{"id":"https://openalex.org/W2116317420","doi":"https://doi.org/10.1109/asscc.2014.7008880","title":"0.2 V 8T SRAM with improved bitline sensing using column-based data randomization","display_name":"0.2 V 8T SRAM with improved bitline sensing using column-based data randomization","publication_year":2014,"publication_date":"2014-11-01","ids":{"openalex":"https://openalex.org/W2116317420","doi":"https://doi.org/10.1109/asscc.2014.7008880","mag":"2116317420"},"language":"en","primary_location":{"id":"doi:10.1109/asscc.2014.7008880","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asscc.2014.7008880","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 IEEE Asian Solid-State Circuits Conference (A-SSCC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101615706","display_name":"Anh Tuan","orcid":"https://orcid.org/0000-0002-8320-6818"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Anh Tuan Do","raw_affiliation_strings":["VIRTUS, Nanyang Technological University, Singapore","VIRTUS, School of Electrical and Electronic Engineering , Nanyang Technological University , Singapore"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"VIRTUS, Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]},{"raw_affiliation_string":"VIRTUS, School of Electrical and Electronic Engineering , Nanyang Technological University , Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002990441","display_name":"Zhaochuan Lee","orcid":null},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Zhaochuan Lee","raw_affiliation_strings":["VIRTUS, Nanyang Technological University, Singapore","VIRTUS, School of Electrical and Electronic Engineering , Nanyang Technological University , Singapore"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"VIRTUS, Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]},{"raw_affiliation_string":"VIRTUS, School of Electrical and Electronic Engineering , Nanyang Technological University , Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100696804","display_name":"Bo Wang","orcid":"https://orcid.org/0000-0001-9199-0799"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Bo Wang","raw_affiliation_strings":["VIRTUS, Nanyang Technological University, Singapore","VIRTUS, School of Electrical and Electronic Engineering , Nanyang Technological University , Singapore"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"VIRTUS, Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]},{"raw_affiliation_string":"VIRTUS, School of Electrical and Electronic Engineering , Nanyang Technological University , Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5045028723","display_name":"Ik\u2010Joon Chang","orcid":"https://orcid.org/0000-0002-8871-8695"},"institutions":[{"id":"https://openalex.org/I35928602","display_name":"Kyung Hee University","ror":"https://ror.org/01zqcg218","country_code":"KR","type":"education","lineage":["https://openalex.org/I35928602"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Ik-Joon Chang","raw_affiliation_strings":["Kyunghee University, Seoul, South Korea","Kyunghee University Seoul South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Kyunghee University, Seoul, South Korea","institution_ids":["https://openalex.org/I35928602"]},{"raw_affiliation_string":"Kyunghee University Seoul South Korea","institution_ids":["https://openalex.org/I35928602"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5013775632","display_name":"Tony T. Kim","orcid":null},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Tony T. Kim","raw_affiliation_strings":["VIRTUS, Nanyang Technological University, Singapore","VIRTUS, School of Electrical and Electronic Engineering , Nanyang Technological University , Singapore"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"VIRTUS, Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]},{"raw_affiliation_string":"VIRTUS, School of Electrical and Electronic Engineering , Nanyang Technological University , Singapore","institution_ids":["https://openalex.org/I172675005"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.2129,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.6196665,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":"35","issue":null,"first_page":"141","last_page":"144"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.8273153901100159},{"id":"https://openalex.org/keywords/swing","display_name":"Swing","score":0.7539511919021606},{"id":"https://openalex.org/keywords/column","display_name":"Column (typography)","score":0.6721879839897156},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6674946546554565},{"id":"https://openalex.org/keywords/margin","display_name":"Margin (machine learning)","score":0.5980194807052612},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5349036455154419},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.49562060832977295},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.44958803057670593},{"id":"https://openalex.org/keywords/biasing","display_name":"Biasing","score":0.41586410999298096},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.31916284561157227},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3168506920337677},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20422828197479248},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.11560958623886108}],"concepts":[{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.8273153901100159},{"id":"https://openalex.org/C65655974","wikidata":"https://www.wikidata.org/wiki/Q14867674","display_name":"Swing","level":2,"score":0.7539511919021606},{"id":"https://openalex.org/C2780551164","wikidata":"https://www.wikidata.org/wiki/Q2306599","display_name":"Column (typography)","level":3,"score":0.6721879839897156},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6674946546554565},{"id":"https://openalex.org/C774472","wikidata":"https://www.wikidata.org/wiki/Q6760393","display_name":"Margin (machine learning)","level":2,"score":0.5980194807052612},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5349036455154419},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.49562060832977295},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.44958803057670593},{"id":"https://openalex.org/C20254490","wikidata":"https://www.wikidata.org/wiki/Q719550","display_name":"Biasing","level":3,"score":0.41586410999298096},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.31916284561157227},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3168506920337677},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20422828197479248},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.11560958623886108},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C126042441","wikidata":"https://www.wikidata.org/wiki/Q1324888","display_name":"Frame (networking)","level":2,"score":0.0},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/asscc.2014.7008880","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asscc.2014.7008880","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 IEEE Asian Solid-State Circuits Conference (A-SSCC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.8799999952316284}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W2006292752","https://openalex.org/W2017216250","https://openalex.org/W2045074698","https://openalex.org/W2049249327","https://openalex.org/W2099911327","https://openalex.org/W2105175332","https://openalex.org/W2106264726","https://openalex.org/W2117574816","https://openalex.org/W2127190809","https://openalex.org/W2144289559","https://openalex.org/W2157693067","https://openalex.org/W2171894735","https://openalex.org/W2293394215","https://openalex.org/W3146394386","https://openalex.org/W4234945234","https://openalex.org/W4248772637"],"related_works":["https://openalex.org/W2360051520","https://openalex.org/W2798244654","https://openalex.org/W34871393","https://openalex.org/W3168108534","https://openalex.org/W1486689224","https://openalex.org/W2094697992","https://openalex.org/W4229574949","https://openalex.org/W2368813785","https://openalex.org/W842509023","https://openalex.org/W2053448087"],"abstract_inverted_index":{"8T":[0],"SRAMs":[1],"operating":[2],"at":[3,113],"sub-threshold":[4],"supply":[5],"voltages":[6],"suffer":[7],"from":[8,35],"bit-line":[9,74],"swing":[10,93],"degradation":[11],"when":[12,29],"the":[13,30,36,39,91,95],"data":[14,56],"pattern":[15],"of":[16,38,60,124],"a":[17,44,72,81,104],"column":[18,66],"is":[19,33,51,67,77,86],"dominated":[20],"by":[21],"`1'":[22],"or":[23],"`0'.":[24],"Worst":[25],"case":[26],"scenarios":[27],"happen":[28],"accessed":[31],"bit":[32],"different":[34],"rest":[37],"column.":[40],"In":[41,79],"this":[42],"work,":[43],"simplified":[45],"Linear":[46],"Feedback":[47],"Shift":[48],"Register":[49],"(LFSR)":[50],"used":[52],"to":[53,69,88],"shuffle":[54],"input":[55],"so":[57],"that":[58],"distribution":[59],"\u201c1\u201d":[61],"and":[62,94,121,127],"\u201c0\u201d":[63],"in":[64,103],"each":[65],"close":[68],"50%.":[70],"As":[71],"result,":[73],"sensing":[75,96],"margin":[76],"enhanced.":[78],"addition,":[80],"bitline":[82,92],"boost":[83],"biasing":[84],"scheme":[85],"applied":[87],"further":[89],"increase":[90],"window.":[97],"A":[98],"16Kb":[99],"test":[100],"chips":[101],"fabricated":[102],"65":[105],"nm":[106],"CMOS":[107],"technology":[108],"demonstrates":[109],"successful":[110],"SRAM":[111],"operation":[112],"0.2":[114],"V,":[115],"room":[116],"temperate,":[117],"having":[118],"power":[119],"consumption":[120],"access":[122],"time":[123],"0.7":[125],"\u03bcW":[126],"2.5":[128],"\u03bcs,":[129],"respectively.":[130]},"counts_by_year":[{"year":2018,"cited_by_count":2},{"year":2015,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}