{"id":"https://openalex.org/W2781101497","doi":"https://doi.org/10.1109/asscc.2017.8240241","title":"Word-line batch Vth modulation of TLC NAND flash memories for both write-hot and cold data","display_name":"Word-line batch Vth modulation of TLC NAND flash memories for both write-hot and cold data","publication_year":2017,"publication_date":"2017-11-01","ids":{"openalex":"https://openalex.org/W2781101497","doi":"https://doi.org/10.1109/asscc.2017.8240241","mag":"2781101497"},"language":"en","primary_location":{"id":"doi:10.1109/asscc.2017.8240241","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asscc.2017.8240241","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE Asian Solid-State Circuits Conference (A-SSCC)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5043922603","display_name":"Yoshiaki Deguchi","orcid":"https://orcid.org/0000-0002-1319-4647"},"institutions":[{"id":"https://openalex.org/I96679780","display_name":"Chuo University","ror":"https://ror.org/03qvqb743","country_code":"JP","type":"education","lineage":["https://openalex.org/I96679780"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yoshiaki Deguchi","raw_affiliation_strings":["Department of Electrical, Electronic, and Communication Engineering, Chuo University, Tokyo, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical, Electronic, and Communication Engineering, Chuo University, Tokyo, Japan","institution_ids":["https://openalex.org/I96679780"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5032914719","display_name":"Ken Takeuchi","orcid":"https://orcid.org/0000-0002-9345-6503"},"institutions":[{"id":"https://openalex.org/I96679780","display_name":"Chuo University","ror":"https://ror.org/03qvqb743","country_code":"JP","type":"education","lineage":["https://openalex.org/I96679780"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Ken Takeuchi","raw_affiliation_strings":["Department of Electrical, Electronic, and Communication Engineering, Chuo University, Tokyo, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical, Electronic, and Communication Engineering, Chuo University, Tokyo, Japan","institution_ids":["https://openalex.org/I96679780"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I96679780"],"apc_list":null,"apc_paid":null,"fwci":1.3488,"has_fulltext":false,"cited_by_count":18,"citation_normalized_percentile":{"value":0.81522822,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"161","last_page":"164"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11181","display_name":"Advanced Data Storage Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11181","display_name":"Advanced Data Storage Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9962000250816345,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10049","display_name":"Magnetic properties of thin films","score":0.982200026512146,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/flash","display_name":"Flash (photography)","score":0.8060779571533203},{"id":"https://openalex.org/keywords/nand-gate","display_name":"NAND gate","score":0.8029446601867676},{"id":"https://openalex.org/keywords/data-retention","display_name":"Data retention","score":0.7068645358085632},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5802749395370483},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5690246820449829},{"id":"https://openalex.org/keywords/flash-file-system","display_name":"Flash file system","score":0.5506026148796082},{"id":"https://openalex.org/keywords/modulation","display_name":"Modulation (music)","score":0.5160769820213318},{"id":"https://openalex.org/keywords/word","display_name":"Word (group theory)","score":0.46136632561683655},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.4498818516731262},{"id":"https://openalex.org/keywords/flash-memory","display_name":"Flash memory","score":0.4205538034439087},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.18394753336906433},{"id":"https://openalex.org/keywords/computer-memory","display_name":"Computer memory","score":0.15193060040473938},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.13972622156143188},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.13373637199401855},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.12450417876243591},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.10933810472488403}],"concepts":[{"id":"https://openalex.org/C2777526259","wikidata":"https://www.wikidata.org/wiki/Q221836","display_name":"Flash (photography)","level":2,"score":0.8060779571533203},{"id":"https://openalex.org/C124296912","wikidata":"https://www.wikidata.org/wiki/Q575178","display_name":"NAND gate","level":3,"score":0.8029446601867676},{"id":"https://openalex.org/C2780866740","wikidata":"https://www.wikidata.org/wiki/Q5227345","display_name":"Data retention","level":2,"score":0.7068645358085632},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5802749395370483},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5690246820449829},{"id":"https://openalex.org/C27670709","wikidata":"https://www.wikidata.org/wiki/Q5457555","display_name":"Flash file system","level":4,"score":0.5506026148796082},{"id":"https://openalex.org/C123079801","wikidata":"https://www.wikidata.org/wiki/Q750240","display_name":"Modulation (music)","level":2,"score":0.5160769820213318},{"id":"https://openalex.org/C90805587","wikidata":"https://www.wikidata.org/wiki/Q10944557","display_name":"Word (group theory)","level":2,"score":0.46136632561683655},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.4498818516731262},{"id":"https://openalex.org/C2776531357","wikidata":"https://www.wikidata.org/wiki/Q174077","display_name":"Flash memory","level":2,"score":0.4205538034439087},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.18394753336906433},{"id":"https://openalex.org/C92855701","wikidata":"https://www.wikidata.org/wiki/Q5830907","display_name":"Computer memory","level":3,"score":0.15193060040473938},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.13972622156143188},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.13373637199401855},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.12450417876243591},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.10933810472488403},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C98986596","wikidata":"https://www.wikidata.org/wiki/Q1143031","display_name":"Semiconductor memory","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/asscc.2017.8240241","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asscc.2017.8240241","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE Asian Solid-State Circuits Conference (A-SSCC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1980584607","https://openalex.org/W1994278419","https://openalex.org/W2053979825","https://openalex.org/W2066792000","https://openalex.org/W2067525510","https://openalex.org/W2527054471","https://openalex.org/W2739689420","https://openalex.org/W2742345709","https://openalex.org/W6648728660","https://openalex.org/W6663996228","https://openalex.org/W6667292314"],"related_works":["https://openalex.org/W2054139911","https://openalex.org/W164278522","https://openalex.org/W1577524679","https://openalex.org/W2606330551","https://openalex.org/W2162027152","https://openalex.org/W2101851311","https://openalex.org/W2391055460","https://openalex.org/W1994190181","https://openalex.org/W4230869547","https://openalex.org/W2378293894"],"abstract_inverted_index":{"comprehensive":[0],"solution":[1],"for":[2,46],"both":[3],"write-hot":[4,21],"and":[5,32,59,84],"cold":[6],"data":[7],"to":[8],"improve":[9],"the":[10,27,34,43,54,61,78,85],"reliability":[11],"of":[12,38,67],"Triple":[13],"Level":[14],"Cell":[15],"(TLC)":[16],"NAND":[17,40,69,75],"Flash":[18,76],"memories.":[19],"For":[20,71],"data,":[22,48],"WBVM":[23,49],"VTHscore":[24],"modulation":[25,52],"decreases":[26,53],"program-disturb":[28],"errors":[29,56,80],"by":[30,36,57,65,82,91],"49%":[31],"enhances":[33],"endurance":[35],"1.8-times":[37],"2D-TLC":[39,68],"Flash.":[41,70],"On":[42],"other":[44],"hand,":[45],"write-cold":[47],"BER":[50],"score":[51],"data-retention":[55,63],"36%":[58],"extends":[60],"acceptable":[62,86],"time":[64,88],"2.3-times":[66],"3D":[72],"vertical":[73],"TLC":[74],"memory,":[77],"dataretention":[79,87],"decrease":[81],"13%":[83],"is":[89],"extended":[90],"1.4-times.":[92]},"counts_by_year":[{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":2}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}