{"id":"https://openalex.org/W2779213440","doi":"https://doi.org/10.1109/asscc.2017.8240257","title":"A 13-bit 160MS/s pipelined subranging-SAR ADC with low-offset dynamic comparator","display_name":"A 13-bit 160MS/s pipelined subranging-SAR ADC with low-offset dynamic comparator","publication_year":2017,"publication_date":"2017-11-01","ids":{"openalex":"https://openalex.org/W2779213440","doi":"https://doi.org/10.1109/asscc.2017.8240257","mag":"2779213440"},"language":"en","primary_location":{"id":"doi:10.1109/asscc.2017.8240257","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asscc.2017.8240257","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE Asian Solid-State Circuits Conference (A-SSCC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100646157","display_name":"Weitao Li","orcid":"https://orcid.org/0000-0001-7855-428X"},"institutions":[{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]},{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Weitao Li","raw_affiliation_strings":["Institute of Microelectronics, Tsinghua University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089","https://openalex.org/I4210119392"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084959547","display_name":"Fule Li","orcid":"https://orcid.org/0000-0002-7341-7240"},"institutions":[{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]},{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Fule Li","raw_affiliation_strings":["Institute of Microelectronics, Tsinghua University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089","https://openalex.org/I4210119392"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100409741","display_name":"Jia Liu","orcid":"https://orcid.org/0000-0003-0383-0934"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]},{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jia Liu","raw_affiliation_strings":["Institute of Microelectronics, Tsinghua University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089","https://openalex.org/I4210119392"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100402286","display_name":"Hongyu Li","orcid":"https://orcid.org/0000-0001-5521-8005"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]},{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hongyu Li","raw_affiliation_strings":["Institute of Microelectronics, Tsinghua University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089","https://openalex.org/I4210119392"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100356864","display_name":"Zhihua Wang","orcid":"https://orcid.org/0000-0001-6567-0759"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]},{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhihua Wang","raw_affiliation_strings":["Institute of Microelectronics, Tsinghua University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089","https://openalex.org/I4210119392"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5100646157"],"corresponding_institution_ids":["https://openalex.org/I4210119392","https://openalex.org/I99065089"],"apc_list":null,"apc_paid":null,"fwci":0.1275,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.499471,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"225","last_page":"228"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/comparator","display_name":"Comparator","score":0.934546709060669},{"id":"https://openalex.org/keywords/spurious-free-dynamic-range","display_name":"Spurious-free dynamic range","score":0.9235649108886719},{"id":"https://openalex.org/keywords/dbc","display_name":"dBc","score":0.6818572878837585},{"id":"https://openalex.org/keywords/offset","display_name":"Offset (computer science)","score":0.6163219213485718},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5988990068435669},{"id":"https://openalex.org/keywords/successive-approximation-adc","display_name":"Successive approximation ADC","score":0.5913803577423096},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.5823078155517578},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.53682941198349},{"id":"https://openalex.org/keywords/flash-adc","display_name":"Flash ADC","score":0.5320276618003845},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5299214720726013},{"id":"https://openalex.org/keywords/decoupling","display_name":"Decoupling (probability)","score":0.4714394807815552},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.41326531767845154},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2642406225204468},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2064605951309204}],"concepts":[{"id":"https://openalex.org/C155745195","wikidata":"https://www.wikidata.org/wiki/Q1164179","display_name":"Comparator","level":3,"score":0.934546709060669},{"id":"https://openalex.org/C119293636","wikidata":"https://www.wikidata.org/wiki/Q657480","display_name":"Spurious-free dynamic range","level":3,"score":0.9235649108886719},{"id":"https://openalex.org/C193523891","wikidata":"https://www.wikidata.org/wiki/Q1771950","display_name":"dBc","level":3,"score":0.6818572878837585},{"id":"https://openalex.org/C175291020","wikidata":"https://www.wikidata.org/wiki/Q1156822","display_name":"Offset (computer science)","level":2,"score":0.6163219213485718},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5988990068435669},{"id":"https://openalex.org/C60154766","wikidata":"https://www.wikidata.org/wiki/Q2650458","display_name":"Successive approximation ADC","level":4,"score":0.5913803577423096},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.5823078155517578},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.53682941198349},{"id":"https://openalex.org/C164862427","wikidata":"https://www.wikidata.org/wiki/Q2744647","display_name":"Flash ADC","level":4,"score":0.5320276618003845},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5299214720726013},{"id":"https://openalex.org/C205606062","wikidata":"https://www.wikidata.org/wiki/Q5249645","display_name":"Decoupling (probability)","level":2,"score":0.4714394807815552},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.41326531767845154},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2642406225204468},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2064605951309204},{"id":"https://openalex.org/C133731056","wikidata":"https://www.wikidata.org/wiki/Q4917288","display_name":"Control engineering","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/asscc.2017.8240257","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asscc.2017.8240257","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE Asian Solid-State Circuits Conference (A-SSCC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.8899999856948853}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1598496480","https://openalex.org/W2011534521","https://openalex.org/W2028332523","https://openalex.org/W2044250819","https://openalex.org/W2122296355","https://openalex.org/W2147887812","https://openalex.org/W2537504266","https://openalex.org/W2586339360","https://openalex.org/W2586381649","https://openalex.org/W2593720627"],"related_works":["https://openalex.org/W3028366910","https://openalex.org/W2340159482","https://openalex.org/W2297502789","https://openalex.org/W2809902876","https://openalex.org/W2904640696","https://openalex.org/W2147238716","https://openalex.org/W3161232211","https://openalex.org/W2971803165","https://openalex.org/W2752640128","https://openalex.org/W2756508297"],"abstract_inverted_index":{"A":[0,48],"13-bit":[1],"160MS/s":[2],"hybrid":[3,23],"ADC":[4,24],"in":[5,11],"65":[6],"nm":[7],"CMOS":[8],"is":[9,26,41,56],"presented":[10],"this":[12],"paper.":[13],"By":[14],"combining":[15],"the":[16,30,45,53,63],"pipelined,":[17],"flash":[18],"and":[19,61,71,78],"SAR":[20],"architectures,":[21],"a":[22],"architecture":[25],"proposed":[27,42,57],"to":[28,43,58],"improve":[29],"power":[31,60],"efficiency.":[32],"An":[33],"input":[34],"offset":[35],"storage":[36],"technique":[37],"of":[38],"dynamic":[39],"comparator":[40],"increase":[44],"conversion":[46],"linearity.":[47],"reference":[49],"voltage":[50],"buffer":[51],"with":[52],"charge":[54],"compensation":[55],"save":[59],"reduce":[62],"decoupling":[64],"capacitor.":[65],"The":[66],"achieved":[67],"peak":[68],"SNDR,":[69],"SFDR,":[70],"FoM":[72],"are":[73],"64.2":[74],"dB,":[75],"80.5":[76],"dBc,":[77],"107.3":[79],"fJ/conversion-step,":[80],"respectively.":[81]},"counts_by_year":[{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":3},{"year":2021,"cited_by_count":2},{"year":2018,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}