{"id":"https://openalex.org/W2146106383","doi":"https://doi.org/10.1109/bmei.2009.5305564","title":"Analysis of Bio-Impedance Measurement Method via Electromagnetic Induction Using Probe-Coil","display_name":"Analysis of Bio-Impedance Measurement Method via Electromagnetic Induction Using Probe-Coil","publication_year":2009,"publication_date":"2009-01-01","ids":{"openalex":"https://openalex.org/W2146106383","doi":"https://doi.org/10.1109/bmei.2009.5305564","mag":"2146106383"},"language":"en","primary_location":{"id":"doi:10.1109/bmei.2009.5305564","is_oa":false,"landing_page_url":"https://doi.org/10.1109/bmei.2009.5305564","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 2nd International Conference on Biomedical Engineering and Informatics","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100406987","display_name":"Chao Wang","orcid":"https://orcid.org/0000-0002-4362-947X"},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Chao Wang","raw_affiliation_strings":["School of Electrical Engineering and Automation, Tianjin University, TJU, Tianjin, China","[Sch. of Electr. Eng. & Autom., Tianjin Univ., Tianjin, China]"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Automation, Tianjin University, TJU, Tianjin, China","institution_ids":["https://openalex.org/I162868743"]},{"raw_affiliation_string":"[Sch. of Electr. Eng. & Autom., Tianjin Univ., Tianjin, China]","institution_ids":["https://openalex.org/I162868743"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100297345","display_name":"Chuanjin Xu","orcid":null},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chuanjin Xu","raw_affiliation_strings":["School of Electrical Engineering and Automation, Tianjin University, TJU, Tianjin, China","[Sch. of Electr. Eng. & Autom., Tianjin Univ., Tianjin, China]"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Automation, Tianjin University, TJU, Tianjin, China","institution_ids":["https://openalex.org/I162868743"]},{"raw_affiliation_string":"[Sch. of Electr. Eng. & Autom., Tianjin Univ., Tianjin, China]","institution_ids":["https://openalex.org/I162868743"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100694854","display_name":"Ming Zhang","orcid":"https://orcid.org/0000-0003-3151-9035"},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ming Zhang","raw_affiliation_strings":["School of Electrical Engineering and Automation, Tianjin University, TJU, Tianjin, China","[Sch. of Electr. Eng. & Autom., Tianjin Univ., Tianjin, China]"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Automation, Tianjin University, TJU, Tianjin, China","institution_ids":["https://openalex.org/I162868743"]},{"raw_affiliation_string":"[Sch. of Electr. Eng. & Autom., Tianjin Univ., Tianjin, China]","institution_ids":["https://openalex.org/I162868743"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100732225","display_name":"Wuliang Yin","orcid":"https://orcid.org/0000-0001-5927-3052"},"institutions":[{"id":"https://openalex.org/I28407311","display_name":"University of Manchester","ror":"https://ror.org/027m9bs27","country_code":"GB","type":"education","lineage":["https://openalex.org/I28407311"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Wuliang Yin","raw_affiliation_strings":["School of Electrical and Electronic Engineering, University of Manchester, Institute of Science and Technology, Manchester, UK","Sch. of Electr. & Electron. Eng., Univ. of Manchester, Manchester, UK#TAB#"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, University of Manchester, Institute of Science and Technology, Manchester, UK","institution_ids":["https://openalex.org/I28407311"]},{"raw_affiliation_string":"Sch. of Electr. & Electron. Eng., Univ. of Manchester, Manchester, UK#TAB#","institution_ids":["https://openalex.org/I28407311"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5100406987"],"corresponding_institution_ids":["https://openalex.org/I162868743"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.19838062,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"497","issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10572","display_name":"Geophysical and Geoelectrical Methods","score":0.9952999949455261,"subfield":{"id":"https://openalex.org/subfields/1908","display_name":"Geophysics"},"field":{"id":"https://openalex.org/fields/19","display_name":"Earth and Planetary Sciences"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.7332746982574463},{"id":"https://openalex.org/keywords/electromagnetic-coil","display_name":"Electromagnetic coil","score":0.710727334022522},{"id":"https://openalex.org/keywords/inductance","display_name":"Inductance","score":0.6397725343704224},{"id":"https://openalex.org/keywords/electromagnetic-induction","display_name":"Electromagnetic induction","score":0.6043455600738525},{"id":"https://openalex.org/keywords/focused-impedance-measurement","display_name":"Focused Impedance Measurement","score":0.5373894572257996},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.48762765526771545},{"id":"https://openalex.org/keywords/induction-coil","display_name":"Induction coil","score":0.4722525477409363},{"id":"https://openalex.org/keywords/conductivity","display_name":"Conductivity","score":0.4370652437210083},{"id":"https://openalex.org/keywords/inductive-sensor","display_name":"Inductive sensor","score":0.4351125955581665},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3874187171459198},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.362959086894989},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.28115034103393555},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2784234881401062},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.2215399444103241},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21471214294433594}],"concepts":[{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.7332746982574463},{"id":"https://openalex.org/C30403606","wikidata":"https://www.wikidata.org/wiki/Q2981904","display_name":"Electromagnetic coil","level":2,"score":0.710727334022522},{"id":"https://openalex.org/C29210110","wikidata":"https://www.wikidata.org/wiki/Q177897","display_name":"Inductance","level":3,"score":0.6397725343704224},{"id":"https://openalex.org/C102130693","wikidata":"https://www.wikidata.org/wiki/Q988780","display_name":"Electromagnetic induction","level":3,"score":0.6043455600738525},{"id":"https://openalex.org/C172066009","wikidata":"https://www.wikidata.org/wiki/Q5463955","display_name":"Focused Impedance Measurement","level":3,"score":0.5373894572257996},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.48762765526771545},{"id":"https://openalex.org/C102998134","wikidata":"https://www.wikidata.org/wiki/Q1417360","display_name":"Induction coil","level":3,"score":0.4722525477409363},{"id":"https://openalex.org/C131540310","wikidata":"https://www.wikidata.org/wiki/Q907564","display_name":"Conductivity","level":2,"score":0.4370652437210083},{"id":"https://openalex.org/C108572070","wikidata":"https://www.wikidata.org/wiki/Q765821","display_name":"Inductive sensor","level":2,"score":0.4351125955581665},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3874187171459198},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.362959086894989},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.28115034103393555},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2784234881401062},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.2215399444103241},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21471214294433594},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/bmei.2009.5305564","is_oa":false,"landing_page_url":"https://doi.org/10.1109/bmei.2009.5305564","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 2nd International Conference on Biomedical Engineering and Informatics","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320335468","display_name":"Natural Science Foundation of Tianjin Municipal Science and Technology Commission","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W1979351380","https://openalex.org/W2034409546","https://openalex.org/W2039978028","https://openalex.org/W2086722400","https://openalex.org/W2100788482","https://openalex.org/W2126887931","https://openalex.org/W2129347706"],"related_works":["https://openalex.org/W2911969801","https://openalex.org/W1992328704","https://openalex.org/W3117325437","https://openalex.org/W2359862590","https://openalex.org/W4367837086","https://openalex.org/W2375000822","https://openalex.org/W2581515454","https://openalex.org/W4207045513","https://openalex.org/W2905286247","https://openalex.org/W2042392959"],"abstract_inverted_index":{"The":[0,63],"bio-impedance":[1],"measurement":[2,23,73],"method":[3,74],"via":[4],"electromagnetic":[5],"induction":[6],"has":[7],"the":[8,15,40,76,81],"non-contact":[9],"character":[10],"which":[11],"overcomes":[12],"influences":[13],"of":[14,33,55],"electrode's":[16],"contact":[17],"impedance":[18,31],"to":[19,38,59,71,80],"measurements.":[20],"However":[21],"its":[22],"results":[24],"have":[25],"a":[26,50],"highly":[27],"complicated":[28],"relationship":[29],"with":[30],"properties":[32],"measured":[34],"objects.":[35],"In":[36],"order":[37],"discover":[39],"regularity,":[41],"this":[42,72],"paper":[43],"deduces":[44],"an":[45],"analytical":[46],"resolution":[47],"model":[48],"using":[49,75],"probe-coil":[51,77],"and":[52,57],"analyzes":[53],"affections":[54],"conductivity":[56],"lift-off":[58],"mutual":[60],"inductance":[61],"variation.":[62],"achieved":[64],"disciplinary":[65],"characters":[66],"are":[67],"valuable":[68],"not":[69],"only":[70],"but":[78],"also":[79],"data":[82],"analysis":[83],"in":[84],"Electromagnetic":[85],"Tomography":[86],"(EMT).":[87]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}