{"id":"https://openalex.org/W2131776465","doi":"https://doi.org/10.1109/ats.2003.1250801","title":"An automatic circuit extractor for RTL verification","display_name":"An automatic circuit extractor for RTL verification","publication_year":2003,"publication_date":"2003-01-01","ids":{"openalex":"https://openalex.org/W2131776465","doi":"https://doi.org/10.1109/ats.2003.1250801","mag":"2131776465"},"language":"en","primary_location":{"id":"doi:10.1109/ats.2003.1250801","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ats.2003.1250801","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 7th International Conference on Properties and Applications of Dielectric Materials (Cat No 03CH37417) ATS-03","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101612110","display_name":"Tun Li","orcid":"https://orcid.org/0000-0001-7498-3909"},"institutions":[{"id":"https://openalex.org/I170215575","display_name":"National University of Defense Technology","ror":"https://ror.org/05d2yfz11","country_code":"CN","type":"education","lineage":["https://openalex.org/I170215575"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Tun Li","raw_affiliation_strings":["National University of Defense Technology, ChangSha, Hunan, China","National Univ. of Defense Technology, Hunan, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National University of Defense Technology, ChangSha, Hunan, China","institution_ids":["https://openalex.org/I170215575"]},{"raw_affiliation_string":"National Univ. of Defense Technology, Hunan, China","institution_ids":["https://openalex.org/I170215575"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5115592004","display_name":"Yang Guo","orcid":"https://orcid.org/0009-0005-6622-8483"},"institutions":[{"id":"https://openalex.org/I170215575","display_name":"National University of Defense Technology","ror":"https://ror.org/05d2yfz11","country_code":"CN","type":"education","lineage":["https://openalex.org/I170215575"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yang Guo","raw_affiliation_strings":["National University of Defense Technology, ChangSha, Hunan, China","National Univ. of Defense Technology, Hunan, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National University of Defense Technology, ChangSha, Hunan, China","institution_ids":["https://openalex.org/I170215575"]},{"raw_affiliation_string":"National Univ. of Defense Technology, Hunan, China","institution_ids":["https://openalex.org/I170215575"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5073968910","display_name":"Sikun Li","orcid":"https://orcid.org/0000-0001-9911-6748"},"institutions":[{"id":"https://openalex.org/I170215575","display_name":"National University of Defense Technology","ror":"https://ror.org/05d2yfz11","country_code":"CN","type":"education","lineage":["https://openalex.org/I170215575"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Sikun Li","raw_affiliation_strings":["National University of Defense Technology, ChangSha, Hunan, China","National Univ. of Defense Technology, Hunan, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National University of Defense Technology, ChangSha, Hunan, China","institution_ids":["https://openalex.org/I170215575"]},{"raw_affiliation_string":"National Univ. of Defense Technology, Hunan, China","institution_ids":["https://openalex.org/I170215575"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I170215575"],"apc_list":null,"apc_paid":null,"fwci":2.2363,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.87668767,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"154","last_page":"160"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.8145052194595337},{"id":"https://openalex.org/keywords/slicing","display_name":"Slicing","score":0.6281301379203796},{"id":"https://openalex.org/keywords/verilog","display_name":"Verilog","score":0.5889200568199158},{"id":"https://openalex.org/keywords/datapath","display_name":"Datapath","score":0.5331121683120728},{"id":"https://openalex.org/keywords/chaining","display_name":"Chaining","score":0.5156797170639038},{"id":"https://openalex.org/keywords/program-slicing","display_name":"Program slicing","score":0.462637335062027},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4221239984035492},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.42202281951904297},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.41241922974586487},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.36223238706588745},{"id":"https://openalex.org/keywords/computer-architecture","display_name":"Computer architecture","score":0.3406505584716797},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.29142534732818604},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.23246309161186218}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.8145052194595337},{"id":"https://openalex.org/C2776190703","wikidata":"https://www.wikidata.org/wiki/Q488148","display_name":"Slicing","level":2,"score":0.6281301379203796},{"id":"https://openalex.org/C2779030575","wikidata":"https://www.wikidata.org/wiki/Q827773","display_name":"Verilog","level":3,"score":0.5889200568199158},{"id":"https://openalex.org/C2781198647","wikidata":"https://www.wikidata.org/wiki/Q1633673","display_name":"Datapath","level":2,"score":0.5331121683120728},{"id":"https://openalex.org/C49020025","wikidata":"https://www.wikidata.org/wiki/Q1059099","display_name":"Chaining","level":2,"score":0.5156797170639038},{"id":"https://openalex.org/C91071405","wikidata":"https://www.wikidata.org/wiki/Q1413145","display_name":"Program slicing","level":3,"score":0.462637335062027},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4221239984035492},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.42202281951904297},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.41241922974586487},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.36223238706588745},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.3406505584716797},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.29142534732818604},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.23246309161186218},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0},{"id":"https://openalex.org/C542102704","wikidata":"https://www.wikidata.org/wiki/Q183257","display_name":"Psychotherapist","level":1,"score":0.0},{"id":"https://openalex.org/C136764020","wikidata":"https://www.wikidata.org/wiki/Q466","display_name":"World Wide Web","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ats.2003.1250801","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ats.2003.1250801","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 7th International Conference on Properties and Applications of Dielectric Materials (Cat No 03CH37417) ATS-03","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.4099999964237213,"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1485100803","https://openalex.org/W1559507652","https://openalex.org/W2002845925","https://openalex.org/W2009653580","https://openalex.org/W2022371756","https://openalex.org/W2107291559","https://openalex.org/W2108885461","https://openalex.org/W2125552249","https://openalex.org/W2151860141","https://openalex.org/W2161314693","https://openalex.org/W2252806406","https://openalex.org/W2293624369","https://openalex.org/W4233398708","https://openalex.org/W6682091976"],"related_works":["https://openalex.org/W2134982133","https://openalex.org/W1964336761","https://openalex.org/W2991905743","https://openalex.org/W2169437772","https://openalex.org/W4239953224","https://openalex.org/W2165685498","https://openalex.org/W4302024603","https://openalex.org/W2347708239","https://openalex.org/W2112395437","https://openalex.org/W2170816480"],"abstract_inverted_index":{"For":[0],"RTL":[1],"verification,":[2],"we":[3],"have":[4],"to":[5],"separate":[6],"the":[7,14,69,122,126],"control":[8],"and":[9,17,37,90,109],"datapath":[10],"parts":[11],"contained":[12],"in":[13],"whole":[15],"design,":[16],"apply":[18],"different":[19,23],"verification":[20],"techniques":[21],"for":[22,47,60],"parts.":[24],"This":[25],"paper":[26],"presents":[27],"a":[28,57,105,112],"new":[29],"circuit":[30,48],"extraction":[31,49],"method":[32,74],"using":[33],"program":[34,45],"slicing":[35,46],"technique,":[36],"develops":[38],"an":[39],"elegant":[40],"theoretical":[41],"basis":[42],"based":[43],"on":[44,118],"from":[50],"Verilog":[51,97],"description.":[52],"The":[53,99,115],"technique":[54,100],"can":[55],"obtain":[56],"chaining":[58],"slice":[59],"given":[61],"signals":[62],"of":[63,72,93,125],"interest.":[64],"Compared":[65],"with":[66,95,104],"related":[67],"researches,":[68],"main":[70],"advantages":[71],"our":[73],"include:":[75],"it":[76,80,87],"is":[77,88,91],"fine":[78],"grain;":[79],"has":[81,101],"no":[82],"HDL":[83],"coding":[84],"style":[85],"limitation;":[86],"precise":[89],"capable":[92],"dealing":[94],"various":[96],"constructions.":[98],"been":[102],"integrated":[103],"commercial":[106],"simulation":[107],"environment":[108],"incorporated":[110],"into":[111],"design":[113],"process.":[114],"experimental":[116],"results":[117],"practical":[119],"designs":[120],"show":[121],"significant":[123],"benefits":[124],"proposed":[127],"approach.":[128]},"counts_by_year":[{"year":2012,"cited_by_count":1}],"updated_date":"2026-06-26T08:34:08.712188","created_date":"2025-10-10T00:00:00"}