{"id":"https://openalex.org/W3003622917","doi":"https://doi.org/10.1109/bcicts45179.2019.8972729","title":"Measurement based accurate definition of the SOA edges for SiGe HBTs","display_name":"Measurement based accurate definition of the SOA edges for SiGe HBTs","publication_year":2019,"publication_date":"2019-11-01","ids":{"openalex":"https://openalex.org/W3003622917","doi":"https://doi.org/10.1109/bcicts45179.2019.8972729","mag":"3003622917"},"language":"en","primary_location":{"id":"doi:10.1109/bcicts45179.2019.8972729","is_oa":false,"landing_page_url":"https://doi.org/10.1109/bcicts45179.2019.8972729","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE BiCMOS and Compound semiconductor Integrated Circuits and Technology Symposium (BCICTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5005011721","display_name":"Mathieu Jaoul","orcid":"https://orcid.org/0000-0003-4401-3199"},"institutions":[{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"Mathieu Jaoul","raw_affiliation_strings":["STMicroelectronics,Crolles,France,38926","STMicroelectronics, Crolles, France"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Crolles,France,38926","institution_ids":["https://openalex.org/I4210104693"]},{"raw_affiliation_string":"STMicroelectronics, Crolles, France","institution_ids":["https://openalex.org/I4210104693"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103826553","display_name":"Didier C\u00e9li","orcid":null},"institutions":[{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Didier C\u00e9li","raw_affiliation_strings":["STMicroelectronics,Crolles,France,38926","STMicroelectronics, Crolles, France"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Crolles,France,38926","institution_ids":["https://openalex.org/I4210104693"]},{"raw_affiliation_string":"STMicroelectronics, Crolles, France","institution_ids":["https://openalex.org/I4210104693"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088672720","display_name":"Cristell Maneux","orcid":"https://orcid.org/0000-0001-9125-5372"},"institutions":[{"id":"https://openalex.org/I15057530","display_name":"Universit\u00e9 de Bordeaux","ror":"https://ror.org/057qpr032","country_code":"FR","type":"education","lineage":["https://openalex.org/I15057530"]},{"id":"https://openalex.org/I4210157089","display_name":"Laboratoire de l'Int\u00e9gration du Mat\u00e9riau au Syst\u00e8me","ror":"https://ror.org/04nabhy78","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I15057530","https://openalex.org/I4210091158","https://openalex.org/I4210095849","https://openalex.org/I4210157089","https://openalex.org/I4210160189"]},{"id":"https://openalex.org/I4210160189","display_name":"Institut Polytechnique de Bordeaux","ror":"https://ror.org/054qv7y42","country_code":"FR","type":"education","lineage":["https://openalex.org/I4210160189"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Cristell Maneux","raw_affiliation_strings":["IMS, Université Bordeaux I,Talence,France,33405","IMS, Universit\u00e9 Bordeaux I, Talence, France"],"affiliations":[{"raw_affiliation_string":"IMS, Université Bordeaux I,Talence,France,33405","institution_ids":["https://openalex.org/I15057530","https://openalex.org/I4210160189"]},{"raw_affiliation_string":"IMS, Universit\u00e9 Bordeaux I, Talence, France","institution_ids":["https://openalex.org/I4210157089","https://openalex.org/I4210160189","https://openalex.org/I15057530"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5008160362","display_name":"Thomas Zimmer","orcid":"https://orcid.org/0000-0002-4311-0969"},"institutions":[{"id":"https://openalex.org/I15057530","display_name":"Universit\u00e9 de Bordeaux","ror":"https://ror.org/057qpr032","country_code":"FR","type":"education","lineage":["https://openalex.org/I15057530"]},{"id":"https://openalex.org/I4210157089","display_name":"Laboratoire de l'Int\u00e9gration du Mat\u00e9riau au Syst\u00e8me","ror":"https://ror.org/04nabhy78","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I15057530","https://openalex.org/I4210091158","https://openalex.org/I4210095849","https://openalex.org/I4210157089","https://openalex.org/I4210160189"]},{"id":"https://openalex.org/I4210160189","display_name":"Institut Polytechnique de Bordeaux","ror":"https://ror.org/054qv7y42","country_code":"FR","type":"education","lineage":["https://openalex.org/I4210160189"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Thomas Zimmer","raw_affiliation_strings":["IMS, Université Bordeaux I,Talence,France,33405","IMS, Universit\u00e9 Bordeaux I, Talence, France"],"affiliations":[{"raw_affiliation_string":"IMS, Université Bordeaux I,Talence,France,33405","institution_ids":["https://openalex.org/I15057530","https://openalex.org/I4210160189"]},{"raw_affiliation_string":"IMS, Universit\u00e9 Bordeaux I, Talence, France","institution_ids":["https://openalex.org/I4210157089","https://openalex.org/I4210160189","https://openalex.org/I15057530"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5005011721"],"corresponding_institution_ids":["https://openalex.org/I4210104693"],"apc_list":null,"apc_paid":null,"fwci":0.4769,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.66765385,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10022","display_name":"Semiconductor Quantum Structures and Devices","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/snapback","display_name":"Snapback","score":0.97707200050354},{"id":"https://openalex.org/keywords/bipolar-junction-transistor","display_name":"Bipolar junction transistor","score":0.7270547151565552},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5985051393508911},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.56419438123703},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5414978861808777},{"id":"https://openalex.org/keywords/heterojunction","display_name":"Heterojunction","score":0.5066002607345581},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4251425266265869},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.39224955439567566},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3017953336238861}],"concepts":[{"id":"https://openalex.org/C2779888857","wikidata":"https://www.wikidata.org/wiki/Q18378810","display_name":"Snapback","level":4,"score":0.97707200050354},{"id":"https://openalex.org/C23061349","wikidata":"https://www.wikidata.org/wiki/Q188946","display_name":"Bipolar junction transistor","level":4,"score":0.7270547151565552},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5985051393508911},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.56419438123703},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5414978861808777},{"id":"https://openalex.org/C79794668","wikidata":"https://www.wikidata.org/wiki/Q1616270","display_name":"Heterojunction","level":2,"score":0.5066002607345581},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4251425266265869},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.39224955439567566},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3017953336238861}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/bcicts45179.2019.8972729","is_oa":false,"landing_page_url":"https://doi.org/10.1109/bcicts45179.2019.8972729","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE BiCMOS and Compound semiconductor Integrated Circuits and Technology Symposium (BCICTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.7099999785423279,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W2010759697","https://openalex.org/W2016672873","https://openalex.org/W2035418552","https://openalex.org/W2078906619","https://openalex.org/W2098509168","https://openalex.org/W2104865388","https://openalex.org/W2112106914","https://openalex.org/W2149394329","https://openalex.org/W2345283220","https://openalex.org/W2515455751","https://openalex.org/W2532811417","https://openalex.org/W2901150876","https://openalex.org/W4238664186","https://openalex.org/W4255613587","https://openalex.org/W6670336823"],"related_works":["https://openalex.org/W2122929824","https://openalex.org/W1998651949","https://openalex.org/W2260348177","https://openalex.org/W2135466537","https://openalex.org/W2188164485","https://openalex.org/W1594412451","https://openalex.org/W2145366991","https://openalex.org/W3148300548","https://openalex.org/W4324123959","https://openalex.org/W2360526032"],"abstract_inverted_index":{"This":[0,48],"paper":[1],"presents":[2],"a":[3,31],"non-destructive":[4],"method":[5],"to":[6,19,85],"characterize":[7],"the":[8,20,24,39,65,74,77,89],"SiGe":[9],"HBTs":[10],"(heterojunction":[11],"bipolar":[12],"transistors)":[13],"at":[14,35],"very":[15],"high":[16,36],"currents/voltages,":[17],"close":[18,84],"functional":[21],"boundaries":[22],"of":[23,73],"transistor":[25,56],"operation.":[26],"Based":[27],"on":[28],"this":[29],"measurement,":[30],"focus":[32],"is":[33,42],"made":[34],"currents":[37],"where":[38],"snapback":[40,62],"behavior":[41],"observed":[43],"using":[44],"IC/VBE":[45],"measurement":[46],"setup.":[47],"analysis":[49],"has":[50,68],"been":[51,69],"carried":[52],"out":[53],"for":[54],"different":[55],"geometries.":[57],"The":[58],"first":[59],"and":[60,86],"second":[61,90],"locus":[63],"in":[64],"IC-VCB":[66],"characteristic":[67],"discussed.":[70],"A":[71],"comparison":[72],"measurements":[75],"with":[76],"HICUM":[78],"model":[79],"shows":[80],"accurate":[81],"simulation":[82],"results":[83],"even":[87],"beyond":[88],"flyback":[91],"locus.":[92]},"counts_by_year":[{"year":2023,"cited_by_count":2},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}