{"id":"https://openalex.org/W2587070063","doi":"https://doi.org/10.1109/asscc.2016.7844191","title":"A single-event upset robust, 2.2 GHz to 3.2 GHz, 345 fs jitter PLL with triple-modular redundant phase detector in 65 nm CMOS","display_name":"A single-event upset robust, 2.2 GHz to 3.2 GHz, 345 fs jitter PLL with triple-modular redundant phase detector in 65 nm CMOS","publication_year":2016,"publication_date":"2016-11-01","ids":{"openalex":"https://openalex.org/W2587070063","doi":"https://doi.org/10.1109/asscc.2016.7844191","mag":"2587070063"},"language":"en","primary_location":{"id":"doi:10.1109/asscc.2016.7844191","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asscc.2016.7844191","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE Asian Solid-State Circuits Conference (A-SSCC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5011305335","display_name":"Jeffrey Prinzie","orcid":"https://orcid.org/0000-0001-9321-315X"},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":true,"raw_author_name":"Jeffrey Prinzie","raw_affiliation_strings":["Dept. of Electrical Engineering, KU Leuven University, Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"Dept. of Electrical Engineering, KU Leuven University, Leuven, Belgium","institution_ids":["https://openalex.org/I99464096"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5051481722","display_name":"Michiel Steyaert","orcid":"https://orcid.org/0000-0001-6398-8325"},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Michiel Steyaert","raw_affiliation_strings":["Dept. of Electrical Engineering, KU Leuven University, Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"Dept. of Electrical Engineering, KU Leuven University, Leuven, Belgium","institution_ids":["https://openalex.org/I99464096"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5016595959","display_name":"Paul Leroux","orcid":"https://orcid.org/0000-0002-1790-2428"},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Paul Leroux","raw_affiliation_strings":["Dept. of Electrical Engineering, KU Leuven University, Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"Dept. of Electrical Engineering, KU Leuven University, Leuven, Belgium","institution_ids":["https://openalex.org/I99464096"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5104832058","display_name":"J\u00f8rgen Christiansen","orcid":null},"institutions":[{"id":"https://openalex.org/I67311998","display_name":"European Organization for Nuclear Research","ror":"https://ror.org/01ggx4157","country_code":"CH","type":"facility","lineage":["https://openalex.org/I67311998"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Jorgen Christiansen","raw_affiliation_strings":["CERN, European Organisation for Particle Physics, Geneva, Switzerland"],"affiliations":[{"raw_affiliation_string":"CERN, European Organisation for Particle Physics, Geneva, Switzerland","institution_ids":["https://openalex.org/I67311998"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5039873132","display_name":"P. Moreira","orcid":"https://orcid.org/0000-0003-1946-2443"},"institutions":[{"id":"https://openalex.org/I67311998","display_name":"European Organization for Nuclear Research","ror":"https://ror.org/01ggx4157","country_code":"CH","type":"facility","lineage":["https://openalex.org/I67311998"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Paulo Moreira","raw_affiliation_strings":["CERN, European Organisation for Particle Physics, Geneva, Switzerland"],"affiliations":[{"raw_affiliation_string":"CERN, European Organisation for Particle Physics, Geneva, Switzerland","institution_ids":["https://openalex.org/I67311998"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5011305335"],"corresponding_institution_ids":["https://openalex.org/I99464096"],"apc_list":null,"apc_paid":null,"fwci":1.8376,"has_fulltext":false,"cited_by_count":29,"citation_normalized_percentile":{"value":0.87172036,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"285","last_page":"288"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10829","display_name":"Interconnection Networks and Systems","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/phase-locked-loop","display_name":"Phase-locked loop","score":0.7784442901611328},{"id":"https://openalex.org/keywords/jitter","display_name":"Jitter","score":0.7712262868881226},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6923407912254333},{"id":"https://openalex.org/keywords/pll-multibit","display_name":"PLL multibit","score":0.6854372620582581},{"id":"https://openalex.org/keywords/phase-noise","display_name":"Phase noise","score":0.6628556847572327},{"id":"https://openalex.org/keywords/single-event-upset","display_name":"Single event upset","score":0.5799487829208374},{"id":"https://openalex.org/keywords/upset","display_name":"Upset","score":0.5367072820663452},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.47636935114860535},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4555377662181854},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.41315802931785583},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.35983723402023315},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.34785985946655273},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.24845156073570251},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.2186356782913208}],"concepts":[{"id":"https://openalex.org/C12707504","wikidata":"https://www.wikidata.org/wiki/Q52637","display_name":"Phase-locked loop","level":3,"score":0.7784442901611328},{"id":"https://openalex.org/C134652429","wikidata":"https://www.wikidata.org/wiki/Q1052698","display_name":"Jitter","level":2,"score":0.7712262868881226},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6923407912254333},{"id":"https://openalex.org/C77881186","wikidata":"https://www.wikidata.org/wiki/Q7119642","display_name":"PLL multibit","level":4,"score":0.6854372620582581},{"id":"https://openalex.org/C89631360","wikidata":"https://www.wikidata.org/wiki/Q1428766","display_name":"Phase noise","level":2,"score":0.6628556847572327},{"id":"https://openalex.org/C2780073065","wikidata":"https://www.wikidata.org/wiki/Q1476733","display_name":"Single event upset","level":3,"score":0.5799487829208374},{"id":"https://openalex.org/C2778002589","wikidata":"https://www.wikidata.org/wiki/Q2406791","display_name":"Upset","level":2,"score":0.5367072820663452},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.47636935114860535},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4555377662181854},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.41315802931785583},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.35983723402023315},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.34785985946655273},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24845156073570251},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.2186356782913208},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/asscc.2016.7844191","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asscc.2016.7844191","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE Asian Solid-State Circuits Conference (A-SSCC)","raw_type":"proceedings-article"},{"id":"pmh:oai:lirias2repo.kuleuven.be:123456789/668166","is_oa":false,"landing_page_url":"https://lirias.kuleuven.be/bitstream/123456789/668166/2/07844191.pdf","pdf_url":null,"source":{"id":"https://openalex.org/S4306401954","display_name":"Lirias (KU Leuven)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I99464096","host_organization_name":"KU Leuven","host_organization_lineage":["https://openalex.org/I99464096"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Asian Solid-State Circuits Conference (A-SSCC), Toyama, Japan, 7-9 November 2016","raw_type":"info:eu-repo/semantics/publishedVersion"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.8999999761581421,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":4,"referenced_works":["https://openalex.org/W1963808541","https://openalex.org/W2034379167","https://openalex.org/W2075310429","https://openalex.org/W2120500930"],"related_works":["https://openalex.org/W1576949837","https://openalex.org/W984417604","https://openalex.org/W2102538861","https://openalex.org/W2104055211","https://openalex.org/W2765704306","https://openalex.org/W2498262093","https://openalex.org/W2123934961","https://openalex.org/W2139484866","https://openalex.org/W2188779191","https://openalex.org/W1994021281"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,29,42,54,100,111,118],"Single":[4,67,132],"Event":[5,68,133],"Upset":[6,134],"(SEU)":[7],"robust":[8],"low":[9,35],"phase-noise":[10],"PLL":[11,24,52,91],"for":[12],"clock":[13],"generation":[14],"in":[15,28,70,99],"harsh":[16],"environments":[17],"like":[18],"nuclear":[19],"and":[20,58,95,109,124],"space":[21],"applications.":[22],"The":[23,51,90],"has":[25,92],"been":[26,93],"implemented":[27],"65":[30],"nm":[31],"CMOS":[32],"technology.":[33],"A":[34,74],"noise":[36,88],"LC-tank":[37],"oscillator":[38],"is":[39,125],"included":[40],"with":[41,60,117],"tuning":[43],"range":[44,102],"from":[45,78,103],"2.2":[46],"GHz":[47],"to":[48,65,81,97,106,127,139],"3.2":[49],"GHz.":[50],"includes":[53],"new":[55],"phase":[56,87],"detector":[57],"divider":[59],"Triple":[61],"Modular":[62],"Redundancy":[63],"(TMR)":[64],"suppress":[66],"Effects":[69],"ionizing":[71],"radiation":[72],"environments.":[73],"highly":[75],"reconfigurable":[76],"bandwidth":[77],"0.7":[79],"MHz":[80,83],"2":[82],"provides":[84],"optimal":[85],"reference":[86],"filtering.":[89],"designed":[94],"measured":[96],"operate":[98],"temperature":[101],"-25":[104],"C":[105,108],"125":[107],"features":[110],"jitter":[112],"of":[113,121],"345":[114],"fs":[115],"rms":[116],"power":[119],"consumption":[120],"11.7":[122],"mW":[123],"tolerant":[126],"10":[128],"%":[129],"supply":[130],"variations.":[131],"laser":[135],"tests":[136],"are":[137],"performed":[138],"verify":[140],"the":[141],"triplicated":[142],"circuit":[143],"performance.":[144]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":4},{"year":2021,"cited_by_count":6},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":6},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}