{"id":"https://openalex.org/W4388623236","doi":"https://doi.org/10.1109/bcicts54660.2023.10310853","title":"Microstrip and Grounded CPW Calibration Kit Comparison for On-Wafer Transistor Characterization from 220 GHz to 325 GHz","display_name":"Microstrip and Grounded CPW Calibration Kit Comparison for On-Wafer Transistor Characterization from 220 GHz to 325 GHz","publication_year":2023,"publication_date":"2023-10-16","ids":{"openalex":"https://openalex.org/W4388623236","doi":"https://doi.org/10.1109/bcicts54660.2023.10310853"},"language":"en","primary_location":{"id":"doi:10.1109/bcicts54660.2023.10310853","is_oa":false,"landing_page_url":"https://doi.org/10.1109/bcicts54660.2023.10310853","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5109537048","display_name":"Rob D. Jones","orcid":null},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]},{"id":"https://openalex.org/I167576493","display_name":"Colorado School of Mines","ror":"https://ror.org/04raf6v53","country_code":"US","type":"education","lineage":["https://openalex.org/I167576493"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Rob D. Jones","raw_affiliation_strings":["National Institute of Standards and Technology (NIST),Boulder,CO,80305","Colorado School of Mines, Golden, CO"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Institute of Standards and Technology (NIST),Boulder,CO,80305","institution_ids":["https://openalex.org/I1321296531"]},{"raw_affiliation_string":"Colorado School of Mines, Golden, CO","institution_ids":["https://openalex.org/I167576493"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5009033464","display_name":"J\u00e9r\u00f4me Ch\u00e9ron","orcid":"https://orcid.org/0000-0002-1423-7725"},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]},{"id":"https://openalex.org/I188538660","display_name":"University of Colorado Boulder","ror":"https://ror.org/02ttsq026","country_code":"US","type":"education","lineage":["https://openalex.org/I188538660"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jerome Cheron","raw_affiliation_strings":["National Institute of Standards and Technology (NIST),Boulder,CO,80305","Department of Physics, University of Colorado, Boulder, CO"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Institute of Standards and Technology (NIST),Boulder,CO,80305","institution_ids":["https://openalex.org/I1321296531"]},{"raw_affiliation_string":"Department of Physics, University of Colorado, Boulder, CO","institution_ids":["https://openalex.org/I188538660"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5025614352","display_name":"Bryan T. Bosworth","orcid":"https://orcid.org/0000-0002-3844-3312"},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Bryan T. Bosworth","raw_affiliation_strings":["National Institute of Standards and Technology (NIST),Boulder,CO,80305"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Institute of Standards and Technology (NIST),Boulder,CO,80305","institution_ids":["https://openalex.org/I1321296531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003177052","display_name":"Benjamin F. Jamroz","orcid":"https://orcid.org/0000-0002-5498-1137"},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Benjamin F. Jamroz","raw_affiliation_strings":["National Institute of Standards and Technology (NIST),Boulder,CO,80305"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Institute of Standards and Technology (NIST),Boulder,CO,80305","institution_ids":["https://openalex.org/I1321296531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033144385","display_name":"Dylan F. Williams","orcid":"https://orcid.org/0000-0002-8271-1505"},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Dylan F. Williams","raw_affiliation_strings":["National Institute of Standards and Technology (NIST),Boulder,CO,80305"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Institute of Standards and Technology (NIST),Boulder,CO,80305","institution_ids":["https://openalex.org/I1321296531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010418756","display_name":"Miguel Urteaga","orcid":"https://orcid.org/0000-0001-5127-929X"},"institutions":[{"id":"https://openalex.org/I880619579","display_name":"Teledyne Technologies (United States)","ror":"https://ror.org/00a1gne75","country_code":"US","type":"company","lineage":["https://openalex.org/I880619579"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Miguel E. Urteaga","raw_affiliation_strings":["Teledyne Scientific Company,Thousand Oaks,CA,91360"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Teledyne Scientific Company,Thousand Oaks,CA,91360","institution_ids":["https://openalex.org/I880619579"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5087588710","display_name":"A. Feldman","orcid":"https://orcid.org/0000-0002-9603-4031"},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ari D. Feldman","raw_affiliation_strings":["National Institute of Standards and Technology (NIST),Boulder,CO,80305"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Institute of Standards and Technology (NIST),Boulder,CO,80305","institution_ids":["https://openalex.org/I1321296531"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5080860125","display_name":"Peter H. Aaen","orcid":"https://orcid.org/0000-0001-6696-0125"},"institutions":[{"id":"https://openalex.org/I167576493","display_name":"Colorado School of Mines","ror":"https://ror.org/04raf6v53","country_code":"US","type":"education","lineage":["https://openalex.org/I167576493"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Peter H. Aaen","raw_affiliation_strings":["Colorado School of Mines,Golden,CO,80401"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Colorado School of Mines,Golden,CO,80401","institution_ids":["https://openalex.org/I167576493"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":8,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.5953,"has_fulltext":false,"cited_by_count":13,"citation_normalized_percentile":{"value":0.83715658,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":97,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"124","last_page":"127"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10262","display_name":"Microwave Engineering and Waveguides","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/coplanar-waveguide","display_name":"Coplanar waveguide","score":0.853164792060852},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.8233791589736938},{"id":"https://openalex.org/keywords/microstrip","display_name":"Microstrip","score":0.7772102355957031},{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.6336104273796082},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.626767098903656},{"id":"https://openalex.org/keywords/ground-plane","display_name":"Ground plane","score":0.6165136098861694},{"id":"https://openalex.org/keywords/wafer","display_name":"Wafer","score":0.5260688662528992},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.5219887495040894},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.48534145951271057},{"id":"https://openalex.org/keywords/characterization","display_name":"Characterization (materials science)","score":0.47703927755355835},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.32616686820983887},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.31599485874176025},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.26612067222595215},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.21118271350860596},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19496017694473267},{"id":"https://openalex.org/keywords/microwave","display_name":"Microwave","score":0.17322975397109985},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.1690879464149475},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.09238749742507935},{"id":"https://openalex.org/keywords/antenna","display_name":"Antenna (radio)","score":0.06199696660041809},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.05329477787017822}],"concepts":[{"id":"https://openalex.org/C3736036","wikidata":"https://www.wikidata.org/wiki/Q15525941","display_name":"Coplanar waveguide","level":3,"score":0.853164792060852},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.8233791589736938},{"id":"https://openalex.org/C123657345","wikidata":"https://www.wikidata.org/wiki/Q639055","display_name":"Microstrip","level":2,"score":0.7772102355957031},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.6336104273796082},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.626767098903656},{"id":"https://openalex.org/C88764893","wikidata":"https://www.wikidata.org/wiki/Q1547722","display_name":"Ground plane","level":3,"score":0.6165136098861694},{"id":"https://openalex.org/C160671074","wikidata":"https://www.wikidata.org/wiki/Q267131","display_name":"Wafer","level":2,"score":0.5260688662528992},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.5219887495040894},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.48534145951271057},{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.47703927755355835},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.32616686820983887},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.31599485874176025},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.26612067222595215},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.21118271350860596},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19496017694473267},{"id":"https://openalex.org/C44838205","wikidata":"https://www.wikidata.org/wiki/Q127995","display_name":"Microwave","level":2,"score":0.17322975397109985},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.1690879464149475},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.09238749742507935},{"id":"https://openalex.org/C21822782","wikidata":"https://www.wikidata.org/wiki/Q131214","display_name":"Antenna (radio)","level":2,"score":0.06199696660041809},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.05329477787017822},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/bcicts54660.2023.10310853","is_oa":false,"landing_page_url":"https://doi.org/10.1109/bcicts54660.2023.10310853","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8100000023841858,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320332178","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1963756629","https://openalex.org/W1978903191","https://openalex.org/W1998340256","https://openalex.org/W2085005620","https://openalex.org/W2112123384","https://openalex.org/W2144056948","https://openalex.org/W2144402683","https://openalex.org/W2168854778","https://openalex.org/W2517653345","https://openalex.org/W2913560873","https://openalex.org/W2923788993","https://openalex.org/W3161852448","https://openalex.org/W3206914881","https://openalex.org/W4210255321"],"related_works":["https://openalex.org/W1546168252","https://openalex.org/W2137538751","https://openalex.org/W2135018839","https://openalex.org/W2119730587","https://openalex.org/W119953515","https://openalex.org/W2161201277","https://openalex.org/W2020649948","https://openalex.org/W2160800367","https://openalex.org/W2181528871","https://openalex.org/W2150954599"],"abstract_inverted_index":{"In":[0],"this":[1],"paper,":[2],"we":[3],"investigate":[4],"the":[5,47,55,60],"effect":[6],"of":[7],"two":[8],"calibration":[9,42,48,57],"errors,":[10],"probe":[11],"placement":[12],"and":[13,31,71,73],"capacitance":[14],"per":[15],"unit":[16],"length,":[17],"on":[18,27],"transistor":[19,69],"characterization,":[20],"from":[21],"220":[22],"GHz":[23],"to":[24,51],"325":[25],"GHz,":[26],"both":[28],"a":[29,37],"microstrip":[30,56],"an":[32],"inverted":[33],"coplanar":[34],"waveguide":[35],"with":[36],"via-stitched":[38],"ground":[39],"plane":[40],"(CPW-G)":[41],"kit.":[43],"We":[44],"find":[45],"that":[46],"errors":[49],"tend":[50],"be":[52],"greater":[53],"for":[54,59,68],"than":[58],"CPW-G":[61],"calibration.":[62],"These":[63],"findings":[64],"have":[65],"critical":[66],"ramifications":[67],"characterization":[70],"modelling,":[72],"active":[74],"circuit":[75],"design.":[76]},"counts_by_year":[{"year":2026,"cited_by_count":3},{"year":2025,"cited_by_count":6},{"year":2024,"cited_by_count":4}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}