{"id":"https://openalex.org/W4312475891","doi":"https://doi.org/10.1109/case49997.2022.9926636","title":"Imbalanced Wafer Map Dataset Classification with Semi-Supervised Learning Method and Optimized Loss Function","display_name":"Imbalanced Wafer Map Dataset Classification with Semi-Supervised Learning Method and Optimized Loss Function","publication_year":2022,"publication_date":"2022-08-20","ids":{"openalex":"https://openalex.org/W4312475891","doi":"https://doi.org/10.1109/case49997.2022.9926636"},"language":"en","primary_location":{"id":"doi:10.1109/case49997.2022.9926636","is_oa":false,"landing_page_url":"https://doi.org/10.1109/case49997.2022.9926636","pdf_url":null,"source":{"id":"https://openalex.org/S4363607892","display_name":"2022 IEEE 18th International Conference on Automation Science and Engineering (CASE)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE 18th International Conference on Automation Science and Engineering (CASE)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5020049082","display_name":"Jianchuan Huang","orcid":null},"institutions":[{"id":"https://openalex.org/I116953780","display_name":"Tongji University","ror":"https://ror.org/03rc6as71","country_code":"CN","type":"education","lineage":["https://openalex.org/I116953780"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Jianchuan Huang","raw_affiliation_strings":["Tongji University,Department of Control Science and Engineering,Shanghai,China,201804"],"affiliations":[{"raw_affiliation_string":"Tongji University,Department of Control Science and Engineering,Shanghai,China,201804","institution_ids":["https://openalex.org/I116953780"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100443076","display_name":"Kuo\u2010Yi Lin","orcid":"https://orcid.org/0000-0002-7461-8116"},"institutions":[{"id":"https://openalex.org/I116953780","display_name":"Tongji University","ror":"https://ror.org/03rc6as71","country_code":"CN","type":"education","lineage":["https://openalex.org/I116953780"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Kuo-Yi Lin","raw_affiliation_strings":["Tongji University,Department of Control Science and Engineering,Shanghai,China,201804"],"affiliations":[{"raw_affiliation_string":"Tongji University,Department of Control Science and Engineering,Shanghai,China,201804","institution_ids":["https://openalex.org/I116953780"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044793383","display_name":"Jia Xu","orcid":"https://orcid.org/0000-0001-9699-6073"},"institutions":[{"id":"https://openalex.org/I116953780","display_name":"Tongji University","ror":"https://ror.org/03rc6as71","country_code":"CN","type":"education","lineage":["https://openalex.org/I116953780"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jia Xu","raw_affiliation_strings":["Tongji University,Department of Control Science and Engineering,Shanghai,China,201804"],"affiliations":[{"raw_affiliation_string":"Tongji University,Department of Control Science and Engineering,Shanghai,China,201804","institution_ids":["https://openalex.org/I116953780"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100293778","display_name":"Li-Li Li-Li","orcid":null},"institutions":[{"id":"https://openalex.org/I116953780","display_name":"Tongji University","ror":"https://ror.org/03rc6as71","country_code":"CN","type":"education","lineage":["https://openalex.org/I116953780"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lili","raw_affiliation_strings":["Tongji University,Department of Control Science and Engineering,Shanghai,China,201804"],"affiliations":[{"raw_affiliation_string":"Tongji University,Department of Control Science and Engineering,Shanghai,China,201804","institution_ids":["https://openalex.org/I116953780"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5020049082"],"corresponding_institution_ids":["https://openalex.org/I116953780"],"apc_list":null,"apc_paid":null,"fwci":1.0394,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.72830971,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"1815","last_page":"1819"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9973999857902527,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","score":0.9922000169754028,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/wafer","display_name":"Wafer","score":0.911455512046814},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6179670691490173},{"id":"https://openalex.org/keywords/semiconductor-device-fabrication","display_name":"Semiconductor device fabrication","score":0.5732858180999756},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5703701376914978},{"id":"https://openalex.org/keywords/function","display_name":"Function (biology)","score":0.5386566519737244},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4777107238769531},{"id":"https://openalex.org/keywords/wafer-testing","display_name":"Wafer testing","score":0.45944324135780334},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.42102497816085815},{"id":"https://openalex.org/keywords/wafer-fabrication","display_name":"Wafer fabrication","score":0.4178093373775482},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.33185288310050964},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.277970552444458},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.13266274333000183}],"concepts":[{"id":"https://openalex.org/C160671074","wikidata":"https://www.wikidata.org/wiki/Q267131","display_name":"Wafer","level":2,"score":0.911455512046814},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6179670691490173},{"id":"https://openalex.org/C66018809","wikidata":"https://www.wikidata.org/wiki/Q1570432","display_name":"Semiconductor device fabrication","level":3,"score":0.5732858180999756},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5703701376914978},{"id":"https://openalex.org/C14036430","wikidata":"https://www.wikidata.org/wiki/Q3736076","display_name":"Function (biology)","level":2,"score":0.5386566519737244},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4777107238769531},{"id":"https://openalex.org/C44445679","wikidata":"https://www.wikidata.org/wiki/Q2538844","display_name":"Wafer testing","level":3,"score":0.45944324135780334},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.42102497816085815},{"id":"https://openalex.org/C35750839","wikidata":"https://www.wikidata.org/wiki/Q7959421","display_name":"Wafer fabrication","level":3,"score":0.4178093373775482},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.33185288310050964},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.277970552444458},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.13266274333000183},{"id":"https://openalex.org/C78458016","wikidata":"https://www.wikidata.org/wiki/Q840400","display_name":"Evolutionary biology","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/case49997.2022.9926636","is_oa":false,"landing_page_url":"https://doi.org/10.1109/case49997.2022.9926636","pdf_url":null,"source":{"id":"https://openalex.org/S4363607892","display_name":"2022 IEEE 18th International Conference on Automation Science and Engineering (CASE)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE 18th International Conference on Automation Science and Engineering (CASE)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Decent work and economic growth","score":0.6000000238418579,"id":"https://metadata.un.org/sdg/8"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":28,"referenced_works":["https://openalex.org/W1975617480","https://openalex.org/W2020286945","https://openalex.org/W2044855549","https://openalex.org/W2104550562","https://openalex.org/W2108501770","https://openalex.org/W2117539524","https://openalex.org/W2120196566","https://openalex.org/W2194775991","https://openalex.org/W2286515324","https://openalex.org/W2412510955","https://openalex.org/W2593609447","https://openalex.org/W2784163702","https://openalex.org/W2790607928","https://openalex.org/W2805484002","https://openalex.org/W2904651525","https://openalex.org/W2913085327","https://openalex.org/W2920311927","https://openalex.org/W2952229419","https://openalex.org/W2963351448","https://openalex.org/W2970941190","https://openalex.org/W3008902695","https://openalex.org/W3035724871","https://openalex.org/W3103152812","https://openalex.org/W6623329352","https://openalex.org/W6675944832","https://openalex.org/W6715189028","https://openalex.org/W6764733053","https://openalex.org/W6779304510"],"related_works":["https://openalex.org/W2170726572","https://openalex.org/W2146435486","https://openalex.org/W2006086900","https://openalex.org/W1483119123","https://openalex.org/W2377558694","https://openalex.org/W2992897358","https://openalex.org/W2394172622","https://openalex.org/W1593076923","https://openalex.org/W2118048293","https://openalex.org/W2148670835"],"abstract_inverted_index":{"Wafer":[0],"is":[1,54,63,108],"the":[2,37,59,86,91,96,105,111],"crucial":[3],"raw":[4],"material":[5],"of":[6,68,98,104,116],"semiconductor":[7,38],"devices.":[8],"In":[9,72],"wafer":[10,21,28,43,60,99,118],"production,":[11],"impurities":[12],"cannot":[13],"be":[14],"removed":[15],"entirely,":[16],"which":[17,114],"will":[18],"cause":[19],"various":[20],"map":[22,29,44,61,100],"defects.":[23],"Quickly":[24],"and":[25,49,51,56,66,84],"precisely":[26],"classifying":[27],"defects":[30],"can":[31],"help":[32],"engineers":[33],"track":[34],"failures":[35],"in":[36],"manufacturing":[39],"process.":[40],"However,":[41],"different":[42],"defect":[45],"patterns":[46],"occur":[47],"randomly":[48],"irregularly,":[50],"labeling":[52],"work":[53],"labor-intensive":[55],"time-consuming.":[57],"Therefore,":[58],"dataset":[62,113],"usually":[64],"imbalanced":[65],"consists":[67,115],"many":[69],"unlabeled":[70,77],"data.":[71],"this":[73],"paper,":[74],"we":[75],"utilize":[76],"data":[78],"by":[79,89],"using":[80],"semi-supervised":[81],"learning":[82],"methods":[83],"alleviate":[85],"imbalance":[87],"problem":[88],"optimizing":[90],"loss":[92],"function":[93],"to":[94],"increase":[95],"accuracy":[97],"classification.":[101],"The":[102],"performance":[103],"proposed":[106],"method":[107],"illustrated":[109],"with":[110],"WM-811K":[112],"real-world":[117],"maps.":[119]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}