{"id":"https://openalex.org/W4388820958","doi":"https://doi.org/10.1109/ats59501.2023.10317956","title":"Fault Diagnosis of Analog Circuits Based on Multi-Scale 1D Convolutional Neural Network","display_name":"Fault Diagnosis of Analog Circuits Based on Multi-Scale 1D Convolutional Neural Network","publication_year":2023,"publication_date":"2023-10-14","ids":{"openalex":"https://openalex.org/W4388820958","doi":"https://doi.org/10.1109/ats59501.2023.10317956"},"language":"en","primary_location":{"id":"doi:10.1109/ats59501.2023.10317956","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ats59501.2023.10317956","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE 32nd Asian Test Symposium (ATS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100333122","display_name":"Weiwei Wang","orcid":"https://orcid.org/0000-0001-8694-6179"},"institutions":[{"id":"https://openalex.org/I75390827","display_name":"Beijing University of Chemical Technology","ror":"https://ror.org/00df5yc52","country_code":"CN","type":"education","lineage":["https://openalex.org/I75390827"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Weiwei Wang","raw_affiliation_strings":["Beijing University of Chemical Technology,Beijing,China","Beijing University of Chemical Technology, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Beijing University of Chemical Technology,Beijing,China","institution_ids":["https://openalex.org/I75390827"]},{"raw_affiliation_string":"Beijing University of Chemical Technology, Beijing, China","institution_ids":["https://openalex.org/I75390827"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100736675","display_name":"Yongchao Zhang","orcid":"https://orcid.org/0000-0001-5892-3391"},"institutions":[{"id":"https://openalex.org/I75390827","display_name":"Beijing University of Chemical Technology","ror":"https://ror.org/00df5yc52","country_code":"CN","type":"education","lineage":["https://openalex.org/I75390827"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yongchao Zhang","raw_affiliation_strings":["Beijing University of Chemical Technology,Beijing,China","Beijing University of Chemical Technology, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Beijing University of Chemical Technology,Beijing,China","institution_ids":["https://openalex.org/I75390827"]},{"raw_affiliation_string":"Beijing University of Chemical Technology, Beijing, China","institution_ids":["https://openalex.org/I75390827"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101101633","display_name":"Feng You","orcid":null},"institutions":[{"id":"https://openalex.org/I75390827","display_name":"Beijing University of Chemical Technology","ror":"https://ror.org/00df5yc52","country_code":"CN","type":"education","lineage":["https://openalex.org/I75390827"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Feng You","raw_affiliation_strings":["Beijing University of Chemical Technology,Beijing,China","Beijing University of Chemical Technology, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Beijing University of Chemical Technology,Beijing,China","institution_ids":["https://openalex.org/I75390827"]},{"raw_affiliation_string":"Beijing University of Chemical Technology, Beijing, China","institution_ids":["https://openalex.org/I75390827"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5029368014","display_name":"Zhigang Yin","orcid":"https://orcid.org/0000-0002-1645-9524"},"institutions":[{"id":"https://openalex.org/I4210094879","display_name":"Shandong Institute of Automation","ror":"https://ror.org/00qdtba35","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210094879","https://openalex.org/I4210142748"]},{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhigang Yin","raw_affiliation_strings":["Institute of Automation, Chinese Academy of Sciences,Beijing,China","Institute of Automation, Chinese Academy of Sciences, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Institute of Automation, Chinese Academy of Sciences,Beijing,China","institution_ids":["https://openalex.org/I4210094879","https://openalex.org/I19820366"]},{"raw_affiliation_string":"Institute of Automation, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210094879","https://openalex.org/I19820366"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101524812","display_name":"Ruilian Zhao","orcid":"https://orcid.org/0000-0002-6024-4010"},"institutions":[{"id":"https://openalex.org/I75390827","display_name":"Beijing University of Chemical Technology","ror":"https://ror.org/00df5yc52","country_code":"CN","type":"education","lineage":["https://openalex.org/I75390827"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ruilian Zhao","raw_affiliation_strings":["Beijing University of Chemical Technology,Beijing,China","Beijing University of Chemical Technology, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Beijing University of Chemical Technology,Beijing,China","institution_ids":["https://openalex.org/I75390827"]},{"raw_affiliation_string":"Beijing University of Chemical Technology, Beijing, China","institution_ids":["https://openalex.org/I75390827"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5100333122"],"corresponding_institution_ids":["https://openalex.org/I75390827"],"apc_list":null,"apc_paid":null,"fwci":0.4011,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.61416679,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/analogue-electronics","display_name":"Analogue electronics","score":0.7840669751167297},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.7619644403457642},{"id":"https://openalex.org/keywords/convolutional-neural-network","display_name":"Convolutional neural network","score":0.7172616124153137},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.673417329788208},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6454049944877625},{"id":"https://openalex.org/keywords/stuck-at-fault","display_name":"Stuck-at fault","score":0.6417199373245239},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5922695994377136},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.5119917988777161},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.49732258915901184},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.48723259568214417},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.42137208580970764},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.41613471508026123},{"id":"https://openalex.org/keywords/fault-model","display_name":"Fault model","score":0.41117459535598755},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.36225438117980957},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.28465017676353455},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.27618521451950073},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.06871980428695679}],"concepts":[{"id":"https://openalex.org/C29074008","wikidata":"https://www.wikidata.org/wiki/Q174925","display_name":"Analogue electronics","level":3,"score":0.7840669751167297},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.7619644403457642},{"id":"https://openalex.org/C81363708","wikidata":"https://www.wikidata.org/wiki/Q17084460","display_name":"Convolutional neural network","level":2,"score":0.7172616124153137},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.673417329788208},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6454049944877625},{"id":"https://openalex.org/C13625343","wikidata":"https://www.wikidata.org/wiki/Q7627418","display_name":"Stuck-at fault","level":4,"score":0.6417199373245239},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5922695994377136},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.5119917988777161},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.49732258915901184},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.48723259568214417},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.42137208580970764},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.41613471508026123},{"id":"https://openalex.org/C167391956","wikidata":"https://www.wikidata.org/wiki/Q1401211","display_name":"Fault model","level":3,"score":0.41117459535598755},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.36225438117980957},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.28465017676353455},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.27618521451950073},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.06871980428695679},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ats59501.2023.10317956","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ats59501.2023.10317956","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE 32nd Asian Test Symposium (ATS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":27,"referenced_works":["https://openalex.org/W1093701151","https://openalex.org/W1149231055","https://openalex.org/W1536929369","https://openalex.org/W2002106843","https://openalex.org/W2029060048","https://openalex.org/W2090016705","https://openalex.org/W2097117768","https://openalex.org/W2171360905","https://openalex.org/W2277157401","https://openalex.org/W2324336313","https://openalex.org/W2559655401","https://openalex.org/W2571260886","https://openalex.org/W2612690371","https://openalex.org/W2752782242","https://openalex.org/W2763269460","https://openalex.org/W2789290713","https://openalex.org/W2890512926","https://openalex.org/W2929815085","https://openalex.org/W2984133648","https://openalex.org/W3000835335","https://openalex.org/W3002656377","https://openalex.org/W3040396712","https://openalex.org/W3104997747","https://openalex.org/W3116425192","https://openalex.org/W3120741450","https://openalex.org/W3158169218","https://openalex.org/W3162621823"],"related_works":["https://openalex.org/W4256030018","https://openalex.org/W2147400189","https://openalex.org/W2340957901","https://openalex.org/W3147038789","https://openalex.org/W1555400249","https://openalex.org/W2031110496","https://openalex.org/W2157154381","https://openalex.org/W2568949342","https://openalex.org/W4253743993","https://openalex.org/W1923485359"],"abstract_inverted_index":{"Analog":[0],"circuit":[1],"is":[2,18,73,123],"an":[3,34,79],"important":[4],"component":[5],"of":[6,15,82,89,163],"modern":[7],"electronic":[8],"systems.":[9],"However,":[10],"the":[11,58,66,69,86,98,131,167,171,188],"soft":[12,139],"fault":[13,36,70,90,111,132,140,164,172],"diagnosis":[14,37,71,133,141,165,173],"analog":[16,48,143,192],"circuits":[17],"challenging":[19],"due":[20],"to":[21,125],"their":[22],"large":[23],"parameter":[24],"variability":[25],"and":[26,61,75,92,104,120,170],"complex":[27],"internal":[28],"structure.":[29],"So,":[30],"this":[31],"paper":[32],"proposes":[33],"automatic":[35],"method":[38,159],"based":[39,77,175,186],"on":[40,78,110,148,176,187],"Multi-Scale":[41],"1D":[42],"Convolutional":[43],"Neural":[44],"Network":[45],"(MS-1D-CNN)":[46],"for":[47,142,191],"circuits.":[49,144,153,193],"Considering":[50],"that":[51,157,184],"faults":[52],"may":[53],"disappear":[54],"or":[55],"weaken":[56],"during":[57],"propagation":[59],"process":[60],"cannot":[62],"be":[63],"manifested":[64],"in":[65,130],"output":[67,189],"signals,":[68],"model":[72,174],"trained":[74],"constructed":[76],"optimum":[80],"set":[81],"test":[83,94,102],"points":[84,103,178],"with":[85],"maximum":[87],"degree":[88],"isolation":[91],"least":[93],"points.":[95],"Furthermore,":[96],"because":[97],"data":[99,179],"at":[100],"different":[101,108],"time":[105],"periods":[106],"have":[107],"influences":[109],"diagnosis,":[112],"a":[113,136],"mixed":[114],"attention":[115,122],"mechanism":[116],"combining":[117],"both":[118],"channel":[119],"spatial":[121],"adopted":[124],"extract":[126],"more":[127,137],"critical":[128],"information":[129],"model,":[134],"achieving":[135],"accurate":[138],"Experiments":[145],"are":[146],"conducted":[147],"four":[149],"widely":[150],"used":[151],"benchmark":[152],"The":[154],"results":[155],"show":[156],"our":[158],"has":[160,180],"higher":[161,181],"accuracy":[162,182],"than":[166,183],"existing":[168],"methods,":[169],"multi-test":[177],"solely":[185],"signals":[190]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}