{"id":"https://openalex.org/W2056570055","doi":"https://doi.org/10.1109/ats.2003.1250792","title":"Efficiency analysis & safety assessment of automatic testing for safety-critical software [railway control","display_name":"Efficiency analysis & safety assessment of automatic testing for safety-critical software [railway control","publication_year":2003,"publication_date":"2003-01-01","ids":{"openalex":"https://openalex.org/W2056570055","doi":"https://doi.org/10.1109/ats.2003.1250792","mag":"2056570055"},"language":"en","primary_location":{"id":"doi:10.1109/ats.2003.1250792","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ats.2003.1250792","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 7th International Conference on Properties and Applications of Dielectric Materials (Cat No 03CH37417) ATS-03","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100931565","display_name":"Fangmei Wu","orcid":null},"institutions":[{"id":"https://openalex.org/I116953780","display_name":"Tongji University","ror":"https://ror.org/03rc6as71","country_code":"CN","type":"education","lineage":["https://openalex.org/I116953780"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Fangmei Wu","raw_affiliation_strings":["School of Electronics & Information Engineering, University of Tongji, Shanghai, China","[Sch. of Electron. & Information Eng., Tongji Univ., Shanghai, China]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronics & Information Engineering, University of Tongji, Shanghai, China","institution_ids":["https://openalex.org/I116953780"]},{"raw_affiliation_string":"[Sch. of Electron. & Information Eng., Tongji Univ., Shanghai, China]","institution_ids":["https://openalex.org/I116953780"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5037039912","display_name":"Lei Huang","orcid":"https://orcid.org/0000-0001-6187-8683"},"institutions":[{"id":"https://openalex.org/I116953780","display_name":"Tongji University","ror":"https://ror.org/03rc6as71","country_code":"CN","type":"education","lineage":["https://openalex.org/I116953780"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lei Huang","raw_affiliation_strings":["School of Electronics & Information Engineering, University of Tongji, Shanghai, China","[Sch. of Electron. & Information Eng., Tongji Univ., Shanghai, China]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronics & Information Engineering, University of Tongji, Shanghai, China","institution_ids":["https://openalex.org/I116953780"]},{"raw_affiliation_string":"[Sch. of Electron. & Information Eng., Tongji Univ., Shanghai, China]","institution_ids":["https://openalex.org/I116953780"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I116953780"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.14722222,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"30","issue":null,"first_page":"106","last_page":"109"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.996399998664856,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.996399998664856,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9837999939918518,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13295","display_name":"Safety Systems Engineering in Autonomy","score":0.958299994468689,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6242259740829468},{"id":"https://openalex.org/keywords/interlocking","display_name":"Interlocking","score":0.5864238739013672},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5616487264633179},{"id":"https://openalex.org/keywords/software-quality","display_name":"Software quality","score":0.5086067914962769},{"id":"https://openalex.org/keywords/functional-safety","display_name":"Functional safety","score":0.5060288310050964},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.4945542514324188},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.32551154494285583},{"id":"https://openalex.org/keywords/software-development","display_name":"Software development","score":0.21748030185699463},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.12341451644897461}],"concepts":[{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6242259740829468},{"id":"https://openalex.org/C2778844933","wikidata":"https://www.wikidata.org/wiki/Q630950","display_name":"Interlocking","level":2,"score":0.5864238739013672},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5616487264633179},{"id":"https://openalex.org/C117447612","wikidata":"https://www.wikidata.org/wiki/Q1412670","display_name":"Software quality","level":4,"score":0.5086067914962769},{"id":"https://openalex.org/C148493468","wikidata":"https://www.wikidata.org/wiki/Q2646951","display_name":"Functional safety","level":2,"score":0.5060288310050964},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.4945542514324188},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.32551154494285583},{"id":"https://openalex.org/C529173508","wikidata":"https://www.wikidata.org/wiki/Q638608","display_name":"Software development","level":3,"score":0.21748030185699463},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.12341451644897461}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ats.2003.1250792","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ats.2003.1250792","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 7th International Conference on Properties and Applications of Dielectric Materials (Cat No 03CH37417) ATS-03","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W1570153265","https://openalex.org/W2115939105","https://openalex.org/W2380764032","https://openalex.org/W6677450920","https://openalex.org/W7067630422"],"related_works":["https://openalex.org/W2287710223","https://openalex.org/W3094364298","https://openalex.org/W82714704","https://openalex.org/W1519020487","https://openalex.org/W2057735720","https://openalex.org/W2382583096","https://openalex.org/W147463599","https://openalex.org/W1835076629","https://openalex.org/W2206206066","https://openalex.org/W2557213213"],"abstract_inverted_index":{"In":[0],"order":[1],"to":[2,60],"ensure":[3],"the":[4,10,62],"quality":[5],"of":[6,12,23,34,64],"safety-critical":[7,65],"software":[8,46],"in":[9,49],"field":[11],"railway":[13,41],"safety":[14,18],"control":[15],"and":[16,20,32,37,55],"protection,":[17],"test":[19],"assessment":[21,38,63],"are":[22,47,58],"great":[24],"importance":[25],"besides":[26],"functional":[27],"test.":[28],"The":[29],"system":[30],"structure":[31],"application":[33],"a":[35],"testing":[36,53],"platform":[39],"for":[40],"computer":[42],"or":[43],"microprocessor":[44],"interlocking":[45],"described":[48],"this":[50],"paper.":[51],"Sufficient":[52],"data":[54],"its":[56],"analysis":[57],"presented":[59],"discuss":[61],"software.":[66]},"counts_by_year":[],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}