{"id":"https://openalex.org/W4287843383","doi":"https://doi.org/10.1109/cacre54574.2022.9834211","title":"Tunnel crack identification based on improved YOLOv5","display_name":"Tunnel crack identification based on improved YOLOv5","publication_year":2022,"publication_date":"2022-07-01","ids":{"openalex":"https://openalex.org/W4287843383","doi":"https://doi.org/10.1109/cacre54574.2022.9834211"},"language":"en","primary_location":{"id":"doi:10.1109/cacre54574.2022.9834211","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cacre54574.2022.9834211","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 7th International Conference on Automation, Control and Robotics Engineering (CACRE)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5111664801","display_name":"Qianwei Dai","orcid":"https://orcid.org/0000-0003-4420-9239"},"institutions":[{"id":"https://openalex.org/I39774598","display_name":"Hefei University","ror":"https://ror.org/01f5rdf64","country_code":"CN","type":"education","lineage":["https://openalex.org/I39774598"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Qianwei Dai","raw_affiliation_strings":["Hefei University,School of Advanced Manufacturing Engineering,Hefei,China","School of Advanced Manufacturing Engineering, Hefei University, Hefei, China"],"affiliations":[{"raw_affiliation_string":"Hefei University,School of Advanced Manufacturing Engineering,Hefei,China","institution_ids":["https://openalex.org/I39774598"]},{"raw_affiliation_string":"School of Advanced Manufacturing Engineering, Hefei University, Hefei, China","institution_ids":["https://openalex.org/I39774598"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028236979","display_name":"Yu Xie","orcid":"https://orcid.org/0000-0003-2680-4050"},"institutions":[{"id":"https://openalex.org/I39774598","display_name":"Hefei University","ror":"https://ror.org/01f5rdf64","country_code":"CN","type":"education","lineage":["https://openalex.org/I39774598"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yu Xie","raw_affiliation_strings":["Hefei University,School of Advanced Manufacturing Engineering,Hefei,China","School of Advanced Manufacturing Engineering, Hefei University, Hefei, China"],"affiliations":[{"raw_affiliation_string":"Hefei University,School of Advanced Manufacturing Engineering,Hefei,China","institution_ids":["https://openalex.org/I39774598"]},{"raw_affiliation_string":"School of Advanced Manufacturing Engineering, Hefei University, Hefei, China","institution_ids":["https://openalex.org/I39774598"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5045774314","display_name":"Jiaqing Xu","orcid":"https://orcid.org/0000-0002-2321-4031"},"institutions":[{"id":"https://openalex.org/I39774598","display_name":"Hefei University","ror":"https://ror.org/01f5rdf64","country_code":"CN","type":"education","lineage":["https://openalex.org/I39774598"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiaqing Xu","raw_affiliation_strings":["Hefei University,School of Advanced Manufacturing Engineering,Hefei,China","School of Advanced Manufacturing Engineering, Hefei University, Hefei, China"],"affiliations":[{"raw_affiliation_string":"Hefei University,School of Advanced Manufacturing Engineering,Hefei,China","institution_ids":["https://openalex.org/I39774598"]},{"raw_affiliation_string":"School of Advanced Manufacturing Engineering, Hefei University, Hefei, China","institution_ids":["https://openalex.org/I39774598"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109177026","display_name":"Yuansheng Xia","orcid":null},"institutions":[{"id":"https://openalex.org/I39774598","display_name":"Hefei University","ror":"https://ror.org/01f5rdf64","country_code":"CN","type":"education","lineage":["https://openalex.org/I39774598"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuansheng Xia","raw_affiliation_strings":["Hefei University,School of Advanced Manufacturing Engineering,Hefei,China","School of Advanced Manufacturing Engineering, Hefei University, Hefei, China"],"affiliations":[{"raw_affiliation_string":"Hefei University,School of Advanced Manufacturing Engineering,Hefei,China","institution_ids":["https://openalex.org/I39774598"]},{"raw_affiliation_string":"School of Advanced Manufacturing Engineering, Hefei University, Hefei, China","institution_ids":["https://openalex.org/I39774598"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082891491","display_name":"Chuangchuang Sheng","orcid":null},"institutions":[{"id":"https://openalex.org/I39774598","display_name":"Hefei University","ror":"https://ror.org/01f5rdf64","country_code":"CN","type":"education","lineage":["https://openalex.org/I39774598"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chuangchuang Sheng","raw_affiliation_strings":["Hefei University,School of Advanced Manufacturing Engineering,Hefei,China","School of Advanced Manufacturing Engineering, Hefei University, Hefei, China"],"affiliations":[{"raw_affiliation_string":"Hefei University,School of Advanced Manufacturing Engineering,Hefei,China","institution_ids":["https://openalex.org/I39774598"]},{"raw_affiliation_string":"School of Advanced Manufacturing Engineering, Hefei University, Hefei, China","institution_ids":["https://openalex.org/I39774598"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064285096","display_name":"Chiheng Tian","orcid":null},"institutions":[{"id":"https://openalex.org/I39774598","display_name":"Hefei University","ror":"https://ror.org/01f5rdf64","country_code":"CN","type":"education","lineage":["https://openalex.org/I39774598"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chiheng Tian","raw_affiliation_strings":["Hefei University,School of Advanced Manufacturing Engineering,Hefei,China","School of Advanced Manufacturing Engineering, Hefei University, Hefei, China"],"affiliations":[{"raw_affiliation_string":"Hefei University,School of Advanced Manufacturing Engineering,Hefei,China","institution_ids":["https://openalex.org/I39774598"]},{"raw_affiliation_string":"School of Advanced Manufacturing Engineering, Hefei University, Hefei, China","institution_ids":["https://openalex.org/I39774598"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5046410057","display_name":"Weiying Ou","orcid":null},"institutions":[{"id":"https://openalex.org/I4210128819","display_name":"Institute of Electrical Engineering","ror":"https://ror.org/033js6g46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210128819"]},{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Weiying Ou","raw_affiliation_strings":["Chinese Academy of Sciences,Institute of Electrical Engineering,Beijing,China","Institute of Electrical Engineering, Chinese Academy of Sciences, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Chinese Academy of Sciences,Institute of Electrical Engineering,Beijing,China","institution_ids":["https://openalex.org/I4210128819","https://openalex.org/I19820366"]},{"raw_affiliation_string":"Institute of Electrical Engineering, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210128819","https://openalex.org/I19820366"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5111664801"],"corresponding_institution_ids":["https://openalex.org/I39774598"],"apc_list":null,"apc_paid":null,"fwci":0.673,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.64631495,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"302","last_page":"307"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11606","display_name":"Infrastructure Maintenance and Monitoring","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11606","display_name":"Infrastructure Maintenance and Monitoring","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.996399998664856,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9918000102043152,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/generalization","display_name":"Generalization","score":0.690308153629303},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6117748022079468},{"id":"https://openalex.org/keywords/identification","display_name":"Identification (biology)","score":0.5962699055671692},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.5934779047966003},{"id":"https://openalex.org/keywords/channel","display_name":"Channel (broadcasting)","score":0.5029250979423523},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.44910430908203125},{"id":"https://openalex.org/keywords/single-shot","display_name":"Single shot","score":0.4480729401111603},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.43058642745018005},{"id":"https://openalex.org/keywords/object","display_name":"Object (grammar)","score":0.4277960956096649},{"id":"https://openalex.org/keywords/radio-frequency-identification","display_name":"Radio-frequency identification","score":0.4128662645816803},{"id":"https://openalex.org/keywords/value","display_name":"Value (mathematics)","score":0.4111228883266449},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.37318626046180725},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.20926445722579956},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.12665903568267822},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.0815645158290863},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.08096209168434143},{"id":"https://openalex.org/keywords/mathematical-analysis","display_name":"Mathematical analysis","score":0.07629665732383728}],"concepts":[{"id":"https://openalex.org/C177148314","wikidata":"https://www.wikidata.org/wiki/Q170084","display_name":"Generalization","level":2,"score":0.690308153629303},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6117748022079468},{"id":"https://openalex.org/C116834253","wikidata":"https://www.wikidata.org/wiki/Q2039217","display_name":"Identification (biology)","level":2,"score":0.5962699055671692},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.5934779047966003},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.5029250979423523},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.44910430908203125},{"id":"https://openalex.org/C3019835501","wikidata":"https://www.wikidata.org/wiki/Q1310130","display_name":"Single shot","level":2,"score":0.4480729401111603},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.43058642745018005},{"id":"https://openalex.org/C2781238097","wikidata":"https://www.wikidata.org/wiki/Q175026","display_name":"Object (grammar)","level":2,"score":0.4277960956096649},{"id":"https://openalex.org/C204222849","wikidata":"https://www.wikidata.org/wiki/Q104954","display_name":"Radio-frequency identification","level":2,"score":0.4128662645816803},{"id":"https://openalex.org/C2776291640","wikidata":"https://www.wikidata.org/wiki/Q2912517","display_name":"Value (mathematics)","level":2,"score":0.4111228883266449},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.37318626046180725},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.20926445722579956},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.12665903568267822},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0815645158290863},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.08096209168434143},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.07629665732383728},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C59822182","wikidata":"https://www.wikidata.org/wiki/Q441","display_name":"Botany","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/cacre54574.2022.9834211","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cacre54574.2022.9834211","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 7th International Conference on Automation, Control and Robotics Engineering (CACRE)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W639708223","https://openalex.org/W2109255472","https://openalex.org/W2752782242","https://openalex.org/W2963857746","https://openalex.org/W3034552520","https://openalex.org/W3177052299"],"related_works":["https://openalex.org/W1577771720","https://openalex.org/W3162204513","https://openalex.org/W2366906938","https://openalex.org/W2371138613","https://openalex.org/W2349391998","https://openalex.org/W4205655149","https://openalex.org/W2048963458","https://openalex.org/W4403360633","https://openalex.org/W43109613","https://openalex.org/W2359952343"],"abstract_inverted_index":{"A":[0],"tunnel":[1,28,33,164],"crack":[2,29],"identification":[3],"method":[4],"based":[5],"on":[6],"improved":[7,118,124],"YOLOv5":[8],"(You":[9],"Only":[10],"Look":[11],"Once":[12],"version":[13],"5)":[14],"is":[15,83,128],"proposed":[16,147],"for":[17,47,54],"the":[18,32,68,72,88,111,123,144],"problem":[19],"of":[20,27,71,91,116,163],"complex":[21],"background":[22],"and":[23,50,85,98,122,130,139,153,157],"low":[24],"recognition":[25,161],"rate":[26,162],"pictures.":[30],"Firstly,":[31],"cracks":[34,49],"are":[35,64],"labeled":[36],"according":[37],"to":[38,66],"a":[39],"novel":[40],"labeling":[41],"method,":[42],"using":[43],"one":[44],"label":[45,52],"box":[46],"regular":[48],"multiple":[51],"boxes":[53],"irregular":[55],"cracks.":[56,165],"Secondly,":[57],"various":[58],"data":[59],"enhancements":[60],"such":[61],"as":[62],"mosaic":[63],"utilized":[65],"enhance":[67],"generalization":[69],"capability":[70],"model.":[73],"Thirdly,":[74],"YOLOv5m":[75,92],"combined":[76,93],"with":[77,87,94,106],"CA":[78],"(Coordinate":[79],"Attention":[80],")":[81],"module":[82],"trained":[84],"compared":[86,105],"training":[89],"results":[90],"SE":[95],"(Squeeze-and-excitation":[96],"networks)":[97],"ECA":[99],"(Efficient":[100],"Channel":[101],"Attention)":[102],"modules.":[103],"Finally,":[104],"common":[107],"object":[108],"detection":[109],"algorithms,":[110],"AP":[112,126],"(Average":[113],"Precision)":[114],"value":[115,127],"final":[117],"algorithm":[119,125],"reaches":[120],"79.7%,":[121],"24%":[129],"23.2%":[131],"higher":[132,160],"than":[133],"SSD":[134,152],"(Single":[135],"Shot":[136],"Multibox":[137],"Detector)":[138],"Faster":[140,154],"R-CNN,":[141],"respectively.":[142],"Therefore,":[143],"YOLOv5m-CA":[145],"model":[146],"in":[148],"this":[149],"paper":[150],"outperforms":[151],"R-CNN":[155],"models":[156],"can":[158],"achieve":[159]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":3},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}