"accuracy.":[43],"In":[44],"this":[45],"paper,":[46],"a":[47,68,109],"novel":[48],"trustworthy":[49,110,120],"dual-scale":[50,87],"network":[51],"(TDS-Net)":[52],"proposed":[54],"accurately":[56],"reliably":[58],"detect":[59],"defects":[62],"with":[63,115],"different":[64,76],"morphologies.":[65],"TDS-Net":[66],"designs":[67],"local-global":[69],"backbone":[70],"strengthen":[72],"ability":[74],"scale":[77,104],"features":[79,97,100],"extraction":[80],"by":[81],"integrating":[82],"convolution":[83],"transformer.":[85],"A":[86],"feature":[88],"fusion":[89],"module":[90,112],"built":[92],"efficiently":[94],"share":[95],"shallow":[96],"deep":[99],"based":[101],"on":[102,128],"local":[103],"global":[106],"scale.":[107],"Moreover,":[108],"prediction":[111],"developed":[114],"Dirichlet":[116],"distribution":[117],"achieve":[119],"results.":[122],"Comparison":[123],"experiments":[124,127],"ablation":[126],"customized":[129],"dataset":[133],"have":[134],"demonstrated":[135],"superiority":[137],"TDS-Net.":[139]},"counts_by_year":[],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}