{"id":"https://openalex.org/W2121382970","doi":"https://doi.org/10.1109/ats.2003.1250863","title":"SAT-based algorithm of verification for port order fault","display_name":"SAT-based algorithm of verification for port order fault","publication_year":2003,"publication_date":"2003-01-01","ids":{"openalex":"https://openalex.org/W2121382970","doi":"https://doi.org/10.1109/ats.2003.1250863","mag":"2121382970"},"language":"en","primary_location":{"id":"doi:10.1109/ats.2003.1250863","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ats.2003.1250863","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 7th International Conference on Properties and Applications of Dielectric Materials (Cat No 03CH37417) ATS-03","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5111844906","display_name":"Ming Shao","orcid":null},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210090176","display_name":"Institute of Computing Technology","ror":"https://ror.org/0090r4d87","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210090176"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Ming Shao","raw_affiliation_strings":["CAS, Institute for Computing Technology, Beijing, China","Graduate School of Chinese Academy of Sciences, Beijing, China"],"affiliations":[{"raw_affiliation_string":"CAS, Institute for Computing Technology, Beijing, China","institution_ids":["https://openalex.org/I4210090176"]},{"raw_affiliation_string":"Graduate School of Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100620993","display_name":"Guanghui Li","orcid":"https://orcid.org/0000-0002-9214-3599"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210090176","display_name":"Institute of Computing Technology","ror":"https://ror.org/0090r4d87","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210090176"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Guanghui Li","raw_affiliation_strings":["CAS, Institute for Computing Technology, Beijing, China","Graduate School of Chinese Academy of Sciences, Beijing, China"],"affiliations":[{"raw_affiliation_string":"CAS, Institute for Computing Technology, Beijing, China","institution_ids":["https://openalex.org/I4210090176"]},{"raw_affiliation_string":"Graduate School of Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I19820366"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5107892598","display_name":"Xiaowei Li","orcid":"https://orcid.org/0009-0004-2060-7384"},"institutions":[{"id":"https://openalex.org/I4210090176","display_name":"Institute of Computing Technology","ror":"https://ror.org/0090r4d87","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210090176"]},{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaowei Li","raw_affiliation_strings":["CAS, Institute for Computing Technology, Beijing, China","Graduate School of Chinese Academy of Sciences, Beijing, China"],"affiliations":[{"raw_affiliation_string":"CAS, Institute for Computing Technology, Beijing, China","institution_ids":["https://openalex.org/I4210090176"]},{"raw_affiliation_string":"Graduate School of Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I19820366"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5111844906"],"corresponding_institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210090176"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.17876279,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"478","last_page":"481"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10142","display_name":"Formal Methods in Verification","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1703","display_name":"Computational Theory and Mathematics"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10904","display_name":"Embedded Systems Design Techniques","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7281602621078491},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.54713374376297},{"id":"https://openalex.org/keywords/boolean-satisfiability-problem","display_name":"Boolean satisfiability problem","score":0.5080676078796387},{"id":"https://openalex.org/keywords/formal-verification","display_name":"Formal verification","score":0.4960208833217621},{"id":"https://openalex.org/keywords/port","display_name":"Port (circuit theory)","score":0.4792375862598419},{"id":"https://openalex.org/keywords/state","display_name":"State (computer science)","score":0.4672887921333313},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.4555273652076721},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4521593451499939},{"id":"https://openalex.org/keywords/functional-verification","display_name":"Functional verification","score":0.41631409525871277},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.32794779539108276},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.29269838333129883},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.12485882639884949},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.11369463801383972}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7281602621078491},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.54713374376297},{"id":"https://openalex.org/C6943359","wikidata":"https://www.wikidata.org/wiki/Q875276","display_name":"Boolean satisfiability problem","level":2,"score":0.5080676078796387},{"id":"https://openalex.org/C111498074","wikidata":"https://www.wikidata.org/wiki/Q173326","display_name":"Formal verification","level":2,"score":0.4960208833217621},{"id":"https://openalex.org/C32802771","wikidata":"https://www.wikidata.org/wiki/Q2443617","display_name":"Port (circuit theory)","level":2,"score":0.4792375862598419},{"id":"https://openalex.org/C48103436","wikidata":"https://www.wikidata.org/wiki/Q599031","display_name":"State (computer science)","level":2,"score":0.4672887921333313},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.4555273652076721},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4521593451499939},{"id":"https://openalex.org/C62460635","wikidata":"https://www.wikidata.org/wiki/Q5508853","display_name":"Functional verification","level":3,"score":0.41631409525871277},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.32794779539108276},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.29269838333129883},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.12485882639884949},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.11369463801383972},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ats.2003.1250863","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ats.2003.1250863","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 7th International Conference on Properties and Applications of Dielectric Materials (Cat No 03CH37417) ATS-03","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1923495615","https://openalex.org/W2010880586","https://openalex.org/W2024148935","https://openalex.org/W2103697477","https://openalex.org/W2107662458","https://openalex.org/W2137958913","https://openalex.org/W2160444875","https://openalex.org/W6640050670","https://openalex.org/W6656308666","https://openalex.org/W6680514463"],"related_works":["https://openalex.org/W2019500818","https://openalex.org/W2360180534","https://openalex.org/W2127167802","https://openalex.org/W2109674123","https://openalex.org/W4256313551","https://openalex.org/W2165929878","https://openalex.org/W2146907344","https://openalex.org/W1840416799","https://openalex.org/W2604391196","https://openalex.org/W2545341068"],"abstract_inverted_index":{"In":[0],"verification":[1,32,41,52],"of":[2,21,51,58,62],"embedded":[3],"core-based":[4],"design,":[5],"the":[6,14,19,22,25,31,39],"port":[7],"order":[8],"fault":[9],"(POF)":[10],"model":[11],"focuses":[12],"on":[13],"errors":[15],"in":[16],"connections":[17],"between":[18],"ports":[20],"cores":[23],"and":[24,34,46],"surrounding":[26],"circuits,":[27],"thus":[28],"considerably":[29],"reduces":[30],"complexity":[33],"time.":[35],"This":[36],"paper":[37],"investigated":[38],"automatic":[40],"pattern":[42],"generation":[43],"for":[44,53],"POF":[45,54,64],"developed":[47],"an":[48],"effective":[49],"algorithm":[50],"using":[55],"SAT":[56,77],"instead":[57],"BDD.":[59],"The":[60],"problem":[61],"detecting":[63],"was":[65,70],"transformed":[66],"into":[67],"SAT,":[68],"which":[69],"efficiently":[71],"solved":[72],"by":[73],"a":[74],"state-of-the-art":[75],"efficient":[76],"solver.":[78]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}