{"id":"https://openalex.org/W2020733548","doi":"https://doi.org/10.1109/asscc.2014.7008893","title":"A 10.4 mW electrical impedance tomography SoC for portable real-time lung ventilation monitoring system","display_name":"A 10.4 mW electrical impedance tomography SoC for portable real-time lung ventilation monitoring system","publication_year":2014,"publication_date":"2014-11-01","ids":{"openalex":"https://openalex.org/W2020733548","doi":"https://doi.org/10.1109/asscc.2014.7008893","mag":"2020733548"},"language":"en","primary_location":{"id":"doi:10.1109/asscc.2014.7008893","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asscc.2014.7008893","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 IEEE Asian Solid-State Circuits Conference (A-SSCC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5033788275","display_name":"Sunjoo Hong","orcid":null},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Sunjoo Hong","raw_affiliation_strings":["Department of Electrical Engineering, KAIST, Daejeon, Republic of Korea","Department of Electrical Engineering KAIST, Daejeon, Republic of Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, KAIST, Daejeon, Republic of Korea","institution_ids":["https://openalex.org/I157485424"]},{"raw_affiliation_string":"Department of Electrical Engineering KAIST, Daejeon, Republic of Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011205347","display_name":"Jaehyuk Lee","orcid":"https://orcid.org/0000-0001-7113-1161"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jaehyuk Lee","raw_affiliation_strings":["Department of Electrical Engineering, KAIST, Daejeon, Republic of Korea","Department of Electrical Engineering KAIST, Daejeon, Republic of Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, KAIST, Daejeon, Republic of Korea","institution_ids":["https://openalex.org/I157485424"]},{"raw_affiliation_string":"Department of Electrical Engineering KAIST, Daejeon, Republic of Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004764068","display_name":"Joonsung Bae","orcid":"https://orcid.org/0000-0002-6375-2248"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Joonsung Bae","raw_affiliation_strings":["Department of Electrical Engineering, KAIST, Daejeon, Republic of Korea","Department of Electrical Engineering KAIST, Daejeon, Republic of Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, KAIST, Daejeon, Republic of Korea","institution_ids":["https://openalex.org/I157485424"]},{"raw_affiliation_string":"Department of Electrical Engineering KAIST, Daejeon, Republic of Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5077896259","display_name":"Hoi\u2010Jun Yoo","orcid":"https://orcid.org/0000-0002-6661-4879"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hoi-Jun Yoo","raw_affiliation_strings":["Department of Electrical Engineering, KAIST, Daejeon, Republic of Korea","Department of Electrical Engineering KAIST, Daejeon, Republic of Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, KAIST, Daejeon, Republic of Korea","institution_ids":["https://openalex.org/I157485424"]},{"raw_affiliation_string":"Department of Electrical Engineering KAIST, Daejeon, Republic of Korea","institution_ids":["https://openalex.org/I157485424"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5033788275"],"corresponding_institution_ids":["https://openalex.org/I157485424"],"apc_list":null,"apc_paid":null,"fwci":1.6747,"has_fulltext":false,"cited_by_count":21,"citation_normalized_percentile":{"value":0.85825292,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"193","last_page":"196"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14189","display_name":"Intravenous Infusion Technology and Safety","score":0.9866999983787537,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11472","display_name":"Analytical Chemistry and Sensors","score":0.9860000014305115,"subfield":{"id":"https://openalex.org/subfields/1502","display_name":"Bioengineering"},"field":{"id":"https://openalex.org/fields/15","display_name":"Chemical Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electrical-impedance-tomography","display_name":"Electrical impedance tomography","score":0.9476066827774048},{"id":"https://openalex.org/keywords/demodulation","display_name":"Demodulation","score":0.8190321326255798},{"id":"https://openalex.org/keywords/system-on-a-chip","display_name":"System on a chip","score":0.5175432562828064},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.5118895769119263},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.49127596616744995},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.47461405396461487},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.4603632986545563},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.4576844274997711},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4038306474685669},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3715391457080841},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3567770719528198},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.34088942408561707},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.30660712718963623}],"concepts":[{"id":"https://openalex.org/C155175808","wikidata":"https://www.wikidata.org/wiki/Q1326472","display_name":"Electrical impedance tomography","level":3,"score":0.9476066827774048},{"id":"https://openalex.org/C195251586","wikidata":"https://www.wikidata.org/wiki/Q1185939","display_name":"Demodulation","level":3,"score":0.8190321326255798},{"id":"https://openalex.org/C118021083","wikidata":"https://www.wikidata.org/wiki/Q610398","display_name":"System on a chip","level":2,"score":0.5175432562828064},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.5118895769119263},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.49127596616744995},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.47461405396461487},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.4603632986545563},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.4576844274997711},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4038306474685669},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3715391457080841},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3567770719528198},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.34088942408561707},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.30660712718963623},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/asscc.2014.7008893","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asscc.2014.7008893","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 IEEE Asian Solid-State Circuits Conference (A-SSCC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8399999737739563,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":21,"referenced_works":["https://openalex.org/W1965973573","https://openalex.org/W1974968894","https://openalex.org/W1978238763","https://openalex.org/W1978770244","https://openalex.org/W1998025986","https://openalex.org/W2009786158","https://openalex.org/W2048331888","https://openalex.org/W2053510218","https://openalex.org/W2062157129","https://openalex.org/W2062689759","https://openalex.org/W2068854215","https://openalex.org/W2085593785","https://openalex.org/W2095886535","https://openalex.org/W2097353049","https://openalex.org/W2111802846","https://openalex.org/W2122896427","https://openalex.org/W2143748013","https://openalex.org/W2159318368","https://openalex.org/W4236312734","https://openalex.org/W4248274982","https://openalex.org/W6641655348"],"related_works":["https://openalex.org/W1996543123","https://openalex.org/W4388516297","https://openalex.org/W2359871536","https://openalex.org/W2010761432","https://openalex.org/W1992681652","https://openalex.org/W2991320615","https://openalex.org/W4389302182","https://openalex.org/W2065289416","https://openalex.org/W2017236304","https://openalex.org/W2136854845"],"abstract_inverted_index":{"An":[0],"electrical":[1],"impedance":[2],"tomography":[3],"(EIT)":[4],"SoC":[5,18,112],"is":[6,19,119],"proposed":[7,17,110],"for":[8,51,67],"the":[9,31,35,39,106],"portable":[10],"real-time":[11],"lung":[12,36],"ventilation":[13,37],"monitoring":[14],"system.":[15],"The":[16,109],"integrated":[20],"into":[21],"belt-type":[22],"EIT":[23,111],"system":[24],"with":[25,97,131],"32":[26],"electrodes":[27],"and":[28,65,71,82,89,101,126],"can":[29,94,102],"show":[30],"dynamic":[32],"images":[33,93],"of":[34,92,99,113],"on":[38,105],"mobile":[40,107],"devices.":[41,108],"It":[42],"has":[43],"3":[44],"key":[45],"building":[46],"blocks;":[47],"1)":[48],"a":[49,61,86],"T-switch":[50],"high":[52,68],"off":[53],"isolation":[54],">":[55],"60":[56],"dB":[57],"between":[58],"electrodes,":[59],"2)":[60],"I/Q":[62],"signal":[63],"generation":[64],"demodulation":[66,76],"fidelity":[69],"image,":[70],"3)":[72],"an":[73],"on-chip":[74],"fast":[75],"scheme":[77],"to":[78],"reduce":[79],"scanning":[80],"time":[81],"ADC":[83],"speed.":[84],"As":[85],"result,":[87],"real":[88],"imaginary":[90],"part":[91],"be":[95,103],"reconstructed":[96],"97.3%":[98],"accuracy":[100],"displayed":[104],"5.0":[114,117],"mm":[115,118],"\u00d7":[116],"fabricated":[120],"in":[121],"0.18":[122],"\u03bcm":[123],"CMOS":[124],"technology,":[125],"consumes":[127],"only":[128],"10.4":[129],"mW":[130],"1.8":[132],"V":[133],"supply.":[134]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":2},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":4},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":4}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}