{"id":"https://openalex.org/W2026204333","doi":"https://doi.org/10.1109/ats.2003.1250784","title":"On estimation of fault efficiency for path delay faults","display_name":"On estimation of fault efficiency for path delay faults","publication_year":2003,"publication_date":"2003-01-01","ids":{"openalex":"https://openalex.org/W2026204333","doi":"https://doi.org/10.1109/ats.2003.1250784","mag":"2026204333"},"language":"en","primary_location":{"id":"doi:10.1109/ats.2003.1250784","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ats.2003.1250784","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 7th International Conference on Properties and Applications of Dielectric Materials (Cat No 03CH37417) ATS-03","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5111621008","display_name":"Fukunaga","orcid":null},"institutions":[{"id":"https://openalex.org/I207014233","display_name":"Kyushu Institute of Technology","ror":"https://ror.org/02278tr80","country_code":"JP","type":"education","lineage":["https://openalex.org/I207014233"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Fukunaga","raw_affiliation_strings":["Graduate School of Computer Science and System Engineering, Kyushu Institute of Technology, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Graduate School of Computer Science and System Engineering, Kyushu Institute of Technology, Japan","institution_ids":["https://openalex.org/I207014233"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5030770240","display_name":"Kajihara","orcid":null},"institutions":[{"id":"https://openalex.org/I207014233","display_name":"Kyushu Institute of Technology","ror":"https://ror.org/02278tr80","country_code":"JP","type":"education","lineage":["https://openalex.org/I207014233"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kajihara","raw_affiliation_strings":["Center for Microelectronics Systems, Kyushu Institute of Technology, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center for Microelectronics Systems, Kyushu Institute of Technology, Japan","institution_ids":["https://openalex.org/I207014233"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5096863971","display_name":"Takeoka","orcid":null},"institutions":[{"id":"https://openalex.org/I1283155146","display_name":"Panasonic (Japan)","ror":"https://ror.org/011tm7n37","country_code":"JP","type":"company","lineage":["https://openalex.org/I1283155146"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takeoka","raw_affiliation_strings":["Semiconductor Company, Matsushita Elecrric Indusrrial Company Limited, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Semiconductor Company, Matsushita Elecrric Indusrrial Company Limited, Japan","institution_ids":["https://openalex.org/I1283155146"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.2325,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.44179414,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"8","issue":null,"first_page":"64","last_page":"67"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.995199978351593,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/path","display_name":"Path (computing)","score":0.7462607622146606},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.7182544469833374},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.5715956687927246},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5400278568267822},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.5196846127510071},{"id":"https://openalex.org/keywords/fault-model","display_name":"Fault model","score":0.4529778063297272},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.4517943859100342},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.2262427806854248},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.13426616787910461}],"concepts":[{"id":"https://openalex.org/C2777735758","wikidata":"https://www.wikidata.org/wiki/Q817765","display_name":"Path (computing)","level":2,"score":0.7462607622146606},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.7182544469833374},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.5715956687927246},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5400278568267822},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5196846127510071},{"id":"https://openalex.org/C167391956","wikidata":"https://www.wikidata.org/wiki/Q1401211","display_name":"Fault model","level":3,"score":0.4529778063297272},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.4517943859100342},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.2262427806854248},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.13426616787910461},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ats.2003.1250784","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ats.2003.1250784","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 7th International Conference on Properties and Applications of Dielectric Materials (Cat No 03CH37417) ATS-03","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W13277579","https://openalex.org/W1583304273","https://openalex.org/W1595368737","https://openalex.org/W1605187320","https://openalex.org/W1761424569","https://openalex.org/W1929998202","https://openalex.org/W2115510193","https://openalex.org/W2119130057","https://openalex.org/W2120212733","https://openalex.org/W2135802341","https://openalex.org/W2138797245","https://openalex.org/W2169138657","https://openalex.org/W3140154188","https://openalex.org/W3142912239","https://openalex.org/W6600530048","https://openalex.org/W6640122991"],"related_works":["https://openalex.org/W4256030018","https://openalex.org/W2147400189","https://openalex.org/W2340957901","https://openalex.org/W2568949342","https://openalex.org/W1555400249","https://openalex.org/W2031110496","https://openalex.org/W2157154381","https://openalex.org/W433800193","https://openalex.org/W3147038789","https://openalex.org/W4253743993"],"abstract_inverted_index":{"In":[0,20],"this":[1],"paper,":[2],"we":[3,48],"propose":[4],"a":[5,68,120],"method":[6,75,86,109],"to":[7,62,76],"estimate":[8,88,112],"fault":[9,23,25,51,55,65,101,113],"efficiency":[10,52,66,114],"for":[11],"path":[12,18,21,97],"delay":[13,22],"faults":[14],"based":[15,94],"on":[16,95],"untestable":[17,45,81,92,96],"analysis.":[19],"testing,":[24],"coverage":[26],"of":[27,41,80,91,115],"test":[28,117],"patterns":[29,118],"is":[30,59,73],"usually,":[31],"very":[32],"low,":[33],"because":[34,71],"logic":[35],"circuits":[36],"often":[37],"have":[38],"huge":[39],"number":[40,79,90],"paths":[42,82,93],"including":[43],"many":[44],"paths.":[46],"Hence":[47],"should":[49],"compute":[50,63,77,100],"rather":[53],"than":[54],"coverage,":[56],"but":[57],"it":[58],"too":[60],"difficult":[61],"exact":[64],"in":[67,119],"short":[69],"time,":[70],"there":[72],"no":[74],"total":[78],"quickly.":[83],"The":[84],"proposed":[85,108],"statistically":[87],"the":[89,107],"analysis,":[98],"and":[99],"efficiency.":[102],"Experimental":[103],"results":[104],"show":[105],"that":[106],"can":[110],"accurately":[111],"given":[116],"reasonable":[121],"time.":[122]},"counts_by_year":[{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}