{"id":"https://openalex.org/W2243464227","doi":"https://doi.org/10.1109/asscc.2015.7387477","title":"A field-programmable lab-on-a-chip with built-in self-test circuit and low-power sensor-fusion solution in 0.35\u03bcm standard CMOS process","display_name":"A field-programmable lab-on-a-chip with built-in self-test circuit and low-power sensor-fusion solution in 0.35\u03bcm standard CMOS process","publication_year":2015,"publication_date":"2015-11-01","ids":{"openalex":"https://openalex.org/W2243464227","doi":"https://doi.org/10.1109/asscc.2015.7387477","mag":"2243464227"},"language":"en","primary_location":{"id":"doi:10.1109/asscc.2015.7387477","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asscc.2015.7387477","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE Asian Solid-State Circuits Conference (A-SSCC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5042846142","display_name":"Kelvin Yi-Tse Lai","orcid":null},"institutions":[{"id":"https://openalex.org/I148366613","display_name":"National Yang Ming Chiao Tung University","ror":"https://ror.org/00se2k293","country_code":"TW","type":"education","lineage":["https://openalex.org/I148366613"]}],"countries":["TW"],"is_corresponding":true,"raw_author_name":"Kelvin Yi-Tse Lai","raw_affiliation_strings":["Department of Electronics Engineering and Institute of Electronics, National Chiao-Tung University, Hsinchu, Taiwan"],"affiliations":[{"raw_affiliation_string":"Department of Electronics Engineering and Institute of Electronics, National Chiao-Tung University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I148366613"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043217280","display_name":"Ming-Feng Shiu","orcid":null},"institutions":[{"id":"https://openalex.org/I148366613","display_name":"National Yang Ming Chiao Tung University","ror":"https://ror.org/00se2k293","country_code":"TW","type":"education","lineage":["https://openalex.org/I148366613"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Ming-Feng Shiu","raw_affiliation_strings":["Department of Electronics Engineering and Institute of Electronics, National Chiao-Tung University, Hsinchu, Taiwan"],"affiliations":[{"raw_affiliation_string":"Department of Electronics Engineering and Institute of Electronics, National Chiao-Tung University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I148366613"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033213622","display_name":"Yiwen Lu","orcid":"https://orcid.org/0000-0002-1969-6744"},"institutions":[{"id":"https://openalex.org/I148366613","display_name":"National Yang Ming Chiao Tung University","ror":"https://ror.org/00se2k293","country_code":"TW","type":"education","lineage":["https://openalex.org/I148366613"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Yi-Wen Lu","raw_affiliation_strings":["Department of Electronics Engineering and Institute of Electronics, National Chiao-Tung University, Hsinchu, Taiwan"],"affiliations":[{"raw_affiliation_string":"Department of Electronics Engineering and Institute of Electronics, National Chiao-Tung University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I148366613"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103611856","display_name":"Yingchieh Ho","orcid":null},"institutions":[{"id":"https://openalex.org/I33096239","display_name":"National Dong Hwa University","ror":"https://ror.org/00mng9617","country_code":"TW","type":"education","lineage":["https://openalex.org/I33096239"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Yingchieh Ho","raw_affiliation_strings":["Dept. of Electrical Engineering, National Dong-Hwa University, Hualien, Taiwan"],"affiliations":[{"raw_affiliation_string":"Dept. of Electrical Engineering, National Dong-Hwa University, Hualien, Taiwan","institution_ids":["https://openalex.org/I33096239"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074951671","display_name":"Yu-Chi Kao","orcid":null},"institutions":[{"id":"https://openalex.org/I148366613","display_name":"National Yang Ming Chiao Tung University","ror":"https://ror.org/00se2k293","country_code":"TW","type":"education","lineage":["https://openalex.org/I148366613"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Yu-Chi Kao","raw_affiliation_strings":["Department of Electronics Engineering and Institute of Electronics, National Chiao-Tung University, Hsinchu, Taiwan"],"affiliations":[{"raw_affiliation_string":"Department of Electronics Engineering and Institute of Electronics, National Chiao-Tung University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I148366613"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5027740007","display_name":"Yu-Tao Yang","orcid":"https://orcid.org/0000-0003-2313-7790"},"institutions":[{"id":"https://openalex.org/I148366613","display_name":"National Yang Ming Chiao Tung University","ror":"https://ror.org/00se2k293","country_code":"TW","type":"education","lineage":["https://openalex.org/I148366613"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Yu-Tao Yang","raw_affiliation_strings":["Department of Electronics Engineering and Institute of Electronics, National Chiao-Tung University, Hsinchu, Taiwan"],"affiliations":[{"raw_affiliation_string":"Department of Electronics Engineering and Institute of Electronics, National Chiao-Tung University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I148366613"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5025935520","display_name":"Gary Wang","orcid":null},"institutions":[{"id":"https://openalex.org/I148366613","display_name":"National Yang Ming Chiao Tung University","ror":"https://ror.org/00se2k293","country_code":"TW","type":"education","lineage":["https://openalex.org/I148366613"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Gary Wang","raw_affiliation_strings":["Department of Electronics Engineering and Institute of Electronics, National Chiao-Tung University, Hsinchu, Taiwan"],"affiliations":[{"raw_affiliation_string":"Department of Electronics Engineering and Institute of Electronics, National Chiao-Tung University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I148366613"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034903164","display_name":"Keng-Ming Liu","orcid":"https://orcid.org/0000-0002-5497-1609"},"institutions":[{"id":"https://openalex.org/I33096239","display_name":"National Dong Hwa University","ror":"https://ror.org/00mng9617","country_code":"TW","type":"education","lineage":["https://openalex.org/I33096239"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Keng-Ming Liu","raw_affiliation_strings":["Dept. of Electrical Engineering, National Dong-Hwa University, Hualien, Taiwan"],"affiliations":[{"raw_affiliation_string":"Dept. of Electrical Engineering, National Dong-Hwa University, Hualien, Taiwan","institution_ids":["https://openalex.org/I33096239"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074752759","display_name":"Hsie-Chia Chang","orcid":"https://orcid.org/0000-0002-0525-8129"},"institutions":[{"id":"https://openalex.org/I148366613","display_name":"National Yang Ming Chiao Tung University","ror":"https://ror.org/00se2k293","country_code":"TW","type":"education","lineage":["https://openalex.org/I148366613"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Hsie-Chia Chang","raw_affiliation_strings":["Department of Electronics Engineering and Institute of Electronics, National Chiao-Tung University, Hsinchu, Taiwan"],"affiliations":[{"raw_affiliation_string":"Department of Electronics Engineering and Institute of Electronics, National Chiao-Tung University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I148366613"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101838014","display_name":"Chen\u2010Yi Lee","orcid":"https://orcid.org/0000-0002-6795-0874"},"institutions":[{"id":"https://openalex.org/I148366613","display_name":"National Yang Ming Chiao Tung University","ror":"https://ror.org/00se2k293","country_code":"TW","type":"education","lineage":["https://openalex.org/I148366613"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Chen-Yi Lee","raw_affiliation_strings":["Department of Electronics Engineering and Institute of Electronics, National Chiao-Tung University, Hsinchu, Taiwan"],"affiliations":[{"raw_affiliation_string":"Department of Electronics Engineering and Institute of Electronics, National Chiao-Tung University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I148366613"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":10,"corresponding_author_ids":["https://openalex.org/A5042846142"],"corresponding_institution_ids":["https://openalex.org/I148366613"],"apc_list":null,"apc_paid":null,"fwci":3.1566,"has_fulltext":false,"cited_by_count":40,"citation_normalized_percentile":{"value":0.92434458,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":100},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12452","display_name":"Electrowetting and Microfluidic Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12452","display_name":"Electrowetting and Microfluidic Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11472","display_name":"Analytical Chemistry and Sensors","score":0.9966999888420105,"subfield":{"id":"https://openalex.org/subfields/1502","display_name":"Bioengineering"},"field":{"id":"https://openalex.org/fields/15","display_name":"Chemical Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10412","display_name":"Microfluidic and Capillary Electrophoresis Applications","score":0.996399998664856,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/microelectrode","display_name":"Microelectrode","score":0.6292223334312439},{"id":"https://openalex.org/keywords/capacitive-sensing","display_name":"Capacitive sensing","score":0.6259444355964661},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6111811995506287},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.5995203852653503},{"id":"https://openalex.org/keywords/microfluidics","display_name":"Microfluidics","score":0.5469295978546143},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5304616689682007},{"id":"https://openalex.org/keywords/lab-on-a-chip","display_name":"Lab-on-a-chip","score":0.48122406005859375},{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.45326635241508484},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.45135223865509033},{"id":"https://openalex.org/keywords/device-under-test","display_name":"Device under test","score":0.4329105019569397},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4194059669971466},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.39306896924972534},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3259996175765991},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3138841986656189},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3105132579803467},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.265000581741333},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.18535172939300537},{"id":"https://openalex.org/keywords/electrode","display_name":"Electrode","score":0.10865655541419983},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.10502433776855469}],"concepts":[{"id":"https://openalex.org/C111670793","wikidata":"https://www.wikidata.org/wiki/Q16979465","display_name":"Microelectrode","level":3,"score":0.6292223334312439},{"id":"https://openalex.org/C206755178","wikidata":"https://www.wikidata.org/wiki/Q1131271","display_name":"Capacitive sensing","level":2,"score":0.6259444355964661},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6111811995506287},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.5995203852653503},{"id":"https://openalex.org/C8673954","wikidata":"https://www.wikidata.org/wiki/Q138845","display_name":"Microfluidics","level":2,"score":0.5469295978546143},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5304616689682007},{"id":"https://openalex.org/C138942068","wikidata":"https://www.wikidata.org/wiki/Q633261","display_name":"Lab-on-a-chip","level":3,"score":0.48122406005859375},{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.45326635241508484},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.45135223865509033},{"id":"https://openalex.org/C76249512","wikidata":"https://www.wikidata.org/wiki/Q1206780","display_name":"Device under test","level":3,"score":0.4329105019569397},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4194059669971466},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.39306896924972534},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3259996175765991},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3138841986656189},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3105132579803467},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.265000581741333},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.18535172939300537},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.10865655541419983},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.10502433776855469},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C195266298","wikidata":"https://www.wikidata.org/wiki/Q2165620","display_name":"Scattering parameters","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/asscc.2015.7387477","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asscc.2015.7387477","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE Asian Solid-State Circuits Conference (A-SSCC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6299999952316284,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1902734869","https://openalex.org/W1993310789","https://openalex.org/W2056184138","https://openalex.org/W2079884243","https://openalex.org/W2092908100","https://openalex.org/W2110778204","https://openalex.org/W2113162124","https://openalex.org/W2115153870","https://openalex.org/W2134904817","https://openalex.org/W2163363366","https://openalex.org/W2168987465","https://openalex.org/W6679891205"],"related_works":["https://openalex.org/W4253324731","https://openalex.org/W2137815833","https://openalex.org/W4324119913","https://openalex.org/W2242980981","https://openalex.org/W4385062389","https://openalex.org/W4242996090","https://openalex.org/W2134288827","https://openalex.org/W1529334324","https://openalex.org/W2216084496","https://openalex.org/W2307848966"],"abstract_inverted_index":{"This":[0,20],"paper":[1],"presents":[2],"a":[3,30],"field":[4],"programmable":[5],"lab-on-a-chip":[6],"(FPLOC)":[7],"with":[8],"microfluidics":[9],"actuation,":[10],"droplet":[11,37,79],"location/":[12],"category":[13],"readback,":[14],"built-in-self-test":[15],"(BIST),":[16],"and":[17,28,52,56,86],"bioassays":[18],"detection.":[19,58],"FPLOC":[21,68],"is":[22],"composed":[23],"of":[24,32,89],"1,800":[25],"MEDA":[26],"microelectrodes":[27,51],"integrates":[29],"set":[31],"microfluidic":[33,70],"operations":[34,71],"to":[35],"perform":[36],"moving/cutting/mixing.":[38],"Besides,":[39],"capacitive":[40,90],"sensing":[41],"circuits":[42],"are":[43],"considered":[44],"for":[45,78,93],"system":[46],"automation,":[47],"droplets":[48],"classification,":[49],"malfunctioning":[50],"surface":[53],"flatness":[54],"testing,":[55],"biomedical":[57,94],"Implemented":[59],"in":[60,65],"0.35\u03bcm":[61],"standard":[62],"CMOS":[63],"process":[64],"7.4mm2,":[66],"the":[67],"demonstrates":[69],"under":[72],"25V":[73],"at":[74,84,96],"1KHz,":[75],"1.3fF":[76],"resolution":[77],"location/category/chip":[80],"BIST":[81],"maps":[82],"readback":[83],"1MHz,":[85],"0.34fF":[87],"sensitivity":[88],"measurement":[91],"window":[92],"detection":[95],"1KHz.":[97]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":6},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":4},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":7},{"year":2017,"cited_by_count":7},{"year":2016,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}