{"id":"https://openalex.org/W3082782712","doi":"https://doi.org/10.1109/async49171.2020.00020","title":"Radiation Hardened Click Controllers for Soft Error Resilient Asynchronous Architectures","display_name":"Radiation Hardened Click Controllers for Soft Error Resilient Asynchronous Architectures","publication_year":2020,"publication_date":"2020-05-01","ids":{"openalex":"https://openalex.org/W3082782712","doi":"https://doi.org/10.1109/async49171.2020.00020","mag":"3082782712"},"language":"en","primary_location":{"id":"doi:10.1109/async49171.2020.00020","is_oa":false,"landing_page_url":"https://doi.org/10.1109/async49171.2020.00020","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 26th IEEE International Symposium on Asynchronous Circuits and Systems (ASYNC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5007948704","display_name":"Felipe A. Kuentzer","orcid":"https://orcid.org/0000-0003-3177-372X"},"institutions":[{"id":"https://openalex.org/I92894754","display_name":"Leibniz Institute for High Performance Microelectronics","ror":"https://ror.org/0489gab80","country_code":"DE","type":"facility","lineage":["https://openalex.org/I315704651","https://openalex.org/I92894754"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Felipe A. Kuentzer","raw_affiliation_strings":["IHP - Leibniz-Institut f\u00fcr innovative Mikroelektronik"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IHP - Leibniz-Institut f\u00fcr innovative Mikroelektronik","institution_ids":["https://openalex.org/I92894754"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071934521","display_name":"Moises Herrera","orcid":null},"institutions":[{"id":"https://openalex.org/I1174212","display_name":"University of Southern California","ror":"https://ror.org/03taz7m60","country_code":"US","type":"education","lineage":["https://openalex.org/I1174212"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Moises Herrera","raw_affiliation_strings":["Ming Hsieh Dept. of Electrical and Computer Engineering, University of Southern California"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Ming Hsieh Dept. of Electrical and Computer Engineering, University of Southern California","institution_ids":["https://openalex.org/I1174212"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041968870","display_name":"Oliver Schrape","orcid":"https://orcid.org/0000-0002-3513-3239"},"institutions":[{"id":"https://openalex.org/I92894754","display_name":"Leibniz Institute for High Performance Microelectronics","ror":"https://ror.org/0489gab80","country_code":"DE","type":"facility","lineage":["https://openalex.org/I315704651","https://openalex.org/I92894754"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Oliver Schrape","raw_affiliation_strings":["IHP - Leibniz-Institut f\u00fcr innovative Mikroelektronik"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IHP - Leibniz-Institut f\u00fcr innovative Mikroelektronik","institution_ids":["https://openalex.org/I92894754"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084205024","display_name":"Peter A. Beerel","orcid":"https://orcid.org/0000-0002-8283-0168"},"institutions":[{"id":"https://openalex.org/I1174212","display_name":"University of Southern California","ror":"https://ror.org/03taz7m60","country_code":"US","type":"education","lineage":["https://openalex.org/I1174212"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Peter A. Beerel","raw_affiliation_strings":["Ming Hsieh Dept. of Electrical and Computer Engineering, University of Southern California"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Ming Hsieh Dept. of Electrical and Computer Engineering, University of Southern California","institution_ids":["https://openalex.org/I1174212"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5004959402","display_name":"Milo\u0161 Krsti\u0107","orcid":"https://orcid.org/0000-0003-0267-0203"},"institutions":[{"id":"https://openalex.org/I92894754","display_name":"Leibniz Institute for High Performance Microelectronics","ror":"https://ror.org/0489gab80","country_code":"DE","type":"facility","lineage":["https://openalex.org/I315704651","https://openalex.org/I92894754"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Milos Krstic","raw_affiliation_strings":["IHP - Leibniz-Institut f\u00fcr innovative Mikroelektronik"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IHP - Leibniz-Institut f\u00fcr innovative Mikroelektronik","institution_ids":["https://openalex.org/I92894754"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.9085,"has_fulltext":false,"cited_by_count":11,"citation_normalized_percentile":{"value":0.74241253,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":93,"max":97},"biblio":{"volume":"37 9","issue":null,"first_page":"78","last_page":"85"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9944000244140625,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10018","display_name":"Advancements in Battery Materials","score":0.9909999966621399,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/asynchronous-communication","display_name":"Asynchronous communication","score":0.7885385155677795},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7548781037330627},{"id":"https://openalex.org/keywords/triple-modular-redundancy","display_name":"Triple modular redundancy","score":0.7153317332267761},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.686757504940033},{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.5897486805915833},{"id":"https://openalex.org/keywords/correctness","display_name":"Correctness","score":0.5652319192886353},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.49892258644104004},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.4844793975353241},{"id":"https://openalex.org/keywords/modular-design","display_name":"Modular design","score":0.4696813225746155},{"id":"https://openalex.org/keywords/asynchronous-system","display_name":"Asynchronous system","score":0.4432622194290161},{"id":"https://openalex.org/keywords/error-detection-and-correction","display_name":"Error detection and correction","score":0.44155848026275635},{"id":"https://openalex.org/keywords/computer-architecture","display_name":"Computer architecture","score":0.36283934116363525},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.2690352201461792},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.21212586760520935},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.14975416660308838},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.14080560207366943},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.0870848298072815}],"concepts":[{"id":"https://openalex.org/C151319957","wikidata":"https://www.wikidata.org/wiki/Q752739","display_name":"Asynchronous communication","level":2,"score":0.7885385155677795},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7548781037330627},{"id":"https://openalex.org/C196371267","wikidata":"https://www.wikidata.org/wiki/Q3998979","display_name":"Triple modular redundancy","level":3,"score":0.7153317332267761},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.686757504940033},{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.5897486805915833},{"id":"https://openalex.org/C55439883","wikidata":"https://www.wikidata.org/wiki/Q360812","display_name":"Correctness","level":2,"score":0.5652319192886353},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.49892258644104004},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.4844793975353241},{"id":"https://openalex.org/C101468663","wikidata":"https://www.wikidata.org/wiki/Q1620158","display_name":"Modular design","level":2,"score":0.4696813225746155},{"id":"https://openalex.org/C7923308","wikidata":"https://www.wikidata.org/wiki/Q4812211","display_name":"Asynchronous system","level":5,"score":0.4432622194290161},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.44155848026275635},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.36283934116363525},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.2690352201461792},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.21212586760520935},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.14975416660308838},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.14080560207366943},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0870848298072815},{"id":"https://openalex.org/C134652429","wikidata":"https://www.wikidata.org/wiki/Q1052698","display_name":"Jitter","level":2,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C137059387","wikidata":"https://www.wikidata.org/wiki/Q426882","display_name":"Clock signal","level":3,"score":0.0},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.0},{"id":"https://openalex.org/C42196554","wikidata":"https://www.wikidata.org/wiki/Q1186179","display_name":"Synchronous circuit","level":4,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/async49171.2020.00020","is_oa":false,"landing_page_url":"https://doi.org/10.1109/async49171.2020.00020","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 26th IEEE International Symposium on Asynchronous Circuits and Systems (ASYNC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.6899999976158142}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":40,"referenced_works":["https://openalex.org/W232434517","https://openalex.org/W658677875","https://openalex.org/W1546526482","https://openalex.org/W1552659583","https://openalex.org/W1559109967","https://openalex.org/W2033045135","https://openalex.org/W2061566868","https://openalex.org/W2071068906","https://openalex.org/W2071377372","https://openalex.org/W2071429830","https://openalex.org/W2092870227","https://openalex.org/W2104677471","https://openalex.org/W2120185818","https://openalex.org/W2121865804","https://openalex.org/W2122995125","https://openalex.org/W2131558934","https://openalex.org/W2132529273","https://openalex.org/W2150314175","https://openalex.org/W2151830106","https://openalex.org/W2153953229","https://openalex.org/W2160639967","https://openalex.org/W2162318113","https://openalex.org/W2164476036","https://openalex.org/W2166752839","https://openalex.org/W2167931908","https://openalex.org/W2193563574","https://openalex.org/W2579875234","https://openalex.org/W2736708202","https://openalex.org/W2767796712","https://openalex.org/W2891377697","https://openalex.org/W3104812533","https://openalex.org/W3148632407","https://openalex.org/W4236432903","https://openalex.org/W4244634726","https://openalex.org/W4251708180","https://openalex.org/W6665820594","https://openalex.org/W6746348176","https://openalex.org/W6754867772","https://openalex.org/W6785475031","https://openalex.org/W7062389935"],"related_works":["https://openalex.org/W2000379092","https://openalex.org/W2995137536","https://openalex.org/W2152497502","https://openalex.org/W1749592617","https://openalex.org/W2085138612","https://openalex.org/W2537369590","https://openalex.org/W2184926577","https://openalex.org/W2116473596","https://openalex.org/W2316937124","https://openalex.org/W3184123971"],"abstract_inverted_index":{"Ensuring":[0],"modern":[1],"VLSI":[2],"systems":[3],"are":[4,105],"resilient":[5,115],"to":[6,14,52,84,151,169],"soft":[7,113],"errors":[8],"resulting":[9],"from":[10,101],"radiation":[11],"effects":[12],"continues":[13],"be":[15],"a":[16,49,62,73,110,141],"challenging":[17],"problem.":[18],"Traditional":[19],"Radiation":[20],"Hardened":[21],"by":[22],"Design":[23,123],"(RHBD)":[24],"approaches":[25],"typically":[26],"have":[27,135],"high":[28],"costs":[29],"in":[30],"terms":[31],"of":[32,75],"area,":[33],"power,":[34],"and/or":[35],"performance":[36],"overheads.":[37],"In":[38,59],"recent":[39],"years,":[40],"pairing":[41],"RHBD":[42,103,159],"with":[43],"asynchronous":[44,67,116],"design":[45],"has":[46],"emerged":[47],"as":[48],"potential":[50],"solution":[51],"reduce":[53],"these":[54],"overheads":[55,166],"and":[56,78,90,125,131,149,153,164],"improve":[57],"efficiency.":[58],"this":[60],"paper,":[61],"generalized":[63],"method":[64],"for":[65,176],"hardening":[66],"Click-based":[68],"controllers":[69,97,139],"is":[70,82],"introduced,":[71],"where":[72],"combination":[74],"spatial":[76],"redundancy":[77],"Guard":[79],"Gate":[80],"(GG)":[81],"used":[83],"mitigate":[85],"Single":[86,91],"Event":[87,92],"Transients":[88],"(SET)":[89],"Upsets":[93],"(SEUs).":[94],"Two":[95],"Click":[96],"that":[98],"can":[99],"benefit":[100],"the":[102,118,126,137,147,157,170],"methodology":[104],"presented,":[106],"each":[107],"one":[108],"targeting":[109],"recently":[111],"proposed":[112,158],"error":[114],"architecture,":[117],"Soft":[119],"Error":[120,129],"Resilient":[121],"Asynchronous":[122,127],"(SERAD)":[124],"Full":[128],"Detection":[130],"Correction":[132],"(AFEDC).":[133],"We":[134],"implemented":[136],"different":[138],"using":[140],"130nm":[142],"cell":[143],"library.":[144],"Results":[145],"show":[146],"correctness":[148],"resilience":[150],"SET":[152],"SEU":[154],"events.":[155],"Additionally,":[156],"templates":[160],"require":[161],"less":[162],"area":[163],"power":[165],"when":[167],"compared":[168],"Triple":[171],"Modular":[172],"Redundancy":[173],"(TMR)":[174],"implementation":[175],"equivalent":[177],"fault":[178],"coverage.":[179]},"counts_by_year":[{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}