{"id":"https://openalex.org/W2902740177","doi":"https://doi.org/10.1109/bcicts.2018.8551045","title":"Analysis of Gate-Voltage Clipping Behavior on Class-F and Inverse Class-F Amplifiers","display_name":"Analysis of Gate-Voltage Clipping Behavior on Class-F and Inverse Class-F Amplifiers","publication_year":2018,"publication_date":"2018-10-01","ids":{"openalex":"https://openalex.org/W2902740177","doi":"https://doi.org/10.1109/bcicts.2018.8551045","mag":"2902740177"},"language":"en","primary_location":{"id":"doi:10.1109/bcicts.2018.8551045","is_oa":false,"landing_page_url":"https://doi.org/10.1109/bcicts.2018.8551045","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5002222866","display_name":"Hiroshi Yamamoto","orcid":"https://orcid.org/0000-0002-5686-5156"},"institutions":[{"id":"https://openalex.org/I4210166210","display_name":"Sumitomo Electric Industries (Japan)","ror":"https://ror.org/05rnkb382","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210166210"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Hiroshi Yamamoto","raw_affiliation_strings":["Transmission Devices Laboratory, Sumitomo Electric Industries, Ltd., Sakae-ku, Yokohama, Kanagawa, Japan"],"affiliations":[{"raw_affiliation_string":"Transmission Devices Laboratory, Sumitomo Electric Industries, Ltd., Sakae-ku, Yokohama, Kanagawa, Japan","institution_ids":["https://openalex.org/I4210166210"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5029878599","display_name":"Ken Kikuchi","orcid":"https://orcid.org/0000-0003-1205-4631"},"institutions":[{"id":"https://openalex.org/I4210166210","display_name":"Sumitomo Electric Industries (Japan)","ror":"https://ror.org/05rnkb382","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210166210"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Ken Kikuchi","raw_affiliation_strings":["Transmission Devices Laboratory, Sumitomo Electric Industries, Ltd., Sakae-ku, Yokohama, Kanagawa, Japan"],"affiliations":[{"raw_affiliation_string":"Transmission Devices Laboratory, Sumitomo Electric Industries, Ltd., Sakae-ku, Yokohama, Kanagawa, Japan","institution_ids":["https://openalex.org/I4210166210"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5036318571","display_name":"Norihiko Ui","orcid":null},"institutions":[{"id":"https://openalex.org/I4210166210","display_name":"Sumitomo Electric Industries (Japan)","ror":"https://ror.org/05rnkb382","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210166210"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Norihiko Ui","raw_affiliation_strings":["Transmission Devices Laboratory, Sumitomo Electric Industries, Ltd., Sakae-ku, Yokohama, Kanagawa, Japan"],"affiliations":[{"raw_affiliation_string":"Transmission Devices Laboratory, Sumitomo Electric Industries, Ltd., Sakae-ku, Yokohama, Kanagawa, Japan","institution_ids":["https://openalex.org/I4210166210"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109217497","display_name":"Kazutaka Inoue","orcid":null},"institutions":[{"id":"https://openalex.org/I4210166210","display_name":"Sumitomo Electric Industries (Japan)","ror":"https://ror.org/05rnkb382","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210166210"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kazutaka Inoue","raw_affiliation_strings":["Transmission Devices Laboratory, Sumitomo Electric Industries, Ltd., Sakae-ku, Yokohama, Kanagawa, Japan"],"affiliations":[{"raw_affiliation_string":"Transmission Devices Laboratory, Sumitomo Electric Industries, Ltd., Sakae-ku, Yokohama, Kanagawa, Japan","institution_ids":["https://openalex.org/I4210166210"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054524691","display_name":"Valeria Vadal\u00e0","orcid":"https://orcid.org/0000-0001-6423-8032"},"institutions":[{"id":"https://openalex.org/I4210166210","display_name":"Sumitomo Electric Industries (Japan)","ror":"https://ror.org/05rnkb382","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210166210"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Valeria Vadala","raw_affiliation_strings":["Transmission Devices Laboratory, Sumitomo Electric Industries, Ltd., Sakae-ku, Yokohama, Kanagawa, Japan"],"affiliations":[{"raw_affiliation_string":"Transmission Devices Laboratory, Sumitomo Electric Industries, Ltd., Sakae-ku, Yokohama, Kanagawa, Japan","institution_ids":["https://openalex.org/I4210166210"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019442446","display_name":"Gianni Bosi","orcid":"https://orcid.org/0000-0001-5315-5688"},"institutions":[{"id":"https://openalex.org/I4210166210","display_name":"Sumitomo Electric Industries (Japan)","ror":"https://ror.org/05rnkb382","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210166210"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Gianni Bosi","raw_affiliation_strings":["Transmission Devices Laboratory, Sumitomo Electric Industries, Ltd., Sakae-ku, Yokohama, Kanagawa, Japan"],"affiliations":[{"raw_affiliation_string":"Transmission Devices Laboratory, Sumitomo Electric Industries, Ltd., Sakae-ku, Yokohama, Kanagawa, Japan","institution_ids":["https://openalex.org/I4210166210"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008749649","display_name":"Antonio Raffo","orcid":"https://orcid.org/0000-0002-8228-6561"},"institutions":[{"id":"https://openalex.org/I4210166210","display_name":"Sumitomo Electric Industries (Japan)","ror":"https://ror.org/05rnkb382","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210166210"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Antonio Raffo","raw_affiliation_strings":["Transmission Devices Laboratory, Sumitomo Electric Industries, Ltd., Sakae-ku, Yokohama, Kanagawa, Japan"],"affiliations":[{"raw_affiliation_string":"Transmission Devices Laboratory, Sumitomo Electric Industries, Ltd., Sakae-ku, Yokohama, Kanagawa, Japan","institution_ids":["https://openalex.org/I4210166210"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5080358704","display_name":"G. Vannini","orcid":"https://orcid.org/0000-0002-9533-9693"},"institutions":[{"id":"https://openalex.org/I201324441","display_name":"University of Ferrara","ror":"https://ror.org/041zkgm14","country_code":"IT","type":"education","lineage":["https://openalex.org/I201324441"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Giorgio Vannini","raw_affiliation_strings":["Department of Engineering, University of Ferrara, Ferrara, Italy"],"affiliations":[{"raw_affiliation_string":"Department of Engineering, University of Ferrara, Ferrara, Italy","institution_ids":["https://openalex.org/I201324441"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5002222866"],"corresponding_institution_ids":["https://openalex.org/I4210166210"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.13017571,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"44","last_page":"47"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11248","display_name":"Advanced Power Amplifier Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11248","display_name":"Advanced Power Amplifier Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9969000220298767,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.5998113751411438},{"id":"https://openalex.org/keywords/inverse","display_name":"Inverse","score":0.5955235362052917},{"id":"https://openalex.org/keywords/clipping","display_name":"Clipping (morphology)","score":0.5458122491836548},{"id":"https://openalex.org/keywords/class","display_name":"Class (philosophy)","score":0.5239146947860718},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5099688768386841},{"id":"https://openalex.org/keywords/nonlinear-system","display_name":"Nonlinear system","score":0.4829637110233307},{"id":"https://openalex.org/keywords/diode","display_name":"Diode","score":0.4814535975456238},{"id":"https://openalex.org/keywords/limiting","display_name":"Limiting","score":0.47780829668045044},{"id":"https://openalex.org/keywords/high-electron-mobility-transistor","display_name":"High-electron-mobility transistor","score":0.4737226068973541},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.45298582315444946},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.441314160823822},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.42790257930755615},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.40336233377456665},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3522142171859741},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.2905159592628479},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.26948779821395874},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.24000975489616394},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.15012171864509583},{"id":"https://openalex.org/keywords/quantum-mechanics","display_name":"Quantum mechanics","score":0.13572260737419128},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.11719968914985657},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.10828229784965515}],"concepts":[{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.5998113751411438},{"id":"https://openalex.org/C207467116","wikidata":"https://www.wikidata.org/wiki/Q4385666","display_name":"Inverse","level":2,"score":0.5955235362052917},{"id":"https://openalex.org/C2776848632","wikidata":"https://www.wikidata.org/wiki/Q853463","display_name":"Clipping (morphology)","level":2,"score":0.5458122491836548},{"id":"https://openalex.org/C2777212361","wikidata":"https://www.wikidata.org/wiki/Q5127848","display_name":"Class (philosophy)","level":2,"score":0.5239146947860718},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5099688768386841},{"id":"https://openalex.org/C158622935","wikidata":"https://www.wikidata.org/wiki/Q660848","display_name":"Nonlinear system","level":2,"score":0.4829637110233307},{"id":"https://openalex.org/C78434282","wikidata":"https://www.wikidata.org/wiki/Q11656","display_name":"Diode","level":2,"score":0.4814535975456238},{"id":"https://openalex.org/C188198153","wikidata":"https://www.wikidata.org/wiki/Q1613840","display_name":"Limiting","level":2,"score":0.47780829668045044},{"id":"https://openalex.org/C162057924","wikidata":"https://www.wikidata.org/wiki/Q1617706","display_name":"High-electron-mobility transistor","level":4,"score":0.4737226068973541},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.45298582315444946},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.441314160823822},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.42790257930755615},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.40336233377456665},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3522142171859741},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.2905159592628479},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.26948779821395874},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24000975489616394},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.15012171864509583},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.13572260737419128},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.11719968914985657},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.10828229784965515},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/bcicts.2018.8551045","is_oa":false,"landing_page_url":"https://doi.org/10.1109/bcicts.2018.8551045","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS)","raw_type":"proceedings-article"},{"id":"pmh:oai:boa.unimib.it:10281/343334","is_oa":false,"landing_page_url":"http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=8536738","pdf_url":null,"source":{"id":"https://openalex.org/S4306401259","display_name":"BOA (University of Milano-Bicocca)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I66752286","host_organization_name":"University of Milano-Bicocca","host_organization_lineage":["https://openalex.org/I66752286"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/conferenceObject"},{"id":"pmh:oai:iris.unife.it:11392/2399763","is_oa":false,"landing_page_url":"http://hdl.handle.net/11392/2399763","pdf_url":null,"source":{"id":"https://openalex.org/S4306400369","display_name":"Institutional Research Information System University of Ferrara (University of Ferrara)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I201324441","host_organization_name":"University of Ferrara","host_organization_lineage":["https://openalex.org/I201324441"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.7300000190734863,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1518006379","https://openalex.org/W1596601344","https://openalex.org/W1983100466","https://openalex.org/W2078229187","https://openalex.org/W2104183221","https://openalex.org/W2110141406","https://openalex.org/W2123191477","https://openalex.org/W2129084477","https://openalex.org/W2204713957","https://openalex.org/W6675379286"],"related_works":["https://openalex.org/W2532810475","https://openalex.org/W1943995216","https://openalex.org/W1986136028","https://openalex.org/W2171730916","https://openalex.org/W2098291540","https://openalex.org/W1992369447","https://openalex.org/W2598293455","https://openalex.org/W2741440636","https://openalex.org/W4312082646","https://openalex.org/W2162684047"],"abstract_inverted_index":{"This":[0],"paper":[1],"describes":[2],"the":[3,45,55,63,71],"influence":[4],"of":[5,14],"gate-voltage":[6],"clipping":[7],"behavior":[8],"on":[9,80],"drain":[10],"efficiency":[11],"in":[12],"case":[13],"class-F":[15,18,49,66],"and":[16],"inverse":[17],"(F":[19],"<sup":[20,50],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[21,51],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">-1</sup>":[22,52],")":[23],"operations":[24],"under":[25],"saturated":[26],"regime.":[27],"Numerical":[28],"analysis":[29],"using":[30],"a":[31,39,81],"simplified":[32],"transistor":[33],"model":[34],"was":[35],"carried":[36,78],"out.":[37],"As":[38],"result,":[40],"we":[41],"have":[42],"demonstrated":[43],"that":[44],"limiting":[46],"factor":[47],"for":[48],"operation":[53],"is":[54,68],"gate-diode":[56],"conduction":[57],"rather":[58],"than":[59],"knee":[60,72],"voltage.":[61],"On":[62],"other":[64],"hand,":[65],"PA":[67],"restricted":[69],"by":[70],"voltage":[73],"effects.":[74],"Furthermore,":[75],"nonlinear":[76],"measurements":[77],"out":[79],"GaN":[82],"HEMT":[83],"support":[84],"our":[85],"analytical":[86],"results.":[87]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}