{"id":"https://openalex.org/W4405709127","doi":"https://doi.org/10.1109/biocas61083.2024.10798264","title":"Amplitude and Phase Errors Optimization for High-Precision Electrical Impedance Measurement System","display_name":"Amplitude and Phase Errors Optimization for High-Precision Electrical Impedance Measurement System","publication_year":2024,"publication_date":"2024-10-24","ids":{"openalex":"https://openalex.org/W4405709127","doi":"https://doi.org/10.1109/biocas61083.2024.10798264"},"language":"en","primary_location":{"id":"doi:10.1109/biocas61083.2024.10798264","is_oa":false,"landing_page_url":"https://doi.org/10.1109/biocas61083.2024.10798264","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE Biomedical Circuits and Systems Conference (BioCAS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5112258104","display_name":"Lingfeng Luan","orcid":null},"institutions":[{"id":"https://openalex.org/I66867065","display_name":"East China Normal University","ror":"https://ror.org/02n96ep67","country_code":"CN","type":"education","lineage":["https://openalex.org/I66867065"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lingfeng Luan","raw_affiliation_strings":["East China Normal University,School of Communication and Electronic Engineering,Shanghai,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"East China Normal University,School of Communication and Electronic Engineering,Shanghai,China","institution_ids":["https://openalex.org/I66867065"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5104195489","display_name":"Yuhao Mao","orcid":null},"institutions":[{"id":"https://openalex.org/I66867065","display_name":"East China Normal University","ror":"https://ror.org/02n96ep67","country_code":"CN","type":"education","lineage":["https://openalex.org/I66867065"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuhao Mao","raw_affiliation_strings":["East China Normal University,School of Communication and Electronic Engineering,Shanghai,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"East China Normal University,School of Communication and Electronic Engineering,Shanghai,China","institution_ids":["https://openalex.org/I66867065"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100417593","display_name":"Wenhao Zhang","orcid":"https://orcid.org/0000-0003-2776-9832"},"institutions":[{"id":"https://openalex.org/I66867065","display_name":"East China Normal University","ror":"https://ror.org/02n96ep67","country_code":"CN","type":"education","lineage":["https://openalex.org/I66867065"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wenhao Zhang","raw_affiliation_strings":["East China Normal University,School of Communication and Electronic Engineering,Shanghai,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"East China Normal University,School of Communication and Electronic Engineering,Shanghai,China","institution_ids":["https://openalex.org/I66867065"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111751920","display_name":"J. S. Ni","orcid":null},"institutions":[{"id":"https://openalex.org/I66867065","display_name":"East China Normal University","ror":"https://ror.org/02n96ep67","country_code":"CN","type":"education","lineage":["https://openalex.org/I66867065"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jieming Ni","raw_affiliation_strings":["East China Normal University,School of Communication and Electronic Engineering,Shanghai,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"East China Normal University,School of Communication and Electronic Engineering,Shanghai,China","institution_ids":["https://openalex.org/I66867065"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101356800","display_name":"Long Xu","orcid":null},"institutions":[{"id":"https://openalex.org/I66867065","display_name":"East China Normal University","ror":"https://ror.org/02n96ep67","country_code":"CN","type":"education","lineage":["https://openalex.org/I66867065"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Long Xu","raw_affiliation_strings":["East China Normal University,School of Communication and Electronic Engineering,Shanghai,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"East China Normal University,School of Communication and Electronic Engineering,Shanghai,China","institution_ids":["https://openalex.org/I66867065"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5085051116","display_name":"Boxiao Liu","orcid":"https://orcid.org/0000-0002-8568-6616"},"institutions":[{"id":"https://openalex.org/I66867065","display_name":"East China Normal University","ror":"https://ror.org/02n96ep67","country_code":"CN","type":"education","lineage":["https://openalex.org/I66867065"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Boxiao Liu","raw_affiliation_strings":["East China Normal University,School of Communication and Electronic Engineering,Shanghai,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"East China Normal University,School of Communication and Electronic Engineering,Shanghai,China","institution_ids":["https://openalex.org/I66867065"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I66867065"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.8384000062942505,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.8384000062942505,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.7354999780654907,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.733299970626831,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.6746354103088379},{"id":"https://openalex.org/keywords/amplitude","display_name":"Amplitude","score":0.6495985984802246},{"id":"https://openalex.org/keywords/focused-impedance-measurement","display_name":"Focused Impedance Measurement","score":0.5466102957725525},{"id":"https://openalex.org/keywords/phase","display_name":"Phase (matter)","score":0.5355268716812134},{"id":"https://openalex.org/keywords/observational-error","display_name":"Observational error","score":0.46797874569892883},{"id":"https://openalex.org/keywords/system-of-measurement","display_name":"System of measurement","score":0.45199328660964966},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.39574384689331055},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.3574404716491699},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3206613063812256},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3099808096885681},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.22195053100585938},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.20835599303245544},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17503154277801514},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.12843498587608337},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.07413259148597717}],"concepts":[{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.6746354103088379},{"id":"https://openalex.org/C180205008","wikidata":"https://www.wikidata.org/wiki/Q159190","display_name":"Amplitude","level":2,"score":0.6495985984802246},{"id":"https://openalex.org/C172066009","wikidata":"https://www.wikidata.org/wiki/Q5463955","display_name":"Focused Impedance Measurement","level":3,"score":0.5466102957725525},{"id":"https://openalex.org/C44280652","wikidata":"https://www.wikidata.org/wiki/Q104837","display_name":"Phase (matter)","level":2,"score":0.5355268716812134},{"id":"https://openalex.org/C19619285","wikidata":"https://www.wikidata.org/wiki/Q196372","display_name":"Observational error","level":2,"score":0.46797874569892883},{"id":"https://openalex.org/C37649242","wikidata":"https://www.wikidata.org/wiki/Q932268","display_name":"System of measurement","level":2,"score":0.45199328660964966},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.39574384689331055},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.3574404716491699},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3206613063812256},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3099808096885681},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.22195053100585938},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.20835599303245544},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17503154277801514},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.12843498587608337},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.07413259148597717},{"id":"https://openalex.org/C1276947","wikidata":"https://www.wikidata.org/wiki/Q333","display_name":"Astronomy","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/biocas61083.2024.10798264","is_oa":false,"landing_page_url":"https://doi.org/10.1109/biocas61083.2024.10798264","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE Biomedical Circuits and Systems Conference (BioCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6399999856948853,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W2143748013","https://openalex.org/W2945639600","https://openalex.org/W2950574594","https://openalex.org/W2953959093","https://openalex.org/W2958068914","https://openalex.org/W2975463509","https://openalex.org/W3025108401","https://openalex.org/W3025413255","https://openalex.org/W3097609090","https://openalex.org/W3110832096","https://openalex.org/W3135355657","https://openalex.org/W3177774876","https://openalex.org/W4220751861","https://openalex.org/W4221069349","https://openalex.org/W4221089853","https://openalex.org/W4282912956","https://openalex.org/W4310058384","https://openalex.org/W4310639034","https://openalex.org/W4312038353","https://openalex.org/W4316813038"],"related_works":["https://openalex.org/W2545105407","https://openalex.org/W1530957495","https://openalex.org/W784500383","https://openalex.org/W2562155397","https://openalex.org/W2752941547","https://openalex.org/W1974813547","https://openalex.org/W1990323938","https://openalex.org/W2072189119","https://openalex.org/W2740538285","https://openalex.org/W2518027987"],"abstract_inverted_index":{"Due":[0],"to":[1,40,85,118],"its":[2],"non-invasive,":[3],"deep":[4],"sensing":[5,23,62],"and":[6,21,29,46,69,79,113,134],"radiationfree":[7],"characteristics,":[8],"electrical":[9,35,96],"impedance":[10,36,97,106],"measurement":[11,37],"has":[12],"become":[13],"a":[14,126,135],"key":[15],"technique":[16],"in":[17,33],"empowering":[18],"biological":[19],"imaging":[20],"flexible":[22,61],"applications.":[24],"However,":[25],"large":[26],"amplitude":[27,68,77,111,132],"error":[28,43,71,88,112,133],"phase":[30,70,115,139],"errors":[31],"exist":[32],"conventional":[34,120],"system":[38,65],"due":[39],"the":[41,47,51,57,60,87,91,95,105,119,122],"harmonic":[42],"of":[44,50,59,90,131,138],"demodulation":[45],"limited":[48],"bandwidth":[49],"circuit,":[52],"which":[53],"will":[54],"significantly":[55],"affect":[56],"accuracy":[58],"systems.":[63],"A":[64],"level":[66],"low":[67],"optimization":[72],"scheme":[73,124],"is":[74,83,107],"proposed":[75,92,123],"with":[76,109],"correction":[78],"pre-I/Q-demodulation.":[80],"Behavior":[81],"model":[82,101],"built":[84],"verify":[86],"reduction":[89,130,137],"scheme.":[93],"For":[94],"tomography":[98],"application,":[99],"behavior":[100],"simulation":[102],"shows":[103],"that":[104],"measured":[108],"0.45%":[110],"0\u00b0":[114],"error.":[116,140],"Compared":[117],"system,":[121],"achieves":[125],"$\\mathbf{7":[127],"4":[128],"\\%}$":[129],"100%":[136]},"counts_by_year":[],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}