{"id":"https://openalex.org/W2073212326","doi":"https://doi.org/10.1109/asscc.2011.6123627","title":"A trimless, 0.5V&amp;#x2013;1.0V wide voltage operation, high density SRAM macro utilizing dynamic cell stability monitor and multiple memory cell access","display_name":"A trimless, 0.5V&amp;#x2013;1.0V wide voltage operation, high density SRAM macro utilizing dynamic cell stability monitor and multiple memory cell access","publication_year":2011,"publication_date":"2011-11-01","ids":{"openalex":"https://openalex.org/W2073212326","doi":"https://doi.org/10.1109/asscc.2011.6123627","mag":"2073212326"},"language":"en","primary_location":{"id":"doi:10.1109/asscc.2011.6123627","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asscc.2011.6123627","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Asian Solid-State Circuits Conference 2011","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5044735538","display_name":"K. Kushida","orcid":null},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"K. Kushida","raw_affiliation_strings":["Center of Semiconductor Research and Development, Toshiba Corporation Semiconductor Company, Kawasaki, Japan","Center for Semiconductor Research and Development, Toshiba Corporation Semiconductor Company, Kawasaki, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center of Semiconductor Research and Development, Toshiba Corporation Semiconductor Company, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]},{"raw_affiliation_string":"Center for Semiconductor Research and Development, Toshiba Corporation Semiconductor Company, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013755323","display_name":"Osamu Hirabayashi","orcid":null},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"O. Hirabayashi","raw_affiliation_strings":["Center of Semiconductor Research and Development, Toshiba Corporation Semiconductor Company, Kawasaki, Japan","Center for Semiconductor Research and Development, Toshiba Corporation Semiconductor Company, Kawasaki, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center of Semiconductor Research and Development, Toshiba Corporation Semiconductor Company, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]},{"raw_affiliation_string":"Center for Semiconductor Research and Development, Toshiba Corporation Semiconductor Company, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5021907697","display_name":"Fumihiko Tachibana","orcid":"https://orcid.org/0000-0002-6311-9215"},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"F. Tachibana","raw_affiliation_strings":["Center of Semiconductor Research and Development, Toshiba Corporation Semiconductor Company, Kawasaki, Japan","Center for Semiconductor Research and Development, Toshiba Corporation Semiconductor Company, Kawasaki, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center of Semiconductor Research and Development, Toshiba Corporation Semiconductor Company, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]},{"raw_affiliation_string":"Center for Semiconductor Research and Development, Toshiba Corporation Semiconductor Company, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5105675534","display_name":"Hiroyuki Hara","orcid":null},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"H. Hara","raw_affiliation_strings":["Center of Semiconductor Research and Development, Toshiba Corporation Semiconductor Company, Kawasaki, Japan","Center for Semiconductor Research and Development, Toshiba Corporation Semiconductor Company, Kawasaki, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center of Semiconductor Research and Development, Toshiba Corporation Semiconductor Company, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]},{"raw_affiliation_string":"Center for Semiconductor Research and Development, Toshiba Corporation Semiconductor Company, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080211932","display_name":"Atsushi Kawasumi","orcid":null},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"A. Kawasumi","raw_affiliation_strings":["Center of Semiconductor Research and Development, Toshiba Corporation Semiconductor Company, Kawasaki, Japan","Center for Semiconductor Research and Development, Toshiba Corporation Semiconductor Company, Kawasaki, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center of Semiconductor Research and Development, Toshiba Corporation Semiconductor Company, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]},{"raw_affiliation_string":"Center for Semiconductor Research and Development, Toshiba Corporation Semiconductor Company, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5037457351","display_name":"Akira Suzuki","orcid":"https://orcid.org/0000-0002-5212-0202"},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"A. Suzuki","raw_affiliation_strings":["Center of Semiconductor Research and Development, Toshiba Corporation Semiconductor Company, Kawasaki, Japan","Center for Semiconductor Research and Development, Toshiba Corporation Semiconductor Company, Kawasaki, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center of Semiconductor Research and Development, Toshiba Corporation Semiconductor Company, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]},{"raw_affiliation_string":"Center for Semiconductor Research and Development, Toshiba Corporation Semiconductor Company, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032269766","display_name":"Y. Takeyama","orcid":null},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Y. Takeyama","raw_affiliation_strings":["Center of Semiconductor Research and Development, Toshiba Corporation Semiconductor Company, Kawasaki, Japan","Center for Semiconductor Research and Development, Toshiba Corporation Semiconductor Company, Kawasaki, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center of Semiconductor Research and Development, Toshiba Corporation Semiconductor Company, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]},{"raw_affiliation_string":"Center for Semiconductor Research and Development, Toshiba Corporation Semiconductor Company, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082083737","display_name":"Y. Fujimura","orcid":"https://orcid.org/0000-0001-7961-8169"},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Y. Fujimura","raw_affiliation_strings":["Center of Semiconductor Research and Development, Toshiba Corporation Semiconductor Company, Kawasaki, Japan","Center for Semiconductor Research and Development, Toshiba Corporation Semiconductor Company, Kawasaki, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center of Semiconductor Research and Development, Toshiba Corporation Semiconductor Company, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]},{"raw_affiliation_string":"Center for Semiconductor Research and Development, Toshiba Corporation Semiconductor Company, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5055824203","display_name":"Yusuke Niki","orcid":null},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Y. Niki","raw_affiliation_strings":["Center of Semiconductor Research and Development, Toshiba Corporation Semiconductor Company, Kawasaki, Japan","Center for Semiconductor Research and Development, Toshiba Corporation Semiconductor Company, Kawasaki, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center of Semiconductor Research and Development, Toshiba Corporation Semiconductor Company, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]},{"raw_affiliation_string":"Center for Semiconductor Research and Development, Toshiba Corporation Semiconductor Company, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082115581","display_name":"M. Shizuno","orcid":null},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"M. Shizuno","raw_affiliation_strings":["Center of Semiconductor Research and Development, Toshiba Corporation Semiconductor Company, Kawasaki, Japan","Center for Semiconductor Research and Development, Toshiba Corporation Semiconductor Company, Kawasaki, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center of Semiconductor Research and Development, Toshiba Corporation Semiconductor Company, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]},{"raw_affiliation_string":"Center for Semiconductor Research and Development, Toshiba Corporation Semiconductor Company, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065694778","display_name":"Shinya Sasaki","orcid":"https://orcid.org/0000-0001-6597-4285"},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"S. Sasaki","raw_affiliation_strings":["Center of Semiconductor Research and Development, Toshiba Corporation Semiconductor Company, Kawasaki, Japan","Center for Semiconductor Research and Development, Toshiba Corporation Semiconductor Company, Kawasaki, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center of Semiconductor Research and Development, Toshiba Corporation Semiconductor Company, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]},{"raw_affiliation_string":"Center for Semiconductor Research and Development, Toshiba Corporation Semiconductor Company, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5054331498","display_name":"Tomoaki Yabe","orcid":null},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"T. Yabe","raw_affiliation_strings":["Center of Semiconductor Research and Development, Toshiba Corporation Semiconductor Company, Kawasaki, Japan","Center for Semiconductor Research and Development, Toshiba Corporation Semiconductor Company, Kawasaki, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center of Semiconductor Research and Development, Toshiba Corporation Semiconductor Company, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]},{"raw_affiliation_string":"Center for Semiconductor Research and Development, Toshiba Corporation Semiconductor Company, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":12,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.0812,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.8009409,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"161","last_page":"164"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.7260558605194092},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.6048186421394348},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5901106595993042},{"id":"https://openalex.org/keywords/trimming","display_name":"Trimming","score":0.5403412580490112},{"id":"https://openalex.org/keywords/memory-cell","display_name":"Memory cell","score":0.524651288986206},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5128272175788879},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4890523850917816},{"id":"https://openalex.org/keywords/access-time","display_name":"Access time","score":0.45415276288986206},{"id":"https://openalex.org/keywords/macro","display_name":"Macro","score":0.44730374217033386},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.4381260871887207},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.42095616459846497},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.26653844118118286},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2421075999736786},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.1681327521800995},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.13763585686683655}],"concepts":[{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.7260558605194092},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.6048186421394348},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5901106595993042},{"id":"https://openalex.org/C56951928","wikidata":"https://www.wikidata.org/wiki/Q3539213","display_name":"Trimming","level":2,"score":0.5403412580490112},{"id":"https://openalex.org/C2776638159","wikidata":"https://www.wikidata.org/wiki/Q18343761","display_name":"Memory cell","level":4,"score":0.524651288986206},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5128272175788879},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4890523850917816},{"id":"https://openalex.org/C194080101","wikidata":"https://www.wikidata.org/wiki/Q46306","display_name":"Access time","level":2,"score":0.45415276288986206},{"id":"https://openalex.org/C166955791","wikidata":"https://www.wikidata.org/wiki/Q629579","display_name":"Macro","level":2,"score":0.44730374217033386},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.4381260871887207},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.42095616459846497},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.26653844118118286},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2421075999736786},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.1681327521800995},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.13763585686683655},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/asscc.2011.6123627","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asscc.2011.6123627","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Asian Solid-State Circuits Conference 2011","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.8700000047683716}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W2047956117","https://openalex.org/W2067392247","https://openalex.org/W2071159343","https://openalex.org/W2100483769","https://openalex.org/W2161000806","https://openalex.org/W2167210005","https://openalex.org/W4235474597","https://openalex.org/W6683296086"],"related_works":["https://openalex.org/W2136045454","https://openalex.org/W2074944429","https://openalex.org/W1991075467","https://openalex.org/W2389637992","https://openalex.org/W2369430179","https://openalex.org/W2609881373","https://openalex.org/W4387697157","https://openalex.org/W2172029144","https://openalex.org/W1504951709","https://openalex.org/W4323831463"],"abstract_inverted_index":{"A":[0,20,48,69,85],"low":[1],"power":[2],"SRAM":[3,88],"operating":[4,61,78],"at":[5,67],"the":[6,31,60,76],"logic":[7],"supply":[8,80],"voltage":[9,81],"of":[10],"0.5V-1.0V":[11],"without":[12],"chip":[13,15,90],"by":[14,29,65],"trimming":[16],"has":[17,97],"been":[18],"developed.":[19],"Dynamic":[21],"Cell":[22,55,72],"Stability":[23],"Monitor":[24],"controls":[25],"wordline":[26],"level":[27],"adaptively":[28],"sensing":[30],"data":[32],"flip":[33],"in":[34,42],"reference":[35],"memory":[36],"cells.":[37],"The":[38],"cell":[39,79,96],"failure":[40],"rate":[41],"every":[43],"process":[44],"corner":[45],"is":[46,63],"improved.":[47],"Modulated":[49],"Wordline":[50],"Level":[51],"Scheme":[52],"for":[53],"Replica":[54],"optimizes":[56],"sense":[57],"timing":[58],"and":[59],"frequency":[62],"improved":[64],"18%":[66],"1.0V.":[68],"Multiple":[70],"Memory":[71],"Access":[73],"Mode":[74],"pushes":[75],"minimum":[77],"down":[82],"to":[83],"0.5V.":[84],"40nm":[86],"2Mb":[87],"test":[89],"with":[91],"0.24um":[92],"<sup":[93],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[94],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</sup>":[95],"demonstrated":[98],"0.5V":[99],"operation.":[100]},"counts_by_year":[{"year":2018,"cited_by_count":1},{"year":2013,"cited_by_count":4}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}