{"id":"https://openalex.org/W2561590197","doi":"https://doi.org/10.1109/bigdata.2016.7840828","title":"Machine learning, linear and Bayesian models for logistic regression in failure detection problems","display_name":"Machine learning, linear and Bayesian models for logistic regression in failure detection problems","publication_year":2016,"publication_date":"2016-12-01","ids":{"openalex":"https://openalex.org/W2561590197","doi":"https://doi.org/10.1109/bigdata.2016.7840828","mag":"2561590197"},"language":"en","primary_location":{"id":"doi:10.1109/bigdata.2016.7840828","is_oa":false,"landing_page_url":"https://doi.org/10.1109/bigdata.2016.7840828","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE International Conference on Big Data (Big Data)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5026355556","display_name":"Bohdan M. Pavlyshenko","orcid":"https://orcid.org/0000-0001-9515-3488"},"institutions":[{"id":"https://openalex.org/I200280692","display_name":"Lviv University","ror":"https://ror.org/01s7y5e82","country_code":"UA","type":"education","lineage":["https://openalex.org/I200280692"]}],"countries":["UA"],"is_corresponding":true,"raw_author_name":"B. Pavlyshenko","raw_affiliation_strings":["SoftServe, Inc., Ivan Franko National University of Lviv, Lviv, Ukraine"],"affiliations":[{"raw_affiliation_string":"SoftServe, Inc., Ivan Franko National University of Lviv, Lviv, Ukraine","institution_ids":["https://openalex.org/I200280692"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5026355556"],"corresponding_institution_ids":["https://openalex.org/I200280692"],"apc_list":null,"apc_paid":null,"fwci":5.3225,"has_fulltext":false,"cited_by_count":42,"citation_normalized_percentile":{"value":0.95973765,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"2046","last_page":"2050"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11871","display_name":"Advanced Statistical Methods and Models","score":0.996399998664856,"subfield":{"id":"https://openalex.org/subfields/2613","display_name":"Statistics and Probability"},"field":{"id":"https://openalex.org/fields/26","display_name":"Mathematics"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11871","display_name":"Advanced Statistical Methods and Models","score":0.996399998664856,"subfield":{"id":"https://openalex.org/subfields/2613","display_name":"Statistics and Probability"},"field":{"id":"https://openalex.org/fields/26","display_name":"Mathematics"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9951000213623047,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10136","display_name":"Statistical Methods and Inference","score":0.9937000274658203,"subfield":{"id":"https://openalex.org/subfields/2613","display_name":"Statistics and Probability"},"field":{"id":"https://openalex.org/fields/26","display_name":"Mathematics"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/logistic-regression","display_name":"Logistic regression","score":0.7439119219779968},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6583589315414429},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.6047857999801636},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.5829745531082153},{"id":"https://openalex.org/keywords/bayesian-linear-regression","display_name":"Bayesian linear regression","score":0.5363906621932983},{"id":"https://openalex.org/keywords/bayesian-probability","display_name":"Bayesian probability","score":0.5334802865982056},{"id":"https://openalex.org/keywords/bayesian-multivariate-linear-regression","display_name":"Bayesian multivariate linear regression","score":0.4712061285972595},{"id":"https://openalex.org/keywords/linear-regression","display_name":"Linear regression","score":0.46217435598373413},{"id":"https://openalex.org/keywords/logistic-model-tree","display_name":"Logistic model tree","score":0.44636979699134827},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.336825966835022},{"id":"https://openalex.org/keywords/bayesian-inference","display_name":"Bayesian inference","score":0.2743295431137085}],"concepts":[{"id":"https://openalex.org/C151956035","wikidata":"https://www.wikidata.org/wiki/Q1132755","display_name":"Logistic regression","level":2,"score":0.7439119219779968},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6583589315414429},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.6047857999801636},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.5829745531082153},{"id":"https://openalex.org/C37903108","wikidata":"https://www.wikidata.org/wiki/Q4874474","display_name":"Bayesian linear regression","level":4,"score":0.5363906621932983},{"id":"https://openalex.org/C107673813","wikidata":"https://www.wikidata.org/wiki/Q812534","display_name":"Bayesian probability","level":2,"score":0.5334802865982056},{"id":"https://openalex.org/C64946054","wikidata":"https://www.wikidata.org/wiki/Q4874476","display_name":"Bayesian multivariate linear regression","level":3,"score":0.4712061285972595},{"id":"https://openalex.org/C48921125","wikidata":"https://www.wikidata.org/wiki/Q10861030","display_name":"Linear regression","level":2,"score":0.46217435598373413},{"id":"https://openalex.org/C61722155","wikidata":"https://www.wikidata.org/wiki/Q6667643","display_name":"Logistic model tree","level":3,"score":0.44636979699134827},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.336825966835022},{"id":"https://openalex.org/C160234255","wikidata":"https://www.wikidata.org/wiki/Q812535","display_name":"Bayesian inference","level":3,"score":0.2743295431137085}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/bigdata.2016.7840828","is_oa":false,"landing_page_url":"https://doi.org/10.1109/bigdata.2016.7840828","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE International Conference on Big Data (Big Data)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W402407836","https://openalex.org/W1678356000","https://openalex.org/W2070493638","https://openalex.org/W2097360283","https://openalex.org/W2131060185","https://openalex.org/W2157076315","https://openalex.org/W2295598076","https://openalex.org/W2917309827","https://openalex.org/W3102476541","https://openalex.org/W4294541781"],"related_works":["https://openalex.org/W2604963692","https://openalex.org/W228771216","https://openalex.org/W3100117756","https://openalex.org/W2363843476","https://openalex.org/W3172887576","https://openalex.org/W2606692828","https://openalex.org/W4281921183","https://openalex.org/W4309298396","https://openalex.org/W2017034551","https://openalex.org/W4248534646"],"abstract_inverted_index":{"In":[0],"this":[1],"work,":[2],"we":[3,21,47],"study":[4],"the":[5,19,23,34,59,71,74,85,89,92,99],"use":[6,35],"of":[7,36,73,91],"logistic":[8,64,82],"regression":[9,65,83],"in":[10,98],"manufacturing":[11],"failures":[12],"detection.":[13],"As":[14],"a":[15],"data":[16,24],"set":[17],"for":[18,63,81,88],"analysis,":[20,101],"used":[22],"from":[25],"Kaggle":[26],"competition":[27],"\u201cBosch":[28],"Production":[29],"Line":[30],"Performance\u201d.":[31],"We":[32],"considered":[33],"machine":[37,44],"learning,":[38],"linear":[39,61],"and":[40],"Bayesian":[41,79],"models.":[42],"For":[43],"learning":[45],"approach,":[46],"analyzed":[48],"XGBoost":[49],"tree":[50],"based":[51],"classifier":[52],"to":[53,69],"obtain":[54],"high":[55],"scored":[56],"classification.":[57],"Using":[58],"generalized":[60],"model":[62],"makes":[66],"it":[67],"possible":[68],"analyze":[70],"influence":[72],"factors":[75],"under":[76],"study.":[77],"The":[78],"approach":[80],"gives":[84],"statistical":[86],"distribution":[87],"parameters":[90],"model.":[93],"It":[94],"can":[95],"be":[96],"useful":[97],"probabilistic":[100],"e.g.":[102],"risk":[103],"assessment.":[104]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":6},{"year":2022,"cited_by_count":5},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":9},{"year":2019,"cited_by_count":5},{"year":2018,"cited_by_count":7},{"year":2017,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}