{"id":"https://openalex.org/W3117370318","doi":"https://doi.org/10.1109/ats49688.2020.9301558","title":"Accurate Testing of Precision Voltage Reference by DC-AC Conversion","display_name":"Accurate Testing of Precision Voltage Reference by DC-AC Conversion","publication_year":2020,"publication_date":"2020-11-23","ids":{"openalex":"https://openalex.org/W3117370318","doi":"https://doi.org/10.1109/ats49688.2020.9301558","mag":"3117370318"},"language":"en","primary_location":{"id":"doi:10.1109/ats49688.2020.9301558","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ats49688.2020.9301558","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE 29th Asian Test Symposium (ATS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5006643454","display_name":"Keno Sato","orcid":null},"institutions":[{"id":"https://openalex.org/I162282272","display_name":"ROHM","ror":"https://ror.org/00vttj605","country_code":"JP","type":"company","lineage":["https://openalex.org/I162282272"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Keno Sato","raw_affiliation_strings":["ROHM Semiconductor, Mimato-Kita-Ku, Yokohama, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ROHM Semiconductor, Mimato-Kita-Ku, Yokohama, Japan","institution_ids":["https://openalex.org/I162282272"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001669942","display_name":"Takayuki Nakatani","orcid":null},"institutions":[{"id":"https://openalex.org/I165735259","display_name":"Gunma University","ror":"https://ror.org/046fm7598","country_code":"JP","type":"education","lineage":["https://openalex.org/I165735259"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takayuki Nakatani","raw_affiliation_strings":["Division of Electronics and Informatics, Faculty of Science and Technology, Gunma University, Kiryu, Gunma, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Division of Electronics and Informatics, Faculty of Science and Technology, Gunma University, Kiryu, Gunma, Japan","institution_ids":["https://openalex.org/I165735259"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5038817476","display_name":"Takashi Ishida","orcid":"https://orcid.org/0000-0002-1060-0777"},"institutions":[{"id":"https://openalex.org/I162282272","display_name":"ROHM","ror":"https://ror.org/00vttj605","country_code":"JP","type":"company","lineage":["https://openalex.org/I162282272"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takashi Ishida","raw_affiliation_strings":["ROHM Semiconductor, Mimato-Kita-Ku, Yokohama, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ROHM Semiconductor, Mimato-Kita-Ku, Yokohama, Japan","institution_ids":["https://openalex.org/I162282272"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5009609514","display_name":"Toshiyuki Okamoto","orcid":null},"institutions":[{"id":"https://openalex.org/I162282272","display_name":"ROHM","ror":"https://ror.org/00vttj605","country_code":"JP","type":"company","lineage":["https://openalex.org/I162282272"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Toshiyuki Okamoto","raw_affiliation_strings":["ROHM Semiconductor, Mimato-Kita-Ku, Yokohama, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ROHM Semiconductor, Mimato-Kita-Ku, Yokohama, Japan","institution_ids":["https://openalex.org/I162282272"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5026364305","display_name":"Tamotsu Ichikawa","orcid":null},"institutions":[{"id":"https://openalex.org/I162282272","display_name":"ROHM","ror":"https://ror.org/00vttj605","country_code":"JP","type":"company","lineage":["https://openalex.org/I162282272"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Tamotsu Ichikawa","raw_affiliation_strings":["ROHM Semiconductor, Mimato-Kita-Ku, Yokohama, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ROHM Semiconductor, Mimato-Kita-Ku, Yokohama, Japan","institution_ids":["https://openalex.org/I162282272"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080778719","display_name":"Anna Kuwana","orcid":null},"institutions":[{"id":"https://openalex.org/I165735259","display_name":"Gunma University","ror":"https://ror.org/046fm7598","country_code":"JP","type":"education","lineage":["https://openalex.org/I165735259"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Anna Kuwana","raw_affiliation_strings":["Division of Electronics and Informatics, Faculty of Science and Technology, Gunma University, Kiryu, Gunma, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Division of Electronics and Informatics, Faculty of Science and Technology, Gunma University, Kiryu, Gunma, Japan","institution_ids":["https://openalex.org/I165735259"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101930271","display_name":"Kazumi Hatayama","orcid":"https://orcid.org/0000-0001-8416-8609"},"institutions":[{"id":"https://openalex.org/I165735259","display_name":"Gunma University","ror":"https://ror.org/046fm7598","country_code":"JP","type":"education","lineage":["https://openalex.org/I165735259"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kazumi Hatayama","raw_affiliation_strings":["Division of Electronics and Informatics, Faculty of Science and Technology, Gunma University, Kiryu, Gunma, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Division of Electronics and Informatics, Faculty of Science and Technology, Gunma University, Kiryu, Gunma, Japan","institution_ids":["https://openalex.org/I165735259"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101691738","display_name":"Haruo Kobayashi","orcid":"https://orcid.org/0000-0002-0990-5522"},"institutions":[{"id":"https://openalex.org/I165735259","display_name":"Gunma University","ror":"https://ror.org/046fm7598","country_code":"JP","type":"education","lineage":["https://openalex.org/I165735259"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Haruo Kobayashi","raw_affiliation_strings":["Division of Electronics and Informatics, Faculty of Science and Technology, Gunma University, Kiryu, Gunma, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Division of Electronics and Informatics, Faculty of Science and Technology, Gunma University, Kiryu, Gunma, Japan","institution_ids":["https://openalex.org/I165735259"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":8,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.5203,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.66393443,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"2"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9969000220298767,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","score":0.984499990940094,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/repeatability","display_name":"Repeatability","score":0.8784854412078857},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.6125256419181824},{"id":"https://openalex.org/keywords/accuracy-and-precision","display_name":"Accuracy and precision","score":0.5799155235290527},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4959295690059662},{"id":"https://openalex.org/keywords/fast-fourier-transform","display_name":"Fast Fourier transform","score":0.4802030324935913},{"id":"https://openalex.org/keywords/voltage-reference","display_name":"Voltage reference","score":0.4277060031890869},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4151817858219147},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.25041037797927856},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.22313246130943298},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20460641384124756},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.19898462295532227},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.11461591720581055}],"concepts":[{"id":"https://openalex.org/C154020017","wikidata":"https://www.wikidata.org/wiki/Q520171","display_name":"Repeatability","level":2,"score":0.8784854412078857},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.6125256419181824},{"id":"https://openalex.org/C202799725","wikidata":"https://www.wikidata.org/wiki/Q272035","display_name":"Accuracy and precision","level":2,"score":0.5799155235290527},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4959295690059662},{"id":"https://openalex.org/C75172450","wikidata":"https://www.wikidata.org/wiki/Q623950","display_name":"Fast Fourier transform","level":2,"score":0.4802030324935913},{"id":"https://openalex.org/C44351266","wikidata":"https://www.wikidata.org/wiki/Q1465532","display_name":"Voltage reference","level":3,"score":0.4277060031890869},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4151817858219147},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.25041037797927856},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.22313246130943298},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20460641384124756},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.19898462295532227},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.11461591720581055}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ats49688.2020.9301558","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ats49688.2020.9301558","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE 29th Asian Test Symposium (ATS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6499999761581421,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W1564201208","https://openalex.org/W2981316053","https://openalex.org/W3147616483"],"related_works":["https://openalex.org/W4320035299","https://openalex.org/W3132513516","https://openalex.org/W2754788186","https://openalex.org/W1792214511","https://openalex.org/W2377183979","https://openalex.org/W1840158209","https://openalex.org/W4367339106","https://openalex.org/W2735263506","https://openalex.org/W4385525234","https://openalex.org/W2913371358"],"abstract_inverted_index":{"This":[0],"paper":[1],"describes":[2],"an":[3],"accurate":[4],"and":[5,18,25,35],"fast":[6],"testing":[7],"technique":[8],"for":[9],"a":[10],"precision":[11],"voltage":[12],"reference.":[13],"Our":[14],"proposed":[15],"DC-AC":[16],"conversion":[17],"FFT":[19],"spectrum":[20],"analysis":[21],"method":[22],"is":[23],"applied":[24],"its":[26],"experiment":[27],"results":[28],"show":[29],"that":[30],"measurement":[31,36],"accuracy":[32],"within":[33,39],"\u00b1100\u03bcV":[34],"variation":[37],"(repeatability)":[38],"\u00b110\u03bcV":[40],"are":[41],"feasible.":[42]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":3}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}