{"id":"https://openalex.org/W2902799894","doi":"https://doi.org/10.1109/bcicts.2018.8551125","title":"FinFET for mm Wave - Technology and Circuit Design Challenges","display_name":"FinFET for mm Wave - Technology and Circuit Design Challenges","publication_year":2018,"publication_date":"2018-10-01","ids":{"openalex":"https://openalex.org/W2902799894","doi":"https://doi.org/10.1109/bcicts.2018.8551125","mag":"2902799894"},"language":"en","primary_location":{"id":"doi:10.1109/bcicts.2018.8551125","is_oa":false,"landing_page_url":"https://doi.org/10.1109/bcicts.2018.8551125","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5059114871","display_name":"Steven Callender","orcid":"https://orcid.org/0000-0002-8121-673X"},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Steven Callender","raw_affiliation_strings":["Intel Corp., Hillsboro, USA"],"affiliations":[{"raw_affiliation_string":"Intel Corp., Hillsboro, USA","institution_ids":["https://openalex.org/I1343180700"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112401104","display_name":"Woorim Shin","orcid":null},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Woorim Shin","raw_affiliation_strings":["Intel Corp., Hillsboro, USA"],"affiliations":[{"raw_affiliation_string":"Intel Corp., Hillsboro, USA","institution_ids":["https://openalex.org/I1343180700"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109317133","display_name":"Hyung\u2010Jin Lee","orcid":null},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Hyung-Jin Lee","raw_affiliation_strings":["Intel Corp., Hillsboro, USA"],"affiliations":[{"raw_affiliation_string":"Intel Corp., Hillsboro, USA","institution_ids":["https://openalex.org/I1343180700"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065695022","display_name":"Stefano Pellerano","orcid":null},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Stefano Pellerano","raw_affiliation_strings":["Intel Corp., Hillsboro, USA"],"affiliations":[{"raw_affiliation_string":"Intel Corp., Hillsboro, USA","institution_ids":["https://openalex.org/I1343180700"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5087348289","display_name":"Christopher Hull","orcid":"https://orcid.org/0000-0002-8479-2062"},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Christopher Hull","raw_affiliation_strings":["Intel Corp., Hillsboro, USA"],"affiliations":[{"raw_affiliation_string":"Intel Corp., Hillsboro, USA","institution_ids":["https://openalex.org/I1343180700"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5059114871"],"corresponding_institution_ids":["https://openalex.org/I1343180700"],"apc_list":null,"apc_paid":null,"fwci":1.545,"has_fulltext":false,"cited_by_count":24,"citation_normalized_percentile":{"value":0.84329113,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"168","last_page":"173"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10262","display_name":"Microwave Engineering and Waveguides","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10936","display_name":"Millimeter-Wave Propagation and Modeling","score":0.9968000054359436,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6342378258705139},{"id":"https://openalex.org/keywords/extremely-high-frequency","display_name":"Extremely high frequency","score":0.5976826548576355},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5817220211029053},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5763061046600342},{"id":"https://openalex.org/keywords/key","display_name":"Key (lock)","score":0.5479200482368469},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5456268787384033},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4882502853870392},{"id":"https://openalex.org/keywords/node","display_name":"Node (physics)","score":0.45758169889450073},{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.45311886072158813},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.433823823928833},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.2654030919075012},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2411051094532013},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.09217023849487305}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6342378258705139},{"id":"https://openalex.org/C45764600","wikidata":"https://www.wikidata.org/wiki/Q570342","display_name":"Extremely high frequency","level":2,"score":0.5976826548576355},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5817220211029053},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5763061046600342},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.5479200482368469},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5456268787384033},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4882502853870392},{"id":"https://openalex.org/C62611344","wikidata":"https://www.wikidata.org/wiki/Q1062658","display_name":"Node (physics)","level":2,"score":0.45758169889450073},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.45311886072158813},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.433823823928833},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.2654030919075012},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2411051094532013},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.09217023849487305},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/bcicts.2018.8551125","is_oa":false,"landing_page_url":"https://doi.org/10.1109/bcicts.2018.8551125","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.8799999952316284,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320325259","display_name":"Indigenous and Northern Affairs Canada","ror":"https://ror.org/05pgxdd43"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1979428197","https://openalex.org/W2037915536","https://openalex.org/W2078556520","https://openalex.org/W2139269689","https://openalex.org/W2545107937","https://openalex.org/W2606511386","https://openalex.org/W2734616144","https://openalex.org/W2786278916","https://openalex.org/W2885353759","https://openalex.org/W2886648682","https://openalex.org/W6748061881"],"related_works":["https://openalex.org/W3014521742","https://openalex.org/W2617868873","https://openalex.org/W3204141294","https://openalex.org/W4386230336","https://openalex.org/W4306968100","https://openalex.org/W2171986175","https://openalex.org/W2089791793","https://openalex.org/W2038858740","https://openalex.org/W1491218245","https://openalex.org/W2562383580"],"abstract_inverted_index":{"As":[0],"next-generation":[1],"communication":[2],"systems":[3,103],"continue":[4],"to":[5,7,72,84],"push":[6],"higher":[8],"operating":[9],"frequencies,":[10],"one":[11],"thing":[12],"that":[13],"has":[14],"grown":[15],"more":[16],"uncertain":[17],"is":[18,23,32],"the":[19,43,60,69,91,98],"technology":[20],"node":[21],"which":[22,117],"most":[24],"suitable":[25],"for":[26,97],"implementing":[27],"these":[28,48],"systems.":[29],"FinFET":[30,65,95],"CMOS":[31],"a":[33,64,107],"viable":[34],"candidate,":[35],"offering":[36],"high-density":[37],"and":[38,67,82,110],"low-leakage":[39],"digital":[40],"transistors.":[41],"However,":[42],"millimeter-wave":[44],"(mmWave)":[45],"capabilities":[46],"of":[47,63,93,100],"devices":[49,96],"remain":[50],"relatively":[51],"unknown":[52],"by":[53,106],"many.":[54],"In":[55],"this":[56],"paper,":[57],"we":[58],"assess":[59],"mmWave":[61,73,102],"performance":[62],"process":[66,116],"discuss":[68],"key":[70],"challenges":[71],"design":[74,80,99],"in":[75,113],"deeply-scaled":[76],"technologies":[77],"along":[78],"with":[79],"techniques":[81],"insight":[83],"overcome":[85],"such":[86],"challenges.":[87],"We":[88],"also":[89],"demonstrate":[90],"suitability":[92],"modern":[94],"energy-efficient":[101],"as":[104],"demonstrated":[105],"75GHz":[108],"LNA":[109],"PA":[111],"implemented":[112],"Intel's":[114],"22FFL":[115],"achieve":[118],"state-of-art":[119],"performance.":[120]},"counts_by_year":[{"year":2024,"cited_by_count":7},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":6},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":4}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}