{"id":"https://openalex.org/W2907638367","doi":"https://doi.org/10.1109/asscc.2018.8579284","title":"A 3.9\u03bcW, 81.3dB SNDR, DC-coupled, Time-based Neural Recording IC with Degeneration R-DAC for Bidirectional Neural Interface in 180nm CMOS","display_name":"A 3.9\u03bcW, 81.3dB SNDR, DC-coupled, Time-based Neural Recording IC with Degeneration R-DAC for Bidirectional Neural Interface in 180nm CMOS","publication_year":2018,"publication_date":"2018-11-01","ids":{"openalex":"https://openalex.org/W2907638367","doi":"https://doi.org/10.1109/asscc.2018.8579284","mag":"2907638367"},"language":"en","primary_location":{"id":"doi:10.1109/asscc.2018.8579284","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asscc.2018.8579284","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE Asian Solid-State Circuits Conference (A-SSCC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5079118468","display_name":"Hyuntak Jeon","orcid":"https://orcid.org/0000-0003-0537-8494"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hyuntak Jeon","raw_affiliation_strings":["School of Electrical Engineering, KAIST, Daejeon, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, KAIST, Daejeon, Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110130176","display_name":"Jun\u2010Suk Bang","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jun-Suk Bang","raw_affiliation_strings":["Samsung Electronics, Hwaseong, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Samsung Electronics, Hwaseong, Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080803394","display_name":"Yoontae Jung","orcid":"https://orcid.org/0000-0003-0461-6729"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Yoontae Jung","raw_affiliation_strings":["School of Electrical Engineering, KAIST, Daejeon, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, KAIST, Daejeon, Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010317853","display_name":"Taeju Lee","orcid":"https://orcid.org/0000-0001-6304-3073"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Taeju Lee","raw_affiliation_strings":["School of Electrical Engineering, KAIST, Daejeon, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, KAIST, Daejeon, Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033004563","display_name":"Yeseul Jeon","orcid":"https://orcid.org/0000-0002-5042-5504"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Yeseul Jeon","raw_affiliation_strings":["School of Electrical Engineering, KAIST, Daejeon, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, KAIST, Daejeon, Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034810716","display_name":"Seok-Tae Koh","orcid":"https://orcid.org/0000-0001-8331-1223"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Seok-Tae Koh","raw_affiliation_strings":["School of Electrical Engineering, KAIST, Daejeon, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, KAIST, Daejeon, Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019543711","display_name":"Jaesuk Choi","orcid":"https://orcid.org/0000-0002-3062-846X"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jaesuk Choi","raw_affiliation_strings":["School of Electrical Engineering, KAIST, Daejeon, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, KAIST, Daejeon, Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058498108","display_name":"Doojin Jang","orcid":"https://orcid.org/0000-0003-0152-612X"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Doojin Jang","raw_affiliation_strings":["School of Electrical Engineering, KAIST, Daejeon, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, KAIST, Daejeon, Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5025815532","display_name":"Soonyoung Hong","orcid":"https://orcid.org/0000-0002-0197-4216"},"institutions":[{"id":"https://openalex.org/I193352282","display_name":"Daegu Gyeongbuk Institute of Science and Technology","ror":"https://ror.org/03frjya69","country_code":"KR","type":"education","lineage":["https://openalex.org/I193352282"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Soonyoung Hong","raw_affiliation_strings":["DGIST, Daegu, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"DGIST, Daegu, Korea","institution_ids":["https://openalex.org/I193352282"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5023245534","display_name":"Minkyu Je","orcid":"https://orcid.org/0000-0003-4580-2771"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Minkyu Je","raw_affiliation_strings":["School of Electrical Engineering, KAIST, Daejeon, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, KAIST, Daejeon, Korea","institution_ids":["https://openalex.org/I157485424"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.2122,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.4844358,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"91","last_page":"92"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11601","display_name":"Neuroscience and Neural Engineering","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2804","display_name":"Cellular and Molecular Neuroscience"},"field":{"id":"https://openalex.org/fields/28","display_name":"Neuroscience"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}},"topics":[{"id":"https://openalex.org/T11601","display_name":"Neuroscience and Neural Engineering","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2804","display_name":"Cellular and Molecular Neuroscience"},"field":{"id":"https://openalex.org/fields/28","display_name":"Neuroscience"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6101930737495422},{"id":"https://openalex.org/keywords/dynamic-range","display_name":"Dynamic range","score":0.49261265993118286},{"id":"https://openalex.org/keywords/resistor","display_name":"Resistor","score":0.4727431535720825},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.46974995732307434},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.44834136962890625},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.43936416506767273},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2637817859649658},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2444147765636444},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.14796552062034607}],"concepts":[{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6101930737495422},{"id":"https://openalex.org/C87133666","wikidata":"https://www.wikidata.org/wiki/Q1161699","display_name":"Dynamic range","level":2,"score":0.49261265993118286},{"id":"https://openalex.org/C137488568","wikidata":"https://www.wikidata.org/wiki/Q5321","display_name":"Resistor","level":3,"score":0.4727431535720825},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.46974995732307434},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.44834136962890625},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.43936416506767273},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2637817859649658},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2444147765636444},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.14796552062034607},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/asscc.2018.8579284","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asscc.2018.8579284","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE Asian Solid-State Circuits Conference (A-SSCC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.7200000286102295}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W2292075739","https://openalex.org/W2537607257","https://openalex.org/W2567171447","https://openalex.org/W2611346865","https://openalex.org/W2742801017"],"related_works":["https://openalex.org/W3200817179","https://openalex.org/W1960166976","https://openalex.org/W2380067098","https://openalex.org/W1992708211","https://openalex.org/W2995582362","https://openalex.org/W2109445684","https://openalex.org/W2081082331","https://openalex.org/W2108183185","https://openalex.org/W2283463320","https://openalex.org/W2978406538"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,17,51,62,68],"5-bit":[4],"VCO-based":[5],"neural":[6,26,79],"recording":[7,80],"IC,":[8],"which":[9],"directly":[10],"quantizes":[11],"the":[12,24,29,32,44,57],"input":[13,45,70,96],"signal":[14,27,87],"and":[15,67,89],"achieves":[16,82],"large":[18,63],"dynamic":[19],"range":[20,97],"(DR)":[21],"to":[22,43],"process":[23],"small-amplitude":[25],"in":[28,61],"presence":[30],"of":[31],"large-amplitude":[33],"stimulation":[34],"artifact":[35],"(SA).":[36],"A":[37],"feedback-controlled":[38],"source":[39],"degeneration":[40],"is":[41],"applied":[42],"transconductor":[46],"circuit":[47,58],"(Gm,in)":[48],"by":[49],"using":[50],"resistor":[52],"DAC":[53],"(R-DAC).":[54],"It":[55],"mitigates":[56],"nonlinearity,":[59],"resulting":[60],"signal-to-noise-and-distortion":[64],"ratio":[65],"(SNDR)":[66],"high":[69],"impedance":[71],"(Z":[72],"<sub":[73,91],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[74,92],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">in</sub>":[75],").":[76],"The":[77],"implemented":[78],"IC":[81],"813dB":[83],"SNDR":[84],"over":[85],"200Hz":[86],"bandwidth":[88],"200mV":[90],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">PP</sub>":[93],"maximum":[94],"allowable":[95],"while":[98],"consuming":[99],"3.9\u03bcW":[100],"per":[101],"channel.":[102]},"counts_by_year":[{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}