{"id":"https://openalex.org/W2589067920","doi":"https://doi.org/10.1109/aspdac.2017.7858379","title":"Containing guardbands","display_name":"Containing guardbands","publication_year":2017,"publication_date":"2017-01-01","ids":{"openalex":"https://openalex.org/W2589067920","doi":"https://doi.org/10.1109/aspdac.2017.7858379","mag":"2589067920"},"language":"en","primary_location":{"id":"doi:10.1109/aspdac.2017.7858379","is_oa":false,"landing_page_url":"https://doi.org/10.1109/aspdac.2017.7858379","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 22nd Asia and South Pacific Design Automation Conference (ASP-DAC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5059133190","display_name":"Hussam Amrouch","orcid":"https://orcid.org/0000-0002-5649-3102"},"institutions":[{"id":"https://openalex.org/I102335020","display_name":"Karlsruhe Institute of Technology","ror":"https://ror.org/04t3en479","country_code":"DE","type":"education","lineage":["https://openalex.org/I102335020","https://openalex.org/I1305996414"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Hussam Amrouch","raw_affiliation_strings":["Chair for Embedded Systems (CES), Karlsruhe Institute of Technology, Karlsruhe, Germany"],"affiliations":[{"raw_affiliation_string":"Chair for Embedded Systems (CES), Karlsruhe Institute of Technology, Karlsruhe, Germany","institution_ids":["https://openalex.org/I102335020"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5063508488","display_name":"J\u00f6rg Henkel","orcid":"https://orcid.org/0000-0001-9602-2922"},"institutions":[{"id":"https://openalex.org/I102335020","display_name":"Karlsruhe Institute of Technology","ror":"https://ror.org/04t3en479","country_code":"DE","type":"education","lineage":["https://openalex.org/I102335020","https://openalex.org/I1305996414"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Jorg Henkel","raw_affiliation_strings":["Chair for Embedded Systems (CES), Karlsruhe Institute of Technology, Karlsruhe, Germany"],"affiliations":[{"raw_affiliation_string":"Chair for Embedded Systems (CES), Karlsruhe Institute of Technology, Karlsruhe, Germany","institution_ids":["https://openalex.org/I102335020"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5059133190"],"corresponding_institution_ids":["https://openalex.org/I102335020"],"apc_list":null,"apc_paid":null,"fwci":0.2867,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.5684196,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"39","issue":null,"first_page":"537","last_page":"542"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7778875231742859},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.7076876759529114},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6844496130943298},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6366015672683716},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5690081119537354},{"id":"https://openalex.org/keywords/interdependence","display_name":"Interdependence","score":0.5330457091331482},{"id":"https://openalex.org/keywords/term","display_name":"Term (time)","score":0.4591066837310791},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.42759114503860474},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.41134247183799744},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18506160378456116},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1669178009033203},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.11274710297584534},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.07342708110809326}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7778875231742859},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.7076876759529114},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6844496130943298},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6366015672683716},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5690081119537354},{"id":"https://openalex.org/C185874996","wikidata":"https://www.wikidata.org/wiki/Q269699","display_name":"Interdependence","level":2,"score":0.5330457091331482},{"id":"https://openalex.org/C61797465","wikidata":"https://www.wikidata.org/wiki/Q1188986","display_name":"Term (time)","level":2,"score":0.4591066837310791},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.42759114503860474},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.41134247183799744},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18506160378456116},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1669178009033203},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.11274710297584534},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.07342708110809326},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C17744445","wikidata":"https://www.wikidata.org/wiki/Q36442","display_name":"Political science","level":0,"score":0.0},{"id":"https://openalex.org/C199539241","wikidata":"https://www.wikidata.org/wiki/Q7748","display_name":"Law","level":1,"score":0.0},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/aspdac.2017.7858379","is_oa":false,"landing_page_url":"https://doi.org/10.1109/aspdac.2017.7858379","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 22nd Asia and South Pacific Design Automation Conference (ASP-DAC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320320879","display_name":"Deutsche Forschungsgemeinschaft","ror":"https://ror.org/018mejw64"},{"id":"https://openalex.org/F4320322516","display_name":"Santen","ror":"https://ror.org/032msy923"},{"id":"https://openalex.org/F4320323428","display_name":"Universitat de Barcelona","ror":"https://ror.org/021018s57"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":35,"referenced_works":["https://openalex.org/W1529164337","https://openalex.org/W1546318334","https://openalex.org/W1966935108","https://openalex.org/W1971395995","https://openalex.org/W1989261992","https://openalex.org/W2001433962","https://openalex.org/W2015159618","https://openalex.org/W2069012095","https://openalex.org/W2071691160","https://openalex.org/W2082973036","https://openalex.org/W2098446574","https://openalex.org/W2113115586","https://openalex.org/W2114648586","https://openalex.org/W2115073796","https://openalex.org/W2117043376","https://openalex.org/W2125263803","https://openalex.org/W2132729131","https://openalex.org/W2147657366","https://openalex.org/W2149134343","https://openalex.org/W2151118077","https://openalex.org/W2156824182","https://openalex.org/W2346485801","https://openalex.org/W2396345169","https://openalex.org/W2401779648","https://openalex.org/W2415551696","https://openalex.org/W2483514863","https://openalex.org/W2588464298","https://openalex.org/W2613754741","https://openalex.org/W3149249597","https://openalex.org/W4251123232","https://openalex.org/W6640183753","https://openalex.org/W6677260143","https://openalex.org/W6721932160","https://openalex.org/W6894391026","https://openalex.org/W7055119176"],"related_works":["https://openalex.org/W2139079562","https://openalex.org/W2749324135","https://openalex.org/W2908433117","https://openalex.org/W2969604939","https://openalex.org/W2378306841","https://openalex.org/W114687057","https://openalex.org/W3122988618","https://openalex.org/W1994631104","https://openalex.org/W3146908316","https://openalex.org/W2588941787"],"abstract_inverted_index":{"Reliability":[0],"concerns":[1],"may":[2],"overtake":[3],"conventional":[4],"design":[5],"constraints":[6],"such":[7],"as":[8,219],"cost":[9],"and":[10,35,108],"performance":[11],"because":[12],"transistors":[13,159],"in":[14,43,141,151,182,188,202,212,220,237],"deep":[15],"nano-CMOS":[16],"era":[17],"are":[18,76,154],"increasingly":[19],"susceptible":[20],"to":[21,31,47,58,69,135,146,224,242,247],"degradation":[22,85,101],"effects.":[23],"This":[24],"made":[25],"reliability":[26,171,199,217,226],"become":[27],"unsustainably":[28],"expensive":[29],"due":[30,241],"need":[32],"for":[33,170],"wider":[34,36],"guardbands":[37,153,240],"(i.e.":[38,88],"safety":[39],"margins).":[40],"It":[41],"is":[42,56,161,175,200,208],"fact":[44],"the":[45,74,98,142,192,221,243],"time":[46],"reverse":[48],"this":[49,62,71,207],"trend:":[50],"instead":[51],"of":[52,77,100,194],"widening":[53],"guardbands,":[54],"it":[55,80,174],"inevitable":[57],"contain":[59],"them.":[60],"In":[61,205],"work,":[63],"we":[64,95,120],"summarize":[65],"three":[66],"novel":[67],"means":[68],"achieve":[70],"goal.":[72],"Since":[73],"causes":[75],"physical":[78],"origin,":[79],"cannot":[81],"be":[82,111],"excluded":[83],"that":[84,104,165],"effects":[86,102],"influence":[87],"amplify":[89],"or":[90],"cancel)":[91],"each":[92],"other.":[93],"Hence,":[94],"first":[96],"investigate":[97],"interdependencies":[99],"demonstrating":[103],"they":[105],"should":[106],"jointly":[107],"not":[109],"separately":[110],"modeled":[112],"towards":[113],"designing":[114],"smaller,":[115],"yet":[116],"sufficient":[117],"guardbands.":[118],"Then,":[119],"show":[121],"how":[122,230],"aging-aware":[123],"logic":[124],"synthesis":[125,144],"based":[126],"on":[127,197],"our":[128,232],"so-called":[129],"degradation-aware":[130],"cell":[131],"libraries,":[132],"enables":[133],"designers":[134],"employ":[136],"mature":[137],"optimization":[138,172],"algorithms":[139],"available":[140],"commercial":[143],"tools":[145],"obtain":[147],"more":[148],"resilient":[149],"circuits":[150],"which":[152],"inherently":[155],"contained.":[156],"Finally,":[157],"instantaneous":[158,195],"aging":[160,181,196,213,234,249],"a":[162,167,209],"recent":[163],"discovery":[164],"bears":[166],"large":[168],"potential":[169],"since":[173],"hardly":[176],"explored":[177],"until":[178],"now.":[179],"Though":[180],"general":[183],"has":[184],"been":[185],"extensively":[186],"studied":[187],"last":[189],"decade,":[190],"investigating":[191],"impact":[193],"circuits'":[198],"still":[201],"its":[203],"infancy.":[204],"fact,":[206],"paradigm":[210],"shift":[211],"from":[214],"sole":[215],"long-term":[216],"degradation,":[218],"traditional":[222],"view,":[223],"short-term":[225],"degradation.":[227],"We":[228],"demonstrate":[229],"employing":[231],"physics-based":[233],"models":[235],"results":[236],"considerably":[238],"smaller":[239],"high":[244],"certainty":[245],"compared":[246],"empirical":[248],"models.":[250]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2018,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}