{"id":"https://openalex.org/W2249275807","doi":"https://doi.org/10.1109/asscc.2015.7387445","title":"A 0.45 V, 15.6 nW MOSFET-only sub-threshold voltage reference with no amplifiers","display_name":"A 0.45 V, 15.6 nW MOSFET-only sub-threshold voltage reference with no amplifiers","publication_year":2015,"publication_date":"2015-11-01","ids":{"openalex":"https://openalex.org/W2249275807","doi":"https://doi.org/10.1109/asscc.2015.7387445","mag":"2249275807"},"language":"en","primary_location":{"id":"doi:10.1109/asscc.2015.7387445","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asscc.2015.7387445","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE Asian Solid-State Circuits Conference (A-SSCC)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100718510","display_name":"Yutao Wang","orcid":"https://orcid.org/0000-0001-8297-8579"},"institutions":[{"id":"https://openalex.org/I149594827","display_name":"Xidian University","ror":"https://ror.org/05s92vm98","country_code":"CN","type":"education","lineage":["https://openalex.org/I149594827"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yutao Wang","raw_affiliation_strings":["School of Microelectronics, Xidian University Xi'an, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Microelectronics, Xidian University Xi'an, China","institution_ids":["https://openalex.org/I149594827"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039575274","display_name":"Zhangming Zhu","orcid":"https://orcid.org/0000-0002-7764-1928"},"institutions":[{"id":"https://openalex.org/I149594827","display_name":"Xidian University","ror":"https://ror.org/05s92vm98","country_code":"CN","type":"education","lineage":["https://openalex.org/I149594827"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhangming Zhu","raw_affiliation_strings":["School of Microelectronics, Xidian University Xi'an, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Microelectronics, Xidian University Xi'an, China","institution_ids":["https://openalex.org/I149594827"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5042533091","display_name":"Jiaojiao Yao","orcid":null},"institutions":[{"id":"https://openalex.org/I149594827","display_name":"Xidian University","ror":"https://ror.org/05s92vm98","country_code":"CN","type":"education","lineage":["https://openalex.org/I149594827"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiaojiao Yao","raw_affiliation_strings":["School of Microelectronics, Xidian University Xi'an, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Microelectronics, Xidian University Xi'an, China","institution_ids":["https://openalex.org/I149594827"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100402361","display_name":"Yintang Yang","orcid":"https://orcid.org/0000-0001-9745-5404"},"institutions":[{"id":"https://openalex.org/I149594827","display_name":"Xidian University","ror":"https://ror.org/05s92vm98","country_code":"CN","type":"education","lineage":["https://openalex.org/I149594827"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yintang Yang","raw_affiliation_strings":["School of Microelectronics, Xidian University Xi'an, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Microelectronics, Xidian University Xi'an, China","institution_ids":["https://openalex.org/I149594827"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I149594827"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/voltage-reference","display_name":"Voltage reference","score":0.6893734335899353},{"id":"https://openalex.org/keywords/threshold-voltage","display_name":"Threshold voltage","score":0.6361076831817627},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.6022324562072754},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.592807948589325},{"id":"https://openalex.org/keywords/mosfet","display_name":"MOSFET","score":0.5864368081092834},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.5657886862754822},{"id":"https://openalex.org/keywords/overdrive-voltage","display_name":"Overdrive voltage","score":0.5561665296554565},{"id":"https://openalex.org/keywords/bandgap-voltage-reference","display_name":"Bandgap voltage reference","score":0.5357842445373535},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5281406044960022},{"id":"https://openalex.org/keywords/line-regulation","display_name":"Line regulation","score":0.51268470287323},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.5042396783828735},{"id":"https://openalex.org/keywords/power-supply-rejection-ratio","display_name":"Power supply rejection ratio","score":0.4773333668708801},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.4689257740974426},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.46355926990509033},{"id":"https://openalex.org/keywords/dropout-voltage","display_name":"Dropout voltage","score":0.44625338912010193},{"id":"https://openalex.org/keywords/low-voltage","display_name":"Low voltage","score":0.4343038499355316},{"id":"https://openalex.org/keywords/process-corners","display_name":"Process corners","score":0.41367167234420776},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.30276158452033997},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.29002517461776733},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19983813166618347}],"concepts":[{"id":"https://openalex.org/C44351266","wikidata":"https://www.wikidata.org/wiki/Q1465532","display_name":"Voltage reference","level":3,"score":0.6893734335899353},{"id":"https://openalex.org/C195370968","wikidata":"https://www.wikidata.org/wiki/Q1754002","display_name":"Threshold voltage","level":4,"score":0.6361076831817627},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.6022324562072754},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.592807948589325},{"id":"https://openalex.org/C2778413303","wikidata":"https://www.wikidata.org/wiki/Q210793","display_name":"MOSFET","level":4,"score":0.5864368081092834},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.5657886862754822},{"id":"https://openalex.org/C195905723","wikidata":"https://www.wikidata.org/wiki/Q7113634","display_name":"Overdrive voltage","level":5,"score":0.5561665296554565},{"id":"https://openalex.org/C127033052","wikidata":"https://www.wikidata.org/wiki/Q48635","display_name":"Bandgap voltage reference","level":5,"score":0.5357842445373535},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5281406044960022},{"id":"https://openalex.org/C2777901765","wikidata":"https://www.wikidata.org/wiki/Q6553328","display_name":"Line regulation","level":5,"score":0.51268470287323},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.5042396783828735},{"id":"https://openalex.org/C15892472","wikidata":"https://www.wikidata.org/wiki/Q1482413","display_name":"Power supply rejection ratio","level":4,"score":0.4773333668708801},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.4689257740974426},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.46355926990509033},{"id":"https://openalex.org/C15032970","wikidata":"https://www.wikidata.org/wiki/Q851210","display_name":"Dropout voltage","level":4,"score":0.44625338912010193},{"id":"https://openalex.org/C128624480","wikidata":"https://www.wikidata.org/wiki/Q1504817","display_name":"Low voltage","level":3,"score":0.4343038499355316},{"id":"https://openalex.org/C192615534","wikidata":"https://www.wikidata.org/wiki/Q7247268","display_name":"Process corners","level":3,"score":0.41367167234420776},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.30276158452033997},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.29002517461776733},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19983813166618347}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/asscc.2015.7387445","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asscc.2015.7387445","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE Asian Solid-State Circuits Conference (A-SSCC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.9100000262260437,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W1964559056","https://openalex.org/W2100518195","https://openalex.org/W2118526058","https://openalex.org/W2139801901","https://openalex.org/W2146031070","https://openalex.org/W2146324717","https://openalex.org/W2149296784"],"related_works":["https://openalex.org/W3146306174","https://openalex.org/W2347289947","https://openalex.org/W2366264921","https://openalex.org/W2382444301","https://openalex.org/W2381696784","https://openalex.org/W2352004681","https://openalex.org/W2372624045","https://openalex.org/W2393887177","https://openalex.org/W4360584767","https://openalex.org/W2384155416"],"abstract_inverted_index":{"An":[0],"ultra-low":[1],"voltage,":[2],"low":[3,5,53],"power,":[4],"line":[6,121],"sensitivity":[7,54,122],"MOSFET-only":[8],"sub-threshold":[9,30],"voltage":[10,41,75,79,99,128],"reference":[11,74,80],"with":[12,84,125],"no":[13],"amplifiers":[14],"is":[15,20,55,68,100,105,117,123,140],"presented.":[16],"The":[17,77,90],"bulk-driven":[18],"technique":[19],"used":[21],"and":[22,42,51,119],"most":[23],"of":[24],"the":[25,29,38,48,52,58,72,95,102,108,120,137],"transistors":[26],"work":[27],"in":[28,37],"operation,":[31],"which":[32],"allows":[33],"a":[34,65],"remarkable":[35],"reduction":[36],"minimum":[39,96],"supply":[40,98,127],"power":[43,97,103,126],"consumption.":[44],"Second-order":[45],"compensation":[46],"improves":[47],"temperature":[49,110],"stability":[50],"realized":[56],"by":[57],"difference":[59],"between":[60],"two":[61],"complementary":[62],"currents.":[63],"Moreover,":[64],"trimming":[66],"circuit":[67],"adopted":[69],"to":[70,115,132],"compensate":[71],"process-related":[73],"variation.":[76],"proposed":[78],"has":[81],"been":[82],"fabricated":[83],"0.18\u03bcm":[85],"1.8":[86,133],"V":[87],"CMOS":[88],"process.":[89],"measurement":[91],"results":[92],"show":[93],"that":[94],"0.45V;":[101],"consumption":[104],"15.6":[106],"nW;":[107],"average":[109],"coefficient":[111],"measured":[112],"from":[113,130],"-40":[114],"85\u00b0C":[116],"59.4ppm/\u00b0C":[118],"0.033%":[124],"ranging":[129],"0.45":[131],"V.":[134],"In":[135],"addition,":[136],"chip":[138],"area":[139],"0.":[141],"013mm2.":[142]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2018,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}