{"id":"https://openalex.org/W2116367041","doi":"https://doi.org/10.1109/ats.2003.1250779","title":"Exhaustive test of several dependable memory architectures designed by GRAAL tool","display_name":"Exhaustive test of several dependable memory architectures designed by GRAAL tool","publication_year":2003,"publication_date":"2003-01-01","ids":{"openalex":"https://openalex.org/W2116367041","doi":"https://doi.org/10.1109/ats.2003.1250779","mag":"2116367041"},"language":"en","primary_location":{"id":"doi:10.1109/ats.2003.1250779","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ats.2003.1250779","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 7th International Conference on Properties and Applications of Dielectric Materials (Cat No 03CH37417) ATS-03","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5048068895","display_name":"Bertuccelli","orcid":null},"institutions":[{"id":"https://openalex.org/I108290504","display_name":"University of Pisa","ror":"https://ror.org/03ad39j10","country_code":"IT","type":"education","lineage":["https://openalex.org/I108290504"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"Bertuccelli","raw_affiliation_strings":["Aurelia Microelettronica SpA, Navacchio, Italy","Dip. di Ingegneria dellInformazione, Universit\u00e0 di Pisa, Pisa, Italy"],"affiliations":[{"raw_affiliation_string":"Aurelia Microelettronica SpA, Navacchio, Italy","institution_ids":[]},{"raw_affiliation_string":"Dip. di Ingegneria dellInformazione, Universit\u00e0 di Pisa, Pisa, Italy","institution_ids":["https://openalex.org/I108290504"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5107504456","display_name":"Bigongiari","orcid":null},"institutions":[{"id":"https://openalex.org/I108290504","display_name":"University of Pisa","ror":"https://ror.org/03ad39j10","country_code":"IT","type":"education","lineage":["https://openalex.org/I108290504"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Bigongiari","raw_affiliation_strings":["Aurelia Microelettronica SpA, Navacchio, Italy","Dip. di Ingegneria dellInformazione, Universit\u00e0 di Pisa, Pisa, Italy"],"affiliations":[{"raw_affiliation_string":"Aurelia Microelettronica SpA, Navacchio, Italy","institution_ids":[]},{"raw_affiliation_string":"Dip. di Ingegneria dellInformazione, Universit\u00e0 di Pisa, Pisa, Italy","institution_ids":["https://openalex.org/I108290504"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5098329770","display_name":"Brogna","orcid":null},"institutions":[{"id":"https://openalex.org/I108290504","display_name":"University of Pisa","ror":"https://ror.org/03ad39j10","country_code":"IT","type":"education","lineage":["https://openalex.org/I108290504"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Brogna","raw_affiliation_strings":["Aurelia Microelettronica SpA, Navacchio, Italy","Dip. di Ingegneria dellInformazione, Universit\u00e0 di Pisa, Pisa, Italy"],"affiliations":[{"raw_affiliation_string":"Aurelia Microelettronica SpA, Navacchio, Italy","institution_ids":[]},{"raw_affiliation_string":"Dip. di Ingegneria dellInformazione, Universit\u00e0 di Pisa, Pisa, Italy","institution_ids":["https://openalex.org/I108290504"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056170822","display_name":"Corrado Di Natale","orcid":"https://orcid.org/0000-0002-0543-4348"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Polytechnic University of Turin","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Di Natale","raw_affiliation_strings":["Dip. di Automatica e Informatica, Politecnico di Turino, Torino, Italy"],"affiliations":[{"raw_affiliation_string":"Dip. di Automatica e Informatica, Politecnico di Turino, Torino, Italy","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5030763022","display_name":"Prinetto","orcid":null},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Polytechnic University of Turin","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Prinetto","raw_affiliation_strings":["Dip. di Automatica e Informatica, Politecnico di Turino, Torino, Italy"],"affiliations":[{"raw_affiliation_string":"Dip. di Automatica e Informatica, Politecnico di Turino, Torino, Italy","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5076824578","display_name":"Roberto Saletti","orcid":"https://orcid.org/0000-0001-9594-3535"},"institutions":[{"id":"https://openalex.org/I108290504","display_name":"University of Pisa","ror":"https://ror.org/03ad39j10","country_code":"IT","type":"education","lineage":["https://openalex.org/I108290504"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Saletti","raw_affiliation_strings":["Dip. di Ingegneria dellInformazione, Universit\u00e0 di Pisa, Pisa, Italy"],"affiliations":[{"raw_affiliation_string":"Dip. di Ingegneria dellInformazione, Universit\u00e0 di Pisa, Pisa, Italy","institution_ids":["https://openalex.org/I108290504"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5048068895"],"corresponding_institution_ids":["https://openalex.org/I108290504"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.17057964,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"32","last_page":"35"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7932655215263367},{"id":"https://openalex.org/keywords/novelty","display_name":"Novelty","score":0.7199832797050476},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5594103932380676},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.5541067123413086},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.5168469548225403},{"id":"https://openalex.org/keywords/memory-test","display_name":"Memory test","score":0.46640530228614807},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.4511890709400177},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4478262662887573},{"id":"https://openalex.org/keywords/measure","display_name":"Measure (data warehouse)","score":0.4282238483428955},{"id":"https://openalex.org/keywords/architecture","display_name":"Architecture","score":0.4187619090080261},{"id":"https://openalex.org/keywords/database","display_name":"Database","score":0.06696879863739014}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7932655215263367},{"id":"https://openalex.org/C2778738651","wikidata":"https://www.wikidata.org/wiki/Q16546687","display_name":"Novelty","level":2,"score":0.7199832797050476},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5594103932380676},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.5541067123413086},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.5168469548225403},{"id":"https://openalex.org/C3017990537","wikidata":"https://www.wikidata.org/wiki/Q6815759","display_name":"Memory test","level":3,"score":0.46640530228614807},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.4511890709400177},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4478262662887573},{"id":"https://openalex.org/C2780009758","wikidata":"https://www.wikidata.org/wiki/Q6804172","display_name":"Measure (data warehouse)","level":2,"score":0.4282238483428955},{"id":"https://openalex.org/C123657996","wikidata":"https://www.wikidata.org/wiki/Q12271","display_name":"Architecture","level":2,"score":0.4187619090080261},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.06696879863739014},{"id":"https://openalex.org/C153349607","wikidata":"https://www.wikidata.org/wiki/Q36649","display_name":"Visual arts","level":1,"score":0.0},{"id":"https://openalex.org/C169760540","wikidata":"https://www.wikidata.org/wiki/Q207011","display_name":"Neuroscience","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C27206212","wikidata":"https://www.wikidata.org/wiki/Q34178","display_name":"Theology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C169900460","wikidata":"https://www.wikidata.org/wiki/Q2200417","display_name":"Cognition","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/ats.2003.1250779","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ats.2003.1250779","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 7th International Conference on Properties and Applications of Dielectric Materials (Cat No 03CH37417) ATS-03","raw_type":"proceedings-article"},{"id":"pmh:oai:arpi.unipi.it:11568/81046","is_oa":false,"landing_page_url":"http://hdl.handle.net/11568/81046","pdf_url":null,"source":{"id":"https://openalex.org/S4377196265","display_name":"CINECA IRIS Institutial research information system (University of Pisa)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I108290504","host_organization_name":"University of Pisa","host_organization_lineage":["https://openalex.org/I108290504"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":2,"referenced_works":["https://openalex.org/W1898929737","https://openalex.org/W1966576605"],"related_works":["https://openalex.org/W2381242807","https://openalex.org/W3126131230","https://openalex.org/W2347541121","https://openalex.org/W4288804799","https://openalex.org/W2080951048","https://openalex.org/W3089617106","https://openalex.org/W3032237421","https://openalex.org/W2390346111","https://openalex.org/W3011883280","https://openalex.org/W2369082698"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,23,57,67,80,104,109,122],"customizable":[4],"injection":[5],"fault":[6,94,97],"system":[7,82,86],"and":[8,28,36,40,51,71,96,121,127,142],"performance":[9],"evaluations":[10],"of":[11,26,38,93,114],"dependable":[12,59],"memory":[13,60,77,116],"collars":[14],"designed":[15],"by":[16],"GRAAL":[17,39,119],"tool.":[18],"The":[19,85,99],"novelty":[20],"consists":[21],"in":[22,54,79,103],"large":[24],"number":[25],"tests":[27],"architecture":[29,49],"comparisons":[30],"which":[31,118],"can":[32],"demonstrate":[33],"the":[34,44,48,76,91,140,146],"efficiency":[35],"validity":[37],"how":[41],"it":[42],"helps":[43],"designer":[45],"to":[46,89,125],"experiment":[47],"sensitivity":[50],"evaluate":[52],"changes":[53],"performances":[55],"when":[56],"particular":[58],"collar":[61],"is":[62,83,101],"chosen":[63],"or":[64],"bypassed.":[65],"Moreover,":[66],"complete":[68],"test":[69,106],"set-tip":[70],"real":[72],"case":[73],"study":[74],"where":[75,111],"interacts":[78],"complex":[81],"described":[84],"collects":[87],"information":[88],"measure":[90],"effects":[92],"detection":[95],"tolerance.":[98],"hardware":[100],"assembled":[102],"configurable":[105],"board":[107],"with":[108],"FPGA":[110],"are":[112],"one":[113],"several":[115],"wrapper":[117],"generates":[120],"serial":[123],"link":[124],"receive":[126],"send":[128],"data":[129,144],"from":[130,145],"an":[131],"acquisition":[132],"system.":[133],"Two":[134],"commercial":[135],"Personal":[136],"Computers":[137],"interact":[138],"thought":[139],"boards":[141],"collect":[143],"experiment.":[147]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}