{"id":"https://openalex.org/W4410772129","doi":"https://doi.org/10.1109/cacml64929.2025.11010951","title":"Textured Surface Defect Detection with Image-Level Accuracy Optimization via Patch-Level Features and Simulation-Based Samples","display_name":"Textured Surface Defect Detection with Image-Level Accuracy Optimization via Patch-Level Features and Simulation-Based Samples","publication_year":2025,"publication_date":"2025-03-28","ids":{"openalex":"https://openalex.org/W4410772129","doi":"https://doi.org/10.1109/cacml64929.2025.11010951"},"language":"en","primary_location":{"id":"doi:10.1109/cacml64929.2025.11010951","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cacml64929.2025.11010951","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 4th Asia Conference on Algorithms, Computing and Machine Learning (CACML)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100726656","display_name":"Fen Li","orcid":"https://orcid.org/0000-0003-1799-6767"},"institutions":[{"id":"https://openalex.org/I76130692","display_name":"Zhejiang University","ror":"https://ror.org/00a2xv884","country_code":"CN","type":"education","lineage":["https://openalex.org/I76130692"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Fen Li","raw_affiliation_strings":["College of Information Science and Electronic Engineering Zhejiang University,Zhejiang Provincial Key Laboratory of Multi-Modal Communication Networks and Intelligent Information Processing,Hangzhou,China"],"affiliations":[{"raw_affiliation_string":"College of Information Science and Electronic Engineering Zhejiang University,Zhejiang Provincial Key Laboratory of Multi-Modal Communication Networks and Intelligent Information Processing,Hangzhou,China","institution_ids":["https://openalex.org/I76130692"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100718416","display_name":"Dongxiao Li","orcid":"https://orcid.org/0000-0002-5619-0419"},"institutions":[{"id":"https://openalex.org/I76130692","display_name":"Zhejiang University","ror":"https://ror.org/00a2xv884","country_code":"CN","type":"education","lineage":["https://openalex.org/I76130692"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Dongxiao Li","raw_affiliation_strings":["College of Information Science and Electronic Engineering Zhejiang University,Zhejiang Provincial Key Laboratory of Multi-Modal Communication Networks and Intelligent Information Processing,Hangzhou,China"],"affiliations":[{"raw_affiliation_string":"College of Information Science and Electronic Engineering Zhejiang University,Zhejiang Provincial Key Laboratory of Multi-Modal Communication Networks and Intelligent Information Processing,Hangzhou,China","institution_ids":["https://openalex.org/I76130692"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011453949","display_name":"Le Huang","orcid":"https://orcid.org/0009-0003-3944-0329"},"institutions":[{"id":"https://openalex.org/I76130692","display_name":"Zhejiang University","ror":"https://ror.org/00a2xv884","country_code":"CN","type":"education","lineage":["https://openalex.org/I76130692"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Le Huang","raw_affiliation_strings":["College of Information Science and Electronic Engineering Zhejiang University,Zhejiang Provincial Key Laboratory of Multi-Modal Communication Networks and Intelligent Information Processing,Hangzhou,China"],"affiliations":[{"raw_affiliation_string":"College of Information Science and Electronic Engineering Zhejiang University,Zhejiang Provincial Key Laboratory of Multi-Modal Communication Networks and Intelligent Information Processing,Hangzhou,China","institution_ids":["https://openalex.org/I76130692"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101890126","display_name":"Huafeng Chen","orcid":"https://orcid.org/0000-0003-4229-4505"},"institutions":[{"id":"https://openalex.org/I76130692","display_name":"Zhejiang University","ror":"https://ror.org/00a2xv884","country_code":"CN","type":"education","lineage":["https://openalex.org/I76130692"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hangrui Chen","raw_affiliation_strings":["College of Information Science and Electronic Engineering Zhejiang University,Zhejiang Provincial Key Laboratory of Multi-Modal Communication Networks and Intelligent Information Processing,Hangzhou,China"],"affiliations":[{"raw_affiliation_string":"College of Information Science and Electronic Engineering Zhejiang University,Zhejiang Provincial Key Laboratory of Multi-Modal Communication Networks and Intelligent Information Processing,Hangzhou,China","institution_ids":["https://openalex.org/I76130692"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5002372483","display_name":"Ming Zhang","orcid":"https://orcid.org/0000-0002-4556-9191"},"institutions":[{"id":"https://openalex.org/I76130692","display_name":"Zhejiang University","ror":"https://ror.org/00a2xv884","country_code":"CN","type":"education","lineage":["https://openalex.org/I76130692"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ming Zhang","raw_affiliation_strings":["College of Information Science and Electronic Engineering Zhejiang University,Zhejiang Provincial Key Laboratory of Multi-Modal Communication Networks and Intelligent Information Processing,Hangzhou,China"],"affiliations":[{"raw_affiliation_string":"College of Information Science and Electronic Engineering Zhejiang University,Zhejiang Provincial Key Laboratory of Multi-Modal Communication Networks and Intelligent Information Processing,Hangzhou,China","institution_ids":["https://openalex.org/I76130692"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5100726656"],"corresponding_institution_ids":["https://openalex.org/I76130692"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.18484419,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"7"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9678999781608582,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.9366000294685364,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5353664755821228},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.4366161823272705},{"id":"https://openalex.org/keywords/surface","display_name":"Surface (topology)","score":0.41786155104637146},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.3703766167163849},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3550141751766205},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.133453369140625}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5353664755821228},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4366161823272705},{"id":"https://openalex.org/C2776799497","wikidata":"https://www.wikidata.org/wiki/Q484298","display_name":"Surface (topology)","level":2,"score":0.41786155104637146},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.3703766167163849},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3550141751766205},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.133453369140625},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/cacml64929.2025.11010951","is_oa":false,"landing_page_url":"https://doi.org/10.1109/cacml64929.2025.11010951","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 4th Asia Conference on Algorithms, Computing and Machine Learning (CACML)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":27,"referenced_works":["https://openalex.org/W2194775991","https://openalex.org/W2549139847","https://openalex.org/W2948982773","https://openalex.org/W2962793481","https://openalex.org/W2964137095","https://openalex.org/W2994817145","https://openalex.org/W3006938707","https://openalex.org/W3092105412","https://openalex.org/W3092704883","https://openalex.org/W3100487172","https://openalex.org/W3114010851","https://openalex.org/W3120387510","https://openalex.org/W3147184966","https://openalex.org/W3166166117","https://openalex.org/W3169651898","https://openalex.org/W3204520143","https://openalex.org/W4214694907","https://openalex.org/W4292264335","https://openalex.org/W4382240612","https://openalex.org/W4391887109","https://openalex.org/W6637373629","https://openalex.org/W6762718338","https://openalex.org/W6765779288","https://openalex.org/W6775204614","https://openalex.org/W6777869702","https://openalex.org/W6779093361","https://openalex.org/W6850180652"],"related_works":["https://openalex.org/W2899084033","https://openalex.org/W2772917594","https://openalex.org/W2036807459","https://openalex.org/W2058170566","https://openalex.org/W2755342338","https://openalex.org/W2166024367","https://openalex.org/W3116076068","https://openalex.org/W2229312674","https://openalex.org/W2951359407","https://openalex.org/W2079911747"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}