{"id":"https://openalex.org/W2067183422","doi":"https://doi.org/10.1109/asscc.2011.6123615","title":"A 1.8V 11μW CMOS smart humidity sensor for RFID sensing applications","display_name":"A 1.8V 11μW CMOS smart humidity sensor for RFID sensing applications","publication_year":2011,"publication_date":"2011-11-01","ids":{"openalex":"https://openalex.org/W2067183422","doi":"https://doi.org/10.1109/asscc.2011.6123615","mag":"2067183422"},"language":"en","primary_location":{"id":"doi:10.1109/asscc.2011.6123615","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asscc.2011.6123615","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Asian Solid-State Circuits Conference 2011","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5074328280","display_name":"Zhichao Tan","orcid":"https://orcid.org/0000-0002-4097-5123"},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Zhichao Tan","raw_affiliation_strings":["Electronic Instrumentation Laboratory, DIMES, Delft University of Technnology, Delft, Netherlands","Electronic Instrumentation Laboratory / DIMES, Delft University of Technology, Delft, the Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electronic Instrumentation Laboratory, DIMES, Delft University of Technnology, Delft, Netherlands","institution_ids":["https://openalex.org/I98358874"]},{"raw_affiliation_string":"Electronic Instrumentation Laboratory / DIMES, Delft University of Technology, Delft, the Netherlands","institution_ids":["https://openalex.org/I98358874"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044280749","display_name":"R. Daamen","orcid":null},"institutions":[{"id":"https://openalex.org/I109147379","display_name":"NXP (Netherlands)","ror":"https://ror.org/059be4e97","country_code":"NL","type":"company","lineage":["https://openalex.org/I109147379"]},{"id":"https://openalex.org/I4210134434","display_name":"NXP (Belgium)","ror":"https://ror.org/031v4g827","country_code":"BE","type":"company","lineage":["https://openalex.org/I109147379","https://openalex.org/I4210134434"]}],"countries":["BE","NL"],"is_corresponding":false,"raw_author_name":"Roel Daamen","raw_affiliation_strings":["NXP Semiconductors, Central Research and Development, Leuven, Belgium","NXP Semiconductors, Central R&D, Leuven, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NXP Semiconductors, Central Research and Development, Leuven, Belgium","institution_ids":["https://openalex.org/I4210134434"]},{"raw_affiliation_string":"NXP Semiconductors, Central R&D, Leuven, Belgium","institution_ids":["https://openalex.org/I109147379"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5036936503","display_name":"A. Humbert","orcid":null},"institutions":[{"id":"https://openalex.org/I109147379","display_name":"NXP (Netherlands)","ror":"https://ror.org/059be4e97","country_code":"NL","type":"company","lineage":["https://openalex.org/I109147379"]},{"id":"https://openalex.org/I4210134434","display_name":"NXP (Belgium)","ror":"https://ror.org/031v4g827","country_code":"BE","type":"company","lineage":["https://openalex.org/I109147379","https://openalex.org/I4210134434"]}],"countries":["BE","NL"],"is_corresponding":false,"raw_author_name":"Aurelie Humbert","raw_affiliation_strings":["NXP Semiconductors, Central Research and Development, Leuven, Belgium","NXP Semiconductors, Central R&D, Leuven, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NXP Semiconductors, Central Research and Development, Leuven, Belgium","institution_ids":["https://openalex.org/I4210134434"]},{"raw_affiliation_string":"NXP Semiconductors, Central R&D, Leuven, Belgium","institution_ids":["https://openalex.org/I109147379"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109959006","display_name":"Kamran Souri","orcid":null},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Kamran Souri","raw_affiliation_strings":["Electronic Instrumentation Laboratory, DIMES, Delft University of Technnology, Delft, Netherlands","Electronic Instrumentation Laboratory / DIMES, Delft University of Technology, Delft, the Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electronic Instrumentation Laboratory, DIMES, Delft University of Technnology, Delft, Netherlands","institution_ids":["https://openalex.org/I98358874"]},{"raw_affiliation_string":"Electronic Instrumentation Laboratory / DIMES, Delft University of Technology, Delft, the Netherlands","institution_ids":["https://openalex.org/I98358874"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088759343","display_name":"Youngcheol Chae","orcid":"https://orcid.org/0000-0002-1618-169X"},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Youngcheol Chae","raw_affiliation_strings":["Electronic Instrumentation Laboratory, DIMES, Delft University of Technnology, Delft, Netherlands","Electronic Instrumentation Laboratory / DIMES, Delft University of Technology, Delft, the Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electronic Instrumentation Laboratory, DIMES, Delft University of Technnology, Delft, Netherlands","institution_ids":["https://openalex.org/I98358874"]},{"raw_affiliation_string":"Electronic Instrumentation Laboratory / DIMES, Delft University of Technology, Delft, the Netherlands","institution_ids":["https://openalex.org/I98358874"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5104017591","display_name":"Y.V. Ponomarev","orcid":null},"institutions":[{"id":"https://openalex.org/I109147379","display_name":"NXP (Netherlands)","ror":"https://ror.org/059be4e97","country_code":"NL","type":"company","lineage":["https://openalex.org/I109147379"]},{"id":"https://openalex.org/I4210134434","display_name":"NXP (Belgium)","ror":"https://ror.org/031v4g827","country_code":"BE","type":"company","lineage":["https://openalex.org/I109147379","https://openalex.org/I4210134434"]}],"countries":["BE","NL"],"is_corresponding":false,"raw_author_name":"Youri V. Ponomarev","raw_affiliation_strings":["NXP Semiconductors, Central Research and Development, Leuven, Belgium","NXP Semiconductors, Central R&D, Leuven, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NXP Semiconductors, Central Research and Development, Leuven, Belgium","institution_ids":["https://openalex.org/I4210134434"]},{"raw_affiliation_string":"NXP Semiconductors, Central R&D, Leuven, Belgium","institution_ids":["https://openalex.org/I109147379"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5019433498","display_name":"Michiel A. P. Pertijs","orcid":"https://orcid.org/0000-0002-9891-4374"},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Michiel A. P. Pertijs","raw_affiliation_strings":["Electronic Instrumentation Laboratory, DIMES, Delft University of Technnology, Delft, Netherlands","Electronic Instrumentation Laboratory / DIMES, Delft University of Technology, Delft, the Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electronic Instrumentation Laboratory, DIMES, Delft University of Technnology, Delft, Netherlands","institution_ids":["https://openalex.org/I98358874"]},{"raw_affiliation_string":"Electronic Instrumentation Laboratory / DIMES, Delft University of Technology, Delft, the Netherlands","institution_ids":["https://openalex.org/I98358874"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":7,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":3.4513,"has_fulltext":false,"cited_by_count":29,"citation_normalized_percentile":{"value":0.92194554,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"105","last_page":"108"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11667","display_name":"Advanced Chemical Sensor Technologies","score":0.9962999820709229,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11667","display_name":"Advanced Chemical Sensor Technologies","score":0.9962999820709229,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11472","display_name":"Analytical Chemistry and Sensors","score":0.9962000250816345,"subfield":{"id":"https://openalex.org/subfields/1502","display_name":"Bioengineering"},"field":{"id":"https://openalex.org/fields/15","display_name":"Chemical Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10461","display_name":"Gas Sensing Nanomaterials and Sensors","score":0.9947999715805054,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.7245507836341858},{"id":"https://openalex.org/keywords/capacitive-sensing","display_name":"Capacitive sensing","score":0.6940481662750244},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6337190866470337},{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.6225276589393616},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5883667469024658},{"id":"https://openalex.org/keywords/interface","display_name":"Interface (matter)","score":0.5401102900505066},{"id":"https://openalex.org/keywords/humidity","display_name":"Humidity","score":0.5243392586708069},{"id":"https://openalex.org/keywords/electro-optical-sensor","display_name":"Electro-optical sensor","score":0.5219699144363403},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5052044987678528},{"id":"https://openalex.org/keywords/intelligent-sensor","display_name":"Intelligent sensor","score":0.48438507318496704},{"id":"https://openalex.org/keywords/wireless-sensor-network","display_name":"Wireless sensor network","score":0.4330172538757324},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.38889020681381226},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.35180068016052246},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.33310163021087646},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.19591927528381348},{"id":"https://openalex.org/keywords/electrode","display_name":"Electrode","score":0.10583025217056274},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.08272895216941833}],"concepts":[{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.7245507836341858},{"id":"https://openalex.org/C206755178","wikidata":"https://www.wikidata.org/wiki/Q1131271","display_name":"Capacitive sensing","level":2,"score":0.6940481662750244},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6337190866470337},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.6225276589393616},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5883667469024658},{"id":"https://openalex.org/C113843644","wikidata":"https://www.wikidata.org/wiki/Q901882","display_name":"Interface (matter)","level":4,"score":0.5401102900505066},{"id":"https://openalex.org/C151420433","wikidata":"https://www.wikidata.org/wiki/Q180600","display_name":"Humidity","level":2,"score":0.5243392586708069},{"id":"https://openalex.org/C3400440","wikidata":"https://www.wikidata.org/wiki/Q2027487","display_name":"Electro-optical sensor","level":2,"score":0.5219699144363403},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5052044987678528},{"id":"https://openalex.org/C176563091","wikidata":"https://www.wikidata.org/wiki/Q669238","display_name":"Intelligent sensor","level":3,"score":0.48438507318496704},{"id":"https://openalex.org/C24590314","wikidata":"https://www.wikidata.org/wiki/Q336038","display_name":"Wireless sensor network","level":2,"score":0.4330172538757324},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.38889020681381226},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.35180068016052246},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.33310163021087646},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.19591927528381348},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.10583025217056274},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.08272895216941833},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C196806460","wikidata":"https://www.wikidata.org/wiki/Q188603","display_name":"Capillary action","level":2,"score":0.0},{"id":"https://openalex.org/C28413391","wikidata":"https://www.wikidata.org/wiki/Q785542","display_name":"Capillary number","level":3,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/asscc.2011.6123615","is_oa":false,"landing_page_url":"https://doi.org/10.1109/asscc.2011.6123615","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Asian Solid-State Circuits Conference 2011","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.8999999761581421}],"awards":[],"funders":[{"id":"https://openalex.org/F4320322725","display_name":"China Scholarship Council","ror":"https://ror.org/04atp4p48"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1913161556","https://openalex.org/W1998133217","https://openalex.org/W2027808471","https://openalex.org/W2056953745","https://openalex.org/W2059099067","https://openalex.org/W2069381991","https://openalex.org/W2111733621","https://openalex.org/W2134489758","https://openalex.org/W2147823186","https://openalex.org/W2166307883"],"related_works":["https://openalex.org/W2348740411","https://openalex.org/W2051563071","https://openalex.org/W1966596465","https://openalex.org/W2337947459","https://openalex.org/W4386858602","https://openalex.org/W2118205267","https://openalex.org/W2126912594","https://openalex.org/W1988444705","https://openalex.org/W2312410299","https://openalex.org/W2134746914"],"abstract_inverted_index":{"A":[0],"fully-integrated":[1],"humidity":[2],"sensor":[3,8,35,87],"for":[4,52],"a":[5,21,27,32,39,60,69,92,96,117],"smart":[6],"RFID":[7],"platform":[9],"has":[10],"been":[11],"realized":[12],"in":[13,101,120],"0.16\u03bcm":[14],"standard":[15],"CMOS":[16],"technology.":[17],"It":[18],"consists":[19],"of":[20,55,63,98,104],"top-metal":[22],"finger-structure":[23],"capacitor":[24],"covered":[25],"with":[26,31,84,95,128],"humidity-sensitive":[28],"layer,":[29],"combined":[30],"micro-power":[33],"flexible":[34],"interface":[36,45,67],"based":[37],"on":[38],"second-order":[40],"incremental":[41],"delta-sigma":[42],"converter.":[43],"The":[44],"can":[46],"be":[47],"easily":[48],"reconfigured":[49],"to":[50,106,124],"compensate":[51],"process":[53],"variation":[54],"the":[56,66,85,102],"sensing":[57],"element.":[58],"In":[59,82],"measurement":[61],"time":[62],"10.2":[64],"ms,":[65],"performs":[68],"13-bits":[70],"capacitance-to-digital":[71],"conversion":[72,94],"while":[73],"consuming":[74],"only":[75,110],"5.85":[76],"\u03bcA":[77],"from":[78],"1.8":[79],"V":[80],"supply.":[81],"combination":[83],"co-integrated":[86],"capacitor,":[88],"it":[89],"thus":[90],"provides":[91],"humidity-to-digital":[93],"resolution":[97],"0.1%":[99],"RH":[100,108],"range":[103],"20%":[105],"90%":[107],"at":[109],"107":[111],"nJ":[112],"per":[113],"measurement.":[114],"This":[115],"represents":[116],"significant":[118],"improvement":[119],"energy":[121],"efficiency":[122],"compared":[123],"existing":[125],"capacitive-sensor":[126],"interfaces":[127],"comparable":[129],"performance.":[130]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":4},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":7},{"year":2013,"cited_by_count":4},{"year":2012,"cited_by_count":4}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}