{"id":"https://openalex.org/W4408442711","doi":"https://doi.org/10.1109/ats64447.2024.10915395","title":"An FPGA-Based Emulation Platform for Functional Safety Verification in Automotive SoC Systems","display_name":"An FPGA-Based Emulation Platform for Functional Safety Verification in Automotive SoC Systems","publication_year":2024,"publication_date":"2024-12-17","ids":{"openalex":"https://openalex.org/W4408442711","doi":"https://doi.org/10.1109/ats64447.2024.10915395"},"language":"en","primary_location":{"id":"doi:10.1109/ats64447.2024.10915395","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ats64447.2024.10915395","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE 33rd Asian Test Symposium (ATS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100538103","display_name":"Yutao Sun","orcid":null},"institutions":[{"id":"https://openalex.org/I139759216","display_name":"Beijing University of Posts and Telecommunications","ror":"https://ror.org/04w9fbh59","country_code":"CN","type":"education","lineage":["https://openalex.org/I139759216"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yutao Sun","raw_affiliation_strings":["Beijing University of Posts and Telecommunications,School of Integrated Circuits,Beijing,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Beijing University of Posts and Telecommunications,School of Integrated Circuits,Beijing,China","institution_ids":["https://openalex.org/I139759216"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032989378","display_name":"Zhijun Wang","orcid":"https://orcid.org/0000-0002-0321-7884"},"institutions":[{"id":"https://openalex.org/I139759216","display_name":"Beijing University of Posts and Telecommunications","ror":"https://ror.org/04w9fbh59","country_code":"CN","type":"education","lineage":["https://openalex.org/I139759216"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhijun Wang","raw_affiliation_strings":["Beijing University of Posts and Telecommunications,School of Integrated Circuits,Beijing,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Beijing University of Posts and Telecommunications,School of Integrated Circuits,Beijing,China","institution_ids":["https://openalex.org/I139759216"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Zean Huang","orcid":null},"institutions":[{"id":"https://openalex.org/I139759216","display_name":"Beijing University of Posts and Telecommunications","ror":"https://ror.org/04w9fbh59","country_code":"CN","type":"education","lineage":["https://openalex.org/I139759216"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zean Huang","raw_affiliation_strings":["Beijing University of Posts and Telecommunications,School of Integrated Circuits,Beijing,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Beijing University of Posts and Telecommunications,School of Integrated Circuits,Beijing,China","institution_ids":["https://openalex.org/I139759216"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5086598535","display_name":"Liping Liang","orcid":"https://orcid.org/0009-0007-6809-2537"},"institutions":[{"id":"https://openalex.org/I139759216","display_name":"Beijing University of Posts and Telecommunications","ror":"https://ror.org/04w9fbh59","country_code":"CN","type":"education","lineage":["https://openalex.org/I139759216"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Liping Liang","raw_affiliation_strings":["Beijing University of Posts and Telecommunications,School of Integrated Circuits,Beijing,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Beijing University of Posts and Telecommunications,School of Integrated Circuits,Beijing,China","institution_ids":["https://openalex.org/I139759216"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I139759216"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.51797276,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T13295","display_name":"Safety Systems Engineering in Autonomy","score":0.9930999875068665,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T13295","display_name":"Safety Systems Engineering in Autonomy","score":0.9930999875068665,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12810","display_name":"Real-time simulation and control systems","score":0.988099992275238,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.986299991607666,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/emulation","display_name":"Emulation","score":0.8850075006484985},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.7213904857635498},{"id":"https://openalex.org/keywords/functional-safety","display_name":"Functional safety","score":0.7121104001998901},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6758425235748291},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.6638647317886353},{"id":"https://openalex.org/keywords/automotive-industry","display_name":"Automotive industry","score":0.5593001246452332},{"id":"https://openalex.org/keywords/system-on-a-chip","display_name":"System on a chip","score":0.5239161252975464},{"id":"https://openalex.org/keywords/hardware-emulation","display_name":"Hardware emulation","score":0.4745543599128723},{"id":"https://openalex.org/keywords/functional-verification","display_name":"Functional verification","score":0.4224978983402252},{"id":"https://openalex.org/keywords/formal-verification","display_name":"Formal verification","score":0.3762584924697876},{"id":"https://openalex.org/keywords/computer-architecture","display_name":"Computer architecture","score":0.3529689311981201},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1950535774230957},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.10665106773376465}],"concepts":[{"id":"https://openalex.org/C149810388","wikidata":"https://www.wikidata.org/wiki/Q5374873","display_name":"Emulation","level":2,"score":0.8850075006484985},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.7213904857635498},{"id":"https://openalex.org/C148493468","wikidata":"https://www.wikidata.org/wiki/Q2646951","display_name":"Functional safety","level":2,"score":0.7121104001998901},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6758425235748291},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.6638647317886353},{"id":"https://openalex.org/C526921623","wikidata":"https://www.wikidata.org/wiki/Q190117","display_name":"Automotive industry","level":2,"score":0.5593001246452332},{"id":"https://openalex.org/C118021083","wikidata":"https://www.wikidata.org/wiki/Q610398","display_name":"System on a chip","level":2,"score":0.5239161252975464},{"id":"https://openalex.org/C94115699","wikidata":"https://www.wikidata.org/wiki/Q5656406","display_name":"Hardware emulation","level":3,"score":0.4745543599128723},{"id":"https://openalex.org/C62460635","wikidata":"https://www.wikidata.org/wiki/Q5508853","display_name":"Functional verification","level":3,"score":0.4224978983402252},{"id":"https://openalex.org/C111498074","wikidata":"https://www.wikidata.org/wiki/Q173326","display_name":"Formal verification","level":2,"score":0.3762584924697876},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.3529689311981201},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1950535774230957},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.10665106773376465},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.0},{"id":"https://openalex.org/C50522688","wikidata":"https://www.wikidata.org/wiki/Q189833","display_name":"Economic growth","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ats64447.2024.10915395","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ats64447.2024.10915395","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE 33rd Asian Test Symposium (ATS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.6200000047683716,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W2570637191","https://openalex.org/W2604160225","https://openalex.org/W2802088203","https://openalex.org/W2971478958","https://openalex.org/W3196113442","https://openalex.org/W3206405179","https://openalex.org/W4289655774","https://openalex.org/W4312036047","https://openalex.org/W4379116037","https://openalex.org/W4388820901","https://openalex.org/W4388820920","https://openalex.org/W4396530065"],"related_works":["https://openalex.org/W3120172095","https://openalex.org/W2118572231","https://openalex.org/W2106507440","https://openalex.org/W2105593427","https://openalex.org/W2108860137","https://openalex.org/W3209085687","https://openalex.org/W2153955347","https://openalex.org/W2533078207","https://openalex.org/W1928822090","https://openalex.org/W4389429005"],"abstract_inverted_index":{"The":[0,44,90,117],"increasing":[1],"complexity":[2],"of":[3,11,47,87,94,127,160],"automotive":[4],"SoC":[5],"systems,":[6],"particularly":[7],"in":[8,50,158],"the":[9,62,102,144],"context":[10],"autonomous":[12],"vehicles,":[13],"demands":[14],"rigorous":[15],"functional":[16,54,132],"safety":[17,55,88,133],"verification":[18],"methods.":[19],"This":[20,73],"paper":[21],"proposes":[22],"a":[23,111,129],"novel":[24],"Functional":[25],"Safety":[26],"FPGA":[27,40,53,150],"Fault":[28],"Injection":[29],"Tool":[30],"(FSF-FIT)":[31],"which":[32],"builds":[33],"an":[34],"FPGA-based":[35],"emulation":[36],"platform":[37],"by":[38,142],"using":[39],"fault":[41,151],"injection":[42,152,161],"techniques.":[43],"core":[45],"innovation":[46],"FSFFIT":[48,95],"lies":[49],"its":[51],"comprehensive":[52],"evaluation":[56],"process,":[57],"targeting":[58],"specific":[59],"components":[60],"within":[61],"Design":[63],"Under":[64],"Test":[65],"(DUT),":[66],"down":[67],"to":[68],"individual":[69],"LUTs":[70],"or":[71],"registers.":[72],"detailed":[74],"approach":[75],"allows":[76],"for":[77],"accurate":[78],"reliability":[79],"level":[80],"(RL)":[81],"and":[82,92],"diagnostic":[83],"coverage":[84],"(DC)":[85],"assessments":[86],"mechanisms.":[89,116],"speed":[91],"accuracy":[93],"were":[96],"validated":[97],"through":[98],"experiments":[99],"conducted":[100],"on":[101,110],"XuanTie":[103],"C906":[104],"RISC-V":[105],"processor":[106],"as":[107,109],"well":[108],"multiplier":[112],"with":[113,125,146],"different":[114],"security":[115],"results":[118,145],"demonstrated":[119],"that":[120,126],"FSFFIT\u2019s":[121],"performance":[122],"is":[123,156],"consistent":[124],"SSIM,":[128],"certified":[130],"ISO26262-compliant":[131],"tool,":[134],"while":[135],"also":[136],"achieving":[137],"faster":[138],"execution":[139],"times.":[140],"Additionally,":[141],"comparing":[143],"some":[147],"state-of-the-art":[148],"(SOTA)":[149],"tools,":[153],"our":[154],"method":[155],"superior":[157],"terms":[159],"speed.":[162]},"counts_by_year":[],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}