{"id":"https://openalex.org/W4404295408","doi":"https://doi.org/10.1109/bcicts59662.2024.10745684","title":"On the Safe Operating Area of InP HBTs","display_name":"On the Safe Operating Area of InP HBTs","publication_year":2024,"publication_date":"2024-10-27","ids":{"openalex":"https://openalex.org/W4404295408","doi":"https://doi.org/10.1109/bcicts59662.2024.10745684"},"language":"en","primary_location":{"id":"doi:10.1109/bcicts59662.2024.10745684","is_oa":false,"landing_page_url":"https://doi.org/10.1109/bcicts59662.2024.10745684","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5061670215","display_name":"Markus M\u00fcller","orcid":"https://orcid.org/0000-0003-1058-1649"},"institutions":[{"id":"https://openalex.org/I78650965","display_name":"Technische Universit\u00e4t Dresden","ror":"https://ror.org/042aqky30","country_code":"DE","type":"education","lineage":["https://openalex.org/I78650965"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Markus M\u00fcller","raw_affiliation_strings":["TU Dresden,Chair for Electron Devices and Integrated Circuits (CEDIC),Germany,01062"],"affiliations":[{"raw_affiliation_string":"TU Dresden,Chair for Electron Devices and Integrated Circuits (CEDIC),Germany,01062","institution_ids":["https://openalex.org/I78650965"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068445893","display_name":"S\u00e9bastien Fr\u00e9gon\u00e8se","orcid":"https://orcid.org/0000-0002-1829-2633"},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I15057530","display_name":"Universit\u00e9 de Bordeaux","ror":"https://ror.org/057qpr032","country_code":"FR","type":"education","lineage":["https://openalex.org/I15057530"]},{"id":"https://openalex.org/I4210157089","display_name":"Laboratoire de l'Int\u00e9gration du Mat\u00e9riau au Syst\u00e8me","ror":"https://ror.org/04nabhy78","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I15057530","https://openalex.org/I4210091158","https://openalex.org/I4210095849","https://openalex.org/I4210157089","https://openalex.org/I4210160189"]},{"id":"https://openalex.org/I4210160189","display_name":"Institut Polytechnique de Bordeaux","ror":"https://ror.org/054qv7y42","country_code":"FR","type":"education","lineage":["https://openalex.org/I4210160189"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Sebastien Fregonese","raw_affiliation_strings":["CNRS, University of Bordeaux, Talence Cedex,IMS Laboratory,France,33400"],"affiliations":[{"raw_affiliation_string":"CNRS, University of Bordeaux, Talence Cedex,IMS Laboratory,France,33400","institution_ids":["https://openalex.org/I4210157089","https://openalex.org/I4210160189","https://openalex.org/I1294671590","https://openalex.org/I15057530"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088861441","display_name":"Christoph Weimer","orcid":"https://orcid.org/0000-0002-6005-0937"},"institutions":[{"id":"https://openalex.org/I78650965","display_name":"Technische Universit\u00e4t Dresden","ror":"https://ror.org/042aqky30","country_code":"DE","type":"education","lineage":["https://openalex.org/I78650965"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Christoph Weimer","raw_affiliation_strings":["TU Dresden,Chair for Electron Devices and Integrated Circuits (CEDIC),Germany,01062"],"affiliations":[{"raw_affiliation_string":"TU Dresden,Chair for Electron Devices and Integrated Circuits (CEDIC),Germany,01062","institution_ids":["https://openalex.org/I78650965"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056506264","display_name":"Guangsheng Liang","orcid":"https://orcid.org/0009-0003-1031-1339"},"institutions":[{"id":"https://openalex.org/I78650965","display_name":"Technische Universit\u00e4t Dresden","ror":"https://ror.org/042aqky30","country_code":"DE","type":"education","lineage":["https://openalex.org/I78650965"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Guangsheng Liang","raw_affiliation_strings":["TU Dresden,Chair for Electron Devices and Integrated Circuits (CEDIC),Germany,01062"],"affiliations":[{"raw_affiliation_string":"TU Dresden,Chair for Electron Devices and Integrated Circuits (CEDIC),Germany,01062","institution_ids":["https://openalex.org/I78650965"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5052598592","display_name":"Xiaodi Jin","orcid":"https://orcid.org/0000-0002-7800-9000"},"institutions":[{"id":"https://openalex.org/I78650965","display_name":"Technische Universit\u00e4t Dresden","ror":"https://ror.org/042aqky30","country_code":"DE","type":"education","lineage":["https://openalex.org/I78650965"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Xiaodi Jin","raw_affiliation_strings":["TU Dresden,Chair for Electron Devices and Integrated Circuits (CEDIC),Germany,01062"],"affiliations":[{"raw_affiliation_string":"TU Dresden,Chair for Electron Devices and Integrated Circuits (CEDIC),Germany,01062","institution_ids":["https://openalex.org/I78650965"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032635428","display_name":"Maximilian Froitzheim","orcid":"https://orcid.org/0009-0009-4432-2494"},"institutions":[{"id":"https://openalex.org/I78650965","display_name":"Technische Universit\u00e4t Dresden","ror":"https://ror.org/042aqky30","country_code":"DE","type":"education","lineage":["https://openalex.org/I78650965"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Maximilian Froitzheim","raw_affiliation_strings":["TU Dresden,Chair for Electron Devices and Integrated Circuits (CEDIC),Germany,01062"],"affiliations":[{"raw_affiliation_string":"TU Dresden,Chair for Electron Devices and Integrated Circuits (CEDIC),Germany,01062","institution_ids":["https://openalex.org/I78650965"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008160362","display_name":"Thomas Zimmer","orcid":"https://orcid.org/0000-0002-4311-0969"},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I15057530","display_name":"Universit\u00e9 de Bordeaux","ror":"https://ror.org/057qpr032","country_code":"FR","type":"education","lineage":["https://openalex.org/I15057530"]},{"id":"https://openalex.org/I4210157089","display_name":"Laboratoire de l'Int\u00e9gration du Mat\u00e9riau au Syst\u00e8me","ror":"https://ror.org/04nabhy78","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I15057530","https://openalex.org/I4210091158","https://openalex.org/I4210095849","https://openalex.org/I4210157089","https://openalex.org/I4210160189"]},{"id":"https://openalex.org/I4210160189","display_name":"Institut Polytechnique de Bordeaux","ror":"https://ror.org/054qv7y42","country_code":"FR","type":"education","lineage":["https://openalex.org/I4210160189"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Thomas Zimmer","raw_affiliation_strings":["CNRS, University of Bordeaux, Talence Cedex,IMS Laboratory,France,33400"],"affiliations":[{"raw_affiliation_string":"CNRS, University of Bordeaux, Talence Cedex,IMS Laboratory,France,33400","institution_ids":["https://openalex.org/I4210157089","https://openalex.org/I4210160189","https://openalex.org/I1294671590","https://openalex.org/I15057530"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5035970449","display_name":"M. Schr\u00f6ter","orcid":"https://orcid.org/0000-0002-5432-716X"},"institutions":[{"id":"https://openalex.org/I78650965","display_name":"Technische Universit\u00e4t Dresden","ror":"https://ror.org/042aqky30","country_code":"DE","type":"education","lineage":["https://openalex.org/I78650965"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Michael Schr\u00f6ter","raw_affiliation_strings":["TU Dresden,Chair for Electron Devices and Integrated Circuits (CEDIC),Germany,01062"],"affiliations":[{"raw_affiliation_string":"TU Dresden,Chair for Electron Devices and Integrated Circuits (CEDIC),Germany,01062","institution_ids":["https://openalex.org/I78650965"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5061670215"],"corresponding_institution_ids":["https://openalex.org/I78650965"],"apc_list":null,"apc_paid":null,"fwci":0.222,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.55003829,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"290","last_page":"293"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9853000044822693,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9853000044822693,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10299","display_name":"Photonic and Optical Devices","score":0.9839000105857849,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10022","display_name":"Semiconductor Quantum Structures and Devices","score":0.9782000184059143,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.49739864468574524},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4724869132041931},{"id":"https://openalex.org/keywords/engineering-physics","display_name":"Engineering physics","score":0.33083656430244446},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.324396550655365},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19555073976516724}],"concepts":[{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.49739864468574524},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4724869132041931},{"id":"https://openalex.org/C61696701","wikidata":"https://www.wikidata.org/wiki/Q770766","display_name":"Engineering physics","level":1,"score":0.33083656430244446},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.324396550655365},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19555073976516724}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/bcicts59662.2024.10745684","is_oa":false,"landing_page_url":"https://doi.org/10.1109/bcicts59662.2024.10745684","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":21,"referenced_works":["https://openalex.org/W1753600784","https://openalex.org/W2057263096","https://openalex.org/W2099689722","https://openalex.org/W2115248616","https://openalex.org/W2119418964","https://openalex.org/W2583697675","https://openalex.org/W2600222344","https://openalex.org/W4236154283","https://openalex.org/W4301022369","https://openalex.org/W4301349821","https://openalex.org/W4322577830","https://openalex.org/W4322577855","https://openalex.org/W4322578000","https://openalex.org/W4385337798","https://openalex.org/W4387250927","https://openalex.org/W4388623354","https://openalex.org/W4388623367","https://openalex.org/W6684309334","https://openalex.org/W6774873848","https://openalex.org/W6989813771","https://openalex.org/W7047492716"],"related_works":["https://openalex.org/W2899084033","https://openalex.org/W2748952813","https://openalex.org/W2016187641","https://openalex.org/W2805339068","https://openalex.org/W4246450666","https://openalex.org/W4388998267","https://openalex.org/W2898370298","https://openalex.org/W2137437058","https://openalex.org/W4390401159","https://openalex.org/W2744391499"],"abstract_inverted_index":{"The":[0],"safe-operating":[1],"area":[2],"of":[3,26],"an":[4],"advanced":[5],"InP":[6],"HBT":[7],"technology":[8,46],"is":[9,36],"studied":[10],"experimentally":[11],"using":[12,38],"pulsed,":[13],"DC":[14],"and":[15,50],"RF":[16],"as":[17,19],"well":[18],"load-pull":[20],"measurements.":[21],"To":[22],"study":[23],"the":[24,27],"implications":[25],"results":[28],"on":[29],"circuit":[30,44],"performance,":[31],"a":[32],"power":[33],"amplifier":[34],"cell":[35],"analyzed":[37],"HICUM/L2.":[39],"Safe-operating-area":[40],"related":[41],"consequences":[42],"for":[43],"design,":[45],"development,":[47],"compact":[48],"modeling":[49],"device":[51],"characterization":[52],"are":[53],"outlined.":[54]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2025-12-19T19:40:27.379048","created_date":"2025-10-10T00:00:00"}