{"id":"https://openalex.org/W2580043311","doi":"https://doi.org/10.1109/biocas.2016.7833825","title":"Scaling ISFET instrumentation with in-pixel quantisation to deep submicron technologies","display_name":"Scaling ISFET instrumentation with in-pixel quantisation to deep submicron technologies","publication_year":2016,"publication_date":"2016-10-01","ids":{"openalex":"https://openalex.org/W2580043311","doi":"https://doi.org/10.1109/biocas.2016.7833825","mag":"2580043311"},"language":"en","primary_location":{"id":"doi:10.1109/biocas.2016.7833825","is_oa":false,"landing_page_url":"https://doi.org/10.1109/biocas.2016.7833825","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE Biomedical Circuits and Systems Conference (BioCAS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5054027777","display_name":"Nicolas Moser","orcid":"https://orcid.org/0000-0002-6689-0486"},"institutions":[{"id":"https://openalex.org/I4210109636","display_name":"NIHR Imperial Biomedical Research Centre","ror":"https://ror.org/01kmhx639","country_code":"GB","type":"facility","lineage":["https://openalex.org/I34931013","https://openalex.org/I4210109636"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Nicolas Moser","raw_affiliation_strings":["Imperial College, Institute of Biomedical Engineering, London, United Kingdom"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Imperial College, Institute of Biomedical Engineering, London, United Kingdom","institution_ids":["https://openalex.org/I4210109636"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083347038","display_name":"Tor Sverre Lande","orcid":"https://orcid.org/0000-0002-1880-2840"},"institutions":[{"id":"https://openalex.org/I184942183","display_name":"University of Oslo","ror":"https://ror.org/01xtthb56","country_code":"NO","type":"education","lineage":["https://openalex.org/I184942183"]}],"countries":["NO"],"is_corresponding":false,"raw_author_name":"Tor Sverre Lande","raw_affiliation_strings":["Department of Informatics, University of Oslo, Norway"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Informatics, University of Oslo, Norway","institution_ids":["https://openalex.org/I184942183"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5069244062","display_name":"Pantelis Georgiou","orcid":"https://orcid.org/0000-0003-2476-3857"},"institutions":[{"id":"https://openalex.org/I4210109636","display_name":"NIHR Imperial Biomedical Research Centre","ror":"https://ror.org/01kmhx639","country_code":"GB","type":"facility","lineage":["https://openalex.org/I34931013","https://openalex.org/I4210109636"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Pantelis Georgiou","raw_affiliation_strings":["Imperial College, Institute of Biomedical Engineering, London, United Kingdom"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Imperial College, Institute of Biomedical Engineering, London, United Kingdom","institution_ids":["https://openalex.org/I4210109636"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":3.9926,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.92897196,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"436","last_page":"439"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11472","display_name":"Analytical Chemistry and Sensors","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1502","display_name":"Bioengineering"},"field":{"id":"https://openalex.org/fields/15","display_name":"Chemical Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11472","display_name":"Analytical Chemistry and Sensors","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1502","display_name":"Bioengineering"},"field":{"id":"https://openalex.org/fields/15","display_name":"Chemical Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11434","display_name":"Electrochemical Analysis and Applications","score":0.9958999752998352,"subfield":{"id":"https://openalex.org/subfields/1603","display_name":"Electrochemistry"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.9930999875068665,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/isfet","display_name":"ISFET","score":0.8573952913284302},{"id":"https://openalex.org/keywords/pixel","display_name":"Pixel","score":0.732552170753479},{"id":"https://openalex.org/keywords/figure-of-merit","display_name":"Figure of merit","score":0.668338418006897},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5385332107543945},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5384644269943237},{"id":"https://openalex.org/keywords/scaling","display_name":"Scaling","score":0.4941101372241974},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.492964506149292},{"id":"https://openalex.org/keywords/passivation","display_name":"Passivation","score":0.4791640341281891},{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.4732559025287628},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.46044620871543884},{"id":"https://openalex.org/keywords/instrumentation","display_name":"Instrumentation (computer programming)","score":0.43900078535079956},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.4157017469406128},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.39040547609329224},{"id":"https://openalex.org/keywords/field-effect-transistor","display_name":"Field-effect transistor","score":0.33608245849609375},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.25561270117759705},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.24984312057495117},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.24201613664627075},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.19568535685539246},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.15237829089164734},{"id":"https://openalex.org/keywords/electrode","display_name":"Electrode","score":0.11728975176811218},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.10232651233673096},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.0987933874130249},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.0941312313079834}],"concepts":[{"id":"https://openalex.org/C154275363","wikidata":"https://www.wikidata.org/wiki/Q904133","display_name":"ISFET","level":5,"score":0.8573952913284302},{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.732552170753479},{"id":"https://openalex.org/C130277099","wikidata":"https://www.wikidata.org/wiki/Q3676605","display_name":"Figure of merit","level":2,"score":0.668338418006897},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5385332107543945},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5384644269943237},{"id":"https://openalex.org/C99844830","wikidata":"https://www.wikidata.org/wiki/Q102441924","display_name":"Scaling","level":2,"score":0.4941101372241974},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.492964506149292},{"id":"https://openalex.org/C33574316","wikidata":"https://www.wikidata.org/wiki/Q917260","display_name":"Passivation","level":3,"score":0.4791640341281891},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.4732559025287628},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.46044620871543884},{"id":"https://openalex.org/C118530786","wikidata":"https://www.wikidata.org/wiki/Q1134732","display_name":"Instrumentation (computer programming)","level":2,"score":0.43900078535079956},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.4157017469406128},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.39040547609329224},{"id":"https://openalex.org/C145598152","wikidata":"https://www.wikidata.org/wiki/Q176097","display_name":"Field-effect transistor","level":4,"score":0.33608245849609375},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.25561270117759705},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24984312057495117},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.24201613664627075},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.19568535685539246},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.15237829089164734},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.11728975176811218},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.10232651233673096},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0987933874130249},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0941312313079834},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/biocas.2016.7833825","is_oa":false,"landing_page_url":"https://doi.org/10.1109/biocas.2016.7833825","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE Biomedical Circuits and Systems Conference (BioCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1588454386","https://openalex.org/W2028403508","https://openalex.org/W2052803981","https://openalex.org/W2061127516","https://openalex.org/W2080433909","https://openalex.org/W2087000982","https://openalex.org/W2119399232","https://openalex.org/W2133863162","https://openalex.org/W2151984008","https://openalex.org/W2467093478","https://openalex.org/W6672341590"],"related_works":["https://openalex.org/W2063174160","https://openalex.org/W1997963871","https://openalex.org/W4250442938","https://openalex.org/W2333264988","https://openalex.org/W4250415373","https://openalex.org/W2022856681","https://openalex.org/W2031348296","https://openalex.org/W2307187547","https://openalex.org/W2083672075","https://openalex.org/W1923276224"],"abstract_inverted_index":{"In":[0,22,87],"this":[1,92,102],"paper,":[2],"we":[3,24,94],"present":[4,46],"an":[5,88],"investigation":[6],"of":[7,49,69,76,98,110,133],"technology":[8],"scaling":[9],"applied":[10],"to":[11,38,63,83,90,106,119,130],"pixel":[12,51,116],"architectures":[13],"for":[14,114],"chemical":[15],"sensing":[16],"using":[17],"Ion-Sensitive":[18],"Field-Effect":[19],"Transistors":[20],"(ISFETs).":[21],"particular,":[23],"focus":[25],"our":[26,50],"discussion":[27],"on":[28],"pixels":[29],"which":[30],"integrate":[31],"mixed-signal":[32],"circuitry,":[33],"providing":[34],"more":[35],"computational":[36],"power":[37],"perform":[39],"in-pixel":[40],"quantisation":[41],"or":[42],"sensor":[43],"calibration.":[44],"We":[45],"the":[47,74,84,108,120,131],"case":[48],"topology":[52],"and":[53,79,100],"analyse":[54],"its":[55],"performance":[56,104],"in":[57,71,123,135],"five":[58],"process":[59],"nodes":[60],"from":[61],"350nm":[62],"65nm.":[64],"Observations":[65],"include":[66],"a":[67,96],"reduction":[68],"95%":[70],"area,":[72],"at":[73],"cost":[75],"increased":[77],"noise":[78],"signal":[80],"attenuation":[81],"due":[82],"passivation":[85],"capacitance.":[86],"attempt":[89],"characterise":[91],"trade-off,":[93],"derive":[95],"Figure":[97],"Merit":[99],"use":[101],"new":[103],"parameter":[105],"demonstrate":[107],"interest":[109],"smaller":[111],"feature":[112],"sizes":[113],"ISFET":[115],"architectures,":[117],"contrarily":[118],"current":[121],"trend":[122],"instrumentation.":[124],"More":[125],"considerations":[126],"will":[127],"be":[128],"given":[129],"implementation":[132],"ISFETs":[134],"deep":[136],"submicron":[137],"technologies.":[138]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}